JP2004340934A5 - - Google Patents

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Publication number
JP2004340934A5
JP2004340934A5 JP2004082655A JP2004082655A JP2004340934A5 JP 2004340934 A5 JP2004340934 A5 JP 2004340934A5 JP 2004082655 A JP2004082655 A JP 2004082655A JP 2004082655 A JP2004082655 A JP 2004082655A JP 2004340934 A5 JP2004340934 A5 JP 2004340934A5
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JP
Japan
Prior art keywords
encoder according
lens
encoder
along
lens arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004082655A
Other languages
English (en)
Japanese (ja)
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JP2004340934A (ja
JP4509615B2 (ja
Filing date
Publication date
Priority claimed from DE10323088A external-priority patent/DE10323088A1/de
Application filed filed Critical
Publication of JP2004340934A publication Critical patent/JP2004340934A/ja
Publication of JP2004340934A5 publication Critical patent/JP2004340934A5/ja
Application granted granted Critical
Publication of JP4509615B2 publication Critical patent/JP4509615B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2004082655A 2003-05-16 2004-03-22 エンコーダ Expired - Fee Related JP4509615B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE10323088A DE10323088A1 (de) 2003-05-16 2003-05-16 Positionsmesseinrichtung

Publications (3)

Publication Number Publication Date
JP2004340934A JP2004340934A (ja) 2004-12-02
JP2004340934A5 true JP2004340934A5 (enExample) 2007-01-18
JP4509615B2 JP4509615B2 (ja) 2010-07-21

Family

ID=33016449

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004082655A Expired - Fee Related JP4509615B2 (ja) 2003-05-16 2004-03-22 エンコーダ

Country Status (7)

Country Link
US (1) US7164482B2 (enExample)
EP (1) EP1477774B1 (enExample)
JP (1) JP4509615B2 (enExample)
CN (1) CN100374823C (enExample)
AT (1) ATE399981T1 (enExample)
DE (2) DE10323088A1 (enExample)
ES (1) ES2308063T3 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10317736A1 (de) * 2003-04-11 2004-10-28 Dr. Johannes Heidenhain Gmbh Abtasteinheit für eine Positionsmesseinrichtung zum optischen Abtasten einer Maßverkörperung
DE102005015743B4 (de) * 2005-04-06 2018-08-23 Dr. Johannes Heidenhain Gmbh Abtasteinheit für eine Positionsmesseinrichtung zum optischen Abtasten einer Maßverkörperung und Positionsmesseinrichtung
DE102006024579B4 (de) * 2006-05-18 2016-09-29 Dr. Johannes Heidenhain Gmbh Vorrichtung zur Bestimmung der Position eines entlang mindestens einer Verschieberichtung bewegbaren Objektes
DE102008046793A1 (de) 2008-09-11 2010-03-18 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102011081879A1 (de) * 2010-11-03 2012-05-03 Dr. Johannes Heidenhain Gmbh Optische Winkelmesseinrichtung
DE102011082156A1 (de) * 2010-12-16 2012-06-21 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
CN102607417B (zh) * 2012-03-30 2014-06-18 中国科学院长春光学精密机械与物理研究所 绝对位置测量装置
CN103852032B (zh) * 2012-12-07 2016-12-21 上海汽车集团股份有限公司 圆柱形轴类零件的特征参数提取方法
DE102016103996B4 (de) 2016-03-04 2023-09-28 Dr. Fritz Faulhaber Gmbh & Co. Kg Encodier-System für kleinbauende Elektromotoren
JP7031118B2 (ja) * 2016-12-09 2022-03-08 ソニーグループ株式会社 画像処理装置、及び、画像処理方法
CN108759794B (zh) * 2018-05-14 2021-03-02 南京涵曦月自动化科技有限公司 多功能建筑标线灯
CN111600617B (zh) * 2020-05-12 2021-06-08 中国科学院软件研究所 一种基于物联网LoRa信号的非接触感知方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4112295A (en) * 1974-12-30 1978-09-05 Instytut Geodezji I Kartograffi Apparatus for direct measurement of displacements with a holographic scale
NL8202300A (nl) * 1982-06-08 1984-01-02 Philips Nv Inrichting voor het bepalen van hoekverplaatsingen van een voorwerp.
NL8502988A (nl) * 1985-11-01 1987-06-01 Philips Nv Halfgeleidende radieele fotodetector, en inrichting bevattende een dergelijke detector.
DE3542514A1 (de) * 1985-12-02 1987-06-04 Zeiss Carl Fa Wegmesseinrichtung
US5486923A (en) * 1992-05-05 1996-01-23 Microe Apparatus for detecting relative movement wherein a detecting means is positioned in the region of natural interference
GB9522491D0 (en) * 1995-11-02 1996-01-03 Renishaw Plc Opto-electronic rotary encoder
JP2000221442A (ja) 1999-01-28 2000-08-11 Nippon Sheet Glass Co Ltd 結像光学装置
US6707613B2 (en) * 2000-04-05 2004-03-16 Rohm Co., Ltd. Lens array unit and method of forming image
JP4271841B2 (ja) 2000-04-05 2009-06-03 ローム株式会社 レンズアレイユニットおよびこれを備えた光学装置
JP2001343506A (ja) * 2000-06-01 2001-12-14 Rohm Co Ltd レンズアレイの製造方法、レンズアレイおよびレンズアレイの遮光処理方法
GB0109057D0 (en) 2001-04-11 2001-05-30 Renishaw Plc Absolute postition measurement

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