JP5710105B2 - 光学式位置測定装置 - Google Patents
光学式位置測定装置 Download PDFInfo
- Publication number
- JP5710105B2 JP5710105B2 JP2009019213A JP2009019213A JP5710105B2 JP 5710105 B2 JP5710105 B2 JP 5710105B2 JP 2009019213 A JP2009019213 A JP 2009019213A JP 2009019213 A JP2009019213 A JP 2009019213A JP 5710105 B2 JP5710105 B2 JP 5710105B2
- Authority
- JP
- Japan
- Prior art keywords
- scanning
- grating
- different
- measuring device
- period
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000003287 optical effect Effects 0.000 title claims description 44
- 238000001514 detection method Methods 0.000 claims description 31
- 238000005259 measurement Methods 0.000 claims description 30
- 230000000737 periodic effect Effects 0.000 claims description 15
- 230000004907 flux Effects 0.000 claims description 8
- 230000010363 phase shift Effects 0.000 claims description 7
- 230000003993 interaction Effects 0.000 claims description 5
- 230000001902 propagating effect Effects 0.000 claims description 5
- 239000003795 chemical substances by application Substances 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 238000009826 distribution Methods 0.000 description 4
- 230000004044 response Effects 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 3
- 230000005484 gravity Effects 0.000 description 3
- 230000033001 locomotion Effects 0.000 description 3
- 230000010287 polarization Effects 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 230000037303 wrinkles Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/36—Forming the light into pulses
- G01D5/38—Forming the light into pulses by diffraction gratings
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optical Transform (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102008007319A DE102008007319A1 (de) | 2008-02-02 | 2008-02-02 | Optische Positionsmesseinrichtung |
| DE102008007319.9 | 2008-02-02 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009186471A JP2009186471A (ja) | 2009-08-20 |
| JP2009186471A5 JP2009186471A5 (enExample) | 2012-02-16 |
| JP5710105B2 true JP5710105B2 (ja) | 2015-04-30 |
Family
ID=40668151
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009019213A Active JP5710105B2 (ja) | 2008-02-02 | 2009-01-30 | 光学式位置測定装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7872762B2 (enExample) |
| EP (1) | EP2085752B1 (enExample) |
| JP (1) | JP5710105B2 (enExample) |
| DE (1) | DE102008007319A1 (enExample) |
| ES (1) | ES2524060T3 (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102008025870A1 (de) * | 2008-05-31 | 2009-12-03 | Dr. Johannes Heidenhain Gmbh | Optische Positionsmesseinrichtung |
| US8436293B2 (en) * | 2009-02-23 | 2013-05-07 | Christopher C. Chang | Optical encoder and method for measuring displacement information using multiple optical tracks of diffractive optical regions having different periodicities |
| CN102192761B (zh) * | 2010-04-22 | 2013-06-05 | 廊坊开发区莱格光电仪器有限公司 | 敞开式激光限束扫描标尺光栅传感器 |
| DE102010043469A1 (de) * | 2010-11-05 | 2012-05-10 | Dr. Johannes Heidenhain Gmbh | Optische Positionsmesseinrichtung |
| DE102010063253A1 (de) * | 2010-12-16 | 2012-06-21 | Dr. Johannes Heidenhain Gmbh | Optische Positionsmesseinrichtung |
| DE102011076178B4 (de) * | 2011-05-20 | 2022-03-31 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| DE102011111900A1 (de) * | 2011-08-30 | 2013-02-28 | Dr. Johannes Heidenhain Gmbh | Vorrichtung zur interferometrischen Abstandsbestimmung |
| TWI546518B (zh) * | 2012-04-20 | 2016-08-21 | 德律科技股份有限公司 | 三維量測系統與三維量測方法 |
| JP6253929B2 (ja) * | 2013-09-11 | 2017-12-27 | 株式会社オプトニクス精密 | 反射型エンコーダ装置 |
| DE102013220214A1 (de) | 2013-10-07 | 2015-04-09 | Dr. Johannes Heidenhain Gmbh | Anordnung zur Positionierung eines Werkzeugs relativ zu einem Werkstück |
| TWI627379B (zh) * | 2013-10-07 | 2018-06-21 | 德商強那斯海登翰博士有限公司 | 光學位置測量裝置 |
| JP6702666B2 (ja) | 2015-07-28 | 2020-06-03 | 株式会社ミツトヨ | 変位検出装置 |
| JP6400036B2 (ja) * | 2016-03-14 | 2018-10-03 | キヤノン株式会社 | 位置検出装置、工作装置、および、露光装置 |
| CN106971369B (zh) * | 2017-03-02 | 2020-06-12 | 南京师范大学 | 一种基于gpu的地形可视域分析的数据调度与分发方法 |
| DE102018212719A1 (de) * | 2018-07-31 | 2020-02-20 | Dr. Johannes Heidenhain Gesellschaft Mit Beschränkter Haftung | Optische Positionsmesseinrichtung |
| JP7513510B2 (ja) * | 2020-11-24 | 2024-07-09 | 株式会社ミツトヨ | 変位センサ及び形状測定装置 |
| CN115113411B (zh) * | 2022-08-31 | 2022-11-22 | 长春理工大学 | 一种多光束合束装置及方法 |
| DE102023208964A1 (de) * | 2023-09-15 | 2025-03-20 | Dr. Johannes Heidenhain Gmbh | Positionsmesssystem |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA2073409A1 (en) * | 1991-10-15 | 1993-04-16 | Paul F. Sullivan | Light beam position detection and control apparatus employing diffraction patterns |
| JP3198789B2 (ja) * | 1994-04-12 | 2001-08-13 | 松下電器産業株式会社 | 光学式エンコーダ |
| US5497226A (en) * | 1994-08-22 | 1996-03-05 | Polaroid Corporation | Quadrature diffractive encoder |
