JP2014524581A - 微粒子のデュアルモード特徴付け - Google Patents

微粒子のデュアルモード特徴付け Download PDF

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Publication number
JP2014524581A
JP2014524581A JP2014526551A JP2014526551A JP2014524581A JP 2014524581 A JP2014524581 A JP 2014524581A JP 2014526551 A JP2014526551 A JP 2014526551A JP 2014526551 A JP2014526551 A JP 2014526551A JP 2014524581 A JP2014524581 A JP 2014524581A
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Prior art keywords
sample
light
detecting
coherent
deriving
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Pending
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JP2014526551A
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Japanese (ja)
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JP2014524581A5 (enExample
Inventor
イー. ニール ルイス
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マルバーン インストゥルメンツ リミテッド
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Publication of JP2014524581A publication Critical patent/JP2014524581A/ja
Publication of JP2014524581A5 publication Critical patent/JP2014524581A5/ja
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/44Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • G01N15/0205Investigating particle size or size distribution by optical means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/14Optical investigation techniques, e.g. flow cytometry
    • G01N15/1434Optical arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4704Angular selective
    • G01N2021/4709Backscatter
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/78Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a change of colour
    • G01N21/80Indicating pH value
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • G01N2201/06113Coherent sources; lasers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/068Optics, miscellaneous

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Dispersion Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2014526551A 2011-08-19 2012-08-17 微粒子のデュアルモード特徴付け Pending JP2014524581A (ja)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US201161525669P 2011-08-19 2011-08-19
US61/525,669 2011-08-19
US201161560596P 2011-11-16 2011-11-16
US61/560,596 2011-11-16
US201261669004P 2012-07-06 2012-07-06
US61/669,004 2012-07-06
PCT/GB2012/052019 WO2013027034A1 (en) 2011-08-19 2012-08-17 Dual-mode characterization of particulates

Publications (2)

Publication Number Publication Date
JP2014524581A true JP2014524581A (ja) 2014-09-22
JP2014524581A5 JP2014524581A5 (enExample) 2015-04-09

Family

ID=47046636

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014526551A Pending JP2014524581A (ja) 2011-08-19 2012-08-17 微粒子のデュアルモード特徴付け

Country Status (5)

Country Link
US (1) US9816922B2 (enExample)
EP (1) EP2742337B1 (enExample)
JP (1) JP2014524581A (enExample)
CN (1) CN103748450A (enExample)
WO (1) WO2013027034A1 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017512999A (ja) * 2014-03-25 2017-05-25 マルバーン インストゥルメンツ リミテッド 液相に分散したタンパク質のラマン分光法による構造調査
JP2017150963A (ja) * 2016-02-25 2017-08-31 株式会社島津製作所 凝集体測定方法及び凝集体測定装置
WO2018070324A1 (ja) * 2016-10-13 2018-04-19 国立研究開発法人産業技術総合研究所 ナノ粒子評価方法およびナノ粒子観察装置

Families Citing this family (12)

* Cited by examiner, † Cited by third party
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JP6348349B2 (ja) * 2014-06-20 2018-06-27 大塚電子株式会社 動的光散乱測定装置及び動的光散乱測定方法
CN104486792B (zh) * 2014-12-19 2018-02-13 宇龙计算机通信科技(深圳)有限公司 Rrm测量方法及测量系统、终端和基站
EP3088863A1 (en) 2015-05-01 2016-11-02 Malvern Instruments Limited Improvements relating to particle characterisation
US10371641B2 (en) 2016-01-21 2019-08-06 TimeGate Instruments Oy Method and apparatus for measuring inelastic scattering
SE1651057A1 (en) * 2016-07-14 2017-12-27 Brännström Gruppen Ab Method and apparatus for determining solids content in a liquid medium
US11130686B2 (en) 2017-01-10 2021-09-28 Vermeer Manufacturing Company Systems and methods for dosing slurries to remove suspended solids
CN108333024B (zh) * 2018-03-21 2020-08-25 杭州娃哈哈科技有限公司 一种姜黄素纳米混悬剂的稳定性评价方法
CN108663295B (zh) * 2018-08-06 2024-01-23 上海景瑞阳实业有限公司 一种纳米粒子粒径分布测试仪及测试方法
DE102020129179A1 (de) 2020-11-05 2022-05-05 Technische Universität Braunschweig Verfahren, computerprogramm und miniaturisierter optofluidischer chip zum untersuchen von partikeln in einer flüssigen probe
DE112022001785T5 (de) * 2021-03-26 2024-02-15 Hamamatsu Photonics K.K. Vorrichtung zur abgeschwächten Totalreflexionsspektroskopie und Verfahren zur abgeschwächten Totalreflexionsspektroskopie
CN113029958B (zh) * 2021-04-01 2023-07-25 温州大学 一种用于检测dna变性的动态光散射检测装置
EP4654117A1 (en) * 2024-05-20 2025-11-26 Malvern Panalytical Limited Material characterisation trend analysis

