JP2015090982A - 外部リードピンを含まないチップスケールダイオードパッケージおよびその製造方法 - Google Patents
外部リードピンを含まないチップスケールダイオードパッケージおよびその製造方法 Download PDFInfo
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- JP2015090982A JP2015090982A JP2014218257A JP2014218257A JP2015090982A JP 2015090982 A JP2015090982 A JP 2015090982A JP 2014218257 A JP2014218257 A JP 2014218257A JP 2014218257 A JP2014218257 A JP 2014218257A JP 2015090982 A JP2015090982 A JP 2015090982A
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Abstract
Description
a)1つまたは複数のリードフレームプレートと、対称位置に形成された複数の位置決め孔とを有する事前打ち抜き構成要素を準備するステップと、
b)ステップa)の2つの同じ事前打ち抜き構成要素から形成された鏡映配置事前打ち抜き構成要素を、一方の事前打ち抜き構成要素を他方の事前打ち抜き構成要素から180度回転させて鏡映向きにし、それらの位置決め孔を通して位置合わせすることによって配置するステップと、
c)1つの関連するダイオードチップを固定するように指定されたステップb)の鏡映配置事前打ち抜き構成要素の任意の所定の領域に、無鉛導電性ペーストを塗布するステップと、
d)ステップc)の任意の対応する所定の領域に正確に溶接される1つまたは複数のダイオードチップを結合するステップであって、任意のダイオードチップの上面と下面が、鏡映配置事前打ち抜き構成要素からの1つの関連するリードフレームプレートとそれぞれ溶接されるステップと、
e)どのリードフレームプレートも密封ケーシングの1つの側面に露出した一端を有することを除いて、ステップd)の全てのダイオードチップおよび全てのリードフレームプレートを閉じ込めるために密封ケーシングをパッケージングするステップと、
f)密封ケーシングの側面におけるステップe)のリードフレームプレートの露出している端部の各々に対し、コーティング、浸漬、蒸着、またはスパッタリング加工によって、当該密封ケーシングに封止された鏡映配置リードフレーム電極の各端部と電気的に接続するように各外部電極を被着するステップと、
g)外部リードピンを含まないより単純な構造構成を備えるチップスケールダイオードパッケージを得るステップと
を含む方法を提供することである。
1.このダイオードパッケージは、チップスケールサイズに小型化され、外部リードピンを外部に残さず、ダイオードパッケージの寸法精度を効果的に向上させる。
2.外部リードピンを含まないことにより、本発明の方法によって製造されるダイオードパッケージは、1つまたは複数のダイオードチップを含んで、様々な工業用途での使用に適した多様性および汎用性を向上および改良できる。
3.従来の既知の半導体デバイスに比べて、このダイオードパッケージは、構造がより簡単であるため、自動化機器による自動大量製造に経済的に適している。
4.このダイオードパッケージは、鉛含有材料を用いずに形成されるので、環境保護に関する要件に適合する。
図4に示されるように、それぞれ1つまたは複数のリードフレームプレート31を有する2つの同一の事前打ち抜き構成要素30が、互いに180度回転されて鏡映向きにされ、それらの位置決め孔35を使用することによって正確な位置に位置合わせされて積層される。
図4に示されるように、印刷またはコーティング加工によって、無鉛導電性ペースト40が、事前打ち抜き構成要素30の各リードフレームプレート31上で指定された所定の領域に塗布され、この領域は、ダイオードチップ20がリードフレームプレート31に正確に固定されるように設計される。
図4に示されるように、ダイボンダを使用して、各ダイオードチップ20をその対応するリードフレームプレート31に正確に結合させる。リードフレームプレート31は、ダイオードチップ20を結合させるために事前打ち抜き構成要素30から構成される。ダイボンディング技術によって、1つのダイオードチップ20と、ダイオードチップ20を結合させるために1組の鏡映配置事前打ち抜き構成要素から構成された2つの対応するリードフレームプレート31との間に空いた全ての間隙が、無鉛導電性ペースト40で均一に充填される。
図5に示されるように、ダイオードチップ20は、上面と下面の両方がその対応するリードフレームプレート31と溶接された後、パッケージング金型内に配置され、金型内に半溶融樹脂が注入される。
図5および図6に示されるように、コーティング、銀浸漬、または薄膜加工によって、密封ケーシング50の各側面に外部電極60が塗布されて、外部電極60が、密封ケーシング50の内部電極33と電気的に接続し、本発明のチップスケールダイオードパッケージ10が完成する。
Claims (6)
- 外部リードピンを含まないチップスケールダイオードパッケージであって、少なくとも、
TVSダイオード、ショットキーダイオード、スイッチダイオード、ツェナーダイオード、または整流器ダイオードからそれぞれ形成された1つまたは複数のダイオードチップと、
1対または複数対の鏡映配置リードフレーム電極と、
どのリードフレーム電極も密封ケーシングの1つの側面に露出した一端を有することを除いて、全てのダイオードチップおよび全ての鏡映配置リードフレーム電極を閉じ込めるために、セラミック材料またはプラスチック材料から形成された密封ケーシングと、
1対または複数対の外部電極とを備え、
各対の鏡映配置リードフレーム電極は、内部電極として前記ダイオードチップの1つに結合され、各対の鏡映配置リードフレーム電極は、2つの同一のリードフレーム電極を備え、一方の電極は、他方の電極から180度回転されて鏡映向きにされ、対応するダイオードチップの上面に接続され、前記他方の電極は、同じダイオードチップの下面に接続され、
各対の外部電極は、2つの対向する外部電極を備え、一方の外部電極は、前記密封ケーシングの1つの側面に塗布され、他方の外部電極は、同じ密封ケーシングの別の側面に塗布され、前記対向する外部電極は、それぞれ対応する鏡映配置リードフレーム電極に電気的に接続されることを特徴とする、
チップスケールダイオードパッケージ。 - 無鉛導電性ペーストから形成された導電性接着層は、あらゆるダイオードチップについて、当該ダイオードチップを結合するための該当の鏡映配置リードフレーム電極との間を結合することを特徴とする請求項1に記載のチップスケールダイオードパッケージ。
- 前記鏡映配置リードフレーム電極および前記外部電極は、Ag、Sn、Cu、Au、Ni、Pd、およびPtからなる群から選択される1つまたは複数の無鉛導電性金属またはその金属合金から形成されることを特徴とする請求項1に記載のチップスケールダイオードパッケージ。
