JP2010529646A5 - - Google Patents
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- Publication number
- JP2010529646A5 JP2010529646A5 JP2010510279A JP2010510279A JP2010529646A5 JP 2010529646 A5 JP2010529646 A5 JP 2010529646A5 JP 2010510279 A JP2010510279 A JP 2010510279A JP 2010510279 A JP2010510279 A JP 2010510279A JP 2010529646 A5 JP2010529646 A5 JP 2010529646A5
- Authority
- JP
- Japan
- Prior art keywords
- silicon carbide
- type silicon
- epitaxial layer
- layer
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims 114
- 229910010271 silicon carbide Inorganic materials 0.000 claims 114
- 239000000758 substrate Substances 0.000 claims 42
- 238000000034 method Methods 0.000 claims 22
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims 8
- 229910052782 aluminium Inorganic materials 0.000 claims 8
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims 8
- 238000005530 etching Methods 0.000 claims 8
- 229910052751 metal Inorganic materials 0.000 claims 8
- 239000002184 metal Substances 0.000 claims 8
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims 4
- 229910052759 nickel Inorganic materials 0.000 claims 4
- 239000010936 titanium Substances 0.000 claims 4
- 229910052719 titanium Inorganic materials 0.000 claims 4
- 238000005224 laser annealing Methods 0.000 claims 2
- 238000001465 metallisation Methods 0.000 claims 2
- 238000004519 manufacturing process Methods 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/756,020 | 2007-05-31 | ||
| US11/756,020 US8866150B2 (en) | 2007-05-31 | 2007-05-31 | Silicon carbide power devices including P-type epitaxial layers and direct ohmic contacts |
| PCT/US2008/004239 WO2008156516A2 (en) | 2007-05-31 | 2008-03-31 | Methods of fabricating silicon carbide power devices by at least partially removing an n-type silicon carbide substrate, and silicon carbide power devices so fabricated |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010529646A JP2010529646A (ja) | 2010-08-26 |
| JP2010529646A5 true JP2010529646A5 (enExample) | 2012-03-01 |
| JP5847398B2 JP5847398B2 (ja) | 2016-01-20 |
Family
ID=40087218
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010510279A Active JP5847398B2 (ja) | 2007-05-31 | 2008-03-31 | n型炭化ケイ素基板を少なくとも部分的に除去することによって炭化ケイ素パワーデバイスを作製する方法、およびそのように作製された炭化ケイ素パワーデバイス |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8866150B2 (enExample) |
| EP (1) | EP2149154B1 (enExample) |
| JP (1) | JP5847398B2 (enExample) |
| WO (1) | WO2008156516A2 (enExample) |
Families Citing this family (68)
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| US7728402B2 (en) | 2006-08-01 | 2010-06-01 | Cree, Inc. | Semiconductor devices including schottky diodes with controlled breakdown |
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| US8193848B2 (en) | 2009-06-02 | 2012-06-05 | Cree, Inc. | Power switching devices having controllable surge current capabilities |
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| US9117739B2 (en) | 2010-03-08 | 2015-08-25 | Cree, Inc. | Semiconductor devices with heterojunction barrier regions and methods of fabricating same |
| US8786024B2 (en) * | 2010-04-15 | 2014-07-22 | Yoshitaka Sugawara | Semiconductor device comprising bipolar and unipolar transistors including a concave and convex portion |
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| US10367089B2 (en) * | 2011-03-28 | 2019-07-30 | General Electric Company | Semiconductor device and method for reduced bias threshold instability |
