JP2008028247A - 基板処理方法および基板処理装置 - Google Patents
基板処理方法および基板処理装置 Download PDFInfo
- Publication number
- JP2008028247A JP2008028247A JP2006201040A JP2006201040A JP2008028247A JP 2008028247 A JP2008028247 A JP 2008028247A JP 2006201040 A JP2006201040 A JP 2006201040A JP 2006201040 A JP2006201040 A JP 2006201040A JP 2008028247 A JP2008028247 A JP 2008028247A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- posture
- processing
- cleaning
- chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0451—Apparatus for manufacturing or treating in a plurality of work-stations
- H10P72/0464—Apparatus for manufacturing or treating in a plurality of work-stations characterised by the construction of the transfer chamber
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/32—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations
- H10P72/3202—Mechanical details, e.g. rollers or belts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/32—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations
- H10P72/3211—Changing orientation of the substrate, e.g. from a horizontal position to a vertical position
Landscapes
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Weting (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006201040A JP2008028247A (ja) | 2006-07-24 | 2006-07-24 | 基板処理方法および基板処理装置 |
| TW096123286A TW200818380A (en) | 2006-07-24 | 2007-06-27 | Substrate processing method and substrate processing apparatus |
| CN2007101373080A CN101114578B (zh) | 2006-07-24 | 2007-07-20 | 基板处理方法及基板处理装置 |
| KR1020070073891A KR100866001B1 (ko) | 2006-07-24 | 2007-07-24 | 기판 처리 방법 및 기판 처리 장치 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006201040A JP2008028247A (ja) | 2006-07-24 | 2006-07-24 | 基板処理方法および基板処理装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP2008028247A true JP2008028247A (ja) | 2008-02-07 |
Family
ID=39022826
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006201040A Abandoned JP2008028247A (ja) | 2006-07-24 | 2006-07-24 | 基板処理方法および基板処理装置 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP2008028247A (https=) |
| KR (1) | KR100866001B1 (https=) |
| CN (1) | CN101114578B (https=) |
| TW (1) | TW200818380A (https=) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150234326A1 (en) * | 2013-06-25 | 2015-08-20 | Boe Technology Group Co., Ltd. | Developing device and developing method |
| WO2018207536A1 (ja) * | 2017-05-09 | 2018-11-15 | 日本電気硝子株式会社 | ガラス板の搬送装置及びガラス板の製造方法 |
| JP7642005B2 (ja) | 2023-03-10 | 2025-03-07 | 株式会社Screenホールディングス | 基板姿勢変更装置および基板処理装置 |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100978852B1 (ko) * | 2008-06-12 | 2010-08-31 | 세메스 주식회사 | 기판 반송 장치 및 그 방법 그리고 그 장치를 갖는 기판제조 설비 |
| TWI407270B (zh) * | 2009-12-30 | 2013-09-01 | Au Optronics Corp | 顯影設備 |
| CN104347352B (zh) * | 2013-07-31 | 2018-05-29 | 细美事有限公司 | 一种基板处理装置及基板处理方法 |
| CN108325900B (zh) * | 2017-09-19 | 2021-02-02 | 福建晟哲自动化科技有限公司 | 一种液晶面板清洗设备 |
| CN107962501B (zh) * | 2017-12-01 | 2019-09-20 | 福建和达玻璃技术有限公司 | 带倾角的异形玻璃盖板防眩表面处理设备 |
| CN108000368B (zh) * | 2017-12-01 | 2020-03-31 | 福建和达玻璃技术有限公司 | 曲边玻璃盖板防眩表面处理设备与处理方法 |
| CN108380564A (zh) * | 2018-02-05 | 2018-08-10 | 武汉华星光电技术有限公司 | 具有自动清洗功能的显影腔室及其清洗组件、清洗方法 |
| WO2021205898A1 (ja) * | 2020-04-06 | 2021-10-14 | 日本電気硝子株式会社 | ガラス板の製造方法及び製造装置 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3704064B2 (ja) | 2001-07-05 | 2005-10-05 | 東京エレクトロン株式会社 | 液処理装置および液処理方法 |
| JP4076755B2 (ja) | 2001-11-02 | 2008-04-16 | アルプス電気株式会社 | ウエット処理装置およびウエット処理方法 |
| JP4309782B2 (ja) | 2004-02-27 | 2009-08-05 | シャープ株式会社 | 液処理装置および液処理方法 |
| KR100602410B1 (ko) * | 2006-01-27 | 2006-07-20 | 주식회사 디엠에스 | 평판 처리 장치 |
-
2006
- 2006-07-24 JP JP2006201040A patent/JP2008028247A/ja not_active Abandoned
-
2007
- 2007-06-27 TW TW096123286A patent/TW200818380A/zh not_active IP Right Cessation
- 2007-07-20 CN CN2007101373080A patent/CN101114578B/zh not_active Expired - Fee Related
- 2007-07-24 KR KR1020070073891A patent/KR100866001B1/ko not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150234326A1 (en) * | 2013-06-25 | 2015-08-20 | Boe Technology Group Co., Ltd. | Developing device and developing method |
| US9581939B2 (en) * | 2013-06-25 | 2017-02-28 | Boe Technology Group Co., Ltd. | Developing device and developing method |
| WO2018207536A1 (ja) * | 2017-05-09 | 2018-11-15 | 日本電気硝子株式会社 | ガラス板の搬送装置及びガラス板の製造方法 |
| JP2018188276A (ja) * | 2017-05-09 | 2018-11-29 | 日本電気硝子株式会社 | ガラス板の搬送装置及びガラス板の製造方法 |
| JP7642005B2 (ja) | 2023-03-10 | 2025-03-07 | 株式会社Screenホールディングス | 基板姿勢変更装置および基板処理装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR100866001B1 (ko) | 2008-10-29 |
| CN101114578A (zh) | 2008-01-30 |
| CN101114578B (zh) | 2011-08-10 |
| KR20080009661A (ko) | 2008-01-29 |
| TWI343088B (https=) | 2011-06-01 |
| TW200818380A (en) | 2008-04-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20090205 |
|
| A762 | Written abandonment of application |
Free format text: JAPANESE INTERMEDIATE CODE: A762 Effective date: 20100604 |