JP2011513960A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2011513960A5 JP2011513960A5 JP2010547955A JP2010547955A JP2011513960A5 JP 2011513960 A5 JP2011513960 A5 JP 2011513960A5 JP 2010547955 A JP2010547955 A JP 2010547955A JP 2010547955 A JP2010547955 A JP 2010547955A JP 2011513960 A5 JP2011513960 A5 JP 2011513960A5
- Authority
- JP
- Japan
- Prior art keywords
- layer
- tunnel junction
- type
- type barrier
- barrier layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims 21
- 239000000463 material Substances 0.000 claims 13
- 230000004888 barrier function Effects 0.000 claims 12
- 230000005693 optoelectronics Effects 0.000 claims 9
- 239000012535 impurity Substances 0.000 claims 5
- 238000000034 method Methods 0.000 claims 5
- 230000007547 defect Effects 0.000 claims 3
- 229910052782 aluminium Inorganic materials 0.000 claims 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims 2
- 230000005670 electromagnetic radiation Effects 0.000 claims 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims 1
- 239000013078 crystal Substances 0.000 claims 1
- 229910052733 gallium Inorganic materials 0.000 claims 1
- 229910052738 indium Inorganic materials 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 229910052757 nitrogen Inorganic materials 0.000 claims 1
- 229910052698 phosphorus Inorganic materials 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102008011849 | 2008-02-29 | ||
| DE102008028036A DE102008028036A1 (de) | 2008-02-29 | 2008-06-12 | Optoelektronischer Halbleiterkörper mit Tunnelübergang und Verfahren zur Herstellung eines solchen |
| PCT/DE2009/000282 WO2009106070A1 (de) | 2008-02-29 | 2009-02-26 | Optoelektronischer halbleiterkörper mit tunnelübergang und verfahren zur herstellung eines solchen |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2011513960A JP2011513960A (ja) | 2011-04-28 |
| JP2011513960A5 true JP2011513960A5 (https=) | 2012-01-12 |
Family
ID=40911448
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010547955A Pending JP2011513960A (ja) | 2008-02-29 | 2009-02-26 | トンネル接合を有するオプトエレクトロニクス半導体ボディおよびそのような半導体ボディの製造方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US20110012088A1 (https=) |
| EP (1) | EP2248192A1 (https=) |
| JP (1) | JP2011513960A (https=) |
| KR (1) | KR20100126458A (https=) |
| CN (1) | CN101960622B (https=) |
| DE (1) | DE102008028036A1 (https=) |
| TW (1) | TWI404232B (https=) |
| WO (1) | WO2009106070A1 (https=) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102009054564A1 (de) * | 2009-12-11 | 2011-06-16 | Osram Opto Semiconductors Gmbh | Laserdiodenanordnung und Verfahren zum Herstellen einer Laserdiodenanordnung |
| JP5678806B2 (ja) * | 2011-06-07 | 2015-03-04 | 株式会社デンソー | 半導体レーザ及びその製造方法 |
| DE102011116232B4 (de) | 2011-10-17 | 2020-04-09 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterchip und Verfahren zu dessen Herstellung |
| CN103579426B (zh) * | 2012-07-19 | 2016-04-27 | 华夏光股份有限公司 | 半导体装置 |
| DE102013104954A1 (de) * | 2013-05-14 | 2014-11-20 | Osram Opto Semiconductors Gmbh | Optoelektronisches Bauelement und Verfahren zu seiner Herstellung |
| TWI597862B (zh) * | 2013-08-30 | 2017-09-01 | 晶元光電股份有限公司 | 具阻障層的光電半導體元件 |
| CN103489975B (zh) * | 2013-10-08 | 2016-09-07 | 东南大学 | 一种具有隧道结结构的氮极性面发光二极管 |
