JP2009088498A5 - - Google Patents
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- JP2009088498A5 JP2009088498A5 JP2008232433A JP2008232433A JP2009088498A5 JP 2009088498 A5 JP2009088498 A5 JP 2009088498A5 JP 2008232433 A JP2008232433 A JP 2008232433A JP 2008232433 A JP2008232433 A JP 2008232433A JP 2009088498 A5 JP2009088498 A5 JP 2009088498A5
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- semiconductor
- release layer
- layer
- forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 claims 43
- 239000004065 semiconductor Substances 0.000 claims 41
- 238000004519 manufacturing process Methods 0.000 claims 7
- 238000000034 method Methods 0.000 claims 7
- 238000004544 sputter deposition Methods 0.000 claims 5
- 238000009413 insulation Methods 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 claims 1
- 239000002184 metal Substances 0.000 claims 1
- 229910044991 metal oxide Inorganic materials 0.000 claims 1
- 150000004706 metal oxides Chemical class 0.000 claims 1
- 230000003746 surface roughness Effects 0.000 claims 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims 1
- 229910052721 tungsten Inorganic materials 0.000 claims 1
- 239000010937 tungsten Substances 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008232433A JP5367330B2 (ja) | 2007-09-14 | 2008-09-10 | Soi基板の作製方法及び半導体装置の作製方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007239167 | 2007-09-14 | ||
| JP2007239167 | 2007-09-14 | ||
| JP2008232433A JP5367330B2 (ja) | 2007-09-14 | 2008-09-10 | Soi基板の作製方法及び半導体装置の作製方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013188367A Division JP5732119B2 (ja) | 2007-09-14 | 2013-09-11 | 半導体装置の作製方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009088498A JP2009088498A (ja) | 2009-04-23 |
| JP2009088498A5 true JP2009088498A5 (enExample) | 2011-10-13 |
| JP5367330B2 JP5367330B2 (ja) | 2013-12-11 |
Family
ID=40454947
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008232433A Expired - Fee Related JP5367330B2 (ja) | 2007-09-14 | 2008-09-10 | Soi基板の作製方法及び半導体装置の作製方法 |
| JP2013188367A Expired - Fee Related JP5732119B2 (ja) | 2007-09-14 | 2013-09-11 | 半導体装置の作製方法 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013188367A Expired - Fee Related JP5732119B2 (ja) | 2007-09-14 | 2013-09-11 | 半導体装置の作製方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (2) | US7951689B2 (enExample) |
| JP (2) | JP5367330B2 (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8067793B2 (en) | 2007-09-27 | 2011-11-29 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including storage capacitor with yttrium oxide capacitor dielectric |
| US8236668B2 (en) | 2007-10-10 | 2012-08-07 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing SOI substrate |
| US8003483B2 (en) | 2008-03-18 | 2011-08-23 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing SOI substrate |
| JP5548395B2 (ja) | 2008-06-25 | 2014-07-16 | 株式会社半導体エネルギー研究所 | Soi基板の作製方法 |
| US7943428B2 (en) * | 2008-12-24 | 2011-05-17 | International Business Machines Corporation | Bonded semiconductor substrate including a cooling mechanism |
