|
US20090109755A1
(en)
*
|
2007-10-24 |
2009-04-30 |
Mori Edan |
Neighbor block refresh for non-volatile memory
|
|
US7859932B2
(en)
*
|
2008-12-18 |
2010-12-28 |
Sandisk Corporation |
Data refresh for non-volatile storage
|
|
JP5317690B2
(ja)
*
|
2008-12-27 |
2013-10-16 |
株式会社東芝 |
メモリシステム
|
|
JP5221332B2
(ja)
*
|
2008-12-27 |
2013-06-26 |
株式会社東芝 |
メモリシステム
|
|
CN102317925B
(zh)
|
2009-02-12 |
2014-07-23 |
株式会社东芝 |
存储器系统和控制存储器系统的方法
|
|
US8683456B2
(en)
*
|
2009-07-13 |
2014-03-25 |
Apple Inc. |
Test partitioning for a non-volatile memory
|
|
US8243525B1
(en)
*
|
2009-09-30 |
2012-08-14 |
Western Digital Technologies, Inc. |
Refreshing non-volatile semiconductor memory by reading without rewriting
|
|
JP5521488B2
(ja)
*
|
2009-10-29 |
2014-06-11 |
アイシン・エィ・ダブリュ株式会社 |
記憶媒体に記憶される情報の管理方法及びプログラム
|
|
JP5349256B2
(ja)
|
2009-11-06 |
2013-11-20 |
株式会社東芝 |
メモリシステム
|
|
JP2011128998A
(ja)
|
2009-12-18 |
2011-06-30 |
Toshiba Corp |
半導体記憶装置
|
|
US8325531B2
(en)
*
|
2010-01-07 |
2012-12-04 |
Spansion Llc |
Memory device
|
|
US8671265B2
(en)
|
2010-03-05 |
2014-03-11 |
Solidfire, Inc. |
Distributed data storage system providing de-duplication of data using block identifiers
|
|
US8650446B2
(en)
*
|
2010-03-24 |
2014-02-11 |
Apple Inc. |
Management of a non-volatile memory based on test quality
|
|
US8645776B2
(en)
*
|
2010-03-24 |
2014-02-04 |
Apple Inc. |
Run-time testing of memory locations in a non-volatile memory
|
|
JP2010160816A
(ja)
*
|
2010-03-29 |
2010-07-22 |
Toshiba Corp |
半導体記憶装置の制御方法
|
|
US8412882B2
(en)
*
|
2010-06-18 |
2013-04-02 |
Microsoft Corporation |
Leveraging chip variability
|
|
JP2012008651A
(ja)
|
2010-06-22 |
2012-01-12 |
Toshiba Corp |
半導体記憶装置、その制御方法および情報処理装置
|
|
US8751903B2
(en)
|
2010-07-26 |
2014-06-10 |
Apple Inc. |
Methods and systems for monitoring write operations of non-volatile memory
|
|
JP2012128645A
(ja)
|
2010-12-15 |
2012-07-05 |
Toshiba Corp |
メモリシステム
|
|
JP2012128643A
(ja)
|
2010-12-15 |
2012-07-05 |
Toshiba Corp |
メモリシステム
|
|
JP5535128B2
(ja)
|
2010-12-16 |
2014-07-02 |
株式会社東芝 |
メモリシステム
|
|
JP2012199724A
(ja)
*
|
2011-03-19 |
2012-10-18 |
Fujitsu Ltd |
データ送信装置、データ受信装置、データ送受信装置及びデータ送受信装置の制御方法
|
|
US8756474B2
(en)
*
|
2011-03-21 |
2014-06-17 |
Denso International America, Inc. |
Method for initiating a refresh operation in a solid-state nonvolatile memory device
|
|
CN103392208A
(zh)
*
|
2011-04-28 |
2013-11-13 |
株式会社日立制作所 |
半导体存储装置和用于控制半导体存储装置的方法
|
|
US9762246B2
(en)
*
|
2011-05-20 |
2017-09-12 |
Semiconductor Energy Laboratory Co., Ltd. |
Semiconductor device with a storage circuit having an oxide semiconductor
|
|
JP5762139B2
(ja)
*
|
2011-05-30 |
2015-08-12 |
株式会社メガチップス |
情報処理端末及び管理サーバ
|
|
US8650353B2
(en)
*
|
2011-07-01 |
2014-02-11 |
Intel Corporation |
Apparatus, system, and method for refreshing non-volatile memory
|
|
TWI471862B
(zh)
*
|
2011-08-19 |
2015-02-01 |
