JP2009186471A5 - - Google Patents

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Publication number
JP2009186471A5
JP2009186471A5 JP2009019213A JP2009019213A JP2009186471A5 JP 2009186471 A5 JP2009186471 A5 JP 2009186471A5 JP 2009019213 A JP2009019213 A JP 2009019213A JP 2009019213 A JP2009019213 A JP 2009019213A JP 2009186471 A5 JP2009186471 A5 JP 2009186471A5
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JP
Japan
Prior art keywords
different
measuring device
optical position
scanning
position measuring
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JP2009019213A
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English (en)
Japanese (ja)
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JP2009186471A (ja
JP5710105B2 (ja
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Priority claimed from DE102008007319A external-priority patent/DE102008007319A1/de
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Publication of JP2009186471A5 publication Critical patent/JP2009186471A5/ja
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Publication of JP5710105B2 publication Critical patent/JP5710105B2/ja
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JP2009019213A 2008-02-02 2009-01-30 光学式位置測定装置 Active JP5710105B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102008007319.9 2008-02-02
DE102008007319A DE102008007319A1 (de) 2008-02-02 2008-02-02 Optische Positionsmesseinrichtung

Publications (3)

Publication Number Publication Date
JP2009186471A JP2009186471A (ja) 2009-08-20
JP2009186471A5 true JP2009186471A5 (enExample) 2012-02-16
JP5710105B2 JP5710105B2 (ja) 2015-04-30

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ID=40668151

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009019213A Active JP5710105B2 (ja) 2008-02-02 2009-01-30 光学式位置測定装置

Country Status (5)

Country Link
US (1) US7872762B2 (enExample)
EP (1) EP2085752B1 (enExample)
JP (1) JP5710105B2 (enExample)
DE (1) DE102008007319A1 (enExample)
ES (1) ES2524060T3 (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008025870A1 (de) * 2008-05-31 2009-12-03 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
US8436293B2 (en) * 2009-02-23 2013-05-07 Christopher C. Chang Optical encoder and method for measuring displacement information using multiple optical tracks of diffractive optical regions having different periodicities
CN102192761B (zh) * 2010-04-22 2013-06-05 廊坊开发区莱格光电仪器有限公司 敞开式激光限束扫描标尺光栅传感器
DE102010043469A1 (de) * 2010-11-05 2012-05-10 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102010063253A1 (de) * 2010-12-16 2012-06-21 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102011076178B4 (de) * 2011-05-20 2022-03-31 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102011111900A1 (de) 2011-08-30 2013-02-28 Dr. Johannes Heidenhain Gmbh Vorrichtung zur interferometrischen Abstandsbestimmung
TWI546518B (zh) * 2012-04-20 2016-08-21 德律科技股份有限公司 三維量測系統與三維量測方法
JP6253929B2 (ja) * 2013-09-11 2017-12-27 株式会社オプトニクス精密 反射型エンコーダ装置
DE102013220214A1 (de) 2013-10-07 2015-04-09 Dr. Johannes Heidenhain Gmbh Anordnung zur Positionierung eines Werkzeugs relativ zu einem Werkstück
TWI627379B (zh) * 2013-10-07 2018-06-21 德商強那斯海登翰博士有限公司 光學位置測量裝置
JP6702666B2 (ja) 2015-07-28 2020-06-03 株式会社ミツトヨ 変位検出装置
JP6400036B2 (ja) * 2016-03-14 2018-10-03 キヤノン株式会社 位置検出装置、工作装置、および、露光装置
CN106971369B (zh) * 2017-03-02 2020-06-12 南京师范大学 一种基于gpu的地形可视域分析的数据调度与分发方法
DE102018212719A1 (de) * 2018-07-31 2020-02-20 Dr. Johannes Heidenhain Gesellschaft Mit Beschränkter Haftung Optische Positionsmesseinrichtung
JP7513510B2 (ja) * 2020-11-24 2024-07-09 株式会社ミツトヨ 変位センサ及び形状測定装置
CN115113411B (zh) * 2022-08-31 2022-11-22 长春理工大学 一种多光束合束装置及方法
DE102023208964A1 (de) * 2023-09-15 2025-03-20 Dr. Johannes Heidenhain Gmbh Positionsmesssystem

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2073409A1 (en) * 1991-10-15 1993-04-16 Paul F. Sullivan Light beam position detection and control apparatus employing diffraction patterns
JP3198789B2 (ja) * 1994-04-12 2001-08-13 松下電器産業株式会社 光学式エンコーダ
US5497226A (en) 1994-08-22 1996-03-05 Polaroid Corporation Quadrature diffractive encoder
DE19511068A1 (de) * 1995-03-25 1996-09-26 Heidenhain Gmbh Dr Johannes Lichtelektrische Positionsmeßeinrichtung
US5808742A (en) * 1995-05-31 1998-09-15 Massachusetts Institute Of Technology Optical alignment apparatus having multiple parallel alignment marks
DE19521295C2 (de) * 1995-06-10 2000-07-13 Heidenhain Gmbh Dr Johannes Lichtelektrische Positionsmeßeinrichtung
DE19748802B4 (de) * 1996-11-20 2010-09-09 Dr. Johannes Heidenhain Gmbh Optische Positionsmeßeinrichtung
DE19716058B4 (de) * 1997-04-17 2011-03-17 Dr. Johannes Heidenhain Gmbh Optische Positionsmeßeinrichtung
US6124589A (en) * 1997-06-16 2000-09-26 West; Donald Lee Virtual mask encoder
US7016025B1 (en) * 1999-06-24 2006-03-21 Asml Holding N.V. Method and apparatus for characterization of optical systems
DE19962278A1 (de) * 1999-12-23 2001-08-02 Heidenhain Gmbh Dr Johannes Positionsmeßeinrichtung
US7088458B1 (en) * 2002-12-23 2006-08-08 Carl Zeiss Smt Ag Apparatus and method for measuring an optical imaging system, and detector unit
US7295315B2 (en) * 2003-06-30 2007-11-13 Kenneth C. Johnson Focus and alignment sensors and methods for use with scanning microlens-array printer
JP4520121B2 (ja) * 2003-08-08 2010-08-04 シャープ株式会社 光学式エンコーダ
DE102005029917A1 (de) * 2005-06-28 2007-01-04 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102005043569A1 (de) * 2005-09-12 2007-03-22 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102006041357A1 (de) * 2005-11-09 2007-05-10 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Verfahren zum Betrieb einer Positionsmesseinrichtung
US7636165B2 (en) * 2006-03-21 2009-12-22 Asml Netherlands B.V. Displacement measurement systems lithographic apparatus and device manufacturing method
DE102006042743A1 (de) * 2006-09-12 2008-03-27 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
US7561280B2 (en) * 2007-03-15 2009-07-14 Agilent Technologies, Inc. Displacement measurement sensor head and system having measurement sub-beams comprising zeroth order and first order diffraction components

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