JP2007010659A5 - - Google Patents

Download PDF

Info

Publication number
JP2007010659A5
JP2007010659A5 JP2006176321A JP2006176321A JP2007010659A5 JP 2007010659 A5 JP2007010659 A5 JP 2007010659A5 JP 2006176321 A JP2006176321 A JP 2006176321A JP 2006176321 A JP2006176321 A JP 2006176321A JP 2007010659 A5 JP2007010659 A5 JP 2007010659A5
Authority
JP
Japan
Prior art keywords
measuring device
position measuring
grating
scanning unit
structures
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2006176321A
Other languages
English (en)
Japanese (ja)
Other versions
JP2007010659A (ja
JP5005969B2 (ja
Filing date
Publication date
Priority claimed from DE102005029917A external-priority patent/DE102005029917A1/de
Application filed filed Critical
Publication of JP2007010659A publication Critical patent/JP2007010659A/ja
Publication of JP2007010659A5 publication Critical patent/JP2007010659A5/ja
Application granted granted Critical
Publication of JP5005969B2 publication Critical patent/JP5005969B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2006176321A 2005-06-28 2006-06-27 位置測定装置 Active JP5005969B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102005029917A DE102005029917A1 (de) 2005-06-28 2005-06-28 Positionsmesseinrichtung
DE102005029917.2 2005-06-28

Publications (3)

Publication Number Publication Date
JP2007010659A JP2007010659A (ja) 2007-01-18
JP2007010659A5 true JP2007010659A5 (enExample) 2009-03-26
JP5005969B2 JP5005969B2 (ja) 2012-08-22

Family

ID=37110275

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006176321A Active JP5005969B2 (ja) 2005-06-28 2006-06-27 位置測定装置

Country Status (6)

Country Link
US (1) US7471397B2 (enExample)
EP (1) EP1739395B1 (enExample)
JP (1) JP5005969B2 (enExample)
CN (1) CN100554868C (enExample)
DE (1) DE102005029917A1 (enExample)
ES (1) ES2610804T3 (enExample)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7641856B2 (en) * 2004-05-14 2010-01-05 Honeywell International Inc. Portable sample analyzer with removable cartridge
DE102005029917A1 (de) * 2005-06-28 2007-01-04 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102006042743A1 (de) 2006-09-12 2008-03-27 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102008008873A1 (de) * 2007-05-16 2008-11-20 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102007023300A1 (de) 2007-05-16 2008-11-20 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Anordnung derselben
DE102008007319A1 (de) 2008-02-02 2009-08-06 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
US7864336B2 (en) * 2008-04-28 2011-01-04 Agilent Technologies, Inc. Compact Littrow encoder
CN102197286B (zh) * 2008-10-23 2014-09-03 株式会社尼康 编码器
JP5814339B2 (ja) 2010-03-30 2015-11-17 ザイゴ コーポレーションＺｙｇｏ Ｃｏｒｐｏｒａｔｉｏｎ 干渉計エンコーダ・システム
DE102010029211A1 (de) 2010-05-21 2011-11-24 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
NL2006743A (en) * 2010-06-09 2011-12-12 Asml Netherlands Bv Position sensor and lithographic apparatus.
DE102011081879A1 (de) * 2010-11-03 2012-05-03 Dr. Johannes Heidenhain Gmbh Optische Winkelmesseinrichtung
DE102010043469A1 (de) * 2010-11-05 2012-05-10 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102011082156A1 (de) * 2010-12-16 2012-06-21 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
JP5849103B2 (ja) 2011-02-01 2016-01-27 ザイゴ コーポレーションＺｙｇｏ Ｃｏｒｐｏｒａｔｉｏｎ 干渉ヘテロダイン光学エンコーダシステム
DE102011005937B4 (de) * 2011-03-23 2020-10-22 Dr. Johannes Heidenhain Gmbh Vorrichtung zur interferentiellen Abstandsmessung
DE102011076178B4 (de) 2011-05-20 2022-03-31 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
US9534934B2 (en) * 2011-09-06 2017-01-03 Nikon Corporation High resolution encoder head
EP2776790B1 (en) 2011-11-09 2016-09-14 Zygo Corporation Compact encoder head for interferometric encoder system
TWI476376B (zh) 2011-11-09 2015-03-11 Zygo Corp 雙程干涉式編碼器系統
DE102012204572A1 (de) * 2012-03-22 2013-09-26 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Anordnung mit einer derartigen Positionsmesseinrichtung
TWI516746B (zh) 2012-04-20 2016-01-11 賽格股份有限公司 在干涉編碼系統中執行非諧循環錯誤補償的方法、裝置及計算機程式產品，以及微影系統
DE102012210309A1 (de) * 2012-06-19 2013-12-19 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102013222383A1 (de) * 2013-02-06 2014-08-07 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102013211758A1 (de) * 2013-06-21 2014-12-24 Dr. Johannes Heidenhain Gmbh Interferometer
TWI627379B (zh) * 2013-10-07 2018-06-21 德商強那斯海登翰博士有限公司 光學位置測量裝置
DE102013220190B4 (de) * 2013-10-07 2021-08-12 Dr. Johannes Heidenhain Gmbh Messteilung und lichtelektrische Positionsmesseinrichtung mit dieser Messteilung
JP6593868B2 (ja) * 2015-07-28 2019-10-23 株式会社ミツトヨ 変位検出装置
CN106813578B (zh) * 2015-11-30 2019-02-22 上海微电子装备（集团）股份有限公司 一种二维光栅测量系统
DE102016200847A1 (de) * 2016-01-21 2017-07-27 Dr. Johannes Heidenhain Gesellschaft Mit Beschränkter Haftung Optische Positionsmesseinrichtung
JP2018066629A (ja) * 2016-10-19 2018-04-26 太陽誘電株式会社 ロードセル
JP6957088B2 (ja) * 2017-04-19 2021-11-02 株式会社ミツトヨ 光学式エンコーダ
US10648838B2 (en) 2017-06-29 2020-05-12 Mitutoyo Corporation Contamination and defect resistant rotary optical encoder configuration including a rotary scale with yawed scale grating bars and structured illumination generating arrangement with a beam deflector configuration
CN114322817A (zh) * 2022-01-21 2022-04-12 东莞创视自动化科技有限公司 可变光栅组合模组及检测方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02504553A (ja) * 1987-12-15 1990-12-20 レニショウ パブリック リミテッド カンパニー 光電スケール読取装置
DE3905730C2 (de) * 1989-02-24 1995-06-14 Heidenhain Gmbh Dr Johannes Positionsmeßeinrichtung
US5079418A (en) 1990-02-20 1992-01-07 Dr. Johannes Heidenhain Gmbh Position measuring apparatus with reflection
JP3478567B2 (ja) * 1992-09-25 2003-12-15 キヤノン株式会社 回転情報検出装置
JP3028716B2 (ja) * 1993-09-29 2000-04-04 キヤノン株式会社 光学式変位センサ
JP3530573B2 (ja) * 1994-04-27 2004-05-24 キヤノン株式会社 光学式変位センサ
DE19748802B4 (de) * 1996-11-20 2010-09-09 Dr. Johannes Heidenhain Gmbh Optische Positionsmeßeinrichtung
EP1319170B1 (de) * 2000-09-14 2005-03-09 Dr. Johannes Heidenhain GmbH Positionsmesseinrichtung
CN1253699C (zh) 2002-03-18 2006-04-26 株式会社三丰 对偏移具有低灵敏度的光学位移传感装置
US20030174343A1 (en) * 2002-03-18 2003-09-18 Mitutoyo Corporation Optical displacement sensing device with reduced sensitivity to misalignment
JP4722474B2 (ja) * 2004-12-24 2011-07-13 株式会社ミツトヨ 変位検出装置
DE102005029917A1 (de) * 2005-06-28 2007-01-04 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
US7858922B2 (en) * 2006-11-20 2010-12-28 Dr. Johannes Heidenhain Gmbh Position-measuring device

Similar Documents

Publication Publication Date Title
JP2007010659A5 (enExample)
ES2606318T3 (es) Codificador óptico para determinar la posición de dos partes que son móviles entre sí en dos direcciones de movimiento
JP5005969B2 (ja) 位置測定装置
JP5710105B2 (ja) 光学式位置測定装置
JP2009186471A5 (enExample)
JP2008129021A5 (enExample)
RU2008138456A (ru) Рентгенодифракционная установка и способ рентгеновской дифракции
CN103091860B (zh) 棱镜扩束器装调仪及装调方法
JP2011247886A5 (enExample)
JP2008129022A5 (enExample)
JP2016156805A5 (enExample)
JP2007298522A5 (enExample)
JP2019117386A5 (ja) エンコーダ装置及び露光装置
JP2010231184A5 (enExample)
JP2018025817A5 (ja) エンコーダ装置及び計測方法、露光装置及び方法、並びにデバイス製造方法
IL312300B1 (en) Optical systems, metrology apparatus and associated methods
JP2015232562A5 (enExample)
JP2009276114A5 (enExample)
JP2012519291A5 (enExample)
JP2012526373A5 (enExample)
JP5128364B2 (ja) 位置測定装置
JP2013164339A5 (enExample)
JP2004340934A5 (enExample)
JP6667197B2 (ja) 測定目盛及びその測定目盛を備えた光電式位置測定装置
JP2007040996A5 (enExample)