| CN103855263A (zh) * | 2014-02-25 | 2014-06-11 | 广东省工业技术研究院(广州有色金属研究院) | 一种具有极化隧道结的GaN基LED外延片及其制备方法 |
| DE102016103852A1 (de) * | 2016-03-03 | 2017-09-07 | Otto-Von-Guericke-Universität Magdeburg | Bauelement im System AlGaInN mit einem Tunnelübergang |
| US9859470B2 (en) * | 2016-03-10 | 2018-01-02 | Epistar Corporation | Light-emitting device with adjusting element |
| DE102016113274B4 (de) * | 2016-07-19 | 2023-03-09 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronischer Halbleiterchip |
| US20180331255A1 (en) * | 2017-05-12 | 2018-11-15 | X Development Llc | Fabrication of ultraviolet light emitting diode with tunnel junction |
| CN107230738B (zh) * | 2017-07-31 | 2019-05-31 | 河北工业大学 | 具有超晶格隧穿结的发光二极管外延结构及其制备方法 |
| JP6964875B2 (ja) * | 2017-11-10 | 2021-11-10 | 学校法人 名城大学 | 窒化物半導体発光素子の製造方法 |
| JP7155723B2 (ja) * | 2018-08-02 | 2022-10-19 | 株式会社リコー | 発光素子及びその製造方法 |
| CN113257940B (zh) | 2020-02-13 | 2023-12-29 | 隆基绿能科技股份有限公司 | 叠层光伏器件及生产方法 |
| CN113066887B (zh) * | 2021-03-19 | 2023-01-20 | 扬州乾照光电有限公司 | 一种太阳电池以及制作方法 |
| CN114566573B (zh) * | 2022-02-12 | 2025-07-04 | 江西兆驰半导体有限公司 | 一种AlGaN基深紫外发光二极管芯片及其制备方法 |
| WO2025198675A1 (en) * | 2023-12-04 | 2025-09-25 | Ohio State Innovation Foundation | Methods of modular construction of 0d-state tunnel junction devices and methods of use thereof |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07326727A (ja) * | 1994-05-30 | 1995-12-12 | Nippon Telegr & Teleph Corp <Ntt> | 共鳴トンネル素子 |
| JP3737175B2 (ja) * | 1995-12-26 | 2006-01-18 | 富士通株式会社 | 光メモリ素子 |
| JPH0992847A (ja) * | 1995-09-21 | 1997-04-04 | Hitachi Cable Ltd | トンネル型半導体素子 |
| US5684309A (en) | 1996-07-11 | 1997-11-04 | North Carolina State University | Stacked quantum well aluminum indium gallium nitride light emitting diodes |
| KR100527349B1 (ko) | 1997-01-09 | 2005-11-09 | 니치아 카가쿠 고교 가부시키가이샤 | 질화물반도체소자 |
| US5831277A (en) | 1997-03-19 | 1998-11-03 | Northwestern University | III-nitride superlattice structures |
| US6266355B1 (en) * | 1997-09-12 | 2001-07-24 | Sdl, Inc. | Group III-V nitride laser devices with cladding layers to suppress defects such as cracking |
| US6841800B2 (en) * | 1997-12-26 | 2005-01-11 | Matsushita Electric Industrial Co., Ltd. | Light-emitting device comprising a gallium-nitride-group compound-semiconductor |
| JP2000277757A (ja) * | 1999-03-26 | 2000-10-06 | Matsushita Electric Ind Co Ltd | 半導体装置及びその製造方法 |
| US6369403B1 (en) * | 1999-05-27 | 2002-04-09 | The Board Of Trustees Of The University Of Illinois | Semiconductor devices and methods with tunnel contact hole sources and non-continuous barrier layer |
| DE19955747A1 (de) | 1999-11-19 | 2001-05-23 | Osram Opto Semiconductors Gmbh | Optische Halbleitervorrichtung mit Mehrfach-Quantentopf-Struktur |
| US6635907B1 (en) * | 1999-11-17 | 2003-10-21 | Hrl Laboratories, Llc | Type II interband heterostructure backward diodes |
| JP4232334B2 (ja) * | 2000-10-20 | 2009-03-04 | 日本電気株式会社 | トンネル接合面発光レーザ |
| US6515308B1 (en) * | 2001-12-21 | 2003-02-04 | Xerox Corporation | Nitride-based VCSEL or light emitting diode with p-n tunnel junction current injection |
| WO2004008551A1 (ja) * | 2002-07-16 | 2004-01-22 | Nitride Semiconductors Co.,Ltd. | 窒化ガリウム系化合物半導体装置 |
| KR100542720B1 (ko) * | 2003-06-03 | 2006-01-11 | 삼성전기주식회사 | GaN계 접합 구조 |