Citations (6)

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JPS6053834A (ja) * 1983-09-02 1985-03-27 Hitachi Ltd レ−ザラマンマイクロプロ−ブ
JP2000146839A (ja) * 1998-11-05 2000-05-26 Toshiba Corp ガス成分濃度計測装置およびガス成分濃度計測方法
JP2000329682A (ja) * 1999-05-19 2000-11-30 Horiba Ltd ラマン分光分析と粒度分布測定を同時に行う分析装置
JP2002535025A (ja) * 1999-01-26 2002-10-22 ニユートン・ラボラトリーズ・インコーポレーテツド 内視鏡用の自己蛍光画像化システム
JP2005306827A (ja) * 2004-04-17 2005-11-04 Isao Shimizu 生体高分子結晶迅速精製・計測の方法および装置
US20100020312A1 (en) * 2006-09-19 2010-01-28 Dae-Hong Jeong Simultaneous detection apparatus of raman and light scattering

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US4586819A (en) * 1982-07-09 1986-05-06 Hitachi, Ltd. Laser Raman microprobe
US5506678A (en) * 1992-02-24 1996-04-09 Hewlett Packard Company System for collecting weakly scattered electromagnetic radiation
JP2842064B2 (ja) 1992-07-30 1998-12-24 株式会社デンソー アナログ−ディジタル変換器
WO1994024545A1 (en) * 1993-04-15 1994-10-27 Board Of Regents, The University Of Texas System Raman spectrometer
WO1998059225A1 (en) * 1997-06-20 1998-12-30 Plasma Tec, Inc. Dispersive atomic vapor raman filter
JP3829962B2 (ja) * 1998-01-22 2006-10-04 富士通株式会社 光アッテネータ並びに該光アッテネータを備えたシステム、光増幅器及び端局装置
EP1913866A1 (en) * 2000-08-21 2008-04-23 The General Hospital Corporation Methods for diagnosing a neurodegenerative condition
US7333197B2 (en) * 2004-11-17 2008-02-19 Honeywell International Inc. Raman detection based flow cytometer
PT2087002E (pt) 2006-10-27 2014-11-26 Lpath Inc Composições e métodos para a ligação de esfingosina-1- fosfato
JP5188758B2 (ja) * 2007-07-17 2013-04-24 株式会社堀場製作所 粒径分布測定装置
FR2933303B1 (fr) 2008-06-30 2010-12-03 Univ Paris Curie Substitut osseux,et procede pour sa preparation.

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6053834A (ja) * 1983-09-02 1985-03-27 Hitachi Ltd レ−ザラマンマイクロプロ−ブ
JP2000146839A (ja) * 1998-11-05 2000-05-26 Toshiba Corp ガス成分濃度計測装置およびガス成分濃度計測方法
JP2002535025A (ja) * 1999-01-26 2002-10-22 ニユートン・ラボラトリーズ・インコーポレーテツド 内視鏡用の自己蛍光画像化システム
JP2000329682A (ja) * 1999-05-19 2000-11-30 Horiba Ltd ラマン分光分析と粒度分布測定を同時に行う分析装置
JP2005306827A (ja) * 2004-04-17 2005-11-04 Isao Shimizu 生体高分子結晶迅速精製・計測の方法および装置
US20100020312A1 (en) * 2006-09-19 2010-01-28 Dae-Hong Jeong Simultaneous detection apparatus of raman and light scattering

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017512999A (ja) * 2014-03-25 2017-05-25 マルバーン インストゥルメンツ リミテッド 液相に分散したタンパク質のラマン分光法による構造調査
JP2017150963A (ja) * 2016-02-25 2017-08-31 株式会社島津製作所 凝集体測定方法及び凝集体測定装置
WO2018070324A1 (ja) * 2016-10-13 2018-04-19 国立研究開発法人産業技術総合研究所 ナノ粒子評価方法およびナノ粒子観察装置
JPWO2018070324A1 (ja) * 2016-10-13 2019-04-25 国立研究開発法人産業技術総合研究所 ナノ粒子評価方法およびナノ粒子観察装置

Also Published As

Publication number Publication date
CN103748450A (zh) 2014-04-23
US9816922B2 (en) 2017-11-14
EP2742337A1 (en) 2014-06-18
WO2013027034A1 (en) 2013-02-28
EP2742337B1 (en) 2016-05-04
US20150146202A1 (en) 2015-05-28

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