JP2011516844A5 - - Google Patents

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Publication number
JP2011516844A5
JP2011516844A5 JP2011502299A JP2011502299A JP2011516844A5 JP 2011516844 A5 JP2011516844 A5 JP 2011516844A5 JP 2011502299 A JP2011502299 A JP 2011502299A JP 2011502299 A JP2011502299 A JP 2011502299A JP 2011516844 A5 JP2011516844 A5 JP 2011516844A5
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JP
Japan
Prior art keywords
inspection system
beam path
lens
less
dark field
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JP2011502299A
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English (en)
Japanese (ja)
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JP5749641B2 (ja
JP2011516844A (ja
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Priority claimed from PCT/EP2009/002482 external-priority patent/WO2009121628A2/en
Publication of JP2011516844A publication Critical patent/JP2011516844A/ja
Publication of JP2011516844A5 publication Critical patent/JP2011516844A5/ja
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Publication of JP5749641B2 publication Critical patent/JP5749641B2/ja
Expired - Fee Related legal-status Critical Current
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JP2011502299A 2008-04-04 2009-04-03 光学検査システム及び方法 Expired - Fee Related JP5749641B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US6494908P 2008-04-04 2008-04-04
US61/064,949 2008-04-04
PCT/EP2009/002482 WO2009121628A2 (en) 2008-04-04 2009-04-03 Optical inspection system and method

Publications (3)

Publication Number Publication Date
JP2011516844A JP2011516844A (ja) 2011-05-26
JP2011516844A5 true JP2011516844A5 (enExample) 2012-05-24
JP5749641B2 JP5749641B2 (ja) 2015-07-15

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JP2011502299A Expired - Fee Related JP5749641B2 (ja) 2008-04-04 2009-04-03 光学検査システム及び方法

Country Status (7)

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US (4) US8072591B2 (enExample)
JP (1) JP5749641B2 (enExample)
KR (1) KR101697240B1 (enExample)
CN (1) CN102016554B (enExample)
DE (1) DE112009000832T5 (enExample)
TW (1) TWI479583B (enExample)
WO (1) WO2009121628A2 (enExample)

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