JP2016526750A5 - - Google Patents

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Publication number
JP2016526750A5
JP2016526750A5 JP2016525343A JP2016525343A JP2016526750A5 JP 2016526750 A5 JP2016526750 A5 JP 2016526750A5 JP 2016525343 A JP2016525343 A JP 2016525343A JP 2016525343 A JP2016525343 A JP 2016525343A JP 2016526750 A5 JP2016526750 A5 JP 2016526750A5
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JP
Japan
Prior art keywords
refresh
row
dram
open
dram bank
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JP2016525343A
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English (en)
Japanese (ja)
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JP6211186B2 (ja
JP2016526750A (ja
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Priority claimed from US14/148,515 external-priority patent/US9524771B2/en
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Publication of JP2016526750A publication Critical patent/JP2016526750A/ja
Publication of JP2016526750A5 publication Critical patent/JP2016526750A5/ja
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Publication of JP6211186B2 publication Critical patent/JP6211186B2/ja
Expired - Fee Related legal-status Critical Current
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JP2016525343A 2013-07-12 2014-05-20 Dramサブアレイレベル自律リフレッシュメモリコントローラの最適化 Expired - Fee Related JP6211186B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201361845818P 2013-07-12 2013-07-12
US61/845,818 2013-07-12
US14/148,515 2014-01-06
US14/148,515 US9524771B2 (en) 2013-07-12 2014-01-06 DRAM sub-array level autonomic refresh memory controller optimization
PCT/US2014/038845 WO2015005975A1 (en) 2013-07-12 2014-05-20 Dram sub-array level autonomic refresh memory controller optimization

Publications (3)

Publication Number Publication Date
JP2016526750A JP2016526750A (ja) 2016-09-05
JP2016526750A5 true JP2016526750A5 (enExample) 2017-03-02
JP6211186B2 JP6211186B2 (ja) 2017-10-11

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Family Applications (1)

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JP2016525343A Expired - Fee Related JP6211186B2 (ja) 2013-07-12 2014-05-20 Dramサブアレイレベル自律リフレッシュメモリコントローラの最適化

Country Status (6)

Country Link
US (1) US9524771B2 (enExample)
EP (1) EP3020046A1 (enExample)
JP (1) JP6211186B2 (enExample)
KR (1) KR101763312B1 (enExample)
CN (1) CN105378847B (enExample)
WO (1) WO2015005975A1 (enExample)

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US11017833B2 (en) 2018-05-24 2021-05-25 Micron Technology, Inc. Apparatuses and methods for pure-time, self adopt sampling for row hammer refresh sampling
US10573370B2 (en) 2018-07-02 2020-02-25 Micron Technology, Inc. Apparatus and methods for triggering row hammer address sampling
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US11227649B2 (en) * 2019-04-04 2022-01-18 Micron Technology, Inc. Apparatuses and methods for staggered timing of targeted refresh operations
US11069393B2 (en) 2019-06-04 2021-07-20 Micron Technology, Inc. Apparatuses and methods for controlling steal rates
US10978132B2 (en) 2019-06-05 2021-04-13 Micron Technology, Inc. Apparatuses and methods for staggered timing of skipped refresh operations
US11023171B2 (en) 2019-07-17 2021-06-01 Micron Technology, Inc. Performing a refresh operation based on a write to read time difference
US11302374B2 (en) 2019-08-23 2022-04-12 Micron Technology, Inc. Apparatuses and methods for dynamic refresh allocation
US11302377B2 (en) * 2019-10-16 2022-04-12 Micron Technology, Inc. Apparatuses and methods for dynamic targeted refresh steals
CN111158585B (zh) * 2019-11-27 2023-08-01 核芯互联科技(青岛)有限公司 一种内存控制器刷新优化方法、装置、设备和存储介质
US11309010B2 (en) 2020-08-14 2022-04-19 Micron Technology, Inc. Apparatuses, systems, and methods for memory directed access pause
US11380382B2 (en) 2020-08-19 2022-07-05 Micron Technology, Inc. Refresh logic circuit layout having aggressor detector circuit sampling circuit and row hammer refresh control circuit
US11348631B2 (en) 2020-08-19 2022-05-31 Micron Technology, Inc. Apparatuses, systems, and methods for identifying victim rows in a memory device which cannot be simultaneously refreshed
CN114255799B (zh) * 2020-09-22 2023-10-17 长鑫存储技术有限公司 存储器数据刷新方法及其控制器、存储器
US11557331B2 (en) 2020-09-23 2023-01-17 Micron Technology, Inc. Apparatuses and methods for controlling refresh operations
US12308069B2 (en) * 2020-10-26 2025-05-20 Qualcomm Incorporated DRAM with quick random row refresh for rowhammer mitigation
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