Silicon Motion Inc |
快閃記憶體控制器
|
|
JP2013069183A
(ja)
*
|
2011-09-26 |
2013-04-18 |
Toshiba Corp |
コントローラおよびメモリシステム
|
|
KR101830808B1
(ko)
*
|
2011-11-04 |
2018-02-22 |
삼성전자주식회사 |
메모리 시스템 및 그것의 데이터 저장 방법
|
|
JP5883284B2
(ja)
*
|
2011-12-13 |
2016-03-09 |
ラピスセミコンダクタ株式会社 |
半導体メモリ制御装置及び制御方法
|
|
US9054992B2
(en)
|
2011-12-27 |
2015-06-09 |
Solidfire, Inc. |
Quality of service policy sets
|
|
US9838269B2
(en)
|
2011-12-27 |
2017-12-05 |
Netapp, Inc. |
Proportional quality of service based on client usage and system metrics
|
|
JP2013164888A
(ja)
|
2012-02-10 |
2013-08-22 |
Toshiba Corp |
半導体記憶装置
|
|
US8924636B2
(en)
|
2012-02-23 |
2014-12-30 |
Kabushiki Kaisha Toshiba |
Management information generating method, logical block constructing method, and semiconductor memory device
|
|
US9251055B2
(en)
|
2012-02-23 |
2016-02-02 |
Kabushiki Kaisha Toshiba |
Memory system and control method of memory system
|
|
US8739000B2
(en)
*
|
2012-03-15 |
2014-05-27 |
Broadcom Corporation |
Multi-modal signal processing with linearization
|
|
US9235346B2
(en)
|
2012-05-04 |
2016-01-12 |
Avago Technologies General Ip (Singapore) Pte. Ltd. |
Dynamic map pre-fetching for improved sequential reads of a solid-state media
|
|
US9337865B2
(en)
|
2012-05-04 |
2016-05-10 |
Seagate Technology Llc |
Log-likelihood ratio (LLR) dampening in low-density parity-check (LDPC) decoders
|
|
TWI467376B
(zh)
*
|
2012-06-11 |
2015-01-01 |
Phison Electronics Corp |
資料保護方法、記憶體控制器與記憶體儲存裝置
|
|
CN102765256B
(zh)
*
|
2012-06-21 |
2014-07-16 |
珠海艾派克微电子有限公司 |
记录芯片使用状态信息的方法、成像盒的芯片及成像盒
|
|
US20140013031A1
(en)
*
|
2012-07-09 |
2014-01-09 |
Yoko Masuo |
Data storage apparatus, memory control method, and electronic apparatus having a data storage apparatus
|
|
US9064579B2
(en)
|
2012-07-16 |
2015-06-23 |
Kabushiki Kaisha Toshiba |
Semiconductor memory apparatus, data transmission device, and recording method
|
|
CN108595345B
(zh)
*
|
2012-07-25 |
2021-11-23 |
慧荣科技股份有限公司 |
管理闪存中所储存的数据的方法及相关记忆装置与控制器
|
|
US8873323B2
(en)
*
|
2012-08-16 |
2014-10-28 |
Transcend Information, Inc. |
Method of executing wear leveling in a flash memory device according to ambient temperature information and related flash memory device
|
|
JP2014086062A
(ja)
*
|
2012-10-29 |
2014-05-12 |
Sony Corp |
記憶制御装置、記憶装置、情報処理システム、および、記憶制御方法
|
|
JP5483378B1
(ja)
*
|
2012-11-01 |
2014-05-07 |
東芝情報システム株式会社 |
フラッシュメモリの劣化検査装置、劣化検査方法及劣化検査用プログラム
|
|
US8930778B2
(en)
|
2012-11-15 |
2015-01-06 |
Seagate Technology Llc |
Read disturb effect determination
|
|
JP6044316B2
(ja)
*
|
2012-12-12 |
2016-12-14 |
株式会社デンソー |
車載電子制御装置
|
|
US9063879B2
(en)
*
|
2012-12-13 |
2015-06-23 |
Sandisk Technologies Inc. |
Inspection of non-volatile memory for disturb effects
|
|
US9324398B2
(en)
*
|
2013-02-04 |
2016-04-26 |
Micron Technology, Inc. |
Apparatuses and methods for targeted refreshing of memory
|
|
JP6184121B2
(ja)
*
|
