JPH10506719A - 2つの物体の相対的な変位を測定する光電式距離及び角度測定装置 - Google Patents
2つの物体の相対的な変位を測定する光電式距離及び角度測定装置Info
- Publication number
- JPH10506719A JPH10506719A JP9507224A JP50722497A JPH10506719A JP H10506719 A JPH10506719 A JP H10506719A JP 9507224 A JP9507224 A JP 9507224A JP 50722497 A JP50722497 A JP 50722497A JP H10506719 A JPH10506719 A JP H10506719A
- Authority
- JP
- Japan
- Prior art keywords
- measuring device
- grating
- angle
- distance
- photoreceivers
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000006073 displacement reaction Methods 0.000 title claims abstract description 8
- 239000011159 matrix material Substances 0.000 claims abstract description 23
- 230000003287 optical effect Effects 0.000 claims description 12
- 238000011156 evaluation Methods 0.000 claims description 4
- 230000005484 gravity Effects 0.000 claims description 2
- 238000005259 measurement Methods 0.000 abstract description 3
- 230000000694 effects Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/36—Forming the light into pulses
- G01D5/38—Forming the light into pulses by diffraction gratings
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optical Transform (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.2つの物体の相対的な変位を測定する光電式距離及び角度測定装置であって 、光源、基準回折格子、スケール回折格子、複数のフォトレシーバーの配列及び 評価回路を有する装置において、Nがフォトレシーバー(1)の数量を示し、n が2以上の偶数を示す数式、即ちN=n・4で表される数量のフォトレシーバー (1)はフォトレシーバー・マトリックス(2)内に配置され、同配置はフォト レシーバー(1)の対角線(a)がフォトレシーバー・マトリックス(2)の対 角線(c)及び光学縞パターン(4)に対して平行に延びるように行われ、フォ トレシーバー・マトリックス(2)の対角線(c)に隣接する同一位相を検出し ない複数のフォトレシーバー(1)の対角線(a)は互いに同一距離(b)だけ 離間し、前記複数のフォトレシーバー(1)の対角線(a)は重心を形成するポ イントを有し、前記同一位相を検出する複数のフォトレシーバー(1)は互いに 電気的に接続され、これらの信号は評価回路に入力される装置。 2.前記光源(10)の光線は基準回折格子(7)を通過し、さらにはスケール 回折格子(9)で反射され、次いで基準回折格子(7)を再度通過した後でフォ トレシーバー・マトリックス(2)上に人射する請求項1に記載の光電式距離及 び角度測定装置。 3.前記光学縞パターン(4)は基準回折格子(7)及びスケール回折格子(9 )の間で角度αを調整することによって形成され、前記角度αは0度より大きく 、かつ10度より小さい請求項1または2に記載の光電式距離及び角度測定装置 。 4.前記光源(10)はフォトレシーバー・マトリックスの中心に配置されてい る請求項1乃至3のいずれか一項に記載の光電式距離及び角度測定装置。 5.前記光源(10)は複数のフォトレシーバー(1)と同一の平面内に配置さ れるか、またはフォトレシーバー・マトリックス(2)上に配置されている請求 項1乃至4のいずれか一項に記載の光電式距離及び角度測定装置。 6.前記光源(10)はLEDとして形成されている請求項1乃至5のいずれか 一項に記載の光電式距離及び角度測定装置。 7.前記基準回折格子(7)はスケール回折格子(9)の少なくとも2倍の長さ の目盛り周期(T)を有する請求項1乃至3のいずれか一項に記載の光電式距離 及び角度測定装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19527287A DE19527287C2 (de) | 1995-07-26 | 1995-07-26 | Fotoelektrisches Weg- und Winkelmeßsystem zum Messen der Verschiebung zweier Objekte zueinander |
DE19527287.0 | 1995-07-26 | ||
PCT/EP1996/003276 WO1997005457A1 (de) | 1995-07-26 | 1996-07-25 | Fotoelektrisches weg- und winkelmesssystem zum messen der verschiebung zweier objekte zueinander |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH10506719A true JPH10506719A (ja) | 1998-06-30 |
JP3644687B2 JP3644687B2 (ja) | 2005-05-11 |
Family
ID=7767826
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50722497A Expired - Fee Related JP3644687B2 (ja) | 1995-07-26 | 1996-07-25 | 2つの物体の相対的な変位を測定する光電式距離及び角度測定装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US5841134A (ja) |
