JP2013012735A5 - - Google Patents
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- Publication number
- JP2013012735A5 JP2013012735A5 JP2012138007A JP2012138007A JP2013012735A5 JP 2013012735 A5 JP2013012735 A5 JP 2013012735A5 JP 2012138007 A JP2012138007 A JP 2012138007A JP 2012138007 A JP2012138007 A JP 2012138007A JP 2013012735 A5 JP2013012735 A5 JP 2013012735A5
- Authority
- JP
- Japan
- Prior art keywords
- layer
- passivation layer
- group iii
- forming
- source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000002161 passivation Methods 0.000 claims 22
- 238000000034 method Methods 0.000 claims 17
- 239000002184 metal Substances 0.000 claims 13
- 150000004767 nitrides Chemical class 0.000 claims 11
- 229910052581 Si3N4 Inorganic materials 0.000 claims 9
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims 9
- 239000000758 substrate Substances 0.000 claims 9
- 238000005229 chemical vapour deposition Methods 0.000 claims 7
- 238000000151 deposition Methods 0.000 claims 6
- 238000000059 patterning Methods 0.000 claims 6
- 238000001312 dry etching Methods 0.000 claims 4
- 238000005530 etching Methods 0.000 claims 3
- 238000004518 low pressure chemical vapour deposition Methods 0.000 claims 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims 2
- 230000008021 deposition Effects 0.000 claims 2
- 239000003989 dielectric material Substances 0.000 claims 2
- 238000011065 in-situ storage Methods 0.000 claims 2
- 238000004519 manufacturing process Methods 0.000 claims 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims 1
- 239000000956 alloy Substances 0.000 claims 1
- 229910045601 alloy Inorganic materials 0.000 claims 1
- 229910052739 hydrogen Inorganic materials 0.000 claims 1
- 239000001257 hydrogen Substances 0.000 claims 1
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161498951P | 2011-06-20 | 2011-06-20 | |
| US61/498,951 | 2011-06-20 | ||
| US201161526107P | 2011-08-22 | 2011-08-22 | |
| US61/526,107 | 2011-08-22 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013012735A JP2013012735A (ja) | 2013-01-17 |
| JP2013012735A5 true JP2013012735A5 (enExample) | 2015-05-28 |
| JP6054070B2 JP6054070B2 (ja) | 2016-12-27 |
Family
ID=46419896
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012138007A Active JP6054070B2 (ja) | 2011-06-20 | 2012-06-19 | Hemt装置を製造するcmosコンパチブルな方法とそのhemt装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (2) | US9070758B2 (enExample) |
| EP (1) | EP2541605A1 (enExample) |
| JP (1) | JP6054070B2 (enExample) |
Families Citing this family (63)
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| US8940620B2 (en) | 2011-12-15 | 2015-01-27 | Power Integrations, Inc. | Composite wafer for fabrication of semiconductor devices |
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| TWI458092B (zh) * | 2012-01-10 | 2014-10-21 | 國立交通大學 | 具有高電子遷移率之氮化鎵電晶體結構 |
| KR20130128281A (ko) * | 2012-05-16 | 2013-11-26 | 삼성전자주식회사 | 고전자이동도 트랜지스터 및 그 제조방법 |
| CN102723358B (zh) * | 2012-05-30 | 2015-01-07 | 苏州能讯高能半导体有限公司 | 绝缘栅场效应晶体管及其制造方法 |
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| US10522670B2 (en) | 2012-06-26 | 2019-12-31 | Nxp Usa, Inc. | Semiconductor device with selectively etched surface passivation |
| US9111868B2 (en) * | 2012-06-26 | 2015-08-18 | Freescale Semiconductor, Inc. | Semiconductor device with selectively etched surface passivation |
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| JP2014187238A (ja) * | 2013-03-25 | 2014-10-02 | Toyoda Gosei Co Ltd | Mis型半導体装置の製造方法 |
