JP2008182219A5 - - Google Patents

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JP2008182219A5
JP2008182219A5 JP2007333533A JP2007333533A JP2008182219A5 JP 2008182219 A5 JP2008182219 A5 JP 2008182219A5 JP 2007333533 A JP2007333533 A JP 2007333533A JP 2007333533 A JP2007333533 A JP 2007333533A JP 2008182219 A5 JP2008182219 A5 JP 2008182219A5
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voltage
circuit
output
light
detection circuit
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JP2008182219A (ja
JP5159294B2 (ja
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JP2007333533A 2006-12-28 2007-12-26 半導体装置 Expired - Fee Related JP5159294B2 (ja)

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JP2007333533A JP5159294B2 (ja) 2006-12-28 2007-12-26 半導体装置

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JP2006354387 2006-12-28
JP2006354387 2006-12-28
JP2007333533A JP5159294B2 (ja) 2006-12-28 2007-12-26 半導体装置

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JP2008182219A JP2008182219A (ja) 2008-08-07
JP2008182219A5 true JP2008182219A5 (enExample) 2011-02-10
JP5159294B2 JP5159294B2 (ja) 2013-03-06

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US (1) US8514165B2 (enExample)
JP (1) JP5159294B2 (enExample)
KR (1) KR101472762B1 (enExample)
CN (1) CN101212854B (enExample)

Families Citing this family (95)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5834327A (en) * 1995-03-18 1998-11-10 Semiconductor Energy Laboratory Co., Ltd. Method for producing display device
KR100996536B1 (ko) * 2006-06-23 2010-11-24 엘지디스플레이 주식회사 액정표시장치의 광센서 회로 및 이를 이용한 백라이트제어장치
WO2008123119A1 (en) * 2007-03-26 2008-10-16 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device and electronic device provided with the photoelectric conversion device
KR101401528B1 (ko) * 2007-06-29 2014-06-03 가부시키가이샤 한도오따이 에네루기 켄큐쇼 광전변환장치 및 그 광전변환장치를 구비하는 전자기기
WO2009014155A1 (en) * 2007-07-25 2009-01-29 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device and electronic device having the same
TWI353063B (en) 2007-07-27 2011-11-21 Au Optronics Corp Photo detector and method for fabricating the same
KR100884458B1 (ko) * 2007-09-14 2009-02-20 삼성모바일디스플레이주식회사 유기전계발광장치 및 그의 제조 방법
JP2009238819A (ja) * 2008-03-26 2009-10-15 Sony Corp リソグラフィー用マスクの作成方法、リソグラフィー用マスクデータの作成方法、裏面入射型固体撮像装置の製造方法、裏面入射型固体撮像装置および電子機器
WO2010016449A1 (en) * 2008-08-08 2010-02-11 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device and electronic device having the same
JP5275739B2 (ja) * 2008-10-03 2013-08-28 株式会社ジャパンディスプレイウェスト センサ素子およびその駆動方法
KR101803720B1 (ko) 2008-10-03 2017-12-01 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
JP5157825B2 (ja) 2008-10-29 2013-03-06 ソニー株式会社 有機elディスプレイの製造方法
US8967848B2 (en) * 2008-11-27 2015-03-03 Konica Minolta Holdings, Inc. Lighting device
US8704216B2 (en) * 2009-02-27 2014-04-22 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
US8008613B2 (en) 2009-05-05 2011-08-30 Apple Inc. Light sensing device having a color sensor and a clear sensor for infrared rejection
JP5728171B2 (ja) * 2009-06-29 2015-06-03 株式会社半導体エネルギー研究所 半導体装置
WO2011004623A1 (ja) * 2009-07-09 2011-01-13 シャープ株式会社 照明装置、表示装置、及びテレビジョン受像器
KR101022118B1 (ko) * 2009-09-02 2011-03-17 삼성모바일디스플레이주식회사 광 감지회로 및 그 구동방법과 이를 구비한 터치 스크린 패널
KR101801956B1 (ko) 2009-09-16 2017-11-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 발광 장치 및 이의 제조 방법