2013-02-08 |
2017-08-23 |
株式会社メガチップス |
記憶装置検査システム、記憶装置検査方法および不揮発性半導体記憶装置
|
|
JP2014157391A
(ja)
*
|
2013-02-14 |
2014-08-28 |
Sony Corp |
記憶制御装置、記憶装置、情報処理システムおよび記憶制御方法
|
|
JP6062768B2
(ja)
*
|
2013-03-01 |
2017-01-18 |
Ｎｅｃプラットフォームズ株式会社 |
メモリ検査装置、メモリ検査方法、およびメモリ検査プログラム
|
|
US9092310B2
(en)
|
2013-03-15 |
2015-07-28 |
Seagate Technology Llc |
Host command based read disturb methodology
|
|
US10372551B2
(en)
*
|
2013-03-15 |
2019-08-06 |
Netlist, Inc. |
Hybrid memory system with configurable error thresholds and failure analysis capability
|
|
KR102039537B1
(ko)
*
|
2013-03-15 |
2019-11-01 |
삼성전자주식회사 |
불휘발성 저장 장치 및 그것의 운영체제 이미지 프로그램 방법
|
|
US9330787B2
(en)
*
|
2013-03-18 |
2016-05-03 |
Kabushiki Kaisha Toshiba |
Memory system and memory controller
|
|
JP6102515B2
(ja)
*
|
2013-05-24 |
2017-03-29 |
富士通株式会社 |
情報処理装置、制御回路、制御プログラム、および制御方法
|
|
US9263158B2
(en)
*
|
2013-08-16 |
2016-02-16 |
Seagate Technology Llc |
Determining data retention time in a solid-state non-volatile memory
|
|
US9047978B2
(en)
|
2013-08-26 |
2015-06-02 |
Micron Technology, Inc. |
Apparatuses and methods for selective row refreshes
|
|
CN110232942B
(zh)
|
2013-09-13 |
2023-01-03 |
铠侠股份有限公司 |
存储装置及其控制方法
|
|
US9372750B2
(en)
*
|
2013-11-01 |
2016-06-21 |
Qualcomm Incorporated |
Method and apparatus for non-volatile RAM error re-mapping
|
|
GB201322075D0
(en)
|
2013-12-13 |
2014-01-29 |
Ibm |
Device for selecting a level for at least one read voltage
|
|
US9785499B2
(en)
|
2014-02-12 |
2017-10-10 |
Seagate Technology Llc |
Hot-read data aggregation and code selection
|
|
US20150244795A1
(en)
|
2014-02-21 |
2015-08-27 |
Solidfire, Inc. |
Data syncing in a distributed system
|
|
KR20150104858A
(ko)
*
|
2014-03-06 |
2015-09-16 |
에스케이하이닉스 주식회사 |
반도체 장치 및 이의 동작 방법
|
|
US9495232B2
(en)
*
|
2014-03-28 |
2016-11-15 |
Intel IP Corporation |
Error correcting (ECC) memory compatibility
|
|
DE102014104717B4
(de)
*
|
2014-04-03 |
2019-08-01 |
Hyperstone Gmbh |
Verfahren und Vorrichtung zur Datenerneuerung für eine Erhöhung der Zuverlässigkeit von Flashspeichern
|
|
US20150331732A1
(en)
*
|
2014-05-13 |
2015-11-19 |
Rambus Inc. |
Memory device having storage for an error code correction event count
|
|
JP2015219938A
(ja)
|
2014-05-21 |
2015-12-07 |
マイクロン テクノロジー， インク． |
半導体装置
|
|
US9478315B2
(en)
*
|
2014-06-03 |
2016-10-25 |
Sandisk Technologies Llc |
Bit error rate mapping in a memory system
|
|
DE102014211111A1
(de)
*
|
2014-06-11 |
2015-12-17 |
Robert Bosch Gmbh |
Refresh eines Speicherbereichs einer nichtflüchtigen Speichereinheit
|
|
US9798728B2
(en)
|
2014-07-24 |
2017-10-24 |
Netapp, Inc. |
System performing data deduplication using a dense tree data structure
|
|
JP6448254B2
(ja)
*
|
2014-08-19 |
2019-01-09 |
ラピスセミコンダクタ株式会社 |
メモリ制御装置及びメモリ制御方法
|
|
US9671960B2
(en)
|
2014-09-12 |
2017-06-06 |
Netapp, Inc. |
Rate matching technique for balancing segment cleaning and I/O workload