EP (1) | EP0804716B1 (ja) |
JP (1) | JP3644687B2 (ja) |
AT (1) | ATE263360T1 (ja) |
DE (2) | DE19527287C2 (ja) |
WO (1) | WO1997005457A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000329585A (ja) * | 1999-05-07 | 2000-11-30 | Dr Johannes Heidenhain Gmbh | 光学位置測定装置の走査ユニット |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19905227A1 (de) | 1998-02-10 | 1999-09-02 | Heidenhain Gmbh Dr Johannes | Optoelektronisches Weg-, Winkel- oder Rotationsmeßgerät |
EP1028309B1 (de) | 1999-02-04 | 2003-04-16 | Dr. Johannes Heidenhain GmbH | Optische Positionsmesseinrichtung |
US6525311B1 (en) | 1999-05-07 | 2003-02-25 | Dr. Johannes Heidenhain Gmbh | Scanning unit for optical position measuring device |
US6545262B1 (en) | 1999-06-04 | 2003-04-08 | Dr. Johannes Heidenhein Gmbh | Position measuring system |
DE19956912A1 (de) * | 1999-11-26 | 2001-08-09 | Heidenhain Gmbh Dr Johannes | Winkelmeßsystem und Winkelmeßverfahren zur berührungslosen Winkelmessung |
AU3986501A (en) * | 2000-02-23 | 2001-09-03 | Zyomyx Inc | Chips having elevated sample surfaces |
DE10020575A1 (de) | 2000-04-28 | 2001-10-31 | Heidenhain Gmbh Dr Johannes | Abtasteinheit für eine optische Positionsmesseinrichtung |
US6664538B1 (en) * | 2000-05-11 | 2003-12-16 | Infineon Technologies North America Corp | Mismatching of gratings to achieve phase shift in an optical position detector |
DE10043828B4 (de) * | 2000-09-06 | 2016-11-10 | Dr. Johannes Heidenhain Gmbh | Abtasteinheit für eine optische Positionsmesseinrichtung |
JP4720058B2 (ja) * | 2000-11-28 | 2011-07-13 | 株式会社Sumco | シリコンウェーハの製造方法 |
DE10116599A1 (de) | 2001-04-03 | 2003-02-06 | Heidenhain Gmbh Dr Johannes | Optische Positionsmesseinrichtung |
DE10357654A1 (de) | 2003-12-10 | 2005-07-14 | Dr. Johannes Heidenhain Gmbh | Abtastkopf für optische Positionsmeßsysteme |
DE102004006067B4 (de) | 2004-01-30 | 2014-08-28 | Dr. Johannes Heidenhain Gmbh | Abtasteinrichtung zur Abtastung einer Maßverkörperung |
US20050190988A1 (en) * | 2004-03-01 | 2005-09-01 | Mass Institute Of Technology (Mit) | Passive positioning sensors |
US20070171526A1 (en) * | 2006-01-26 | 2007-07-26 | Mass Institute Of Technology (Mit) | Stereographic positioning systems and methods |
CN101715542B (zh) * | 2007-05-23 | 2012-09-05 | 特里伯耶拿有限公司 | 找平设备和方法 |
DE102011053043A1 (de) * | 2011-08-26 | 2013-02-28 | Ic-Haus Gmbh | Integrierte Schaltungsanordnung, Positionsmessvorrichtung und Verfahren zur Herstellung einer integrierten Schaltungsanordnung |
DE102018108347B4 (de) | 2018-04-09 | 2021-02-04 | Picofine GmbH | Optischer Encoder und Verfahren zur Erfassung einer Relativbewegung |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4837101B1 (ja) * | 1968-02-06 | 1973-11-09 | ||
JPS5869216U (ja) * | 1981-11-02 | 1983-05-11 | 横河電機株式会社 | 光式物理量変換装置 |
JPH04259817A (ja) * | 1990-10-20 | 1992-09-16 | Dr Johannes Heidenhain Gmbh | 干渉測定装置 |
