JP2007040996A5 - - Google Patents

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Publication number
JP2007040996A5
JP2007040996A5 JP2006207397A JP2006207397A JP2007040996A5 JP 2007040996 A5 JP2007040996 A5 JP 2007040996A5 JP 2006207397 A JP2006207397 A JP 2006207397A JP 2006207397 A JP2006207397 A JP 2006207397A JP 2007040996 A5 JP2007040996 A5 JP 2007040996A5
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JP
Japan
Prior art keywords
scale
scanning
partial beam
measurement
graduation
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JP2006207397A
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English (en)
Japanese (ja)
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JP2007040996A (ja
JP5106807B2 (ja
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Priority claimed from DE102005036180.3A external-priority patent/DE102005036180B4/de
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Publication of JP2007040996A publication Critical patent/JP2007040996A/ja
Publication of JP2007040996A5 publication Critical patent/JP2007040996A5/ja
Application granted granted Critical
Publication of JP5106807B2 publication Critical patent/JP5106807B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2006207397A 2005-08-02 2006-07-31 光学式エンコーダ Expired - Fee Related JP5106807B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102005036180.3 2005-08-02
DE102005036180.3A DE102005036180B4 (de) 2005-08-02 2005-08-02 Optische Positionsmesseinrichtung

Publications (3)

Publication Number Publication Date
JP2007040996A JP2007040996A (ja) 2007-02-15
JP2007040996A5 true JP2007040996A5 (enExample) 2009-08-27
JP5106807B2 JP5106807B2 (ja) 2012-12-26

Family

ID=37669905

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006207397A Expired - Fee Related JP5106807B2 (ja) 2005-08-02 2006-07-31 光学式エンコーダ

Country Status (3)

Country Link
US (1) US7404259B2 (enExample)
JP (1) JP5106807B2 (enExample)
DE (1) DE102005036180B4 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7608813B1 (en) * 2008-11-18 2009-10-27 Mitutoyo Corporation Scale track configuration for absolute optical encoder including a detector electronics with plurality of track detector portions
JP6032924B2 (ja) * 2011-04-13 2016-11-30 キヤノン株式会社 エンコーダ
JP5755010B2 (ja) 2011-04-14 2015-07-29 キヤノン株式会社 エンコーダ
US10452025B2 (en) * 2013-11-04 2019-10-22 Luminit Llc Substrate-guided wave-based transparent holographic center high mounted stop light and method of fabrication thereof
JP6593868B2 (ja) * 2015-07-28 2019-10-23 株式会社ミツトヨ 変位検出装置
DE102017201257A1 (de) * 2017-01-26 2018-07-26 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
EP3527953B1 (en) * 2018-02-14 2022-07-20 Hohner Automation S.L. Methods to calculate the shape of a mask slots of an optical incremental encoder
DE102019206937A1 (de) * 2019-05-14 2020-11-19 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
EP4421454B1 (de) * 2023-02-23 2025-04-30 Dr. Johannes Heidenhain GmbH Skalenelement für eine induktive positionsmesseinrichtung

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH669457A5 (enExample) * 1986-02-18 1989-03-15 Mettler Instrumente Ag
US5237391A (en) * 1988-11-23 1993-08-17 The Boeing Company Multitrack multilevel sensing system
DE3905730C2 (de) * 1989-02-24 1995-06-14 Heidenhain Gmbh Dr Johannes Positionsmeßeinrichtung
US4991125A (en) * 1989-04-19 1991-02-05 Mitutoyo Corporation Displacement detector
DE4040794A1 (de) * 1990-12-17 1992-06-25 Ems Technik Gmbh Verfahren und lagegeber zur lagebestimmung eines positionierkoerpers relativ zu einem bezugskoerper
EP0547270B1 (de) * 1991-12-20 1995-05-17 Dr. Johannes Heidenhain GmbH Fotoelektrische Vorrichtung zur Erzeugung oberwellenfreier periodischer Signale
US6178653B1 (en) * 1998-11-20 2001-01-30 Lucent Technologies Inc. Probe tip locator
DE50105554D1 (de) * 2000-09-14 2005-04-14 Heidenhain Gmbh Dr Johannes Positionsmesseinrichtung
US20040135076A1 (en) * 2003-01-15 2004-07-15 Xerox Corporation Method and apparatus for obtaining a high quality sine wave from an analog quadrature encoder

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