JP2004531065A5 - - Google Patents

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JP2004531065A5
JP2004531065A5 JP2002592200A JP2002592200A JP2004531065A5 JP 2004531065 A5 JP2004531065 A5 JP 2004531065A5 JP 2002592200 A JP2002592200 A JP 2002592200A JP 2002592200 A JP2002592200 A JP 2002592200A JP 2004531065 A5 JP2004531065 A5 JP 2004531065A5
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semiconductor body
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JP4511118B2 (ja
JP2004531065A (ja
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Priority claimed from US09/864,436 external-priority patent/US6537921B2/en
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Claims (4)

  1. a)第1導電型の半導体ボディを準備する工程であって、前記半導体ボディが第1表面上に第2導電型の層を有する工程と、
    b)前記第2導電型層上に複数のシリンドリカル酸化物台を形成する工程と、
    c)方向性エッチングを行って、各台間の前記第2導電型層中にトレンチを形成する工程と、
    d)各台間の前記第2導電型層中に第1導電型の領域を形成する工程であって、前記領域が前記台の下方にいくらか延びている、工程と、
    e)方向性エッチングを行って、各台間の前記第2導電型層を通して延びるより深いトレンチを形成し、各台間の前記第2導電型層中の前記第1導電型領域を除去し、前記第2導電型層のうち前記台の下方にいくらか延びた部分は除去しない、工程と、
    f)ゲート酸化物を堆積する工程と、
    g)高ドープのポリ半導体層を堆積する工程と、
    h)前記ポリ半導体層に対して方向性エッチングを行って、各台間の前記ゲート酸化物から前記ポリ半導体層を除去する工程と、
    i)注入を行って、各台間の領域を第1導電型から第2導電型へ変換する工程と、
    j)方向性エッチングを行って、前記台の側壁上の前記酸化物上にあるポリ半導体層の高さをさらに減じて、前記d)の層の残留部の高さにする工程と、
    k)露出した前記ゲート酸化物を除去する工程と、
    l)ダイオードに対する第1電気コンタクトとして導電層を堆積する工程と、
    m)ダイオードに対する第2電気コンタクトとして、前記半導体ボディに対する電気的コンタクトを形成する工程と
    を含むダイオード形成方法。
  2. a)第1導電型の半導体ボディの第1表面上に複数のシリンドリカル半導体台を形成する工程であって、前記台は、前記半導体ボディから延びる第1導電型の下部領域と、第2導電型の上部領域とを有しており、前記台の前記上部領域と前記下部領域の間でpn接合が形成され、さらに、前記台は、前記pn接合に隣接する前記上部領域内にあり、その周辺に延びる第1導電型の領域を有する、工程と、
    b)前記下部領域から延び、かつ前記上部領域の周辺に延びるゲート酸化物および導電性ゲートを形成する工程と、
    c)前記導電性ゲートに接触する導電層を形成する工程と、
    d)前記半導体ボディに対して導電性コンタクトを形成する工程と
    を含むダイオード形成方法。
  3. 第1導電型の半導体ボディと、
    前記半導体ボディ上の第1表面上の複数のシリンドリカル台であって、各台は第1導電型の下部領域および第2導電型の上部領域を有し、前記下部領域と前記上部領域の間にpn接合が形成され、前記下部領域および前記上部領域は各台の側壁を決めているシリンドリカル台と、
    前記pn接合に隣接する各台の上部領域の周辺にある第1導電型の領域と、
    前記下部領域から各台の前記上部領域の周辺にある前記第1導電型領域に延びる、各台の前記側壁上のゲート酸化物であって、各台の前記上部領域の周辺にある前記第1導電型領域の部分が前記ゲート酸化物によって覆われてはいないゲート酸化物と、
    前記ゲート酸化物を覆う導電性ゲートと、
    各台間の第2導電型層と、
    前記複数のシリンドリカル台を覆い、各台の前記上部領域の周辺にある前記導電性ゲートおよび前記第1導電型領域に対して電気コンタクトをなす導電層と、
    前記半導体ボディに対して電気コンタクトをなす導電層と
    を備えたダイオード。
  4. 第1導電型の半導体ボディ上の第1表面上の複数のシリンドリカル半導体台であって、前記台は、前記半導体ボディから延びる第1導電型の下部領域、および第2導電型の上部領域を有し、前記下部領域と前記上部領域の間にpn接合が形成され、さらに前記台は、前記pn接合に隣接する前記上部領域内にあり、その周辺に延びる第1導電型の領域を有する、シリンドリカル半導体台と、
    前記下部領域から各台の前記上部領域内の前記第1導電型領域に延び、かつ各台の前記上部領域の周辺に延びる、ゲート酸化物および導電性ゲートと、
    前記導電性ゲート、および前記上部領域内にありその周辺に延びる前記第1導電型領域と接触する導電層と、
    前記半導体ボディに対する導電コンタクトと
    を備えたダイオード。
JP2002592200A 2001-05-23 2002-05-08 縦形の金属/酸化物/シリコン型電界効果ダイオード Expired - Fee Related JP4511118B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/864,436 US6537921B2 (en) 2001-05-23 2001-05-23 Vertical metal oxide silicon field effect semiconductor diodes
PCT/US2002/014848 WO2002095835A2 (en) 2001-05-23 2002-05-08 Vertical metal oxide semiconductor field-effect diodes

Publications (3)

Publication Number Publication Date
JP2004531065A JP2004531065A (ja) 2004-10-07
JP2004531065A5 true JP2004531065A5 (ja) 2005-12-22
JP4511118B2 JP4511118B2 (ja) 2010-07-28

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JP2002592200A Expired - Fee Related JP4511118B2 (ja) 2001-05-23 2002-05-08 縦形の金属/酸化物/シリコン型電界効果ダイオード

Country Status (12)

Country Link
US (1) US6537921B2 (ja)
EP (2) EP1393382B1 (ja)
JP (1) JP4511118B2 (ja)
KR (1) KR100883873B1 (ja)
CN (1) CN1309092C (ja)
AT (1) ATE516596T1 (ja)
AU (1) AU2002305526B8 (ja)
BR (1) BR0209916A (ja)
CA (1) CA2447722A1 (ja)
IL (2) IL158845A0 (ja)
TW (1) TW558839B (ja)
WO (1) WO2002095835A2 (ja)

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