JP2012248703A5 - - Google Patents
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- Publication number
- JP2012248703A5 JP2012248703A5 JP2011119619A JP2011119619A JP2012248703A5 JP 2012248703 A5 JP2012248703 A5 JP 2012248703A5 JP 2011119619 A JP2011119619 A JP 2011119619A JP 2011119619 A JP2011119619 A JP 2011119619A JP 2012248703 A5 JP2012248703 A5 JP 2012248703A5
- Authority
- JP
- Japan
- Prior art keywords
- conductive layer
- groove
- substrate body
- wiring board
- inner bottom
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 claims 14
- 238000004519 manufacturing process Methods 0.000 claims 4
- 239000002184 metal Substances 0.000 claims 4
- 229910052751 metal Inorganic materials 0.000 claims 4
- 238000000034 method Methods 0.000 claims 3
- 239000010949 copper Substances 0.000 claims 2
- 238000009713 electroplating Methods 0.000 claims 2
- 230000002093 peripheral effect Effects 0.000 claims 2
- 229910052710 silicon Inorganic materials 0.000 claims 2
- 239000010703 silicon Substances 0.000 claims 2
- 239000010936 titanium Substances 0.000 claims 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims 1
- 239000012670 alkaline solution Substances 0.000 claims 1
- 229910052802 copper Inorganic materials 0.000 claims 1
- 238000005530 etching Methods 0.000 claims 1
- 229910052719 titanium Inorganic materials 0.000 claims 1
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011119619A JP5613620B2 (ja) | 2011-05-27 | 2011-05-27 | 配線基板及びその製造方法 |
| US13/480,985 US8729407B2 (en) | 2011-05-27 | 2012-05-25 | Wiring substrate and method for manufacturing wiring substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011119619A JP5613620B2 (ja) | 2011-05-27 | 2011-05-27 | 配線基板及びその製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012248703A JP2012248703A (ja) | 2012-12-13 |
| JP2012248703A5 true JP2012248703A5 (enExample) | 2014-04-24 |
| JP5613620B2 JP5613620B2 (ja) | 2014-10-29 |
Family
ID=47218463
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011119619A Active JP5613620B2 (ja) | 2011-05-27 | 2011-05-27 | 配線基板及びその製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8729407B2 (enExample) |
| JP (1) | JP5613620B2 (enExample) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8304863B2 (en) * | 2010-02-09 | 2012-11-06 | International Business Machines Corporation | Electromigration immune through-substrate vias |
| US20140306349A1 (en) * | 2013-04-11 | 2014-10-16 | Qualcomm Incorporated | Low cost interposer comprising an oxidation layer |
| JP2014236102A (ja) * | 2013-05-31 | 2014-12-15 | 凸版印刷株式会社 | 貫通電極付き配線基板、その製造方法及び半導体装置 |
| JP6286169B2 (ja) * | 2013-09-26 | 2018-02-28 | 新光電気工業株式会社 | 配線基板及びその製造方法 |
| US10777839B2 (en) * | 2014-03-28 | 2020-09-15 | Infineon Technologies Ag | Method for forming a battery element, a battery element and a battery |
| TWI553804B (zh) * | 2014-06-06 | 2016-10-11 | 矽品精密工業股份有限公司 | 基板結構之製法 |
| KR102211741B1 (ko) * | 2014-07-21 | 2021-02-03 | 삼성전기주식회사 | 인쇄회로기판 및 인쇄회로기판의 제조 방법 |
| JP2016213283A (ja) * | 2015-05-01 | 2016-12-15 | ソニー株式会社 | 製造方法、および貫通電極付配線基板 |
| EP3109199B1 (fr) * | 2015-06-25 | 2022-05-11 | Nivarox-FAR S.A. | Piece a base de silicium avec au moins un chanfrein et son procede de fabrication |
| TWI625991B (zh) * | 2016-10-17 | 2018-06-01 | 南亞電路板股份有限公司 | 電路板結構與其製造方法 |
| JP7230462B2 (ja) * | 2017-12-04 | 2023-03-01 | ローム株式会社 | 半導体装置およびその製造方法 |
| WO2019171470A1 (ja) * | 2018-03-06 | 2019-09-12 | 株式会社 東芝 | コンデンサ及びその製造方法 |
| CN111508893B (zh) * | 2019-01-31 | 2023-12-15 | 奥特斯(中国)有限公司 | 部件承载件及制造部件承载件的方法 |
| US11711885B2 (en) * | 2020-01-31 | 2023-07-25 | Ttm Technologies, Inc. | Method of manufacturing printed circuit board assemblies with engineered thermal paths |
| US11950371B2 (en) * | 2019-08-22 | 2024-04-02 | Hongqisheng Precision Electronics (Qinhuangdao) Co., Ltd. | Method for manufacturing transparent circuit board |
| US11901266B2 (en) * | 2021-08-30 | 2024-02-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device structure and method for forming the same |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4340832B2 (ja) * | 2001-05-10 | 2009-10-07 | 日立電線株式会社 | 配線基板及びその製造方法 |
| JP2003318178A (ja) * | 2002-04-24 | 2003-11-07 | Seiko Epson Corp | 半導体装置及びその製造方法、回路基板並びに電子機器 |
| JP4056854B2 (ja) | 2002-11-05 | 2008-03-05 | 新光電気工業株式会社 | 半導体装置の製造方法 |
| US7088003B2 (en) * | 2004-02-19 | 2006-08-08 | International Business Machines Corporation | Structures and methods for integration of ultralow-k dielectrics with improved reliability |
| JP5038612B2 (ja) * | 2005-09-29 | 2012-10-03 | 富士通セミコンダクター株式会社 | 半導体装置 |
| JP5154789B2 (ja) * | 2006-12-21 | 2013-02-27 | ルネサスエレクトロニクス株式会社 | 半導体装置並びに半導体装置の製造方法 |
| US8334202B2 (en) * | 2009-11-03 | 2012-12-18 | Infineon Technologies Ag | Device fabricated using an electroplating process |
| KR20120048991A (ko) * | 2010-11-08 | 2012-05-16 | 삼성전자주식회사 | 반도체 장치 및 그 제조 방법 |
| US9018094B2 (en) * | 2011-03-07 | 2015-04-28 | Invensas Corporation | Substrates with through vias with conductive features for connection to integrated circuit elements, and methods for forming through vias in substrates |
| JP2013105753A (ja) * | 2011-11-10 | 2013-05-30 | Toshiba Corp | 半導体装置の製造方法 |
-
2011
- 2011-05-27 JP JP2011119619A patent/JP5613620B2/ja active Active
-
2012
- 2012-05-25 US US13/480,985 patent/US8729407B2/en active Active
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