JP2018537867A5 - - Google Patents
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- Publication number
- JP2018537867A5 JP2018537867A5 JP2018542684A JP2018542684A JP2018537867A5 JP 2018537867 A5 JP2018537867 A5 JP 2018537867A5 JP 2018542684 A JP2018542684 A JP 2018542684A JP 2018542684 A JP2018542684 A JP 2018542684A JP 2018537867 A5 JP2018537867 A5 JP 2018537867A5
- Authority
- JP
- Japan
- Prior art keywords
- silicon
- sige
- fin
- nanowire
- nanostructure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 57
- 229910052710 silicon Inorganic materials 0.000 claims 57
- 239000010703 silicon Substances 0.000 claims 57
- 239000002070 nanowire Substances 0.000 claims 49
- 229910000577 Silicon-germanium Inorganic materials 0.000 claims 41
- 239000002086 nanomaterial Substances 0.000 claims 19
- 239000000758 substrate Substances 0.000 claims 18
- 238000000034 method Methods 0.000 claims 16
- 239000011159 matrix material Substances 0.000 claims 15
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 claims 13
- 229910045601 alloy Inorganic materials 0.000 claims 13
- 239000000956 alloy Substances 0.000 claims 13
- 238000000137 annealing Methods 0.000 claims 8
- 229910052732 germanium Inorganic materials 0.000 claims 8
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims 8
- 239000013078 crystal Substances 0.000 claims 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 5
- 229910052814 silicon oxide Inorganic materials 0.000 claims 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims 3
- 239000000463 material Substances 0.000 claims 3
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims 3
- 229910052760 oxygen Inorganic materials 0.000 claims 3
- 239000001301 oxygen Substances 0.000 claims 3
- 230000007547 defect Effects 0.000 claims 2
- 230000005611 electricity Effects 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201562248561P | 2015-10-30 | 2015-10-30 | |
| US62/248,561 | 2015-10-30 | ||
| PCT/US2016/059037 WO2017075165A1 (en) | 2015-10-30 | 2016-10-27 | Encapsulated nanosturctures and method for fabricating |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018537867A JP2018537867A (ja) | 2018-12-20 |
| JP2018537867A5 true JP2018537867A5 (enExample) | 2019-12-05 |
| JP6773795B2 JP6773795B2 (ja) | 2020-10-21 |
Family
ID=58630816
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018542684A Active JP6773795B2 (ja) | 2015-10-30 | 2016-10-27 | カプセル化ナノ構造及び作製方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US9985101B2 (enExample) |
| JP (1) | JP6773795B2 (enExample) |
| KR (1) | KR102557215B1 (enExample) |
| CN (1) | CN108352400B (enExample) |
| TW (1) | TWI705499B (enExample) |
| WO (1) | WO2017075165A1 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR3046243B1 (fr) * | 2015-12-24 | 2017-12-22 | Commissariat Energie Atomique | Capteur nw-fet comportant au moins deux detecteurs distincts a nanofil de semi-conducteur |
| KR102429611B1 (ko) * | 2016-06-10 | 2022-08-04 | 삼성전자주식회사 | 반도체 장치 제조 방법 |
| EP3382761A1 (en) | 2017-03-29 | 2018-10-03 | IMEC vzw | Integration of silicon-germanium semiconductor structures |
| EP3425673A1 (en) * | 2017-07-04 | 2019-01-09 | IMEC vzw | Germanium nanowire fabrication |
| US10680063B2 (en) * | 2018-09-07 | 2020-06-09 | International Business Machines Corporation | Method of manufacturing stacked SiGe nanotubes |
| US11222950B2 (en) * | 2019-04-24 | 2022-01-11 | National Technology & Engineering Solutions Of Sandia, Llc | Method for fabricating embedded nanostructures with arbitrary shape |
| TWI838260B (zh) * | 2019-10-21 | 2024-04-01 | 美商應用材料股份有限公司 | 水平gaa奈米線及奈米平板電晶體 |
| US11094699B1 (en) | 2020-05-28 | 2021-08-17 | Micron Technology, Inc. | Apparatuses including stacked horizontal capacitor structures and related methods, memory devices, and electronic systems |
| KR20220112317A (ko) | 2021-02-03 | 2022-08-11 | 삼성전자주식회사 | 반도체 소자 |
| WO2023039307A2 (en) * | 2021-05-28 | 2023-03-16 | University Of Florida Research Foundation, Inc. | Self-amplified resonators with embedded piezoresistive elements for high performance, ultra-low swap microwave and millimeter-wave applications |
| US12262559B2 (en) * | 2022-04-07 | 2025-03-25 | Applied Materials, Inc. | Monolithic complementary field-effect transistors having carbon-doped release layers |
