JP2004117344A5 - - Google Patents
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- Publication number
- JP2004117344A5 JP2004117344A5 JP2003311323A JP2003311323A JP2004117344A5 JP 2004117344 A5 JP2004117344 A5 JP 2004117344A5 JP 2003311323 A JP2003311323 A JP 2003311323A JP 2003311323 A JP2003311323 A JP 2003311323A JP 2004117344 A5 JP2004117344 A5 JP 2004117344A5
- Authority
- JP
- Japan
- Prior art keywords
- signal
- bit stream
- transition
- bitstream
- electronic device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP02021145A EP1316808B1 (en) | 2002-09-24 | 2002-09-24 | Transition adjustment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2004117344A JP2004117344A (ja) | 2004-04-15 |
| JP2004117344A5 true JP2004117344A5 (enExample) | 2007-02-22 |
Family
ID=8185482
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003311323A Ceased JP2004117344A (ja) | 2002-09-24 | 2003-09-03 | ビットストリームの遷移を調節する方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9103887B2 (enExample) |
| EP (1) | EP1316808B1 (enExample) |
| JP (1) | JP2004117344A (enExample) |
| CN (1) | CN1318853C (enExample) |
| DE (1) | DE60200289T2 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7526054B2 (en) * | 2005-03-04 | 2009-04-28 | Analog Devices, Inc. | Method, article, and apparatus for a dynamic phase delay compensator |
| US7394277B2 (en) * | 2006-04-20 | 2008-07-01 | Advantest Corporation | Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method |
| US20090113245A1 (en) * | 2007-10-30 | 2009-04-30 | Teradyne, Inc. | Protocol aware digital channel apparatus |
| KR102458563B1 (ko) * | 2018-02-12 | 2022-10-28 | 한국전자통신연구원 | 백스캐터 통신을 사용한 통신 방법 및 통신 장치 |
| CN112104339B (zh) * | 2020-08-28 | 2021-06-01 | 电子科技大学 | 一种适用于含跳变边沿信号的平滑滤波方法 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07123218B2 (ja) | 1986-05-16 | 1995-12-25 | 株式会社トプコン | 走査同期信号発生回路 |
| JPS6331212A (ja) | 1986-07-24 | 1988-02-09 | Nec Corp | 位相同期回路 |
| US4814879A (en) | 1987-08-07 | 1989-03-21 | Rca Licensing Corporation | Signal phase alignment circuitry |
| JP2527017B2 (ja) | 1988-11-22 | 1996-08-21 | ヤマハ株式会社 | デジタルフィルタ |
| US5272729A (en) * | 1991-09-20 | 1993-12-21 | International Business Machines Corporation | Clock signal latency elimination network |
| US5436937A (en) * | 1993-02-01 | 1995-07-25 | Motorola, Inc. | Multi-mode digital phase lock loop |
| JP3636506B2 (ja) * | 1995-06-19 | 2005-04-06 | 株式会社アドバンテスト | 半導体試験装置 |
| JP3502450B2 (ja) * | 1994-08-22 | 2004-03-02 | 株式会社アドバンテスト | パターン発生器 |
| TW422927B (en) * | 1998-02-09 | 2001-02-21 | Advantest Corp | Test apparatus for semiconductor device |
| US6100733A (en) * | 1998-06-09 | 2000-08-08 | Siemens Aktiengesellschaft | Clock latency compensation circuit for DDR timing |
| US6820234B2 (en) * | 1998-06-29 | 2004-11-16 | Acuid Limited | Skew calibration means and a method of skew calibration |
| US6181616B1 (en) * | 1998-09-03 | 2001-01-30 | Micron Technology, Inc. | Circuits and systems for realigning data output by semiconductor testers to packet-based devices under test |
| JP3114934B2 (ja) * | 1998-10-09 | 2000-12-04 | 株式会社アドバンテスト | 自動パターン同期回路及び同期方法 |
| US6442223B1 (en) * | 1999-04-26 | 2002-08-27 | International Business Machines Corporation | Method and system for data transfer |
| US6993695B2 (en) * | 2001-06-06 | 2006-01-31 | Agilent Technologies, Inc. | Method and apparatus for testing digital devices using transition timestamps |
-
2002
- 2002-09-24 EP EP02021145A patent/EP1316808B1/en not_active Expired - Lifetime
- 2002-09-24 DE DE60200289T patent/DE60200289T2/de not_active Expired - Lifetime
-
2003
- 2003-05-28 US US10/446,568 patent/US9103887B2/en not_active Expired - Fee Related
- 2003-07-17 CN CNB031495958A patent/CN1318853C/zh not_active Expired - Fee Related
- 2003-09-03 JP JP2003311323A patent/JP2004117344A/ja not_active Ceased
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