CN102034451A (zh) * 2009-09-30 2011-04-27 乐金显示有限公司 液晶显示装置
KR101759504B1 (ko) 2009-10-09 2017-07-19 가부시키가이샤 한도오따이 에네루기 켄큐쇼 발광 표시 장치 및 이를 포함한 전자 기기
KR20220038542A (ko) 2009-10-21 2022-03-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 아날로그 회로 및 반도체 장치
KR101761957B1 (ko) * 2009-12-18 2017-07-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 액정 표시 장치를 구동하는 방법
KR102020739B1 (ko) * 2009-12-18 2019-09-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 광 센서를 포함하는 표시 장치 및 그 구동 방법
CN102725961B (zh) * 2010-01-15 2017-10-13 株式会社半导体能源研究所 半导体器件和电子设备
KR102031848B1 (ko) 2010-01-20 2019-10-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 전자 기기 및 전자 시스템
TW201732525A (zh) * 2010-03-08 2017-09-16 半導體能源研究所股份有限公司 電子裝置及電子系統
US8830278B2 (en) * 2010-04-09 2014-09-09 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device and method for driving the same
CN102834861B (zh) * 2010-04-09 2016-02-10 株式会社半导体能源研究所 液晶显示设备和驱动该液晶显示设备的方法
US8907881B2 (en) * 2010-04-09 2014-12-09 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device and method for driving the same
JP5940252B2 (ja) 2010-04-16 2016-06-29 株式会社半導体エネルギー研究所 表示装置
US9697788B2 (en) 2010-04-28 2017-07-04 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device
KR20180082636A (ko) 2010-04-28 2018-07-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
KR101672344B1 (ko) * 2010-05-20 2016-11-04 삼성전자주식회사 광센싱 회로, 상기 광센싱 회로의 구동 방법, 및 상기 광센싱 회로를 채용한 광센싱 장치
US8637802B2 (en) * 2010-06-18 2014-01-28 Semiconductor Energy Laboratory Co., Ltd. Photosensor, semiconductor device including photosensor, and light measurement method using photosensor
US8487306B2 (en) * 2010-06-18 2013-07-16 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion element, display device, electronic device, and method for manufacturing photoelectric conversion element
US9117958B2 (en) * 2010-06-25 2015-08-25 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device comprising photoelectric conversion element
US8605059B2 (en) 2010-07-02 2013-12-10 Semiconductor Energy Laboratory Co., Ltd. Input/output device and driving method thereof
TWI562109B (en) 2010-08-05 2016-12-11 Semiconductor Energy Lab Co Ltd Driving method of liquid crystal display device
US8946877B2 (en) * 2010-09-29 2015-02-03 Avago Technologies General Ip (Singapore) Pte. Ltd. Semiconductor package including cap
US9209209B2 (en) 2010-10-29 2015-12-08 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device and method for operating the same
US8854865B2 (en) * 2010-11-24 2014-10-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor memory device
TW201235758A (en) * 2011-02-24 2012-09-01 Ind Tech Res Inst Pixel structure, driving method and driving system of hybrid display device
JP5790040B2 (ja) * 2011-03-11 2015-10-07 ソニー株式会社 照明装置および表示装置
KR101963457B1 (ko) * 2011-04-29 2019-03-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 기억 장치 및 그 구동 방법
GB2494168B (en) * 2011-09-01 2014-04-09 Memsstar Ltd Improved deposition technique for micro electro-mechanical structures (MEMS)
JP5857187B2 (ja) * 2011-11-21 2016-02-10 パナソニックIpマネジメント株式会社 便座装置
US9236408B2 (en) 2012-04-25 2016-01-12 Semiconductor Energy Laboratory Co., Ltd. Oxide semiconductor device including photodiode
KR102201963B1 (ko) 2012-09-24 2021-01-11 가부시키가이샤 한도오따이 에네루기 켄큐쇼 정보 처리 장치의 구동 방법 및 프로그램