| FR2953640B1 (fr) * | 2009-12-04 | 2012-02-10 | S O I Tec Silicon On Insulator Tech | Procede de fabrication d'une structure de type semi-conducteur sur isolant, a pertes electriques diminuees et structure correspondante |
| US8377799B2 (en) | 2010-03-31 | 2013-02-19 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing SOI substrate |
| JP5917036B2 (ja) | 2010-08-05 | 2016-05-11 | 株式会社半導体エネルギー研究所 | Soi基板の作製方法 |
| WO2012043971A2 (ko) * | 2010-09-29 | 2012-04-05 | 포항공과대학교 산학협력단 | 롤 형상의 모기판을 이용한 플렉서블 전자소자의 제조방법, 플렉서블 전자소자 및 플렉서블 기판 |
| JP5790095B2 (ja) * | 2011-04-01 | 2015-10-07 | ソニー株式会社 | 薄膜素子及びその製造方法、並びに、画像表示装置の製造方法 |
| US9269858B2 (en) * | 2011-08-31 | 2016-02-23 | Micron Technology, Inc. | Engineered substrates for semiconductor devices and associated systems and methods |
| US9324449B2 (en) | 2012-03-28 | 2016-04-26 | Semiconductor Energy Laboratory Co., Ltd. | Driver circuit, signal processing unit having the driver circuit, method for manufacturing the signal processing unit, and display device |
| US8877603B2 (en) | 2012-03-30 | 2014-11-04 | International Business Machines Corporation | Semiconductor-on-oxide structure and method of forming |
| TWI516567B (zh) * | 2013-03-26 | 2016-01-11 | 群創光電股份有限公司 | 顯示面板之製作方法 |
| JP6349739B2 (ja) * | 2014-01-21 | 2018-07-04 | 株式会社リコー | 発光装置及びその製造方法並びに露光ヘッド |
| CN109087936A (zh) * | 2018-08-24 | 2018-12-25 | 京东方科技集团股份有限公司 | 一种柔性显示基板的制备方法 |
| FR3098642B1 (fr) | 2019-07-12 | 2021-06-11 | Soitec Silicon On Insulator | procédé de fabrication d'une structure comprenant une couche mince reportée sur un support muni d’une couche de piégeage de charges |
Family Cites Families (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2737147B2 (ja) | 1988-04-22 | 1998-04-08 | ソニー株式会社 | 絶縁膜の形成方法 |
| JP3237888B2 (ja) | 1992-01-31 | 2001-12-10 | キヤノン株式会社 | 半導体基体及びその作製方法 |
| JP2742747B2 (ja) | 1992-05-29 | 1998-04-22 | 株式会社半導体エネルギー研究所 | 薄膜トランジスタを有する多層半導体集積回路 |
| FR2748851B1 (fr) | 1996-05-15 | 1998-08-07 | Commissariat Energie Atomique | Procede de realisation d'une couche mince de materiau semiconducteur |
| EP1655633A3 (en) * | 1996-08-27 | 2006-06-21 | Seiko Epson Corporation | Exfoliating method, transferring method of thin film device, thin film integrated circuit device, and liquid crystal display device |
| US6191007B1 (en) * | 1997-04-28 | 2001-02-20 | Denso Corporation | Method for manufacturing a semiconductor substrate |
| JPH1126733A (ja) * | 1997-07-03 | 1999-01-29 | Seiko Epson Corp | 薄膜デバイスの転写方法、薄膜デバイス、薄膜集積回路装置,アクティブマトリクス基板、液晶表示装置および電子機器 |
| JPH11163363A (ja) * | 1997-11-22 | 1999-06-18 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
| JP2000012864A (ja) | 1998-06-22 | 2000-01-14 | Semiconductor Energy Lab Co Ltd | 半導体装置の作製方法 |
| JP2000077287A (ja) | 1998-08-26 | 2000-03-14 | Nissin Electric Co Ltd | 結晶薄膜基板の製造方法 |
| JP2000124092A (ja) | 1998-10-16 | 2000-04-28 | Shin Etsu Handotai Co Ltd | 水素イオン注入剥離法によってsoiウエーハを製造する方法およびこの方法で製造されたsoiウエーハ |
| FR2797347B1 (fr) | 1999-08-04 | 2001-11-23 | Commissariat Energie Atomique | Procede de transfert d'une couche mince comportant une etape de surfragililisation |
| US6261957B1 (en) * | 1999-08-20 | 2001-07-17 | Taiwan Semiconductor Manufacturing Company | Self-planarized gap-filling by HDPCVD for shallow trench isolation |
