JP2020016578A - 電圧検出回路、半導体装置及び製造方法 - Google Patents
電圧検出回路、半導体装置及び製造方法 Download PDFInfo
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- 238000001514 detection method Methods 0.000 title claims abstract description 63
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 9
- 239000004065 semiconductor Substances 0.000 title claims description 6
- 238000000034 method Methods 0.000 title claims 3
- 238000009295 crossflow filtration Methods 0.000 description 21
- 230000010355 oscillation Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 8
- 238000012544 monitoring process Methods 0.000 description 8
- 238000011109 contamination Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/385—Arrangements for measuring battery or accumulator variables
- G01R31/387—Determining ampere-hour charge capacity or SoC
- G01R31/388—Determining ampere-hour charge capacity or SoC involving voltage measurements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/382—Arrangements for monitoring battery or accumulator variables, e.g. SoC
- G01R31/3835—Arrangements for monitoring battery or accumulator variables, e.g. SoC involving only voltage measurements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/005—Circuits for altering the indicating characteristic, e.g. making it non-linear
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/144—Measuring arrangements for voltage not covered by other subgroups of G01R15/14
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16576—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing DC or AC voltage with one threshold
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/3644—Constructional arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K21/00—Details of pulse counters or frequency dividers
- H03K21/08—Output circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K23/00—Pulse counters comprising counting chains; Frequency dividers comprising counting chains
- H03K23/40—Gating or clocking signals applied to all stages, i.e. synchronous counters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
- H03K3/037—Bistable circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
Abstract
Description
図2は、電圧検出回路100の動作を示すタイミングチャートである。
図4は、電圧検出回路200の動作を示すタイミングチャートである。O29は、出力制御回路29の出力信号である。
11 コンパレータ
12 基準電圧回路
13、14 ラッチ回路
15 NOT回路
16、17 NOR回路
20 発振回路
21、22 マルチプレクサ
23、24、25、26、27,28 TFF回路
29 出力制御回路
30 バッテリ状態監視回路
100、200 電圧検出回路
300 バッテリ装置
Claims (7)
- 被測定電圧が所定電圧に到達したことを検出する電圧検出回路であって、
粗調整用可変抵抗回路と微調整用可変抵抗回路を備えた抵抗分圧回路と、
前記抵抗分圧回路の出力電圧と基準電圧と比較した結果の検出信号を出力する比較回路と、
前記粗調整用可変抵抗回路を制御する粗調整部と、
前記微調整用可変抵抗回路を制御する微調整部と、
前記比較回路の検出信号に応じて前記粗調整部と前記微調整部を制御する制御部と、を備えた
ことを特徴とする電圧検出回路。 - 前記微調整用可変抵抗回路の調整範囲は、前記粗調整用可変抵抗回路を構成する最小の抵抗値の抵抗の調整範囲よりも広い
ことを特徴とする請求項1に記載の電圧検出回路。 - 前記制御部は、前記粗調整部を動作させた後に、前記比較回路の検出信号の変化に呼応して前記粗調整部を停止し且つ前記微調整部を動作させ、前記比較回路の検出信号の次の変化に呼応して前記微調整部を停止する
ことを特徴とする請求項1または2に記載の電圧検出回路。 - 前記微調整部は、前記粗調整部が動作している時に、前記抵抗分圧回路の出力電圧にオフセット電圧を加えるように構成された
ことを特徴とする請求項3に記載の電圧検出回路。 - 前記基準電圧は、前記粗調整部が動作している時に、オフセット電圧が加えられる
ことを特徴とする請求項3に記載の電圧検出回路。 - 請求項1から5のいずれかに記載の電圧検出回路を備える
ことを特徴とする半導体装置。 - 粗調整用可変抵抗回路と微調整用可変抵抗回路を備えた抵抗分圧回路と、
前記抵抗分圧回路の出力電圧と基準電圧と比較した結果の検出信号を出力する比較回路と、
前記粗調整用可変抵抗回路を制御する粗調整部と、
前記微調整用可変抵抗回路を制御する微調整部と、
前記比較回路の検出信号に応じて前記粗調整部と前記微調整部を制御する制御部と、を有する電圧検出回路を備えた半導体装置の製造方法であって、
前記制御部は、前記粗調整部を動作させ、
前記制御部は、前記比較回路の検出信号が変化したとき前記粗調整部を停止し、且つ前記微調整部を動作させ、
前記制御部は、前記比較回路の検出信号が変化したとき前記微調整部を停止し、
前記粗調整用可変抵抗回路と前記微調整用可変抵抗回路の抵抗値を決定する
ことを特徴とする半導体装置の製造方法。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
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JP2018140442A JP7242124B2 (ja) | 2018-07-26 | 2018-07-26 | 電圧検出回路、半導体装置及び製造方法 |
TW108123840A TWI801623B (zh) | 2018-07-26 | 2019-07-05 | 電壓檢測電路、半導體裝置以及半導體裝置的製造方法 |
KR1020190088819A KR20200012751A (ko) | 2018-07-26 | 2019-07-23 | 전압 검출 회로, 반도체 장치 및 반도체 장치의 제조 방법 |
US16/519,694 US11255880B2 (en) | 2018-07-26 | 2019-07-23 | Voltage detection circuit, semiconductor device, and semiconductor device manufacturing method |
CN201910669914.XA CN110850312B (zh) | 2018-07-26 | 2019-07-24 | 电压检测电路、半导体装置以及半导体装置的制造方法 |
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JP2018140442A JP7242124B2 (ja) | 2018-07-26 | 2018-07-26 | 電圧検出回路、半導体装置及び製造方法 |
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JP7242124B2 JP7242124B2 (ja) | 2023-03-20 |
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JP (1) | JP7242124B2 (ja) |
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TW (1) | TWI801623B (ja) |
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- 2019-07-23 US US16/519,694 patent/US11255880B2/en active Active
- 2019-07-23 KR KR1020190088819A patent/KR20200012751A/ko active Search and Examination
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JPH04330815A (ja) * | 1991-05-02 | 1992-11-18 | Alpine Electron Inc | 学習型音量調整装置 |
JPH05110370A (ja) * | 1991-10-16 | 1993-04-30 | Fujitsu Ltd | 電圧減衰量の調節回路 |
JP2009031093A (ja) * | 2007-07-26 | 2009-02-12 | Seiko Instruments Inc | 電圧検出回路、電圧安定化回路、バッテリ状態監視回路及びバッテリ装置並びにトリミング方法 |
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US11255880B2 (en) | 2022-02-22 |
CN110850312A (zh) | 2020-02-28 |
CN110850312B (zh) | 2023-10-20 |
TWI801623B (zh) | 2023-05-11 |
KR20200012751A (ko) | 2020-02-05 |
JP7242124B2 (ja) | 2023-03-20 |
TW202007983A (zh) | 2020-02-16 |
US20200033382A1 (en) | 2020-01-30 |
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