|
|
US10133511B2
(en)
|
2014-09-12 |
2018-11-20 |
Netapp, Inc |
Optimized segment cleaning technique
|
|
US9583219B2
(en)
*
|
2014-09-27 |
2017-02-28 |
Qualcomm Incorporated |
Method and apparatus for in-system repair of memory in burst refresh
|
|
US9251909B1
(en)
|
2014-09-29 |
2016-02-02 |
International Business Machines Corporation |
Background threshold voltage shifting using base and delta threshold voltage shift values in flash memory
|
|
US9690655B2
(en)
|
2014-09-30 |
2017-06-27 |
EMC IP Holding Company LLC |
Method and system for improving flash storage utilization by predicting bad m-pages
|
|
US9563373B2
(en)
|
2014-10-21 |
2017-02-07 |
International Business Machines Corporation |
Detecting error count deviations for non-volatile memory blocks for advanced non-volatile memory block management
|
|
US10365859B2
(en)
|
2014-10-21 |
2019-07-30 |
International Business Machines Corporation |
Storage array management employing a merged background management process
|
|
JP6686892B2
(ja)
*
|
2014-10-24 |
2020-04-22 |
ソニー株式会社 |
メモリコントローラ、メモリシステム、および、メモリコントローラの制御方法
|
|
US9836229B2
(en)
|
2014-11-18 |
2017-12-05 |
Netapp, Inc. |
N-way merge technique for updating volume metadata in a storage I/O stack
|
|
JP2016118815A
(ja)
|
2014-12-18 |
2016-06-30 |
パナソニックＩｐマネジメント株式会社 |
不揮発性メモリ装置
|
|
US9990279B2
(en)
|
2014-12-23 |
2018-06-05 |
International Business Machines Corporation |
Page-level health equalization
|
|
US10339048B2
(en)
|
2014-12-23 |
2019-07-02 |
International Business Machines Corporation |
Endurance enhancement scheme using memory re-evaluation
|
|
JP5989156B2
(ja)
*
|
2015-02-10 |
2016-09-07 |
株式会社日立製作所 |
フラッシュメモリモジュール
|
|
US9720601B2
(en)
|
2015-02-11 |
2017-08-01 |
Netapp, Inc. |
Load balancing technique for a storage array
|
|
CN104636674B
(zh)
*
|
2015-03-17 |
2017-06-09 |
浪潮集团有限公司 |
一种用于受损数据恢复的线性估计方法
|
|
US9762460B2
(en)
|
2015-03-24 |
2017-09-12 |
Netapp, Inc. |
Providing continuous context for operational information of a storage system
|
|
US9710317B2
(en)
*
|
2015-03-30 |
2017-07-18 |
Netapp, Inc. |
Methods to identify, handle and recover from suspect SSDS in a clustered flash array
|
|
US9836349B2
(en)
*
|
2015-05-29 |
2017-12-05 |
Winbond Electronics Corp. |
Methods and systems for detecting and correcting errors in nonvolatile memory
|
|
US9740566B2
(en)
|
2015-07-31 |
2017-08-22 |
Netapp, Inc. |
Snapshot creation workflow
|
|
DE102015215401B4
(de)
*
|
2015-08-12 |
2020-10-01 |
Infineon Technologies Ag |
Speichervorrichtung und Verfahren zum Korrigieren einer gespeicherten Bitfolge
|
|
JP6577302B2
(ja)
*
|
2015-08-28 |
2019-09-18 |
東芝メモリ株式会社 |
メモリシステム
|
|
US9977615B2
(en)
*
|
2015-09-28 |
2018-05-22 |
Qualcomm Incorporated |
Smart refresh of data on flash devices
|
|
KR20170076883A
(ko)
*
|
2015-12-24 |
2017-07-05 |
에스케이하이닉스 주식회사 |
메모리 시스템 및 그의 동작방법
