|
JPS57117238A
(en)
|
1981-01-14 |
1982-07-21 |
Nippon Kogaku Kk <Nikon> |
Exposing and baking device for manufacturing integrated circuit with illuminometer
|
|
JPS6144429A
(ja)
|
1984-08-09 |
1986-03-04 |
Nippon Kogaku Kk <Nikon> |
位置合わせ方法、及び位置合せ装置
|
|
US4780617A
(en)
|
1984-08-09 |
1988-10-25 |
Nippon Kogaku K.K. |
Method for successive alignment of chip patterns on a substrate
|
|
JP3200874B2
(ja)
|
1991-07-10 |
2001-08-20 |
株式会社ニコン |
投影露光装置
|
|
US5243195A
(en)
|
1991-04-25 |
1993-09-07 |
Nikon Corporation |
Projection exposure apparatus having an off-axis alignment system and method of alignment therefor
|
|
US5559582A
(en)
*
|
1992-08-28 |
1996-09-24 |
Nikon Corporation |
Exposure apparatus
|
|
JPH08313842A
(ja)
|
1995-05-15 |
1996-11-29 |
Nikon Corp |
照明光学系および該光学系を備えた露光装置
|
|
JP4029182B2
(ja)
|
1996-11-28 |
2008-01-09 |
株式会社ニコン |
露光方法
|
|
EP1944654A3
(en)
|
1996-11-28 |
2010-06-02 |
Nikon Corporation |
An exposure apparatus and an exposure method
|
|
JP4029183B2
(ja)
|
1996-11-28 |
2008-01-09 |
株式会社ニコン |
投影露光装置及び投影露光方法
|
|
WO1998028665A1
(en)
|
1996-12-24 |
1998-07-02 |
Koninklijke Philips Electronics N.V. |
Two-dimensionally balanced positioning device with two object holders, and lithographic device provided with such a positioning device
|
|
JPH1116816A
(ja)
|
1997-06-25 |
1999-01-22 |
Nikon Corp |
投影露光装置、該装置を用いた露光方法、及び該装置を用いた回路デバイスの製造方法
|
|
JPH1123692A
(ja)
|
1997-06-30 |
1999-01-29 |
Sekisui Chem Co Ltd |
地中探査用アンテナ
|
|
JPH1128790A
(ja)
|
1997-07-09 |
1999-02-02 |
Asahi Chem Ind Co Ltd |
紫外線遮蔽用熱可塑性樹脂板
|
|
JP4210871B2
(ja)
|
1997-10-31 |
2009-01-21 |
株式会社ニコン |
露光装置
|
|
US6020964A
(en)
|
1997-12-02 |
2000-02-01 |
Asm Lithography B.V. |
Interferometer system and lithograph apparatus including an interferometer system
|
|
JP4264676B2
(ja)
|
1998-11-30 |
2009-05-20 |
株式会社ニコン |
露光装置及び露光方法
|
|
US6897963B1
(en)
|
1997-12-18 |
2005-05-24 |
Nikon Corporation |
Stage device and exposure apparatus
|
|
US6208407B1
(en)
|
1997-12-22 |
2001-03-27 |
Asm Lithography B.V. |
Method and apparatus for repetitively projecting a mask pattern on a substrate, using a time-saving height measurement
|
|
WO1999046835A1
(en)
|
1998-03-11 |
1999-09-16 |
Nikon Corporation |
Ultraviolet laser apparatus and exposure apparatus comprising the ultraviolet laser apparatus
|
|
WO1999049504A1
(fr)
|
1998-03-26 |
1999-09-30 |
Nikon Corporation |
Procede et systeme d'exposition par projection
|
|
EP1079223A4
(en)
|
1998-05-19 |
2002-11-27 |
Nikon Corp |
INSTRUMENT AND METHOD FOR MEASURING ABERATIONS, PROJECTION DEVICE INCLUDING THIS INSTRUMENT AND ITS MANUFACTURING METHOD
|
|
WO2001035168A1
(en)
|
1999-11-10 |
2001-05-17 |
Massachusetts Institute Of Technology |
Interference lithography utilizing phase-locked scanning beams
|
|
US20020041377A1
(en)
|
2000-04-25 |
2002-04-11 |
Nikon Corporation |
Aerial image measurement method and unit, optical properties measurement method and unit, adjustment method of projection optical system, exposure method and apparatus, making method of exposure apparatus, and device manufacturing method
|
|
JP2002014005A
(ja)
|
2000-04-25 |
2002-01-18 |
Nikon Corp |
空間像計測方法、結像特性計測方法、空間像計測装置及び露光装置
|
|
KR100815222B1
(ko)
|
2001-02-27 |
2008-03-19 |
에이에스엠엘 유에스, 인크. |
리소그래피 장치 및 적어도 하나의 레티클 상에 형성된 적어도 두 개의 패턴으로부터의 이미지로 기판 스테이지 상의 필드를 노출시키는 방법
|
|
TW529172B
(en)