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| US9142662B2 (en) | 2011-05-06 | 2015-09-22 | Cree, Inc. | Field effect transistor devices with low source resistance |
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| WO2013036370A1 (en) | 2011-09-11 | 2013-03-14 | Cree, Inc. | High current density power module comprising transistors with improved layout |
| US8618582B2 (en) | 2011-09-11 | 2013-12-31 | Cree, Inc. | Edge termination structure employing recesses for edge termination elements |
| US8680587B2 (en) | 2011-09-11 | 2014-03-25 | Cree, Inc. | Schottky diode |
| US9640617B2 (en) | 2011-09-11 | 2017-05-02 | Cree, Inc. | High performance power module |
| US9373617B2 (en) | 2011-09-11 | 2016-06-21 | Cree, Inc. | High current, low switching loss SiC power module |
| US8664665B2 (en) | 2011-09-11 | 2014-03-04 | Cree, Inc. | Schottky diode employing recesses for elements of junction barrier array |
| JP5751113B2 (ja) * | 2011-09-28 | 2015-07-22 | 住友電気工業株式会社 | 炭化珪素半導体装置の製造方法 |
| CN103151262A (zh) * | 2011-12-07 | 2013-06-12 | 无锡华润华晶微电子有限公司 | 平面型绝缘栅双极型晶体管及其制备方法 |
| JP5811829B2 (ja) | 2011-12-22 | 2015-11-11 | 住友電気工業株式会社 | 半導体装置の製造方法 |
| US8730629B2 (en) * | 2011-12-22 | 2014-05-20 | General Electric Company | Variable breakdown transient voltage suppressor |
| JP5742712B2 (ja) * | 2011-12-29 | 2015-07-01 | 住友電気工業株式会社 | 炭化珪素半導体装置の製造方法 |
| JP2013235891A (ja) * | 2012-05-07 | 2013-11-21 | Denso Corp | 半導体装置 |
| KR101876579B1 (ko) * | 2012-09-13 | 2018-07-10 | 매그나칩 반도체 유한회사 | 전력용 반도체 소자 및 그 소자의 제조 방법 |
| JP2014063948A (ja) * | 2012-09-24 | 2014-04-10 | Sumitomo Electric Ind Ltd | 炭化珪素半導体装置の製造方法 |
| US9911838B2 (en) * | 2012-10-26 | 2018-03-06 | Ixys Corporation | IGBT die structure with auxiliary P well terminal |
| US9530844B2 (en) | 2012-12-28 | 2016-12-27 | Cree, Inc. | Transistor structures having reduced electrical field at the gate oxide and methods for making same |
| US10115815B2 (en) * | 2012-12-28 | 2018-10-30 | Cree, Inc. | Transistor structures having a deep recessed P+ junction and methods for making same |
| US10062749B2 (en) * | 2013-06-18 | 2018-08-28 | Monolith Semiconductor Inc. | High voltage semiconductor devices and methods of making the devices |
| JP6230323B2 (ja) * | 2013-08-01 | 2017-11-15 | 株式会社東芝 | 半導体装置 |
| JP6189131B2 (ja) * | 2013-08-01 | 2017-08-30 | 株式会社東芝 | 半導体装置およびその製造方法 |
| JP2015041638A (ja) * | 2013-08-20 | 2015-03-02 | 住友電気工業株式会社 | 炭化珪素半導体装置およびその製造方法 |
| JP6197995B2 (ja) * | 2013-08-23 | 2017-09-20 | 富士電機株式会社 | ワイドバンドギャップ絶縁ゲート型半導体装置 |
| JP6046010B2 (ja) * | 2013-09-09 | 2016-12-14 | 株式会社東芝 | 半導体装置及びその製造方法 |
| US9437756B2 (en) | 2013-09-27 | 2016-09-06 | Sunpower Corporation | Metallization of solar cells using metal foils |
| CN104810282B (zh) * | 2014-01-26 | 2019-05-14 | 国家电网公司 | 一种采用n型碳化硅衬底制作n沟道igbt器件的方法 |
| US9842738B2 (en) * | 2014-04-09 | 2017-12-12 | Mitsubishi Electric Corporation | Method for manufacturing silicon carbide semiconductor device and silicon carbide semiconductor device |
| US10103540B2 (en) * | 2014-04-24 | 2018-10-16 | General Electric Company | Method and system for transient voltage suppression devices with active control |
| US20150364550A1 (en) | 2014-06-16 | 2015-12-17 | Infineon Technologies Ag | Optimized layer for semiconductor |
| JP6268298B2 (ja) * | 2014-08-26 | 2018-01-24 | 株式会社日立製作所 | 4h−SiC絶縁ゲートバイポーラトランジスタおよびその製造方法 |
| US9780206B2 (en) * | 2015-02-27 | 2017-10-03 | Purdue Research Foundation | Methods of reducing the electrical and thermal resistance of SiC substrates and devices made thereby |
| WO2017158747A1 (ja) * | 2016-03-16 | 2017-09-21 | 株式会社日立製作所 | エピタキシャル基板の製造方法および半導体装置の製造方法 |
