JP2004117344A - ビットストリームの遷移を調節する方法 - Google Patents

ビットストリームの遷移を調節する方法 Download PDF

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Publication number
JP2004117344A
JP2004117344A JP2003311323A JP2003311323A JP2004117344A JP 2004117344 A JP2004117344 A JP 2004117344A JP 2003311323 A JP2003311323 A JP 2003311323A JP 2003311323 A JP2003311323 A JP 2003311323A JP 2004117344 A JP2004117344 A JP 2004117344A
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JP
Japan
Prior art keywords
signal
transition
bit stream
bitstream
expected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2003311323A
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English (en)
Japanese (ja)
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JP2004117344A5 (enExample
Inventor
Jochen Rivoir
ヨハン・リヴォワ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
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Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2004117344A publication Critical patent/JP2004117344A/ja
Publication of JP2004117344A5 publication Critical patent/JP2004117344A5/ja
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Data Exchanges In Wide-Area Networks (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)
JP2003311323A 2002-09-24 2003-09-03 ビットストリームの遷移を調節する方法 Ceased JP2004117344A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP02021145A EP1316808B1 (en) 2002-09-24 2002-09-24 Transition adjustment

Publications (2)

Publication Number Publication Date
JP2004117344A true JP2004117344A (ja) 2004-04-15
JP2004117344A5 JP2004117344A5 (enExample) 2007-02-22

Family

ID=8185482

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003311323A Ceased JP2004117344A (ja) 2002-09-24 2003-09-03 ビットストリームの遷移を調節する方法

Country Status (5)

Country Link
US (1) US9103887B2 (enExample)
EP (1) EP1316808B1 (enExample)
JP (1) JP2004117344A (enExample)
CN (1) CN1318853C (enExample)
DE (1) DE60200289T2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2007123055A1 (ja) * 2006-04-20 2009-09-03 株式会社アドバンテスト 試験装置、試験方法、ジッタフィルタ回路、及びジッタフィルタ方法

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7526054B2 (en) * 2005-03-04 2009-04-28 Analog Devices, Inc. Method, article, and apparatus for a dynamic phase delay compensator
US20090113245A1 (en) * 2007-10-30 2009-04-30 Teradyne, Inc. Protocol aware digital channel apparatus
KR102458563B1 (ko) * 2018-02-12 2022-10-28 한국전자통신연구원 백스캐터 통신을 사용한 통신 방법 및 통신 장치
CN112104339B (zh) * 2020-08-28 2021-06-01 电子科技大学 一种适用于含跳变边沿信号的平滑滤波方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0862304A (ja) * 1994-08-22 1996-03-08 Advantest Corp パターン発生器
JPH097392A (ja) * 1995-06-19 1997-01-10 Advantest Corp 半導体試験装置
JPH11190759A (ja) * 1998-10-09 1999-07-13 Advantest Corp 自動パターン同期回路及び同期方法
WO1999040450A1 (fr) * 1998-02-09 1999-08-12 Advantest Corporation Appareil pour l'essai de dispositif a semi-conducteur

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07123218B2 (ja) 1986-05-16 1995-12-25 株式会社トプコン 走査同期信号発生回路
JPS6331212A (ja) 1986-07-24 1988-02-09 Nec Corp 位相同期回路
US4814879A (en) 1987-08-07 1989-03-21 Rca Licensing Corporation Signal phase alignment circuitry
JP2527017B2 (ja) 1988-11-22 1996-08-21 ヤマハ株式会社 デジタルフィルタ
US5272729A (en) * 1991-09-20 1993-12-21 International Business Machines Corporation Clock signal latency elimination network
US5436937A (en) * 1993-02-01 1995-07-25 Motorola, Inc. Multi-mode digital phase lock loop
US6100733A (en) * 1998-06-09 2000-08-08 Siemens Aktiengesellschaft Clock latency compensation circuit for DDR timing
US6820234B2 (en) * 1998-06-29 2004-11-16 Acuid Limited Skew calibration means and a method of skew calibration
US6181616B1 (en) * 1998-09-03 2001-01-30 Micron Technology, Inc. Circuits and systems for realigning data output by semiconductor testers to packet-based devices under test
US6442223B1 (en) * 1999-04-26 2002-08-27 International Business Machines Corporation Method and system for data transfer
US6993695B2 (en) * 2001-06-06 2006-01-31 Agilent Technologies, Inc. Method and apparatus for testing digital devices using transition timestamps

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0862304A (ja) * 1994-08-22 1996-03-08 Advantest Corp パターン発生器
JPH097392A (ja) * 1995-06-19 1997-01-10 Advantest Corp 半導体試験装置
WO1999040450A1 (fr) * 1998-02-09 1999-08-12 Advantest Corporation Appareil pour l'essai de dispositif a semi-conducteur
JPH11190759A (ja) * 1998-10-09 1999-07-13 Advantest Corp 自動パターン同期回路及び同期方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2007123055A1 (ja) * 2006-04-20 2009-09-03 株式会社アドバンテスト 試験装置、試験方法、ジッタフィルタ回路、及びジッタフィルタ方法

Also Published As

Publication number Publication date
CN1318853C (zh) 2007-05-30
EP1316808B1 (en) 2004-03-24
US20040057541A1 (en) 2004-03-25
US9103887B2 (en) 2015-08-11
DE60200289D1 (de) 2004-04-29
DE60200289T2 (de) 2005-02-17
CN1485624A (zh) 2004-03-31
EP1316808A1 (en) 2003-06-04

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