|
2001-07-24 |
2003-04-21 |
Asml Netherlands Bv |
Imaging apparatus
|
|
US20050059617A1
(en)
|
2001-09-17 |
2005-03-17 |
Takeshi Imanishi |
Novel anitsense oligonucleotide derivatives against to hepatitis c virus
|
|
AU2002351933A1
(en)
|
2001-11-08 |
2003-05-19 |
Develogen Aktiengesellschaft Fur Entwicklungsbiologische Forschung |
Men protein, gst2, rab-rp1, csp, f-box protein lilina/fbl7, abc50, coronin, sec61 alpha, or vhappa1-1, or homologous proteins involved in the regulation of energy homeostasis
|
|
JP4214729B2
(ja)
|
2002-07-25 |
2009-01-28 |
コニカミノルタホールディングス株式会社 |
硬化性白インク組成物
|
|
KR20050035890A
(ko)
|
2002-08-23 |
2005-04-19 |
가부시키가이샤 니콘 |
투영 광학계, 포토리소그래피 방법, 노광 장치 및 그 이용방법
|
|
US6893629B2
(en)
|
2002-10-30 |
2005-05-17 |
Isp Investments Inc. |
Delivery system for a tooth whitener
|
|
SG135052A1
(en)
|
2002-11-12 |
2007-09-28 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
EP1420298B1
(en)
|
2002-11-12 |
2013-02-20 |
ASML Netherlands B.V. |
Lithographic apparatus
|
|
KR101101737B1
(ko)
*
|
2002-12-10 |
2012-01-05 |
가부시키가이샤 니콘 |
노광장치 및 노광방법, 디바이스 제조방법
|
|
CN100370533C
(zh)
|
2002-12-13 |
2008-02-20 |
皇家飞利浦电子股份有限公司 |
用于照射层的方法和用于将辐射导向层的装置
|
|
ATE365962T1
(de)
|
2002-12-19 |
2007-07-15 |
Koninkl Philips Electronics Nv |
Verfahren und anordnung zum bestrahlen einer schicht mittels eines lichtpunkts
|
|
EP1584089B1
(en)
|
2002-12-19 |
2006-08-02 |
Koninklijke Philips Electronics N.V. |
Method and device for irradiating spots on a layer
|
|
KR101643112B1
(ko)
|
2003-02-26 |
2016-07-26 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법 및 디바이스 제조 방법
|
|
JP2004304135A
(ja)
|
2003-04-01 |
2004-10-28 |
Nikon Corp |
露光装置、露光方法及びマイクロデバイスの製造方法
|
|
KR101289959B1
(ko)
|
2003-04-11 |
2013-07-26 |
가부시키가이샤 니콘 |
액침 리소그래피에 의한 광학기기의 세정방법
|
|
JP2005277363A
(ja)
*
|
2003-05-23 |
2005-10-06 |
Nikon Corp |
露光装置及びデバイス製造方法
|
|
TWI474380B
(zh)
|
2003-05-23 |
2015-02-21 |
尼康股份有限公司 |
A method of manufacturing an exposure apparatus and an element
|
|
EP1486827B1
(en)
|
2003-06-11 |
2011-11-02 |
ASML Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
EP3104396B1
(en)
*
|
2003-06-13 |
2018-03-21 |
Nikon Corporation |
Exposure method, substrate stage, exposure apparatus, and device manufacturing method
|
|
US7370659B2
(en)
*
|
2003-08-06 |
2008-05-13 |
Micron Technology, Inc. |
Photolithographic stepper and/or scanner machines including cleaning devices and methods of cleaning photolithographic stepper and/or scanner machines
|
|
JP4305095B2
(ja)
*
|
2003-08-29 |
2009-07-29 |
株式会社ニコン |
光学部品の洗浄機構を搭載した液浸投影露光装置及び液浸光学部品洗浄方法
|
|
JP4444920B2
(ja)
|
2003-09-19 |
2010-03-31 |
株式会社ニコン |
露光装置及びデバイス製造方法
|
|
KR20060126949A
(ko)
|
2003-10-08 |
2006-12-11 |
가부시키가이샤 니콘 |
기판 반송 장치와 기판 반송 방법, 노광 장치와 노광 방법,및 디바이스 제조 방법
|
|
US20050122218A1
(en)
|
2003-12-06 |
2005-06-09 |
Goggin Christopher M. |
Ranging and warning device using emitted and reflected wave energy
|
|
WO2005059617A2
(en)
|
2003-12-15 |
2005-06-30 |
Carl Zeiss Smt Ag |
Projection objective having a high aperture and a planar end surface
|
|
JP5102492B2
(ja)
|
2003-12-19 |
2012-12-19 |
カール・ツァイス・エスエムティー・ゲーエムベーハー |
結晶素子を有するマイクロリソグラフィー投影用対物レンズ
|
|
US7589822B2
(en)
|
2004-02-02 |
2009-09-15 |
Nikon Corporation |
Stage drive method and stage unit, exposure apparatus, and device manufacturing method
|
|
US7557900B2
(en)
*
|
