JP2003347238A5 - - Google Patents
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- Publication number
- JP2003347238A5 JP2003347238A5 JP2002155507A JP2002155507A JP2003347238A5 JP 2003347238 A5 JP2003347238 A5 JP 2003347238A5 JP 2002155507 A JP2002155507 A JP 2002155507A JP 2002155507 A JP2002155507 A JP 2002155507A JP 2003347238 A5 JP2003347238 A5 JP 2003347238A5
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor layer
- gallium nitride
- compound semiconductor
- semiconductor device
- base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims 37
- 229910002601 GaN Inorganic materials 0.000 claims 20
- 150000001875 compounds Chemical class 0.000 claims 18
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims 15
- 229910052751 metal Inorganic materials 0.000 claims 9
- 239000002184 metal Substances 0.000 claims 9
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims 4
- -1 gallium nitride compound Chemical class 0.000 claims 4
- 239000007789 gas Substances 0.000 claims 4
- 239000013078 crystal Substances 0.000 claims 3
- 238000004519 manufacturing process Methods 0.000 claims 2
- 229910052757 nitrogen Inorganic materials 0.000 claims 2
- 230000001788 irregular Effects 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 239000002994 raw material Substances 0.000 claims 1
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002155507A JP4178836B2 (ja) | 2002-05-29 | 2002-05-29 | 窒化ガリウム系半導体素子及びその製造方法 |
| US10/445,601 US20040056267A1 (en) | 2002-05-29 | 2003-05-27 | Gallium nitride semiconductor device and method of producing the same |
| US11/045,652 US20050145856A1 (en) | 2002-05-29 | 2005-01-28 | Gallium nitride semiconductor device and method of producing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002155507A JP4178836B2 (ja) | 2002-05-29 | 2002-05-29 | 窒化ガリウム系半導体素子及びその製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2003347238A JP2003347238A (ja) | 2003-12-05 |
| JP2003347238A5 true JP2003347238A5 (enExample) | 2005-04-07 |
| JP4178836B2 JP4178836B2 (ja) | 2008-11-12 |
Family
ID=29772017
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002155507A Expired - Lifetime JP4178836B2 (ja) | 2002-05-29 | 2002-05-29 | 窒化ガリウム系半導体素子及びその製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (2) | US20040056267A1 (enExample) |
| JP (1) | JP4178836B2 (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2005069388A1 (ja) * | 2004-01-20 | 2005-07-28 | Nichia Corporation | 半導体発光素子 |
| JP4967657B2 (ja) * | 2004-06-18 | 2012-07-04 | 日本電気株式会社 | Iii族窒化物半導体光素子およびその製造方法 |
| US7781780B2 (en) | 2008-03-31 | 2010-08-24 | Bridgelux, Inc. | Light emitting diodes with smooth surface for reflective electrode |
| JP2012064663A (ja) * | 2010-09-14 | 2012-03-29 | Advanced Power Device Research Association | 窒化物半導体装置およびその製造方法 |
| KR101684859B1 (ko) * | 2011-01-05 | 2016-12-09 | 삼성전자주식회사 | 발광 다이오드 제조방법 및 이에 의하여 제조된 발광 다이오드 |
| CN104205370B (zh) * | 2012-04-02 | 2017-03-22 | 旭化成株式会社 | 光学基板、半导体发光元件以及半导体发光元件的制造方法 |
| US11362237B2 (en) * | 2020-06-02 | 2022-06-14 | Facebook Technologies, Llc | High-efficiency red micro-LED with localized current aperture |
| CN113410356B (zh) * | 2021-07-21 | 2023-11-17 | 山西中科潞安紫外光电科技有限公司 | 一种倒装结构深紫外发光二极管芯片及其制备方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5578839A (en) * | 1992-11-20 | 1996-11-26 | Nichia Chemical Industries, Ltd. | Light-emitting gallium nitride-based compound semiconductor device |
| JP2000049114A (ja) * | 1998-07-30 | 2000-02-18 | Sony Corp | 電極およびその形成方法ならびに半導体装置およびその製造方法 |
| JP3469484B2 (ja) * | 1998-12-24 | 2003-11-25 | 株式会社東芝 | 半導体発光素子およびその製造方法 |
| JP3833848B2 (ja) * | 1999-05-10 | 2006-10-18 | パイオニア株式会社 | 3族窒化物半導体素子製造方法 |
| GB2350927A (en) * | 1999-06-12 | 2000-12-13 | Sharp Kk | A method growing nitride semiconductor layer by molecular beam epitaxy |
| TW472400B (en) * | 2000-06-23 | 2002-01-11 | United Epitaxy Co Ltd | Method for roughing semiconductor device surface to increase the external quantum efficiency |
| JP4148664B2 (ja) * | 2001-02-02 | 2008-09-10 | 三洋電機株式会社 | 窒化物系半導体レーザ素子およびその形成方法 |
| GB2376563A (en) * | 2001-06-13 | 2002-12-18 | Sharp Kk | A method of growing a magnesium-doped nitride semiconductor material |
| US6744075B2 (en) * | 2001-09-17 | 2004-06-01 | Sanyo Electric Co., Ltd. | Nitride-based semiconductor light-emitting device and method of forming the same |
| WO2003063215A1 (en) * | 2002-01-21 | 2003-07-31 | Matsushita Electric Industrial Co., Ltd. | Nitride semiconductor device manufacturing method |
| US6847057B1 (en) * | 2003-08-01 | 2005-01-25 | Lumileds Lighting U.S., Llc | Semiconductor light emitting devices |
-
2002
- 2002-05-29 JP JP2002155507A patent/JP4178836B2/ja not_active Expired - Lifetime
-
2003
- 2003-05-27 US US10/445,601 patent/US20040056267A1/en not_active Abandoned
-
2005
- 2005-01-28 US US11/045,652 patent/US20050145856A1/en not_active Abandoned
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