Family Cites Families (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AU2003290510A1 (en) | 2002-06-26 | 2004-04-19 | Cornell Research Foundation, Inc. | Small scale wires with microelectromechanical devices |
| KR100481209B1 (ko) * | 2002-10-01 | 2005-04-08 | 삼성전자주식회사 | 다중 채널을 갖는 모스 트랜지스터 및 그 제조방법 |
| TWI283066B (en) * | 2004-09-07 | 2007-06-21 | Samsung Electronics Co Ltd | Field effect transistor (FET) having wire channels and method of fabricating the same |
| US7405465B2 (en) * | 2004-09-29 | 2008-07-29 | Sandisk 3D Llc | Deposited semiconductor structure to minimize n-type dopant diffusion and method of making |
| US7829139B2 (en) | 2005-03-17 | 2010-11-09 | The George Washington University | Method of making nanoparticle wires |
| JP4310399B2 (ja) * | 2006-12-08 | 2009-08-05 | 株式会社東芝 | 半導体装置及びその製造方法 |
| US20080135949A1 (en) * | 2006-12-08 | 2008-06-12 | Agency For Science, Technology And Research | Stacked silicon-germanium nanowire structure and method of forming the same |
| US7821061B2 (en) * | 2007-03-29 | 2010-10-26 | Intel Corporation | Silicon germanium and germanium multigate and nanowire structures for logic and multilevel memory applications |
| FR2924108B1 (fr) * | 2007-11-28 | 2010-02-12 | Commissariat Energie Atomique | Procede d'elaboration, sur un materiau dielectrique, de nanofils en materiaux semi-conducteur connectant deux electrodes |
| US8273591B2 (en) | 2008-03-25 | 2012-09-25 | International Business Machines Corporation | Super lattice/quantum well nanowires |
| JP2010129974A (ja) * | 2008-12-01 | 2010-06-10 | Toshiba Corp | 相補型半導体装置とその製造方法 |
| US7851790B2 (en) * | 2008-12-30 | 2010-12-14 | Intel Corporation | Isolated Germanium nanowire on Silicon fin |
| JP2011199105A (ja) * | 2010-03-23 | 2011-10-06 | Toshiba Corp | 半導体装置の製造方法 |
| US8753942B2 (en) | 2010-12-01 | 2014-06-17 | Intel Corporation | Silicon and silicon germanium nanowire structures |
| US8859389B2 (en) * | 2011-01-28 | 2014-10-14 | Kabushiki Kaisha Toshiba | Methods of making fins and fin field effect transistors (FinFETs) |
| JP5271372B2 (ja) * | 2011-03-18 | 2013-08-21 | 株式会社東芝 | 半導体装置の製造方法 |
| WO2013095652A1 (en) * | 2011-12-23 | 2013-06-27 | Intel Corporation | Uniaxially strained nanowire structure |
| CN109065611B (zh) * | 2011-12-23 | 2022-07-12 | 谷歌有限责任公司 | 具有非分立的源极区和漏极区的纳米线结构 |
| US8927405B2 (en) * | 2012-12-18 | 2015-01-06 | International Business Machines Corporation | Accurate control of distance between suspended semiconductor nanowires and substrate surface |
| US9064942B2 (en) * | 2013-01-28 | 2015-06-23 | International Business Machines Corporation | Nanowire capacitor for bidirectional operation |
| US9184269B2 (en) * | 2013-08-20 | 2015-11-10 | Taiwan Semiconductor Manufacturing Company Limited | Silicon and silicon germanium nanowire formation |
| US8872161B1 (en) * | 2013-08-26 | 2014-10-28 | Taiwan Semiconductor Manufacturing Company, Ltd. | Integrate circuit with nanowires |
| US9263520B2 (en) | 2013-10-10 | 2016-02-16 | Globalfoundries Inc. | Facilitating fabricating gate-all-around nanowire field-effect transistors |
| US9660035B2 (en) | 2014-01-29 | 2017-05-23 | International Business Machines Corporation | Semiconductor device including superlattice SiGe/Si fin structure |
| US9985030B2 (en) | 2014-04-07 | 2018-05-29 | International Business Machines Corporation | FinFET semiconductor device having integrated SiGe fin |
| WO2015171699A1 (en) * | 2014-05-07 | 2015-11-12 | President And Fellows Of Harvard College | Controlled growth of nanoscale wires |
| US9431483B1 (en) * | 2015-03-16 | 2016-08-30 | United Microelectronics Corp. | Nanowire and method of fabricating the same |
-
2016
- 2016-10-27 US US15/335,605 patent/US9985101B2/en active Active
- 2016-10-27 JP JP2018542684A patent/JP6773795B2/ja active Active
- 2016-10-27 KR KR1020187015224A patent/KR102557215B1/ko active Active
- 2016-10-27 CN CN201680063745.XA patent/CN108352400B/zh active Active
- 2016-10-27 WO PCT/US2016/059037 patent/WO2017075165A1/en not_active Ceased
- 2016-10-28 TW TW105134945A patent/TWI705499B/zh active
-
2018
- 2018-04-30 US US15/966,482 patent/US10411096B2/en active Active
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