| DE19511068A1 (de) * | 1995-03-25 | 1996-09-26 | Heidenhain Gmbh Dr Johannes | Lichtelektrische Positionsmeßeinrichtung |
| US5808742A (en) * | 1995-05-31 | 1998-09-15 | Massachusetts Institute Of Technology | Optical alignment apparatus having multiple parallel alignment marks |
| DE19521295C2 (de) * | 1995-06-10 | 2000-07-13 | Heidenhain Gmbh Dr Johannes | Lichtelektrische Positionsmeßeinrichtung |
| DE19748802B4 (de) * | 1996-11-20 | 2010-09-09 | Dr. Johannes Heidenhain Gmbh | Optische Positionsmeßeinrichtung |
| DE19716058B4 (de) * | 1997-04-17 | 2011-03-17 | Dr. Johannes Heidenhain Gmbh | Optische Positionsmeßeinrichtung |
| US6124589A (en) * | 1997-06-16 | 2000-09-26 | West; Donald Lee | Virtual mask encoder |
| US7016025B1 (en) * | 1999-06-24 | 2006-03-21 | Asml Holding N.V. | Method and apparatus for characterization of optical systems |
| DE19962278A1 (de) * | 1999-12-23 | 2001-08-02 | Heidenhain Gmbh Dr Johannes | Positionsmeßeinrichtung |
| US7088458B1 (en) * | 2002-12-23 | 2006-08-08 | Carl Zeiss Smt Ag | Apparatus and method for measuring an optical imaging system, and detector unit |
| US7295315B2 (en) * | 2003-06-30 | 2007-11-13 | Kenneth C. Johnson | Focus and alignment sensors and methods for use with scanning microlens-array printer |
| JP4520121B2 (ja) * | 2003-08-08 | 2010-08-04 | シャープ株式会社 | 光学式エンコーダ |
| DE102005029917A1 (de) | 2005-06-28 | 2007-01-04 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| DE102005043569A1 (de) * | 2005-09-12 | 2007-03-22 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| DE102006041357A1 (de) * | 2005-11-09 | 2007-05-10 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung und Verfahren zum Betrieb einer Positionsmesseinrichtung |
| US7636165B2 (en) * | 2006-03-21 | 2009-12-22 | Asml Netherlands B.V. | Displacement measurement systems lithographic apparatus and device manufacturing method |
| DE102006042743A1 (de) * | 2006-09-12 | 2008-03-27 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| US7561280B2 (en) * | 2007-03-15 | 2009-07-14 | Agilent Technologies, Inc. | Displacement measurement sensor head and system having measurement sub-beams comprising zeroth order and first order diffraction components |
-
2008
- 2008-02-02 DE DE102008007319A patent/DE102008007319A1/de not_active Withdrawn
- 2008-12-09 EP EP08171105.3A patent/EP2085752B1/de active Active
- 2008-12-09 ES ES08171105.3T patent/ES2524060T3/es active Active
-
2009
- 2009-01-23 US US12/321,642 patent/US7872762B2/en active Active
- 2009-01-30 JP JP2009019213A patent/JP5710105B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US7872762B2 (en) | 2011-01-18 |
| ES2524060T3 (es) | 2014-12-03 |
| US20090195792A1 (en) | 2009-08-06 |
| EP2085752A3 (de) | 2013-10-16 |
| EP2085752A2 (de) | 2009-08-05 |
| EP2085752B1 (de) | 2014-11-05 |
| JP2009186471A (ja) | 2009-08-20 |
| DE102008007319A1 (de) | 2009-08-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5710105B2 (ja) | 光学式位置測定装置 | |
| JP5100266B2 (ja) | エンコーダ | |
| CN101688795B (zh) | 光学位置测量装置 | |
| JP4677169B2 (ja) | 位置測定装置 | |
| CN100554868C (zh) | 位置测量装置 | |
| JP5147368B2 (ja) | エンコーダ | |
| JP5147367B2 (ja) | エンコーダ | |
| JP2009186471A5 (enExample) | ||
| JP5882672B2 (ja) | 光学式位置測定装置 | |
| JP7222081B2 (ja) | 線形及び回転マルチトラック絶対位置エンコーダ並びにそれを使用した方法 | |
| JP6588836B2 (ja) | 光学位置測定装置 | |
| WO2015011848A1 (ja) | 変位計測装置及び変位計測方法 | |
| US9952068B2 (en) | Optical element | |
| US20120217383A1 (en) | Optical encoder | |
| JP2007304097A (ja) | 光学エンコーダ | |
| JP2005526951A (ja) | 基準点タルボットエンコーダ | |
| JP5128364B2 (ja) | 位置測定装置 | |
| JP2001141521A (ja) | 位置を測定しかつ案内誤差を算出する装置 | |
| JP6525546B2 (ja) | 位置計測装置 | |
| JP6427093B2 (ja) | 光学式位置測定装置 | |
| EP0484104A1 (en) | Opto-electronic scale reading apparatus | |
| JP6289609B2 (ja) | 干渉式間隔測定装置 | |
| JP7572834B2 (ja) | 光学的な位置測定装置 | |
| US20250093510A1 (en) | Position measuring system | |
| JP5378524B2 (ja) | 光学式位置測定装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RD04 | Notification of resignation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7424 Effective date: 20100517 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20111226 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20111226 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20130729 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20130903 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20131129 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20140903 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20141120 |
|
| A911 | Transfer to examiner for re-examination before appeal (zenchi) |
Free format text: JAPANESE INTERMEDIATE CODE: A911 Effective date: 20141203 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20150204 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20150304 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 5710105 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |