JP2012519291A5 - - Google Patents
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- Publication number
- JP2012519291A5 JP2012519291A5 JP2011552373A JP2011552373A JP2012519291A5 JP 2012519291 A5 JP2012519291 A5 JP 2012519291A5 JP 2011552373 A JP2011552373 A JP 2011552373A JP 2011552373 A JP2011552373 A JP 2011552373A JP 2012519291 A5 JP2012519291 A5 JP 2012519291A5
- Authority
- JP
- Japan
- Prior art keywords
- measuring device
- position measuring
- support substrate
- optical component
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005540 biological transmission Effects 0.000 claims 16
- 230000003287 optical effect Effects 0.000 claims 15
- 239000000758 substrate Substances 0.000 claims 15
- 230000000737 periodic effect Effects 0.000 claims 10
- 238000001514 detection method Methods 0.000 claims 8
- 238000003491 array Methods 0.000 claims 1
- 230000004907 flux Effects 0.000 claims 1
- 238000003384 imaging method Methods 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102009001262.1 | 2009-03-02 | ||
| DE200910001262 DE102009001262A1 (de) | 2009-03-02 | 2009-03-02 | Positionsmesseinrichtung |
| PCT/EP2010/051290 WO2010100005A2 (de) | 2009-03-02 | 2010-02-03 | Positionsmesseinrichtung |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012519291A JP2012519291A (ja) | 2012-08-23 |
| JP2012519291A5 true JP2012519291A5 (enExample) | 2013-03-14 |
| JP5436582B2 JP5436582B2 (ja) | 2014-03-05 |
Family
ID=42538255
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011552373A Expired - Fee Related JP5436582B2 (ja) | 2009-03-02 | 2010-02-03 | 位置測定装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8854630B2 (enExample) |
| EP (1) | EP2404143B1 (enExample) |
| JP (1) | JP5436582B2 (enExample) |
| CN (1) | CN102341676B (enExample) |
| DE (1) | DE102009001262A1 (enExample) |
| WO (1) | WO2010100005A2 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102010028725B4 (de) | 2010-05-07 | 2023-05-25 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| EP2693166B1 (de) * | 2012-07-31 | 2015-09-09 | SICK STEGMANN GmbH | Sende- und Empfangseinheit und Drehgeber mit einer solchen |
| DE102013220214A1 (de) * | 2013-10-07 | 2015-04-09 | Dr. Johannes Heidenhain Gmbh | Anordnung zur Positionierung eines Werkzeugs relativ zu einem Werkstück |
| JP6047508B2 (ja) | 2014-01-27 | 2016-12-21 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置、試料画像取得方法、およびプログラム記録媒体 |
| EP3009806B1 (de) * | 2014-10-14 | 2016-12-14 | Dr. Johannes Heidenhain GmbH | Positionsmesseinrichtung mit Vorrichtung zur Kompensation von Fehlern durch thermische Dilatation eines Massstabes |
| DE102016200847A1 (de) * | 2016-01-21 | 2017-07-27 | Dr. Johannes Heidenhain Gesellschaft Mit Beschränkter Haftung | Optische Positionsmesseinrichtung |
| ES2752656T3 (es) * | 2017-08-01 | 2020-04-06 | Fagor Automation S Coop | Método de comprobación para un dispositivo optoelectrónico de medida, y dispositivo |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6424407B1 (en) | 1998-03-09 | 2002-07-23 | Otm Technologies Ltd. | Optical translation measurement |
| JP4658452B2 (ja) * | 2003-02-07 | 2011-03-23 | オリンパス株式会社 | 光学式エンコーダ |
| JP4021382B2 (ja) * | 2003-07-28 | 2007-12-12 | オリンパス株式会社 | 光学式エンコーダ及びその製造方法並びに光学レンズモジュール |
| DE102006021017A1 (de) | 2006-05-05 | 2007-11-08 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| JP5155538B2 (ja) | 2006-09-11 | 2013-03-06 | 株式会社エヌ・ティ・ティ・ドコモ | 測定対象物搭載装置、電磁界特性測定システム |
| JP4912801B2 (ja) * | 2006-09-11 | 2012-04-11 | オリンパス株式会社 | 光学式エンコーダ |
| DE102007028943A1 (de) | 2007-06-22 | 2008-12-24 | Dr. Johannes Heidenhain Gmbh | Abtasteinheit für eine optische Positionsmesseinrichtung |
-
2009
- 2009-03-02 DE DE200910001262 patent/DE102009001262A1/de not_active Withdrawn
-
2010
- 2010-02-03 CN CN201080010169.5A patent/CN102341676B/zh not_active Expired - Fee Related
- 2010-02-03 EP EP10703831.7A patent/EP2404143B1/de not_active Not-in-force
- 2010-02-03 JP JP2011552373A patent/JP5436582B2/ja not_active Expired - Fee Related
- 2010-02-03 US US13/203,688 patent/US8854630B2/en not_active Expired - Fee Related
- 2010-02-03 WO PCT/EP2010/051290 patent/WO2010100005A2/de not_active Ceased
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