KR101983230B1 (ko) * 2012-10-19 2019-05-29 삼성디스플레이 주식회사 유기 발광 표시 장치 및 그 제조방법
CN103856200A (zh) * 2012-12-04 2014-06-11 上海华虹宏力半导体制造有限公司 电平转换器
JP6088306B2 (ja) * 2013-03-18 2017-03-01 エスアイアイ・セミコンダクタ株式会社 受光回路
KR102079251B1 (ko) * 2013-05-21 2020-04-08 삼성디스플레이 주식회사 유기 발광 표시 장치 및 그 제조 방법
US9766754B2 (en) * 2013-08-27 2017-09-19 Samsung Display Co., Ltd. Optical sensing array embedded in a display and method for operating the array
TWI523217B (zh) * 2013-09-12 2016-02-21 友達光電股份有限公司 畫素結構
CN103747556B (zh) * 2013-10-12 2016-01-20 林应存 一种实现精确照度控制的方法及装置
JP2015169822A (ja) * 2014-03-07 2015-09-28 船井電機株式会社 プロジェクタ
US9705004B2 (en) 2014-08-01 2017-07-11 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP6164183B2 (ja) * 2014-09-16 2017-07-19 トヨタ自動車株式会社 電流制御回路
US9704893B2 (en) 2015-08-07 2017-07-11 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device
FR3041462B1 (fr) * 2015-09-22 2017-11-03 Valeo Comfort & Driving Assistance Dispositif electronique de detection d'un signal emis par un capteur de verrouillage et/ou de deverouillage d'un ouvrant de vehicule automobile
KR101771316B1 (ko) * 2015-09-30 2017-08-25 엘지디스플레이 주식회사 광학 필름 일체형 액정 표시장치
GB201519171D0 (en) * 2015-10-30 2015-12-16 Woodenshark Llc Lightpack (UK)
CN105307337B (zh) * 2015-11-02 2019-02-12 固安翌光科技有限公司 一种自动调节亮度的oled发光器件及其制备方法
CN105392260B (zh) * 2015-12-11 2017-12-05 北京城建智控科技有限公司 信号灯控制装置
KR102439245B1 (ko) * 2016-01-29 2022-09-01 삼성전자주식회사 전자 장치 및 그 제어 방법
JP6906978B2 (ja) 2016-02-25 2021-07-21 株式会社半導体エネルギー研究所 半導体装置、半導体ウェハ、および電子機器
US10409053B1 (en) * 2016-06-21 2019-09-10 Amazon Technologies, Inc. Apparatus and method for reducing power consumption during display driving
KR102484070B1 (ko) * 2016-07-15 2023-01-03 엘지디스플레이 주식회사 유기발광표시장치
KR102495573B1 (ko) * 2017-07-21 2023-02-03 삼성전자주식회사 이미지 센서
EP3460520B1 (en) 2017-09-25 2023-07-19 Hexagon Technology Center GmbH Multi-beam laser scanner
WO2019177755A1 (en) 2018-03-13 2019-09-19 Apple Inc. Displays with direct-lit backlight units
CN115798365A (zh) * 2018-04-08 2023-03-14 北京小米移动软件有限公司 显示面板、光电检测方法、装置及计算机可读存储介质
FI127965B (en) 2018-05-07 2019-06-14 Oura Health Oy Arrangement for a photodetector circuit for low power applications, and a corresponding method and a computer program product
KR102868385B1 (ko) * 2018-08-09 2025-10-13 가부시키가이샤 한도오따이 에네루기 켄큐쇼 입출력 장치, 정보 처리 장치
KR102554431B1 (ko) * 2018-09-05 2023-07-13 삼성전자주식회사 반도체 장치 및 반도체 장치 제조 방법
KR102114103B1 (ko) * 2018-11-05 2020-05-22 주식회사 아바코 산화물 반도체 박막 검사장치 및 산화물 반도체 박막 검사방법
KR102736610B1 (ko) * 2019-07-23 2024-12-03 삼성디스플레이 주식회사 표시 장치의 오버드라이빙 데이터 획득 방법, 표시 장치의 구동 방법, 및 표시 장치
CN111103056B (zh) * 2019-11-28 2022-05-27 北京大学深圳研究生院 一种薄膜晶体管集成的光传感器
US11188112B2 (en) * 2020-03-27 2021-11-30 Analog Devices, Inc. Current mirror arrangements with adjustable offset buffers
KR102271828B1 (ko) * 2020-06-22 2021-07-01 주식회사 글로벌테크놀로지 디스플레이를 위한 백라이트 장치
KR102312357B1 (ko) * 2020-06-22 2021-10-13 주식회사 글로벌테크놀로지 디스플레이를 위한 백라이트 장치 및 그의 전류 제어 집적 회로
CN111912460A (zh) * 2020-07-23 2020-11-10 重庆大学 电树枝在线监测的声光组合装置
CN111912459A (zh) * 2020-07-23 2020-11-10 重庆大学 电树枝的声光组合在线测量方法
KR102507770B1 (ko) * 2020-08-26 2023-03-07 국민대학교산학협력단 시냅스 및 시냅스 어레이와, 이를 이용한 컴퓨팅 시스템 및 그 구동 방법
JP7773234B2 (ja) * 2020-08-28 2025-11-19 テヒニシュ ウニヴァズィテート ウィーン 光学画像認識および分類装置
WO2022054282A1 (ja) * 2020-09-14 2022-03-17 日本電信電話株式会社 光受電装置、通信装置及び光受電方法
CN112291882A (zh) * 2020-10-23 2021-01-29 四川西南联盛通讯技术有限公司 超薄手机led背光驱动控制系统
TWI807254B (zh) * 2021-02-02 2023-07-01 袁知賢 光放大模組及其製作方法
CN113252734B (zh) * 2021-06-22 2021-09-24 电子科技大学 一种电阻型气体传感器柔性电路及气体浓度计算方法
CN113629156B (zh) * 2021-08-11 2023-10-27 无锡中微晶园电子有限公司 适用于光电探测器的颜色均一性调节方法
US12464917B2 (en) * 2022-03-16 2025-11-04 Hefei Xinsheng Optoelectronics Technology Co., Ltd. Display substrate, manufacturing method thereof, and display device
CN115265774B (zh) * 2022-07-29 2025-04-01 上海中航光电子有限公司 一种光强检测方法及光强检测电路
CN119923557A (zh) * 2023-07-31 2025-05-02 京东方科技集团股份有限公司 光检测结构、显示面板和显示装置
TWI892278B (zh) * 2023-10-27 2025-08-01 佳世達科技股份有限公司 畫素電路以及顯示裝置

Family Cites Families (58)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4065668A (en) * 1976-07-22 1977-12-27 National Semiconductor Corporation Photodiode operational amplifier
DE2705308C2 (de) * 1977-02-09 1979-04-19 Bodenseewerk Perkin-Elmer & Co Gmbh, 7770 Ueberlingen Vorrichtung zum Aufheizen eines Graphitrohres in einer Graphitrohrküvette eines Atomabsorptionsspektrometers
US4251742A (en) * 1979-04-09 1981-02-17 Rca Corporation Current source, as for switching PIN diodes
US4454416A (en) * 1982-01-13 1984-06-12 Sprague Electric Company Photo-electric circuit employing current mirrors
JPS6020655A (ja) 1983-07-15 1985-02-01 Iwatsu Electric Co Ltd 光検出回路
JPS61274379A (ja) * 1985-05-29 1986-12-04 Olympus Optical Co Ltd 半導体レ−ザ駆動装置
US5117118A (en) * 1988-10-19 1992-05-26 Astex Co., Ltd. Photoelectric switch using an integrated circuit with reduced interconnections
EP0445757A3 (en) 1990-03-07 1992-04-08 Tdk Corporation Electric discharge lamp unit
JPH03257794A (ja) 1990-03-07 1991-11-18 Tdk Corp 放電灯点灯装置
US5298455A (en) * 1991-01-30 1994-03-29 Tdk Corporation Method for producing a non-single crystal semiconductor device
US5576222A (en) * 1992-01-27 1996-11-19 Tdk Corp. Method of making a semiconductor image sensor device
DE9213278U1 (de) 1992-10-02 1992-12-03 Endress + Hauser Conducta Gesellschaft für Meß- und Regeltechnik mbH & Co., 7016 Gerlingen Vorrichtung zur Trübungsmessung bei wässrigen Medien
DE69416363T2 (de) * 1993-03-23 1999-09-23 Semiconductor Energy Laboratory Co., Ltd. Abbildendes festkörperbauteil und herstellungsverfahren dafür
JPH0767152B2 (ja) * 1993-03-25 1995-07-19 日本電気株式会社 イメージセンサとその駆動方法
US5343033A (en) * 1993-06-22 1994-08-30 Apache Technology Inc. Method and apparatus for detecting laser light having a plurality of pulse integrator and automatic gain control circuits
US5760760A (en) * 1995-07-17 1998-06-02 Dell Usa, L.P. Intelligent LCD brightness control system
JP3444093B2 (ja) 1996-06-10 2003-09-08 株式会社デンソー 光センサ回路
US5786801A (en) * 1996-09-06 1998-07-28 Sony Corporation Back light control apparatus and method for a flat display system
US6188380B1 (en) * 1997-02-03 2001-02-13 Nanao Corporation Photodetector of liquid crystal display and luminance control device using the same
JPH10256841A (ja) * 1997-03-14 1998-09-25 Sony Corp フォトダイオード増幅回路
JP3667058B2 (ja) * 1997-11-19 2005-07-06 キヤノン株式会社 光電変換装置
US6287888B1 (en) * 1997-12-26 2001-09-11 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device and process for producing photoelectric conversion device
EP0928971A1 (en) * 1997-12-29 1999-07-14 Deutsche Thomson Brandt Automatically adapting forward or reversed biased photodiode detection circuit
US6757018B1 (en) * 1998-12-18 2004-06-29 Agilent Technologies, Inc. CMOS image sensor with pixel level gain control
US6057738A (en) * 1999-02-08 2000-05-02 Industrial Technology Research Insititute High dynamic range optical receiver preamplifier
EP1032052B1 (en) * 1999-02-26 2010-07-21 Kaneka Corporation Method of manufacturing silicon based thin film photoelectric conversion device
JP2001175799A (ja) 1999-10-07 2001-06-29 Fuji Photo Film Co Ltd 光検出装置、明暗情報コード読取装置及びその調整方法
JP2001244555A (ja) * 2000-03-01 2001-09-07 Pioneer Electronic Corp 自動電力制御回路
KR100676354B1 (ko) * 2000-03-02 2007-01-31 산요덴키가부시키가이샤 가변 저항 회로, 연산 증폭 회로, 반도체 집적 회로,시상수 전환 회로 및 파형 성형 회로
JP2001274645A (ja) 2000-03-24 2001-10-05 Sanyo Electric Co Ltd 演算増幅回路および集積回路
JP2001266391A (ja) 2000-03-23 2001-09-28 Matsushita Electric Ind Co Ltd 光情報処理装置
JP2002026369A (ja) 2000-07-04 2002-01-25 Ricoh Co Ltd フォトセンサ回路
US7030551B2 (en) 2000-08-10 2006-04-18 Semiconductor Energy Laboratory Co., Ltd. Area sensor and display apparatus provided with an area sensor
JP4127480B2 (ja) 2002-04-23 2008-07-30 オリンパス株式会社 測光回路
EP1372261A1 (en) * 2002-06-12 2003-12-17 Agilent Technologies, Inc. - a Delaware corporation - Control loop apparatus, current measuring circuit apparatus and methods therefor
JP2004022051A (ja) * 2002-06-14 2004-01-22 Sharp Corp 受光アンプ素子
US7091462B2 (en) * 2002-08-26 2006-08-15 Jds Uniphase Corporation Transmitter with laser monitoring and wavelength stabilization circuit
JP2004085306A (ja) * 2002-08-26 2004-03-18 Kyushu Ando Denki Kk 光検出器
JP4373063B2 (ja) * 2002-09-02 2009-11-25 株式会社半導体エネルギー研究所 電子回路装置
JP4147094B2 (ja) * 2002-11-22 2008-09-10 キヤノン株式会社 放射線撮像装置及び放射線撮像システム
JP4107067B2 (ja) 2002-11-27 2008-06-25 日立電線株式会社 光受信器
AU2003289448A1 (en) * 2003-01-08 2004-08-23 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and its fabricating method
US6897429B1 (en) * 2003-02-10 2005-05-24 Foveon, Inc. Managing power consumption by sampling circuit current sources
US6914230B2 (en) * 2003-02-26 2005-07-05 Agilent Technologies, Inc. System and method for reducing trapped charge effects in a CMOS photodetector
US7253391B2 (en) * 2003-09-19 2007-08-07 Semiconductor Energy Laboratory Co., Ltd. Optical sensor device and electronic apparatus
CN100477240C (zh) * 2003-10-06 2009-04-08 株式会社半导体能源研究所 半导体器件以及制造该器件的方法
EP1523043B1 (en) * 2003-10-06 2011-12-28 Semiconductor Energy Laboratory Co., Ltd. Optical sensor and method for manufacturing the same
JP4481135B2 (ja) 2003-10-06 2010-06-16 株式会社半導体エネルギー研究所 半導体装置及びその作製方法
JP4295075B2 (ja) 2003-12-05 2009-07-15 日本電信電話株式会社 光・電気変換回路および電界検出光学装置
WO2005114749A1 (en) 2004-05-21 2005-12-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
JP4387905B2 (ja) 2004-09-17 2009-12-24 株式会社東芝 半導体光センサ装置及びこれを組込んだ情報機器
US7214922B2 (en) * 2004-09-17 2007-05-08 Kabushiki Kaisha Toshiba Semiconductor photosensor device and information apparatus with sensitivity region for wide dynamic range
JP2006261524A (ja) 2005-03-18 2006-09-28 Denso Corp 受光回路
JP4619318B2 (ja) 2005-05-23 2011-01-26 株式会社半導体エネルギー研究所 光電変換装置
EP1727120B1 (en) * 2005-05-23 2008-07-09 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device and manufacturing method thereof
JP2007059889A (ja) 2005-07-27 2007-03-08 Semiconductor Energy Lab Co Ltd 半導体装置
CN101233394B (zh) 2005-07-27 2014-02-26 株式会社半导体能源研究所 半导体装置
WO2007125977A1 (en) 2006-04-27 2007-11-08 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic appliance using the same

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