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| JP6136573B2 (ja) * | 2013-05-27 | 2017-05-31 | 富士通株式会社 | 半導体装置及び半導体装置の製造方法 |
| KR102193085B1 (ko) * | 2013-07-08 | 2020-12-21 | 이피션트 파워 컨버젼 코퍼레이션 | 갈륨 나이트라이드 소자 및 집적회로 내에 자기-정렬된 격리를 제작하는 방법 |
| US9263569B2 (en) * | 2013-08-05 | 2016-02-16 | Taiwan Semiconductor Manufacturing Company, Ltd. | MISFET device and method of forming the same |
| EP2843696A1 (en) * | 2013-08-27 | 2015-03-04 | IMEC vzw | A method for dopant implantation of FinFET structures |
| EP2881982B1 (en) * | 2013-12-05 | 2019-09-04 | IMEC vzw | Method for fabricating cmos compatible contact layers in semiconductor devices |
| EP2930754A1 (en) | 2014-04-11 | 2015-10-14 | Nxp B.V. | Semiconductor device |
| JP6591168B2 (ja) * | 2015-02-04 | 2019-10-16 | 株式会社東芝 | 半導体装置及びその製造方法 |
| JP6591169B2 (ja) | 2015-02-04 | 2019-10-16 | 株式会社東芝 | 半導体装置及びその製造方法 |
| JP6520197B2 (ja) | 2015-02-20 | 2019-05-29 | 富士通株式会社 | 化合物半導体装置及びその製造方法 |
| US9679762B2 (en) * | 2015-03-17 | 2017-06-13 | Toshiba Corporation | Access conductivity enhanced high electron mobility transistor |
| JP6478752B2 (ja) * | 2015-03-24 | 2019-03-06 | 株式会社東芝 | 半導体装置及びその製造方法 |
| JP6635400B2 (ja) * | 2015-06-30 | 2020-01-22 | サンケン電気株式会社 | 半導体装置 |
| CN105405878B (zh) * | 2015-11-27 | 2018-11-16 | 西安电子科技大学 | 多沟道侧栅结构的绝缘栅AlGaN/GaN高电子迁移率晶体管 |
| CN105448962B (zh) * | 2015-11-27 | 2019-01-08 | 西安电子科技大学 | 多沟道侧栅结构的AlGaN/GaN高电子迁移率晶体管 |
| US9917171B2 (en) | 2016-07-21 | 2018-03-13 | International Business Machines Corporation | Low-resistive, CMOS-compatible, Au-free ohmic contact to N—InP |
| CN106601787B (zh) * | 2016-12-01 | 2020-06-26 | 北京大学 | 一种InxAlyGa1-x-yN/GaN异质结构及其外延方法 |
| JP6834709B2 (ja) * | 2017-04-03 | 2021-02-24 | 住友電気工業株式会社 | 窒化珪素パッシベーション膜の成膜方法及び半導体装置の製造方法 |
| WO2019068034A2 (en) * | 2017-09-29 | 2019-04-04 | Biothlon, Inc. | NANOPORA DEVICE AND METHOD FOR MANUFACTURING THE SAME |
| CN109659361B (zh) * | 2017-10-12 | 2022-03-04 | 电力集成公司 | 用于异质结器件的栅极堆叠体 |
| TWI674630B (zh) * | 2018-10-18 | 2019-10-11 | 環球晶圓股份有限公司 | 高電子遷移率電晶體的製造方法 |
| US10741494B2 (en) * | 2018-11-07 | 2020-08-11 | Semiconductor Components Industries, Llc | Electronic device including a contact structure contacting a layer |
| KR20220017936A (ko) | 2019-06-07 | 2022-02-14 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| CN112242441A (zh) * | 2019-07-16 | 2021-01-19 | 联华电子股份有限公司 | 高电子迁移率晶体管 |
| CN110600443B (zh) * | 2019-08-02 | 2021-07-20 | 中国科学院微电子研究所 | 一种异构集成hemt器件结构 |
| CN110660780A (zh) * | 2019-09-19 | 2020-01-07 | 大同新成新材料股份有限公司 | 一种形成氮化物半导体器件的工艺 |
| US12206014B2 (en) | 2019-11-29 | 2025-01-21 | Nippon Telegraph And Telephone Corporation | Field-effect transistor and method for manufacturing the same |
| CN111341660B (zh) * | 2020-04-07 | 2024-08-27 | 深圳镓华微电子有限公司 | 氮化镓mishemt的制作方法以及结构 |
| CN112509924B (zh) * | 2020-11-04 | 2022-08-05 | 中国电子科技集团公司第五十五研究所 | 一种E/D集成的GaN HEMT器件制备方法 |
| CN112652535A (zh) * | 2020-12-22 | 2021-04-13 | 深圳市美浦森半导体有限公司 | 一种氮化镓异质结二极管制备方法及二极管 |
| WO2022177504A1 (en) * | 2021-02-22 | 2022-08-25 | Igss-Gan Pte Ltd | Semiconductor apparatus and method for fabricating thereof |
| CN113113478B (zh) * | 2021-03-01 | 2022-10-04 | 西安电子科技大学 | 基于欧姆再生长的GaN基射频功率器件及其制备方法 |
| CN113035783B (zh) * | 2021-03-12 | 2022-07-22 | 浙江集迈科微电子有限公司 | 石墨烯器件与GaN器件异质集成结构及制备方法 |
| CN115132585A (zh) | 2021-03-29 | 2022-09-30 | 联华电子股份有限公司 | 高电子迁移率晶体管及其制作方法 |
| CN115394648A (zh) * | 2021-05-25 | 2022-11-25 | 联华电子股份有限公司 | 氮化物半导体元件及其制造方法 |
| CN114023817A (zh) * | 2021-11-01 | 2022-02-08 | 桂林理工大学 | 带压电介质层的GaN HEMT器件 |
| WO2023127520A1 (ja) * | 2021-12-27 | 2023-07-06 | ローム株式会社 | 窒化物半導体装置およびその製造方法 |
