DE60018540D1 - Wellenfrontsensor mit multifokaler Hartmannplatte und seine Verwendung in einer Linsenmessvorrichtung oder einem aktiven optischen Reflexionsteleskop - Google Patents

Wellenfrontsensor mit multifokaler Hartmannplatte und seine Verwendung in einer Linsenmessvorrichtung oder einem aktiven optischen Reflexionsteleskop

Info

Publication number
DE60018540D1
DE60018540D1 DE60018540T DE60018540T DE60018540D1 DE 60018540 D1 DE60018540 D1 DE 60018540D1 DE 60018540 T DE60018540 T DE 60018540T DE 60018540 T DE60018540 T DE 60018540T DE 60018540 D1 DE60018540 D1 DE 60018540D1
Authority
DE
Germany
Prior art keywords
lenses
wavefront sensor
multifocal
measuring device
active optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60018540T
Other languages
English (en)
Other versions
DE60018540T2 (de
Inventor
Eiichi Yanagi
Makoto Fujino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Topcon Corp
Original Assignee
Topcon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Topcon Corp filed Critical Topcon Corp
Publication of DE60018540D1 publication Critical patent/DE60018540D1/de
Application granted granted Critical
Publication of DE60018540T2 publication Critical patent/DE60018540T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Telescopes (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
DE60018540T 1999-12-28 2000-12-27 Wellenfrontsensor mit multifokaler Hartmannplatte und seine Verwendung in einer Linsenmessvorrichtung oder einem aktiven optischen Reflexionsteleskop Expired - Lifetime DE60018540T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP37522399A JP4549468B2 (ja) 1999-12-28 1999-12-28 レンズメータ
JP37522399 1999-12-28

Publications (2)

Publication Number Publication Date
DE60018540D1 true DE60018540D1 (de) 2005-04-14
DE60018540T2 DE60018540T2 (de) 2006-02-23

Family

ID=18505177

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60018540T Expired - Lifetime DE60018540T2 (de) 1999-12-28 2000-12-27 Wellenfrontsensor mit multifokaler Hartmannplatte und seine Verwendung in einer Linsenmessvorrichtung oder einem aktiven optischen Reflexionsteleskop

Country Status (7)

Country Link
US (1) US6480267B2 (de)
EP (1) EP1113251B1 (de)
JP (1) JP4549468B2 (de)
KR (1) KR100383330B1 (de)
CN (1) CN1188674C (de)
AT (1) ATE290686T1 (de)
DE (1) DE60018540T2 (de)

