JP2005274156A - 欠陥検査装置 - Google Patents
欠陥検査装置 Download PDFInfo
- Publication number
- JP2005274156A JP2005274156A JP2004083569A JP2004083569A JP2005274156A JP 2005274156 A JP2005274156 A JP 2005274156A JP 2004083569 A JP2004083569 A JP 2004083569A JP 2004083569 A JP2004083569 A JP 2004083569A JP 2005274156 A JP2005274156 A JP 2005274156A
- Authority
- JP
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- Prior art keywords
- subject
- image
- imaging
- wavelength
- defect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 123
- 238000003384 imaging method Methods 0.000 claims abstract description 152
- 238000005286 illumination Methods 0.000 claims abstract description 41
- 238000001514 detection method Methods 0.000 claims abstract description 13
- 230000004907 flux Effects 0.000 claims abstract description 7
- 230000007547 defect Effects 0.000 claims description 124
- 230000003287 optical effect Effects 0.000 claims description 22
- 238000002310 reflectometry Methods 0.000 abstract 2
- 238000005259 measurement Methods 0.000 description 28
- 238000012545 processing Methods 0.000 description 28
- 238000000034 method Methods 0.000 description 19
- 230000003595 spectral effect Effects 0.000 description 15
- 230000008569 process Effects 0.000 description 14
- 230000032258 transport Effects 0.000 description 13
- 238000012937 correction Methods 0.000 description 11
- 239000000758 substrate Substances 0.000 description 11
- 239000013307 optical fiber Substances 0.000 description 10
- 239000010408 film Substances 0.000 description 6
- 230000008859 change Effects 0.000 description 5
- 230000002950 deficient Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 230000000737 periodic effect Effects 0.000 description 5
- 238000010521 absorption reaction Methods 0.000 description 3
- 229910052736 halogen Inorganic materials 0.000 description 3
- 150000002367 halogens Chemical class 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 239000000284 extract Substances 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 210000001747 pupil Anatomy 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Images
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004083569A JP2005274156A (ja) | 2004-03-22 | 2004-03-22 | 欠陥検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004083569A JP2005274156A (ja) | 2004-03-22 | 2004-03-22 | 欠陥検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005274156A true JP2005274156A (ja) | 2005-10-06 |
| JP2005274156A5 JP2005274156A5 (enExample) | 2007-04-26 |
Family
ID=35174008
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004083569A Pending JP2005274156A (ja) | 2004-03-22 | 2004-03-22 | 欠陥検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2005274156A (enExample) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008076827A (ja) * | 2006-09-22 | 2008-04-03 | Toppan Printing Co Ltd | 欠陥検査装置における照明角度設定方法 |
| JP2008175565A (ja) * | 2007-01-16 | 2008-07-31 | Fujifilm Corp | 光透過性部材の欠陥検出装置及び方法 |
| JP2009150832A (ja) * | 2007-12-21 | 2009-07-09 | Hitachi Ltd | ハードディスクメディア上のパターンの検査方法及び検査装置 |
| JP2010527008A (ja) * | 2007-05-07 | 2010-08-05 | ケーエルエー−テンカー・コーポレーション | ウエハーの層の検査に用いる候補として検査装置の一つ以上の光学モードを同定するためにコンピューターにより実施する方法、コンピューター可読の媒体、および装置 |
| JP2011096305A (ja) * | 2009-10-28 | 2011-05-12 | Hitachi High-Technologies Corp | 光学式磁気ディスク両面欠陥検査装置及びその方法 |
| JP2011129208A (ja) * | 2009-12-18 | 2011-06-30 | Hitachi High-Technologies Corp | パターンドメディア用ハードディスク表面検査装置及び表面検査方法 |
| JP2014027319A (ja) * | 2013-11-06 | 2014-02-06 | Sokudo Co Ltd | 基板処理装置および検査周辺露光システム |
