JP2016518785A - 保持電圧を低減したフリップフロップ - Google Patents

保持電圧を低減したフリップフロップ Download PDF

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Publication number
JP2016518785A
JP2016518785A JP2016507576A JP2016507576A JP2016518785A JP 2016518785 A JP2016518785 A JP 2016518785A JP 2016507576 A JP2016507576 A JP 2016507576A JP 2016507576 A JP2016507576 A JP 2016507576A JP 2016518785 A JP2016518785 A JP 2016518785A
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JP
Japan
Prior art keywords
stage
flop
flip
output
master stage
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Pending
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JP2016507576A
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English (en)
Japanese (ja)
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JP2016518785A5 (https=
Inventor
ラソウリ、セッド・ハディ
ダッタ、アニメシュ
シャー、ジャイ・マドゥカー
サン−ローレン、マーチン
パーカー、ピーユシュ・クマー
バパット、サチン
ビラングディピチャイ、ラマプラサス
アブ−ラーマ、モハメド・ハサン
パテル、プラヤグ・バーヌブハイ
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Qualcomm Inc
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Qualcomm Inc
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Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of JP2016518785A publication Critical patent/JP2016518785A/ja
Publication of JP2016518785A5 publication Critical patent/JP2016518785A5/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01—Details
    • H03K3/012—Modifications of generator to improve response time or to decrease power consumption
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356—Bistable circuits
    • H03K3/356008—Bistable circuits ensuring a predetermined initial state when the supply voltage has been applied; storing the actual state when the supply voltage fails
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356—Bistable circuits
    • H03K3/3562—Bistable circuits of the primary-secondary type
    • H03K3/35625—Bistable circuits of the primary-secondary type using complementary field-effect transistors
JP2016507576A 2013-04-12 2014-04-04 保持電圧を低減したフリップフロップ Pending JP2016518785A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/862,015 2013-04-12
US13/862,015 US9673786B2 (en) 2013-04-12 2013-04-12 Flip-flop with reduced retention voltage
PCT/US2014/033051 WO2014168838A2 (en) 2013-04-12 2014-04-04 A flip-flop with reduced retention voltage

Publications (2)

Publication Number Publication Date
JP2016518785A true JP2016518785A (ja) 2016-06-23
JP2016518785A5 JP2016518785A5 (https=) 2017-08-31

Family

ID=50631117

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016507576A Pending JP2016518785A (ja) 2013-04-12 2014-04-04 保持電圧を低減したフリップフロップ

Country Status (6)

Country Link
US (1) US9673786B2 (https=)
EP (1) EP2984756A2 (https=)
JP (1) JP2016518785A (https=)
KR (1) KR20150143603A (https=)
CN (1) CN105122646B (https=)
WO (1) WO2014168838A2 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017516397A (ja) * 2014-05-02 2017-06-15 クアルコム，インコーポレイテッド 分散型ワイヤレスローカルエリアネットワークドライバモデルを使用してワイヤレス通信を管理するための技法

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US9270257B2 (en) * 2013-08-13 2016-02-23 Texas Instruments Incorporated Dual-port positive level sensitive reset data retention latch
KR102280526B1 (ko) * 2014-12-08 2021-07-21 삼성전자주식회사 저전력 작은-면적 고속 마스터-슬레이브 플립-플롭 회로와, 이를 포함하는 장치들
US9641160B2 (en) * 2015-03-02 2017-05-02 Intel Corporation Common N-well state retention flip-flop
KR102216807B1 (ko) * 2015-03-25 2021-02-19 삼성전자주식회사 반도체 회로
WO2017147895A1 (en) * 2016-03-04 2017-09-08 Qualcomm Incorporated Low-area low clock-power flip-flop
US10394471B2 (en) 2016-08-24 2019-08-27 Qualcomm Incorporated Adaptive power regulation methods and systems
US9990984B1 (en) * 2016-12-06 2018-06-05 Qualcomm Incorporated Pulse-stretcher clock generator circuit for high speed memory subsystems
US10262723B2 (en) 2017-05-25 2019-04-16 Samsung Electronics Co., Ltd. System and method for improving scan hold-time violation and low voltage operation in sequential circuit
US11152347B2 (en) 2018-04-13 2021-10-19 Qualcomm Incorporated Cell circuits formed in circuit cells employing offset gate cut areas in a non-active area for routing transistor gate cross-connections
JP2022534821A (ja) * 2019-06-04 2022-08-04 リトル ドラゴン アイピー ホールディング エルエルシー 低消費電力フリップフロップ回路
US11171659B1 (en) * 2021-01-05 2021-11-09 Micron Technology, Inc. Techniques for reliable clock speed change and associated circuits and methods
CN120014957B (zh) * 2025-04-14 2025-07-18 江苏帝奥微电子股份有限公司 一种基于ltps cmos的面板栅极驱动电路

Citations (12)

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Publication number Priority date Publication date Assignee Title
JPS5711526A (en) * 1980-06-25 1982-01-21 Nec Corp Latch circuit
JPS6179318A (ja) * 1984-09-27 1986-04-22 Fujitsu Ltd フリツプフロツプ回路
JPS61144121A (ja) * 1984-12-18 1986-07-01 Nec Corp 分周回路
JPS6318814A (ja) * 1986-07-11 1988-01-26 Nec Corp フリツプフロツプ回路
JPH06104701A (ja) * 1992-09-24 1994-04-15 Nec Ic Microcomput Syst Ltd フリップフロップ回路
JPH06140885A (ja) * 1992-10-24 1994-05-20 Nec Ic Microcomput Syst Ltd 半導体集積回路
JPH1188140A (ja) * 1997-09-10 1999-03-30 Nec Corp 低消費電力半導体集積回路
JP2002185309A (ja) * 2000-12-18 2002-06-28 Hitachi Ltd データ保持回路および半導体装置並びに半導体装置の設計方法
JP2005167184A (ja) * 2003-11-13 2005-06-23 Renesas Technology Corp 半導体集積回路装置
US20090058484A1 (en) * 2007-08-27 2009-03-05 Texas Instruments Incorporated Slave latch controlled retention flop with lower leakage and higher performance
JP2010226083A (ja) * 2009-02-27 2010-10-07 Renesas Electronics Corp 半導体集積回路装置
JP2012257209A (ja) * 2011-05-13 2012-12-27 Semiconductor Energy Lab Co Ltd 半導体装置