|
|
US9847105B2
(en)
*
|
2016-02-01 |
2017-12-19 |
Samsung Electric Co., Ltd. |
Memory package, memory module including the same, and operation method of memory package
|
|
KR102512448B1
(ko)
*
|
2016-03-28 |
2023-03-22 |
에스케이하이닉스 주식회사 |
메모리 시스템 및 그의 동작 방법
|
|
JP2017182854A
(ja)
|
2016-03-31 |
2017-10-05 |
マイクロン テクノロジー， インク． |
半導体装置
|
|
US10929022B2
(en)
|
2016-04-25 |
2021-02-23 |
Netapp. Inc. |
Space savings reporting for storage system supporting snapshot and clones
|
|
JP2018041154A
(ja)
*
|
2016-09-05 |
2018-03-15 |
東芝メモリ株式会社 |
ストレージシステムおよび処理方法
|
|
JP2018041204A
(ja)
|
2016-09-06 |
2018-03-15 |
東芝メモリ株式会社 |
メモリ装置及び情報処理システム
|
|
US10642763B2
(en)
|
2016-09-20 |
2020-05-05 |
Netapp, Inc. |
Quality of service policy sets
|
|
US10481798B2
(en)
|
2016-10-28 |
2019-11-19 |
Pure Storage, Inc. |
Efficient flash management for multiple controllers
|
|
US10482983B2
(en)
*
|
2016-12-22 |
2019-11-19 |
Seagate Technology Llc |
Read disturb detection based on dynamic bit error rate estimation
|
|
US10885991B2
(en)
*
|
2017-04-04 |
2021-01-05 |
Sandisk Technologies Llc |
Data rewrite during refresh window
|
|
CN108877856B
(zh)
|
2017-05-10 |
2021-02-19 |
慧荣科技股份有限公司 |
储存装置、记录方法以及预载方法
|
|
CN108877858B
(zh)
*
|
2017-05-10 |
2021-02-19 |
慧荣科技股份有限公司 |
储存装置以及刷新方法
|
|
JP2019046530A
(ja)
|
2017-09-07 |
2019-03-22 |
東芝メモリ株式会社 |
メモリシステム
|
|
US10297304B1
(en)
*
|
2017-11-12 |
2019-05-21 |
Nanya Technology Corporation |
Memory device and operating method thereof
|
|
US11048581B2
(en)
|
2017-11-17 |
2021-06-29 |
Samsung Electronics Co., Ltd. |
Storage device telemetry for provisioning I/O
|
|
US10446243B2
(en)
*
|
2017-12-18 |
2019-10-15 |
Macronix International Co., Ltd. |
Storage device and associated control method to determine target memory blocks for probe operation
|
|
US10580475B2
(en)
|
2018-01-22 |
2020-03-03 |
Micron Technology, Inc. |
Apparatuses and methods for calculating row hammer refresh addresses in a semiconductor device
|
|
KR102507302B1
(ko)
|
2018-01-22 |
2023-03-07 |
삼성전자주식회사 |
스토리지 장치 및 상기 스토리지 장치의 동작 방법
|
|
JP7074519B2
(ja)
*
|
2018-03-19 |
2022-05-24 |
キオクシア株式会社 |
メモリシステム、および、メモリ制御方法
|
|
US10839922B2
(en)
*
|
2018-05-26 |
2020-11-17 |
Sandisk Technologies Llc |
Memory disturb detection
|
|
US11152050B2
(en)
|
2018-06-19 |
2021-10-19 |
Micron Technology, Inc. |
Apparatuses and methods for multiple row hammer refresh address sequences
|
|
KR102777472B1
(ko)
*
|
2018-11-15 |
2025-03-10 |
에스케이하이닉스 주식회사 |
반도체장치 및 반도체시스템
|
|
US10770127B2
(en)
|
2019-02-06 |
2020-09-08 |
Micron Technology, Inc. |
Apparatuses and methods for managing row access counts
|
|
US11043254B2
(en)
|
2019-03-19 |
2021-06-22 |
Micron Technology, Inc. |
Semiconductor device having cam that stores address signals
|
|
US11264096B2
(en)
|
2019-05-14 |
2022-03-01 |
Micron Technology, Inc. |