| KR20210143118A (ko) * | 2020-05-19 | 2021-11-26 | 어플라이드 머티어리얼스, 인코포레이티드 | 표면 변형들의 이미지 기반 계측 |
| CN119198782A (zh) * | 2024-12-02 | 2024-12-27 | 江苏南晶红外光学仪器有限公司 | 一种光学玻璃用表面划痕用检测设备及检测方法 |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61138102A (ja) * | 1984-12-11 | 1986-06-25 | Kawasaki Steel Corp | 鋼板表面の塗油量測定方法及び装置 |
| JPH01250708A (ja) * | 1988-03-30 | 1989-10-05 | Dainippon Screen Mfg Co Ltd | 薄膜パターンの検出装置 |
| JPH06118009A (ja) * | 1992-10-05 | 1994-04-28 | Matsushita Electric Ind Co Ltd | 異物検査装置および異物検査方法 |
| JPH1038772A (ja) * | 1996-07-19 | 1998-02-13 | Murata Mfg Co Ltd | 液状試料の測定方法とそれに用いる試料ホルダおよびx線回折装置 |
| JPH10253546A (ja) * | 1997-03-12 | 1998-09-25 | Toshiba Corp | 半導体基板の評価方法および評価装置 |
| JPH11264800A (ja) * | 1998-03-18 | 1999-09-28 | Nikon Corp | 検査装置 |
| JP2000077494A (ja) * | 1998-08-27 | 2000-03-14 | Hitachi Ltd | 半導体集積回路装置の製造方法 |
| WO2001071323A1 (fr) * | 2000-03-24 | 2001-09-27 | Olympus Optical Co., Ltd. | Appareil de detection de defauts |
-
2004
- 2004-03-22 JP JP2004083569A patent/JP2005274156A/ja active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61138102A (ja) * | 1984-12-11 | 1986-06-25 | Kawasaki Steel Corp | 鋼板表面の塗油量測定方法及び装置 |
| JPH01250708A (ja) * | 1988-03-30 | 1989-10-05 | Dainippon Screen Mfg Co Ltd | 薄膜パターンの検出装置 |
| JPH06118009A (ja) * | 1992-10-05 | 1994-04-28 | Matsushita Electric Ind Co Ltd | 異物検査装置および異物検査方法 |
| JPH1038772A (ja) * | 1996-07-19 | 1998-02-13 | Murata Mfg Co Ltd | 液状試料の測定方法とそれに用いる試料ホルダおよびx線回折装置 |
| JPH10253546A (ja) * | 1997-03-12 | 1998-09-25 | Toshiba Corp | 半導体基板の評価方法および評価装置 |
| JPH11264800A (ja) * | 1998-03-18 | 1999-09-28 | Nikon Corp | 検査装置 |
| JP2000077494A (ja) * | 1998-08-27 | 2000-03-14 | Hitachi Ltd | 半導体集積回路装置の製造方法 |
| WO2001071323A1 (fr) * | 2000-03-24 | 2001-09-27 | Olympus Optical Co., Ltd. | Appareil de detection de defauts |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008076827A (ja) * | 2006-09-22 | 2008-04-03 | Toppan Printing Co Ltd | 欠陥検査装置における照明角度設定方法 |
| JP2008175565A (ja) * | 2007-01-16 | 2008-07-31 | Fujifilm Corp | 光透過性部材の欠陥検出装置及び方法 |
| JP2010527008A (ja) * | 2007-05-07 | 2010-08-05 | ケーエルエー−テンカー・コーポレーション | ウエハーの層の検査に用いる候補として検査装置の一つ以上の光学モードを同定するためにコンピューターにより実施する方法、コンピューター可読の媒体、および装置 |
| JP2009150832A (ja) * | 2007-12-21 | 2009-07-09 | Hitachi Ltd | ハードディスクメディア上のパターンの検査方法及び検査装置 |
| JP2011096305A (ja) * | 2009-10-28 | 2011-05-12 | Hitachi High-Technologies Corp | 光学式磁気ディスク両面欠陥検査装置及びその方法 |
| JP2011129208A (ja) * | 2009-12-18 | 2011-06-30 | Hitachi High-Technologies Corp | パターンドメディア用ハードディスク表面検査装置及び表面検査方法 |
| JP2014027319A (ja) * | 2013-11-06 | 2014-02-06 | Sokudo Co Ltd | 基板処理装置および検査周辺露光システム |
| KR20210143118A (ko) * | 2020-05-19 | 2021-11-26 | 어플라이드 머티어리얼스, 인코포레이티드 | 표면 변형들의 이미지 기반 계측 |
| KR102687194B1 (ko) | 2020-05-19 | 2024-07-19 | 어플라이드 머티어리얼스, 인코포레이티드 | 표면 변형들의 이미지 기반 계측 |
| US12288350B2 (en) | 2020-05-19 | 2025-04-29 | Applied Materials, Inc. | Image based metrology of surface deformations |
| CN119198782A (zh) * | 2024-12-02 | 2024-12-27 | 江苏南晶红外光学仪器有限公司 | 一种光学玻璃用表面划痕用检测设备及检测方法 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070313 |
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| A621 | Written request for application examination |
Effective date: 20070313 Free format text: JAPANESE INTERMEDIATE CODE: A621 |
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| A977 | Report on retrieval |
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| A02 | Decision of refusal |
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