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US20050122308A1 (en) * 2002-05-28 2005-06-09 Matthew Bell Self-contained interactive video display system
US7710391B2 (en) 2002-05-28 2010-05-04 Matthew Bell Processing an image utilizing a spatially varying pattern
EP1543767A4 (de) * 2002-09-26 2008-03-19 Topcon Corp System zur messung von charakteristischen augenmerkmalen
WO2004055776A1 (en) * 2002-12-13 2004-07-01 Reactrix Systems Interactive directed light/sound system
CN100451577C (zh) * 2003-10-15 2009-01-14 中国科学院光电技术研究所 基于微棱镜阵列的脉冲光光束质量检测哈特曼波前传感器
EP1676442A2 (de) 2003-10-24 2006-07-05 Reactrix Systems, Inc. Verfahren und system zur verwaltung eines interaktiven video-display-systems
US20050151961A1 (en) * 2003-12-31 2005-07-14 Mcgraw John T. Surface layer atmospheric turbulence differential image motion measurement
US8103045B2 (en) * 2005-01-04 2012-01-24 Stc.Unm Structure function monitor
US9128519B1 (en) 2005-04-15 2015-09-08 Intellectual Ventures Holding 67 Llc Method and system for state-based control of objects
US8081822B1 (en) 2005-05-31 2011-12-20 Intellectual Ventures Holding 67 Llc System and method for sensing a feature of an object in an interactive video display
US20080296477A1 (en) * 2005-08-31 2008-12-04 U.S.A. as represented by the Administrator of the National Aeronautics and Space Adm. Optical system for inducing focus diversity
US8098277B1 (en) 2005-12-02 2012-01-17 Intellectual Ventures Holding 67 Llc Systems and methods for communication between a reactive video system and a mobile communication device
US7445335B2 (en) * 2006-01-20 2008-11-04 Clarity Medical Systems, Inc. Sequential wavefront sensor
CN100573065C (zh) * 2006-08-07 2009-12-23 中国科学院光电技术研究所 一种基于线性相位反演的波前测量方法
JP5430572B2 (ja) 2007-09-14 2014-03-05 インテレクチュアル ベンチャーズ ホールディング ６７ エルエルシー ジェスチャベースのユーザインタラクションの処理
US8159682B2 (en) 2007-11-12 2012-04-17 Intellectual Ventures Holding 67 Llc Lens system
US8259163B2 (en) * 2008-03-07 2012-09-04 Intellectual Ventures Holding 67 Llc Display with built in 3D sensing
US8595218B2 (en) 2008-06-12 2013-11-26 Intellectual Ventures Holding 67 Llc Interactive display management systems and methods
JP2010230578A (ja) * 2009-03-27 2010-10-14 Fujifilm Corp 偏芯量測定方法
JP5430290B2 (ja) * 2009-08-20 2014-02-26 キヤノン株式会社 測定方法及び測定装置
US9182289B2 (en) * 2011-10-14 2015-11-10 Canon Kabushiki Kaisha Apparatus and method for estimating wavefront parameters
JP5875537B2 (ja) * 2013-01-28 2016-03-02 三菱電機株式会社 形状可変鏡装置
US20170054499A1 (en) 2015-08-21 2017-02-23 SA Photonics, Inc. Free space optical (fso) system
CN108352895B (zh) * 2015-08-21 2020-03-24 Sa光子学公司 自由空间光学(fso)系统
US9973274B1 (en) 2015-10-07 2018-05-15 SA Photonics, Inc. Fast tracking free space optical module
CN106500968B (zh) * 2016-11-16 2019-07-02 中国科学院云南天文台 一种基于杨氏双缝干涉理论检测望远镜成像质量的方法
CN109556834B (zh) * 2017-09-26 2022-04-05 株式会社拓普康 镜片特性测量装置及镜片特性测量方法
CN112197876A (zh) * 2020-09-27 2021-01-08 中国科学院光电技术研究所 基于四象限离散相位调制的单远场型深度学习波前复原方法
CN113238374B (zh) * 2020-09-30 2022-08-05 南京航空航天大学 一种高功率激光器准直系统设计方法
CN113092076B (zh) * 2021-04-23 2022-10-14 航天科工微电子系统研究院有限公司 大口径变焦反射望远镜现场焦距检测方法及检测光路
US11909439B2 (en) 2021-04-23 2024-02-20 SA Photonics, Inc. Wavefront sensor with inner detector and outer detector

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US5493391A (en) * 1994-07-11 1996-02-20 Sandia Corporation One dimensional wavefront distortion sensor comprising a lens array system
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JPH09288040A (ja) * 1996-04-19 1997-11-04 Topcon Corp レンズメータ
JP3526381B2 (ja) * 1997-01-28 2004-05-10 三洋電機株式会社 固体撮像装置
JPH11125581A (ja) * 1997-10-24 1999-05-11 Topcon Corp オートレンズメータ
JPH11137522A (ja) * 1997-11-11 1999-05-25 Topcon Corp 光学特性測定装置
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JP3431828B2 (ja) * 1998-04-09 2003-07-28 三菱電機株式会社 波面センサー
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Also Published As

Publication number Publication date
KR100383330B1 (ko) 2003-05-12
CN1301954A (zh) 2001-07-04
ATE290686T1 (de) 2005-03-15
US6480267B2 (en) 2002-11-12
CN1188674C (zh) 2005-02-09
EP1113251A3 (de) 2003-09-17
DE60018540T2 (de) 2006-02-23
EP1113251A2 (de) 2001-07-04
KR20010062745A (ko) 2001-07-07
EP1113251B1 (de) 2005-03-09
JP4549468B2 (ja) 2010-09-22
US20010006210A1 (en) 2001-07-05
JP2001188025A (ja) 2001-07-10

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