| US7095052B2 (en) * | 2004-10-22 | 2006-08-22 | Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. | Method and structure for improved LED light output |
| DE102005035722B9 (de) * | 2005-07-29 | 2021-11-18 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronischer Halbleiterchip und Verfahren zu dessen Herstellung |
| US7473941B2 (en) * | 2005-08-15 | 2009-01-06 | Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. | Structures for reducing operating voltage in a semiconductor device |
| TWI266440B (en) * | 2005-10-20 | 2006-11-11 | Formosa Epitaxy Inc | Light emitting diode chip |
| US8124957B2 (en) * | 2006-02-22 | 2012-02-28 | Cree, Inc. | Low resistance tunnel junctions in wide band gap materials and method of making same |
| US7737451B2 (en) * | 2006-02-23 | 2010-06-15 | Cree, Inc. | High efficiency LED with tunnel junction layer |
| JP4172505B2 (ja) * | 2006-06-29 | 2008-10-29 | 住友電気工業株式会社 | 面発光型半導体素子及び面発光型半導体素子の製造方法 |
| DE102007031926A1 (de) * | 2007-07-09 | 2009-01-15 | Osram Opto Semiconductors Gmbh | Strahlungsemittierender Halbleiterkörper |
-
2008
- 2008-06-12 DE DE102008028036A patent/DE102008028036A1/de not_active Withdrawn
-
2009
- 2009-02-26 WO PCT/DE2009/000282 patent/WO2009106070A1/de not_active Ceased
- 2009-02-26 JP JP2010547955A patent/JP2011513960A/ja active Pending
- 2009-02-26 EP EP09715687A patent/EP2248192A1/de not_active Withdrawn
- 2009-02-26 US US12/919,532 patent/US20110012088A1/en not_active Abandoned
- 2009-02-26 KR KR1020107021815A patent/KR20100126458A/ko not_active Abandoned
- 2009-02-26 CN CN200980107061.5A patent/CN101960622B/zh not_active Expired - Fee Related
- 2009-02-27 TW TW098106280A patent/TWI404232B/zh not_active IP Right Cessation
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2011513960A5 (https=) | ||
| Margetis et al. | Growth and characterization of epitaxial Ge1-XSnx alloys and heterostructures using a commercial CVD system | |
| CN106415854B (zh) | 包括n型和p型超晶格的电子装置 | |
| Perillat-Merceroz et al. | Compared growth mechanisms of Zn-polar ZnO nanowires on O-polar ZnO and on sapphire | |
| CN102820392B (zh) | 一种发光二极管的外延片及其制造方法 | |
| Park et al. | Efficient stress-relaxation in InGaN/GaN light-emitting diodes using carbon nanotubes | |
| CN104362233A (zh) | 一种GaN基发光二极管的外延片及其制备方法 | |
| WO2013131352A1 (zh) | 半导体发光二极管及其制造方法 | |
| Peng et al. | Room-temperature direct-bandgap electroluminescence from type-I GeSn/SiGeSn multiple quantum wells for 2 μm LEDs | |
| CN103050592A (zh) | 具有p型超晶格的led外延结构及其制备方法 | |
| CN104810445B (zh) | 一种发光二极管的外延片及其制备方法 | |
| JP2007535806A5 (https=) | ||
| JP2014053639A5 (ja) | 半導体素子用エピタキシャル基板の作製方法、半導体素子用エピタキシャル基板、および半導体素子 | |
| CN102044598A (zh) | 一种GaN基发光二极管外延片及其生长方法 | |
| WO2013168371A1 (ja) | エピタキシャル基板、半導体装置及び半導体装置の製造方法 | |
| CN104300049A (zh) | 带有应变源的GeSn量子阱红外发光器 | |
| US20140048819A1 (en) | Semiconductor light-emitting device | |
| WO2016054191A1 (en) | Ultraviolet light emitting device doped with boron | |
| TW201523837A (zh) | 基底結構、互補金屬氧化物半導體元件以及製造互補金屬氧化物半導體元件的方法 | |
| CN104332537B (zh) | 一种高浓度Te掺杂的发光二极管外延结构 | |
| CN103999232B (zh) | 多量子阱太阳能电池及多量子阱太阳能电池的制造方法 | |
| CN103779405B (zh) | GaAs衬底上生长赝配高电子迁移晶体管材料及方法 | |
| CN104253182B (zh) | 一种具有非对称垒层的蓝光led外延结构 | |
| CN109390440A (zh) | 一种发光二极管的外延片及制备方法 | |
| CN117410402B (zh) | 一种发光二极管外延片及其制备方法、Micro-LED芯片 |