Apparatuses, systems, and methods for a content addressable memory cell with latch and comparator circuits
|
|
US11158364B2
(en)
|
2019-05-31 |
2021-10-26 |
Micron Technology, Inc. |
Apparatuses and methods for tracking victim rows
|
|
US11158373B2
(en)
|
2019-06-11 |
2021-10-26 |
Micron Technology, Inc. |
Apparatuses, systems, and methods for determining extremum numerical values
|
|
US11139015B2
(en)
|
2019-07-01 |
2021-10-05 |
Micron Technology, Inc. |
Apparatuses and methods for monitoring word line accesses
|
|
US10832792B1
(en)
|
2019-07-01 |
2020-11-10 |
Micron Technology, Inc. |
Apparatuses and methods for adjusting victim data
|
|
US11386946B2
(en)
|
2019-07-16 |
2022-07-12 |
Micron Technology, Inc. |
Apparatuses and methods for tracking row accesses
|
|
US10943636B1
(en)
|
2019-08-20 |
2021-03-09 |
Micron Technology, Inc. |
Apparatuses and methods for analog row access tracking
|
|
US10964378B2
(en)
|
2019-08-22 |
2021-03-30 |
Micron Technology, Inc. |
Apparatus and method including analog accumulator for determining row access rate and target row address used for refresh operation
|
|
US11200942B2
(en)
|
2019-08-23 |
2021-12-14 |
Micron Technology, Inc. |
Apparatuses and methods for lossy row access counting
|
|
JP7291640B2
(ja)
*
|
2020-01-24 |
2023-06-15 |
ラピスセミコンダクタ株式会社 |
半導体記憶装置及び半導体記憶装置のリフレッシュ方法
|
|
US11222682B1
(en)
|
2020-08-31 |
2022-01-11 |
Micron Technology, Inc. |
Apparatuses and methods for providing refresh addresses
|
|
US11462291B2
(en)
|
2020-11-23 |
2022-10-04 |
Micron Technology, Inc. |
Apparatuses and methods for tracking word line accesses
|
|
KR20220096077A
(ko)
|
2020-12-30 |
2022-07-07 |
삼성전자주식회사 |
Ecc 데이터를 이용하여 신뢰성 검사를 수행하는 스토리지 장치
|
|
US11482275B2
(en)
|
2021-01-20 |
2022-10-25 |
Micron Technology, Inc. |
Apparatuses and methods for dynamically allocated aggressor detection
|
|
US11600314B2
(en)
|
2021-03-15 |
2023-03-07 |
Micron Technology, Inc. |
Apparatuses and methods for sketch circuits for refresh binning
|
|
US11664063B2
(en)
|
2021-08-12 |
2023-05-30 |
Micron Technology, Inc. |
Apparatuses and methods for countering memory attacks
|
|
US11688451B2
(en)
|
2021-11-29 |
2023-06-27 |
Micron Technology, Inc. |
Apparatuses, systems, and methods for main sketch and slim sketch circuit for row address tracking
|
|
KR20230090598A
(ko)
|
2021-12-15 |
2023-06-22 |
삼성전자주식회사 |
히스토리 데이터를 사용하는 스토리지 컨트롤러, 그것의 동작하는 방법, 및 그것을 포함하는 스토리지 장치의 동작하는 방법
|
|
KR20230096304A
(ko)
|
2021-12-23 |
2023-06-30 |
삼성전자주식회사 |
비휘발성 메모리 장치의 리프로그램 방법, 프로그램 방법 및 이를 수행하는 비휘발성 메모리 장치
|
|
US12165687B2
(en)
|
2021-12-29 |
2024-12-10 |
Micron Technology, Inc. |
Apparatuses and methods for row hammer counter mat
|
|
US11928354B2
(en)
*
|
2022-01-21 |
2024-03-12 |
Dell Products L.P. |
Read-disturb-based read temperature determination system
|
|
KR102537770B1
(ko)
*
|
2022-06-08 |
2023-05-30 |
삼성전자주식회사 |
기입 스로틀링을 이용한 스토리지 장치의 데이터 기입 방법 및 이를 수행하는 스토리지 장치
|