| JP6658171B2 (ja) * | 2016-03-22 | 2020-03-04 | 富士電機株式会社 | 半導体装置の製造方法 |
| JP6949018B2 (ja) * | 2016-07-15 | 2021-10-13 | ローム株式会社 | 半導体装置および半導体装置の製造方法 |
| US10332876B2 (en) * | 2017-09-14 | 2019-06-25 | Infineon Technologies Austria Ag | Method of forming compound semiconductor body |
| CN108039367B (zh) * | 2017-11-27 | 2020-09-25 | 西安理工大学 | 一种基于n长基区碳化硅晶闸管及其制作方法 |
| US11489069B2 (en) | 2017-12-21 | 2022-11-01 | Wolfspeed, Inc. | Vertical semiconductor device with improved ruggedness |
| US10615274B2 (en) | 2017-12-21 | 2020-04-07 | Cree, Inc. | Vertical semiconductor device with improved ruggedness |
| CN111199972B (zh) * | 2018-11-16 | 2023-05-16 | 比亚迪半导体股份有限公司 | 集成级联器件及其制备方法 |
| US11967616B2 (en) | 2018-12-07 | 2024-04-23 | Hitachi Energy Ltd | Vertical silicon carbide power MOSFET and IGBT and a method of manufacturing the same |
| RU188684U1 (ru) * | 2019-01-10 | 2019-04-22 | Закрытое акционерное общество "ГРУППА КРЕМНИЙ ЭЛ" | Силовое полупроводниковое устройство на основе карбида кремния |
| CN113140633B (zh) * | 2020-01-17 | 2022-05-24 | 张清纯 | 一种半导体器件及其制造方法 |
| US11282927B2 (en) | 2020-06-02 | 2022-03-22 | Cree, Inc. | Contact structures for semiconductor devices |
| US11843061B2 (en) | 2020-08-27 | 2023-12-12 | Wolfspeed, Inc. | Power silicon carbide based semiconductor devices with improved short circuit capabilities and methods of making such devices |
| DE102021204298A1 (de) * | 2021-04-29 | 2022-11-03 | Robert Bosch Gesellschaft mit beschränkter Haftung | Verfahren zum Herstellen eines vertikalen Leistungshalbleiterbauelements und vertikales Leistungshalbleiterbauelement |
| CN113555282B (zh) * | 2021-06-15 | 2023-08-08 | 扬州国扬电子有限公司 | Mos控制晶闸管的制造方法及mos控制晶闸管 |
| US20230006049A1 (en) * | 2021-06-30 | 2023-01-05 | Hunan Sanan Semiconductor Co., Ltd. | Silicon carbide power device with an enhanced junction field effect transistor region |
| JP2025517727A (ja) * | 2022-05-17 | 2025-06-10 | ヴィシャイ シリコニックス,エルエルシー | Mosfetデバイス |
| TWI818652B (zh) * | 2022-07-29 | 2023-10-11 | 鴻海精密工業股份有限公司 | 半導體裝置的製造方法 |
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| SE525574C2 (sv) | 2002-08-30 | 2005-03-15 | Okmetic Oyj | Lågdopat kiselkarbidsubstrat och användning därav i högspänningskomponenter |
| JP3960174B2 (ja) | 2002-09-09 | 2007-08-15 | 富士電機デバイステクノロジー株式会社 | 半導体装置の製造方法 |
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| JP2005175174A (ja) | 2003-12-10 | 2005-06-30 | Shindengen Electric Mfg Co Ltd | 絶縁ゲート型バイポーラトランジスタの製造方法 |
| US7118970B2 (en) * | 2004-06-22 | 2006-10-10 | Cree, Inc. | Methods of fabricating silicon carbide devices with hybrid well regions |
| US20060211210A1 (en) * | 2004-08-27 | 2006-09-21 | Rensselaer Polytechnic Institute | Material for selective deposition and etching |
| JP2006156658A (ja) | 2004-11-29 | 2006-06-15 | Toshiba Corp | 半導体装置 |
| US7414268B2 (en) * | 2005-05-18 | 2008-08-19 | Cree, Inc. | High voltage silicon carbide MOS-bipolar devices having bi-directional blocking capabilities |
| US20060267021A1 (en) * | 2005-05-27 | 2006-11-30 | General Electric Company | Power devices and methods of manufacture |
| JP2009509339A (ja) | 2005-09-16 | 2009-03-05 | クリー インコーポレイテッド | 炭化ケイ素パワーデバイスを有する半導体ウェハを処理する方法 |
-
2007
- 2007-05-31 US US11/756,020 patent/US8866150B2/en active Active
-
2008
- 2008-03-31 EP EP08825948.6A patent/EP2149154B1/en active Active
- 2008-03-31 JP JP2010510279A patent/JP5847398B2/ja active Active
- 2008-03-31 WO PCT/US2008/004239 patent/WO2008156516A2/en not_active Ceased
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