| US6525415B2 (en) | 1999-12-28 | 2003-02-25 | Fuji Xerox Co., Ltd. | Three-dimensional semiconductor integrated circuit apparatus and manufacturing method therefor |
| US6475072B1 (en) * | 2000-09-29 | 2002-11-05 | International Business Machines Corporation | Method of wafer smoothing for bonding using chemo-mechanical polishing (CMP) |
| FR2817395B1 (fr) * | 2000-11-27 | 2003-10-31 | Soitec Silicon On Insulator | Procede de fabrication d'un substrat notamment pour l'optique, l'electronique ou l'optoelectronique et substrat obtenu par ce procede |
| JP4803884B2 (ja) | 2001-01-31 | 2011-10-26 | キヤノン株式会社 | 薄膜半導体装置の製造方法 |
| JP4027740B2 (ja) * | 2001-07-16 | 2007-12-26 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| KR100944886B1 (ko) | 2001-10-30 | 2010-03-03 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제조 방법 |
| US7508034B2 (en) | 2002-09-25 | 2009-03-24 | Sharp Kabushiki Kaisha | Single-crystal silicon substrate, SOI substrate, semiconductor device, display device, and manufacturing method of semiconductor device |
| JP2004134672A (ja) * | 2002-10-11 | 2004-04-30 | Sony Corp | 超薄型半導体装置の製造方法および製造装置、並びに超薄型の裏面照射型固体撮像装置の製造方法および製造装置 |
| JP4574118B2 (ja) * | 2003-02-12 | 2010-11-04 | 株式会社半導体エネルギー研究所 | 半導体装置及びその作製方法 |
| JP2004311955A (ja) * | 2003-03-25 | 2004-11-04 | Sony Corp | 超薄型電気光学表示装置の製造方法 |
| JP2006049800A (ja) | 2004-03-10 | 2006-02-16 | Seiko Epson Corp | 薄膜デバイスの供給体、薄膜デバイスの供給体の製造方法、転写方法、半導体装置の製造方法及び電子機器 |
| JP4538254B2 (ja) * | 2004-03-25 | 2010-09-08 | ルネサスエレクトロニクス株式会社 | Euvリソグラフィー用マスク基板及びその製造方法 |
| US7179719B2 (en) | 2004-09-28 | 2007-02-20 | Sharp Laboratories Of America, Inc. | System and method for hydrogen exfoliation |
| KR100601976B1 (ko) | 2004-12-08 | 2006-07-18 | 삼성전자주식회사 | 스트레인 실리콘 온 인슐레이터 구조체 및 그 제조방법 |
| US7387946B2 (en) * | 2005-06-07 | 2008-06-17 | Freescale Semiconductor, Inc. | Method of fabricating a substrate for a planar, double-gated, transistor process |
| EP1760776B1 (en) * | 2005-08-31 | 2019-12-25 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method for semiconductor device with flexible substrate |
| EP1760798B1 (en) * | 2005-08-31 | 2012-01-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
| JP2007080949A (ja) * | 2005-09-12 | 2007-03-29 | Shin Etsu Handotai Co Ltd | Soiウエーハの製造方法 |
| JP2007220749A (ja) * | 2006-02-14 | 2007-08-30 | Seiko Epson Corp | 半導体装置の製造方法 |
| JP5446059B2 (ja) * | 2006-04-24 | 2014-03-19 | 豊田合成株式会社 | GaN系半導体発光素子の製造方法 |
| DE102006020825A1 (de) * | 2006-05-04 | 2007-11-08 | Siltronic Ag | Verfahren zur Herstellung einer Schichtenstruktur |
| KR101447048B1 (ko) | 2007-04-20 | 2014-10-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | Soi 기판 및 반도체장치의 제조방법 |
-
2008
- 2008-09-10 JP JP2008232433A patent/JP5367330B2/ja not_active Expired - Fee Related
- 2008-09-11 US US12/232,131 patent/US7951689B2/en not_active Expired - Fee Related
-
2011
- 2011-03-11 US US13/045,810 patent/US8399337B2/en not_active Expired - Fee Related
-
2013
- 2013-09-11 JP JP2013188367A patent/JP5732119B2/ja not_active Expired - Fee Related
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