| TWI815442B (zh) * | 2022-05-12 | 2023-09-11 | 環球晶圓股份有限公司 | 高電子遷移率電晶體結構及製造方法 |
| CN114843267B (zh) * | 2022-06-08 | 2024-04-19 | 东南大学 | 一种增强型N沟道和P沟道GaN器件集成结构 |
| JP2024005760A (ja) * | 2022-06-30 | 2024-01-17 | 富士通株式会社 | 半導体装置、半導体装置の製造方法及び電子装置 |
| CN118538755A (zh) * | 2023-02-21 | 2024-08-23 | 东南大学 | 氮化镓半导体器件及其制备方法 |
| CN119092584B (zh) * | 2024-08-19 | 2025-09-26 | 中山大学 | 一种异质结光电探测器的外延结构及制备方法 |
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| TW457555B (en) * | 1998-03-09 | 2001-10-01 | Siemens Ag | Surface passivation using silicon oxynitride |
| JP2002009253A (ja) * | 2000-06-19 | 2002-01-11 | Sony Corp | 半導体装置およびその製造方法 |
| US6593193B2 (en) * | 2001-02-27 | 2003-07-15 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device and method for fabricating the same |
| EP2267783B1 (en) * | 2001-07-24 | 2017-06-21 | Cree, Inc. | Insulating gate algan/gan hemt |
| US7446217B2 (en) * | 2002-11-14 | 2008-11-04 | Advanced Technology Materials, Inc. | Composition and method for low temperature deposition of silicon-containing films |
| US20070138506A1 (en) * | 2003-11-17 | 2007-06-21 | Braddock Walter D | Nitride metal oxide semiconductor integrated transistor devices |
| EP2273553B1 (en) | 2004-06-30 | 2020-02-12 | IMEC vzw | A method for fabricating AlGaN/GaN HEMT devices |
| WO2006080109A1 (ja) | 2005-01-25 | 2006-08-03 | Fujitsu Limited | Mis構造を有する半導体装置及びその製造方法 |
| US20070018199A1 (en) | 2005-07-20 | 2007-01-25 | Cree, Inc. | Nitride-based transistors and fabrication methods with an etch stop layer |
| US20090309187A1 (en) * | 2005-08-24 | 2009-12-17 | Jae-Hyoung Choi | Semiconductor Device and Method of Fabricating the Same |
| JP4823671B2 (ja) | 2005-12-13 | 2011-11-24 | 日本電信電話株式会社 | 窒化物半導体を用いたヘテロ構造電界効果トランジスタ |
| US7709269B2 (en) | 2006-01-17 | 2010-05-04 | Cree, Inc. | Methods of fabricating transistors including dielectrically-supported gate electrodes |
| US8431962B2 (en) * | 2007-12-07 | 2013-04-30 | Northrop Grumman Systems Corporation | Composite passivation process for nitride FET |
| JP5345328B2 (ja) * | 2008-02-22 | 2013-11-20 | 住友電工デバイス・イノベーション株式会社 | 半導体装置の製造方法 |
| US8129555B2 (en) * | 2008-08-12 | 2012-03-06 | Air Products And Chemicals, Inc. | Precursors for depositing silicon-containing films and methods for making and using same |
| US8330167B2 (en) * | 2008-11-26 | 2012-12-11 | Furukawa Electric Co., Ltd | GaN-based field effect transistor and method of manufacturing the same |
| US8105889B2 (en) | 2009-07-27 | 2012-01-31 | Cree, Inc. | Methods of fabricating transistors including self-aligned gate electrodes and source/drain regions |
| WO2011039800A1 (ja) * | 2009-09-29 | 2011-04-07 | 株式会社 東芝 | 半導体装置 |
| US9111868B2 (en) * | 2012-06-26 | 2015-08-18 | Freescale Semiconductor, Inc. | Semiconductor device with selectively etched surface passivation |
| US8946776B2 (en) * | 2012-06-26 | 2015-02-03 | Freescale Semiconductor, Inc. | Semiconductor device with selectively etched surface passivation |
| US8803158B1 (en) * | 2013-02-18 | 2014-08-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | High electron mobility transistor and method of forming the same |
| US8946779B2 (en) * | 2013-02-26 | 2015-02-03 | Freescale Semiconductor, Inc. | MISHFET and Schottky device integration |
-
2012
- 2012-06-18 US US13/525,644 patent/US9070758B2/en active Active
- 2012-06-19 EP EP12172551A patent/EP2541605A1/en not_active Ceased
- 2012-06-19 JP JP2012138007A patent/JP6054070B2/ja active Active
-
2015
- 2015-06-26 US US14/752,375 patent/US9252258B2/en active Active
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