DE4328525A1 (de) * | 1993-08-25 | 1995-04-06 | Mikroelektronik Und Technologi | Längen- oder Winkelmeßeinrichtung |
JPH07146160A (ja) * | 1993-07-15 | 1995-06-06 | Dr Johannes Heidenhain Gmbh | 光電測長または測角装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1316062A (fr) * | 1962-02-07 | 1963-01-25 | Procédé et appareil pour détecter et indiquer l'amplitude d'un mouvement relatif,applicable notamment à la commande des machines-outils | |
CH466593A (de) * | 1967-02-23 | 1968-12-15 | Contraves Ag | Optisch-Elektrische-Winkelmesseinrichtung |
DE2500798A1 (de) * | 1975-01-10 | 1976-07-15 | Leitz Ernst Gmbh | Optisches messystem |
US4819051A (en) * | 1987-06-29 | 1989-04-04 | Honeywell Inc. | Compensated rotary position encoder |
JPH07888Y2 (ja) * | 1988-02-22 | 1995-01-11 | 株式会社ミツトヨ | 光学式変位検出器 |
DE3942178A1 (de) * | 1989-08-08 | 1991-02-21 | Heidenhain Gmbh Dr Johannes | Laengen- oder winkelmesseinrichtung |
WO1991003712A1 (en) * | 1989-09-06 | 1991-03-21 | Human Machine Interfaces Ltd. | Measurement device |
DE4316250C2 (de) * | 1993-05-14 | 1997-06-12 | Heidenhain Gmbh Dr Johannes | Lichtelektrische Längen- oder Winkelmeßeinrichtung |
JP3082516B2 (ja) * | 1993-05-31 | 2000-08-28 | キヤノン株式会社 | 光学式変位センサおよび該光学式変位センサを用いた駆動システム |
-
1995
- 1995-07-26 DE DE19527287A patent/DE19527287C2/de not_active Expired - Fee Related
-
1996
- 1996-07-25 US US08/809,591 patent/US5841134A/en not_active Expired - Lifetime
- 1996-07-25 DE DE59610955T patent/DE59610955D1/de not_active Expired - Lifetime
- 1996-07-25 WO PCT/EP1996/003276 patent/WO1997005457A1/de active IP Right Grant
- 1996-07-25 JP JP50722497A patent/JP3644687B2/ja not_active Expired - Fee Related
- 1996-07-25 AT AT96927599T patent/ATE263360T1/de active
- 1996-07-25 EP EP96927599A patent/EP0804716B1/de not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4837101B1 (ja) * | 1968-02-06 | 1973-11-09 | ||
JPS5869216U (ja) * | 1981-11-02 | 1983-05-11 | 横河電機株式会社 | 光式物理量変換装置 |
JPH04259817A (ja) * | 1990-10-20 | 1992-09-16 | Dr Johannes Heidenhain Gmbh | 干渉測定装置 |
JPH07146160A (ja) * | 1993-07-15 | 1995-06-06 | Dr Johannes Heidenhain Gmbh | 光電測長または測角装置 |
DE4328525A1 (de) * | 1993-08-25 | 1995-04-06 | Mikroelektronik Und Technologi | Längen- oder Winkelmeßeinrichtung |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000329585A (ja) * | 1999-05-07 | 2000-11-30 | Dr Johannes Heidenhain Gmbh | 光学位置測定装置の走査ユニット |
JP4580060B2 (ja) * | 1999-05-07 | 2010-11-10 | ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング | 光学位置測定装置の走査ユニット |
Also Published As
Publication number | Publication date |
---|---|
JP3644687B2 (ja) | 2005-05-11 |
EP0804716B1 (de) | 2004-03-31 |
DE19527287A1 (de) | 1997-01-30 |
DE59610955D1 (de) | 2004-05-06 |
US5841134A (en) | 1998-11-24 |
DE19527287C2 (de) | 2000-06-29 |
WO1997005457A1 (de) | 1997-02-13 |
ATE263360T1 (de) | 2004-04-15 |
EP0804716A1 (de) | 1997-11-05 |
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