JP2011257583A5 - - Google Patents

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Publication number
JP2011257583A5
JP2011257583A5 JP2010131772A JP2010131772A JP2011257583A5 JP 2011257583 A5 JP2011257583 A5 JP 2011257583A5 JP 2010131772 A JP2010131772 A JP 2010131772A JP 2010131772 A JP2010131772 A JP 2010131772A JP 2011257583 A5 JP2011257583 A5 JP 2011257583A5
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JP
Japan
Prior art keywords
confocal microscope
scanning
photodetector
scanning confocal
microscope according
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JP2010131772A
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English (en)
Japanese (ja)
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JP2011257583A (ja
JP5541972B2 (ja
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Priority to JP2010131772A priority Critical patent/JP5541972B2/ja
Priority claimed from JP2010131772A external-priority patent/JP5541972B2/ja
Priority to EP11004598.6A priority patent/EP2395380B1/en
Priority to US13/153,559 priority patent/US8530824B2/en
Publication of JP2011257583A publication Critical patent/JP2011257583A/ja
Publication of JP2011257583A5 publication Critical patent/JP2011257583A5/ja
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Publication of JP5541972B2 publication Critical patent/JP5541972B2/ja
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JP2010131772A 2010-06-09 2010-06-09 走査型共焦点顕微鏡 Active JP5541972B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2010131772A JP5541972B2 (ja) 2010-06-09 2010-06-09 走査型共焦点顕微鏡
EP11004598.6A EP2395380B1 (en) 2010-06-09 2011-06-06 Scanning microscope
US13/153,559 US8530824B2 (en) 2010-06-09 2011-06-06 Scanning microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010131772A JP5541972B2 (ja) 2010-06-09 2010-06-09 走査型共焦点顕微鏡

Publications (3)

Publication Number Publication Date
JP2011257583A JP2011257583A (ja) 2011-12-22
JP2011257583A5 true JP2011257583A5 (enExample) 2013-06-20
JP5541972B2 JP5541972B2 (ja) 2014-07-09

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ID=44509883

Family Applications (1)

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JP2010131772A Active JP5541972B2 (ja) 2010-06-09 2010-06-09 走査型共焦点顕微鏡

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US (1) US8530824B2 (enExample)
EP (1) EP2395380B1 (enExample)
JP (1) JP5541972B2 (enExample)

Families Citing this family (9)

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Publication number Priority date Publication date Assignee Title
JP5541972B2 (ja) * 2010-06-09 2014-07-09 オリンパス株式会社 走査型共焦点顕微鏡
JP5945400B2 (ja) * 2011-11-18 2016-07-05 オリンパス株式会社 検出光学系および走査型顕微鏡
JP6120611B2 (ja) * 2013-02-27 2017-04-26 日立マクセル株式会社 ビーム走査型表示装置
CN105352923B (zh) * 2014-10-21 2018-08-03 清华大学 一种快速宽视场体全息荧光显微成像系统
WO2016061710A1 (zh) * 2014-10-21 2016-04-28 清华大学 一种快速宽视场体全息荧光显微成像系统
JP2017219400A (ja) * 2016-06-07 2017-12-14 オリンパス株式会社 レーザ顕微鏡
CN111879247B (zh) * 2020-08-03 2022-05-20 海伯森技术（深圳）有限公司 一种测量轴孔规格的装置
CN119173798A (zh) * 2022-05-16 2024-12-20 高露洁-棕榄公司 用于使用镜面针孔阵列对多于一个样品平面同时采样的技术
CN115201954B (zh) * 2022-09-07 2022-12-06 杭州拓致光电科技有限公司 一种低通道串扰的复用体光栅角度放大器及其制备方法

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JP5775687B2 (ja) * 2010-12-17 2015-09-09 オリンパス株式会社 分光検出装置

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