- 前記無鉛導電性ペーストは、Ag、Sn、Cu、Au、Ni、Pd、およびPtからなる群から選択される1つまたは複数の無鉛導電性金属を含有することを特徴とする請求項2に記載のチップスケールダイオードパッケージ。
- 請求項1に記載のチップスケールダイオードパッケージを製造するための方法であって、
a)互いに平行に、間隔を空けて配置された1つまたは複数のリードフレームプレートと、対称位置に形成された複数の位置決め孔とを有する事前打ち抜き構成要素を準備するステップと、
b)ステップa)の2つの同じの事前打ち抜き構成要素から形成された鏡映配置事前打ち抜き構成要素を、一方の事前打ち抜き構成要素を他方の事前打ち抜き構成要素から180度回転させて鏡映向きにし、それらの位置決め孔を通して正確な位置に位置合わせすることによって配置するステップと、
c)1つの関連するダイオードチップを固定するために指定されたステップb)の鏡映配置事前打ち抜き構成要素の任意の所定の領域に、無鉛導電性ペーストを塗布するステップと、
d)TVSダイオード、ショットキーダイオード、スイッチダイオード、ツェナーダイオード、または整流器ダイオードから形成され、ステップc)の任意の対応する所定の領域に正確に溶接される1つまたは複数のダイオードチップを結合するステップであって、任意のダイオードチップの上面は、鏡映配置事前打ち抜き構成要素からの1つの関連するリードフレームプレートと溶接され、任意のダイオードチップの下面は、同じ鏡映配置事前打ち抜き構成要素からの別の関連するリードフレームプレートと溶接されるステップと、
e)どのリードフレームプレートも密封ケーシングの1つの側面に露出した一端を有することを除いて、ステップd)の全てのダイオードチップおよび全てのリードフレームプレートを閉じ込めるために密封ケーシングをパッケージングするステップと、
f)ステップe)のリードフレームプレートの端部が露出している密封ケーシングの側面における当該端部に対し、当該密封ケーシングに既に封止された鏡映配置リードフレーム電極の各端部と電気的に接続するように外部電極を被着することにより、外部リードピンを含まないチップスケールダイオードパッケージが得られるステップと、を含むことを特徴とする、
方法。 - 得られたダイオードパッケージは、単一のダイオードチップを有するSMTダイオードパッケージ、または複数のダイオードチップを有するアレイタイプSMTダイオードパッケージであることを特徴とする請求項5に記載のチップスケールダイオードパッケージを製造するための方法。
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TWI394176B (zh) * | 2009-03-06 | 2013-04-21 | Sfi Electronics Technology Inc | 一種晶片型熱敏電阻及其製法 |
US8981539B2 (en) * | 2013-06-10 | 2015-03-17 | Alpha & Omega Semiconductor, Inc. | Packaged power semiconductor with interconnection of dies and metal clips on lead frame |
US8957510B2 (en) * | 2013-07-03 | 2015-02-17 | Freescale Semiconductor, Inc. | Using an integrated circuit die configuration for package height reduction |
US8987881B2 (en) * | 2013-07-10 | 2015-03-24 | Freescale Semiconductor, Inc. | Hybrid lead frame and ball grid array package |
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2013
- 2013-11-05 TW TW102140150A patent/TWI559576B/zh active
-
2014
- 2014-10-24 US US14/523,066 patent/US9165872B2/en active Active
- 2014-10-27 JP JP2014218257A patent/JP2015090982A/ja active Pending
- 2014-10-28 DE DE201410115657 patent/DE102014115657A1/de not_active Withdrawn
- 2014-10-30 KR KR1020140148967A patent/KR101650895B1/ko active IP Right Grant
- 2014-10-31 CN CN201410605779.XA patent/CN104319268B/zh active Active
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JPS54104787A (en) * | 1978-02-03 | 1979-08-17 | Toshiba Corp | Lead frame for photo coupling element |
JPH06310362A (ja) * | 1993-04-24 | 1994-11-04 | Taiyo Yuden Co Ltd | リードフレーム及びその製造方法 |
US5614759A (en) * | 1994-07-12 | 1997-03-25 | General Instrument Corp. | Automated assembly of semiconductor devices using a pair of lead frames |
JPH10503329A (ja) * | 1995-05-12 | 1998-03-24 | フィリップス エレクトロニクス ネムローゼ フェンノートシャップ | 表面取付けに好適な半導体デバイスの製造方法 |
Also Published As
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TWI559576B (zh) | 2016-11-21 |
KR101650895B1 (ko) | 2016-08-24 |
CN104319268A (zh) | 2015-01-28 |
US20150123254A1 (en) | 2015-05-07 |
TW201519475A (zh) | 2015-05-16 |
DE102014115657A1 (de) | 2015-05-07 |
CN104319268B (zh) | 2017-12-01 |
US9165872B2 (en) | 2015-10-20 |
KR20150051884A (ko) | 2015-05-13 |
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