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JPS58210715A (ja) 1982-05-31 1983-12-08 Matsushita Electric Works Ltd フリツプフロツプ回路
US4807266A (en) * 1987-09-28 1989-02-21 Compaq Computer Corporation Circuit and method for performing equal duty cycle odd value clock division and clock synchronization
US5015875A (en) 1989-12-01 1991-05-14 Motorola, Inc. Toggle-free scan flip-flop
US5719878A (en) * 1995-12-04 1998-02-17 Motorola Inc. Scannable storage cell and method of operation
US6573775B2 (en) * 2001-10-30 2003-06-03 Integrated Device Technology, Inc. Integrated circuit flip-flops that utilize master and slave latched sense amplifiers
US6794914B2 (en) * 2002-05-24 2004-09-21 Qualcomm Incorporated Non-volatile multi-threshold CMOS latch with leakage control
KR101045295B1 (ko) * 2004-04-29 2011-06-29 삼성전자주식회사 Ｍｔｃｍｏｓ 플립-플롭, 그를 포함하는 ｍｔｃｍｏｓ회로, 및 그 생성 방법
US7123068B1 (en) * 2005-04-01 2006-10-17 Freescale Semiconductor, Inc. Flip-flop circuit having low power data retention
US7138842B2 (en) * 2005-04-01 2006-11-21 Freescale Semiconductor, Inc. Flip-flop circuit having low power data retention
JP2006339948A (ja) 2005-06-01 2006-12-14 Renesas Technology Corp パルスラッチ回路及び半導体集積回路
US7375567B2 (en) * 2005-06-30 2008-05-20 Texas Instruments Incorporated Digital storage element architecture comprising dual scan clocks and preset functionality
US20070085585A1 (en) * 2005-10-13 2007-04-19 Arm Limited Data retention in operational and sleep modes
US7868677B2 (en) * 2006-12-28 2011-01-11 Stmicroelectronics Pvt. Ltd. Low power flip-flop circuit
US7768331B1 (en) 2007-01-30 2010-08-03 Marvell International Ltd. State-retentive master-slave flip flop to reduce standby leakage current
JP2008219491A (ja) * 2007-03-05 2008-09-18 Nec Electronics Corp マスタスレーブ型フリップフロップ回路およびラッチ回路
US7804669B2 (en) * 2007-04-19 2010-09-28 Qualcomm Incorporated Stacked ESD protection circuit having reduced trigger voltage
US7583121B2 (en) * 2007-08-30 2009-09-01 Freescale Semiconductor, Inc. Flip-flop having logic state retention during a power down mode and method therefor
US8427214B2 (en) 2010-06-03 2013-04-23 Arm Limited Clock state independent retention master-slave flip-flop

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5711526A (en) * 1980-06-25 1982-01-21 Nec Corp Latch circuit
JPS6179318A (ja) * 1984-09-27 1986-04-22 Fujitsu Ltd フリツプフロツプ回路
JPS61144121A (ja) * 1984-12-18 1986-07-01 Nec Corp 分周回路
JPS6318814A (ja) * 1986-07-11 1988-01-26 Nec Corp フリツプフロツプ回路
JPH06104701A (ja) * 1992-09-24 1994-04-15 Nec Ic Microcomput Syst Ltd フリップフロップ回路
JPH06140885A (ja) * 1992-10-24 1994-05-20 Nec Ic Microcomput Syst Ltd 半導体集積回路
JPH1188140A (ja) * 1997-09-10 1999-03-30 Nec Corp 低消費電力半導体集積回路
JP2002185309A (ja) * 2000-12-18 2002-06-28 Hitachi Ltd データ保持回路および半導体装置並びに半導体装置の設計方法
JP2005167184A (ja) * 2003-11-13 2005-06-23 Renesas Technology Corp 半導体集積回路装置
US20090058484A1 (en) * 2007-08-27 2009-03-05 Texas Instruments Incorporated Slave latch controlled retention flop with lower leakage and higher performance
JP2010226083A (ja) * 2009-02-27 2010-10-07 Renesas Electronics Corp 半導体集積回路装置
JP2012257209A (ja) * 2011-05-13 2012-12-27 Semiconductor Energy Lab Co Ltd 半導体装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
湯山俊夫著, 「ディジタルＩＣ回路の設計」, vol. 第２版, JPN6009010660, 10 January 1987 (1987-01-10), JP, pages 41 - 47, ISSN: 0003756421 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017516397A (ja) * 2014-05-02 2017-06-15 クアルコム，インコーポレイテッド 分散型ワイヤレスローカルエリアネットワークドライバモデルを使用してワイヤレス通信を管理するための技法

Also Published As

Publication number Publication date
US9673786B2 (en) 2017-06-06
WO2014168838A3 (en) 2014-12-11
CN105122646A (zh) 2015-12-02
EP2984756A2 (en) 2016-02-17
US20140306735A1 (en) 2014-10-16
WO2014168838A2 (en) 2014-10-16
CN105122646B (zh) 2018-09-07
KR20150143603A (ko) 2015-12-23

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