2004-02-10 |
2009-07-07 |
Nikon Corporation |
Exposure apparatus, device manufacturing method, maintenance method, and exposure method
|
|
US7898642B2
(en)
*
|
2004-04-14 |
2011-03-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7616383B2
(en)
|
2004-05-18 |
2009-11-10 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
CN1954408B
(zh)
*
|
2004-06-04 |
2012-07-04 |
尼康股份有限公司 |
曝光装置、曝光方法及元件制造方法
|
|
KR101421915B1
(ko)
|
2004-06-09 |
2014-07-22 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
US20090225286A1
(en)
|
2004-06-21 |
2009-09-10 |
Nikon Corporation |
Exposure apparatus, method for cleaning member thereof , maintenance method for exposure apparatus, maintenance device, and method for producing device
|
|
JP2006013806A
(ja)
|
2004-06-24 |
2006-01-12 |
Maspro Denkoh Corp |
信号処理装置及びcatv用ヘッドエンド装置
|
|
US7463330B2
(en)
|
2004-07-07 |
2008-12-09 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
JP2006032750A
(ja)
*
|
2004-07-20 |
2006-02-02 |
Canon Inc |
液浸型投影露光装置、及びデバイス製造方法
|
|
US7224427B2
(en)
|
2004-08-03 |
2007-05-29 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
Megasonic immersion lithography exposure apparatus and method
|
|
KR101230712B1
(ko)
|
2004-08-03 |
2013-02-07 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법 및 디바이스 제조 방법
|
|
JP4534651B2
(ja)
*
|
2004-08-03 |
2010-09-01 |
株式会社ニコン |
露光装置、デバイス製造方法及び液体回収方法
|
|
US7701550B2
(en)
*
|
2004-08-19 |
2010-04-20 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
JP4772306B2
(ja)
|
2004-09-06 |
2011-09-14 |
株式会社東芝 |
液浸光学装置及び洗浄方法
|
|
WO2006038952A2
(en)
|
2004-09-30 |
2006-04-13 |
Nikon Corporation |
Projection optical device and exposure apparatus
|
|
CN101044594B
(zh)
*
|
2004-10-26 |
2010-05-12 |
株式会社尼康 |
衬底处理方法、曝光装置及器件制造方法
|
|
JP4848956B2
(ja)
|
2004-11-01 |
2011-12-28 |
株式会社ニコン |
露光装置、露光方法、及びデバイス製造方法
|
|
US7362412B2
(en)
|
2004-11-18 |
2008-04-22 |
International Business Machines Corporation |
Method and apparatus for cleaning a semiconductor substrate in an immersion lithography system
|
|
US7732123B2
(en)
|
2004-11-23 |
2010-06-08 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
Immersion photolithography with megasonic rinse
|
|
JP4784513B2
(ja)
|
2004-12-06 |
2011-10-05 |
株式会社ニコン |
メンテナンス方法、メンテナンス機器、露光装置、及びデバイス製造方法
|
|
JP4752473B2
(ja)
|
2004-12-09 |
2011-08-17 |
株式会社ニコン |
露光装置、露光方法及びデバイス製造方法
|
|
US7880860B2
(en)
|
2004-12-20 |
2011-02-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US20060250588A1
(en)
|
2005-05-03 |
2006-11-09 |
Stefan Brandl |
Immersion exposure tool cleaning system and method
|
|
WO2006122578A1
(en)
|
2005-05-17 |
2006-11-23 |
Freescale Semiconductor, Inc. |
Contaminant removal apparatus and method therefor
|
|
US7986395B2
(en)
|
2005-10-24 |
2011-07-26 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
Immersion lithography apparatus and methods
|
|
US8125610B2
(en)
*
|
2005-12-02 |
2012-02-28 |
ASML Metherlands B.V. |
Method for preventing or reducing contamination of an immersion type projection apparatus and an immersion type lithographic apparatus
|
|
US7969548B2
(en)
|
2006-05-22 |
2011-06-28 |
Asml Netherlands B.V. |
Lithographic apparatus and lithographic apparatus cleaning method
|
|
US8564759B2
(en)
|
2006-06-29 |
2013-10-22 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
Apparatus and method for immersion lithography
|