JP2014524581A5 - - Google Patents

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Publication number
JP2014524581A5
JP2014524581A5 JP2014526551A JP2014526551A JP2014524581A5 JP 2014524581 A5 JP2014524581 A5 JP 2014524581A5 JP 2014526551 A JP2014526551 A JP 2014526551A JP 2014526551 A JP2014526551 A JP 2014526551A JP 2014524581 A5 JP2014524581 A5 JP 2014524581A5
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JP
Japan
Prior art keywords
sample
light
light source
detecting
deriving
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Pending
Application number
JP2014526551A
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English (en)
Japanese (ja)
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JP2014524581A (ja
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Priority claimed from PCT/GB2012/052019 external-priority patent/WO2013027034A1/en
Publication of JP2014524581A publication Critical patent/JP2014524581A/ja
Publication of JP2014524581A5 publication Critical patent/JP2014524581A5/ja
Pending legal-status Critical Current

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JP2014526551A 2011-08-19 2012-08-17 微粒子のデュアルモード特徴付け Pending JP2014524581A (ja)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US201161525669P 2011-08-19 2011-08-19
US61/525,669 2011-08-19
US201161560596P 2011-11-16 2011-11-16
US61/560,596 2011-11-16
US201261669004P 2012-07-06 2012-07-06
US61/669,004 2012-07-06
PCT/GB2012/052019 WO2013027034A1 (en) 2011-08-19 2012-08-17 Dual-mode characterization of particulates

Publications (2)

Publication Number Publication Date
JP2014524581A JP2014524581A (ja) 2014-09-22
JP2014524581A5 true JP2014524581A5 (enExample) 2015-04-09

Family

ID=47046636

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014526551A Pending JP2014524581A (ja) 2011-08-19 2012-08-17 微粒子のデュアルモード特徴付け

Country Status (5)

Country Link
US (1) US9816922B2 (enExample)
EP (1) EP2742337B1 (enExample)
JP (1) JP2014524581A (enExample)
CN (1) CN103748450A (enExample)
WO (1) WO2013027034A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015145149A1 (en) * 2014-03-25 2015-10-01 Malvern Instruments Ltd. Raman spectroscopic structure investigation of proteins dispersed in a liquid phase
JP6348349B2 (ja) * 2014-06-20 2018-06-27 大塚電子株式会社 動的光散乱測定装置及び動的光散乱測定方法
CN104486792B (zh) * 2014-12-19 2018-02-13 宇龙计算机通信科技(深圳)有限公司 Rrm测量方法及测量系统、终端和基站
EP3088863A1 (en) 2015-05-01 2016-11-02 Malvern Instruments Limited Improvements relating to particle characterisation
US10371641B2 (en) 2016-01-21 2019-08-06 TimeGate Instruments Oy Method and apparatus for measuring inelastic scattering
JP2017150963A (ja) * 2016-02-25 2017-08-31 株式会社島津製作所 凝集体測定方法及び凝集体測定装置
SE1651057A1 (en) * 2016-07-14 2017-12-27 Brännström Gruppen Ab Method and apparatus for determining solids content in a liquid medium
JP6659062B2 (ja) * 2016-10-13 2020-03-04 国立研究開発法人産業技術総合研究所 ナノ粒子評価方法およびナノ粒子観察装置
US11130686B2 (en) 2017-01-10 2021-09-28 Vermeer Manufacturing Company Systems and methods for dosing slurries to remove suspended solids
CN108333024B (zh) * 2018-03-21 2020-08-25 杭州娃哈哈科技有限公司 一种姜黄素纳米混悬剂的稳定性评价方法
CN108663295B (zh) * 2018-08-06 2024-01-23 上海景瑞阳实业有限公司 一种纳米粒子粒径分布测试仪及测试方法
DE102020129179A1 (de) 2020-11-05 2022-05-05 Technische Universität Braunschweig Verfahren, computerprogramm und miniaturisierter optofluidischer chip zum untersuchen von partikeln in einer flüssigen probe
DE112022001785T5 (de) * 2021-03-26 2024-02-15 Hamamatsu Photonics K.K. Vorrichtung zur abgeschwächten Totalreflexionsspektroskopie und Verfahren zur abgeschwächten Totalreflexionsspektroskopie
CN113029958B (zh) * 2021-04-01 2023-07-25 温州大学 一种用于检测dna变性的动态光散射检测装置
EP4654117A1 (en) * 2024-05-20 2025-11-26 Malvern Panalytical Limited Material characterisation trend analysis

Family Cites Families (17)

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US4586819A (en) * 1982-07-09 1986-05-06 Hitachi, Ltd. Laser Raman microprobe
JPS6053834A (ja) * 1983-09-02 1985-03-27 Hitachi Ltd レ−ザラマンマイクロプロ−ブ
US5506678A (en) * 1992-02-24 1996-04-09 Hewlett Packard Company System for collecting weakly scattered electromagnetic radiation
JP2842064B2 (ja) 1992-07-30 1998-12-24 株式会社デンソー アナログ−ディジタル変換器
WO1994024545A1 (en) * 1993-04-15 1994-10-27 Board Of Regents, The University Of Texas System Raman spectrometer
WO1998059225A1 (en) * 1997-06-20 1998-12-30 Plasma Tec, Inc. Dispersive atomic vapor raman filter
JP3829962B2 (ja) * 1998-01-22 2006-10-04 富士通株式会社 光アッテネータ並びに該光アッテネータを備えたシステム、光増幅器及び端局装置
JP3651755B2 (ja) * 1998-11-05 2005-05-25 株式会社東芝 ガス成分濃度計測装置およびガス成分濃度計測方法
KR20010110420A (ko) * 1999-01-26 2001-12-13 추후제출 내시경 진단용 자가 형광 영상화 시스템
JP3422725B2 (ja) * 1999-05-19 2003-06-30 株式会社堀場製作所 ラマン分光分析と粒度分布測定を同時に行う分析装置
EP1913866A1 (en) * 2000-08-21 2008-04-23 The General Hospital Corporation Methods for diagnosing a neurodegenerative condition
JP2005306827A (ja) 2004-04-17 2005-11-04 Isao Shimizu 生体高分子結晶迅速精製・計測の方法および装置
US7333197B2 (en) * 2004-11-17 2008-02-19 Honeywell International Inc. Raman detection based flow cytometer
KR100817854B1 (ko) * 2006-09-19 2008-03-31 재단법인서울대학교산학협력재단 라만 산란광 및 광산란의 동시 검출 장치
PT2087002E (pt) 2006-10-27 2014-11-26 Lpath Inc Composições e métodos para a ligação de esfingosina-1- fosfato
JP5188758B2 (ja) * 2007-07-17 2013-04-24 株式会社堀場製作所 粒径分布測定装置
FR2933303B1 (fr) 2008-06-30 2010-12-03 Univ Paris Curie Substitut osseux,et procede pour sa preparation.

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