JP2003347229A5 - - Google Patents

Download PDF

Info

Publication number
JP2003347229A5
JP2003347229A5 JP2002158608A JP2002158608A JP2003347229A5 JP 2003347229 A5 JP2003347229 A5 JP 2003347229A5 JP 2002158608 A JP2002158608 A JP 2002158608A JP 2002158608 A JP2002158608 A JP 2002158608A JP 2003347229 A5 JP2003347229 A5 JP 2003347229A5
Authority
JP
Japan
Prior art keywords
film
silicon
semiconductor device
germanium
manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002158608A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003347229A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2002158608A priority Critical patent/JP2003347229A/ja
Priority claimed from JP2002158608A external-priority patent/JP2003347229A/ja
Priority to US10/440,102 priority patent/US6897129B2/en
Priority to TW092113887A priority patent/TWI260049B/zh
Priority to KR10-2003-0034368A priority patent/KR20030094018A/ko
Publication of JP2003347229A publication Critical patent/JP2003347229A/ja
Priority to US11/103,465 priority patent/US20050173705A1/en
Publication of JP2003347229A5 publication Critical patent/JP2003347229A5/ja
Priority to US11/969,154 priority patent/US8878244B2/en
Pending legal-status Critical Current

Links

JP2002158608A 2002-05-31 2002-05-31 半導体装置の製造方法および半導体装置 Pending JP2003347229A (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2002158608A JP2003347229A (ja) 2002-05-31 2002-05-31 半導体装置の製造方法および半導体装置
US10/440,102 US6897129B2 (en) 2002-05-31 2003-05-19 Fabrication method of semiconductor device and semiconductor device
TW092113887A TWI260049B (en) 2002-05-31 2003-05-22 Fabrication method of semiconductor device and semiconductor device
KR10-2003-0034368A KR20030094018A (ko) 2002-05-31 2003-05-29 반도체 장치의 제조 방법 및 반도체 장치
US11/103,465 US20050173705A1 (en) 2002-05-31 2005-04-12 Fabrication method of semiconductor device and semiconductor device
US11/969,154 US8878244B2 (en) 2002-05-31 2008-01-03 Semiconductor device having strained silicon film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002158608A JP2003347229A (ja) 2002-05-31 2002-05-31 半導体装置の製造方法および半導体装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2006237138A Division JP4696037B2 (ja) 2006-09-01 2006-09-01 半導体装置の製造方法および半導体装置

Publications (2)

Publication Number Publication Date
JP2003347229A JP2003347229A (ja) 2003-12-05
JP2003347229A5 true JP2003347229A5 (enExample) 2005-09-08

Family

ID=29561550

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002158608A Pending JP2003347229A (ja) 2002-05-31 2002-05-31 半導体装置の製造方法および半導体装置

Country Status (4)

Country Link
US (3) US6897129B2 (enExample)
JP (1) JP2003347229A (enExample)
KR (1) KR20030094018A (enExample)
TW (1) TWI260049B (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4557505B2 (ja) * 2003-05-19 2010-10-06 コバレントマテリアル株式会社 半導体基板の製造方法
KR100640971B1 (ko) * 2004-12-31 2006-11-02 동부일렉트로닉스 주식회사 반도체 소자의 제조 방법
US7972703B2 (en) * 2005-03-03 2011-07-05 Ferrotec (Usa) Corporation Baffle wafers and randomly oriented polycrystalline silicon used therefor
EP1763069B1 (en) * 2005-09-07 2016-04-13 Soitec Method for forming a semiconductor heterostructure
US20070154637A1 (en) * 2005-12-19 2007-07-05 Rohm And Haas Electronic Materials Llc Organometallic composition
KR100873299B1 (ko) * 2007-08-20 2008-12-11 주식회사 실트론 Ssoi 기판의 제조방법
JP5018473B2 (ja) * 2007-12-28 2012-09-05 富士通セミコンダクター株式会社 半導体装置の製造方法
JP2010103142A (ja) * 2008-10-21 2010-05-06 Toshiba Corp 半導体装置の製造方法
US8623728B2 (en) * 2009-07-28 2014-01-07 Taiwan Semiconductor Manufacturing Company, Ltd. Method for forming high germanium concentration SiGe stressor
US8598027B2 (en) * 2010-01-20 2013-12-03 International Business Machines Corporation High-K transistors with low threshold voltage
US8598020B2 (en) * 2010-06-25 2013-12-03 Applied Materials, Inc. Plasma-enhanced chemical vapor deposition of crystalline germanium
JP6004429B2 (ja) * 2012-09-10 2016-10-05 国立研究開発法人産業技術総合研究所 単結晶SiGe層の製造方法及びそれを用いた太陽電池
JP6640596B2 (ja) * 2016-02-22 2020-02-05 東京エレクトロン株式会社 成膜方法
CN108350602B (zh) * 2016-03-18 2020-11-27 株式会社Lg化学 用于制造多晶硅的超高温沉淀工艺
EP3229262B1 (en) 2016-04-05 2018-08-15 Siltronic AG Method for the vapour phase etching of a semiconductor wafer for trace metal analysis
US11296227B2 (en) 2019-10-16 2022-04-05 Taiwan Semiconductor Manufacturing Co., Ltd. Method of manufacturing semiconductor devices and semiconductor devices
WO2025155387A1 (en) * 2024-01-17 2025-07-24 La Luce Cristallina Inc. Twin-free, small lattice parameter perovskite pseudo-substrates on silicon carrier wafers and fabrication methods therefor

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS648727U (enExample) 1987-07-07 1989-01-18
KR890003983A (ko) 1987-08-27 1989-04-19 엔.라이스 머레트 종래의 cvd 반응로를 사용한 스트레인층 초격자의 연속 화학 증착 성장 방법
US6004137A (en) * 1991-01-10 1999-12-21 International Business Machines Corporation Method of making graded channel effect transistor
JPH0691249B2 (ja) 1991-01-10 1994-11-14 インターナショナル・ビジネス・マシーンズ・コーポレイション 変調ドープ形misfet及びその製造方法
US5221413A (en) 1991-04-24 1993-06-22 At&T Bell Laboratories Method for making low defect density semiconductor heterostructure and devices made thereby
CA2062134C (en) 1991-05-31 1997-03-25 Ibm Low Defect Densiry/Arbitrary Lattice Constant Heteroepitaxial Layers
JPH05315269A (ja) 1992-03-11 1993-11-26 Central Glass Co Ltd 薄膜の製膜方法
JPH0669131A (ja) 1992-08-17 1994-03-11 Oki Electric Ind Co Ltd 半導体薄膜形成方法
JP3080806B2 (ja) 1993-03-26 2000-08-28 エア・ウォーター株式会社 エピタキシャル膜成長法
JPH0745530A (ja) 1993-07-27 1995-02-14 Shin Etsu Handotai Co Ltd 縦型気相成長装置
JPH07201740A (ja) 1993-12-28 1995-08-04 Toshiba Corp エピタキシャル成長方法
US5906951A (en) * 1997-04-30 1999-05-25 International Business Machines Corporation Strained Si/SiGe layers on insulator
EP1016129B2 (en) 1997-06-24 2009-06-10 Massachusetts Institute Of Technology Controlling threading dislocation densities using graded layers and planarization
US6127233A (en) * 1997-12-05 2000-10-03 Texas Instruments Incorporated Lateral MOSFET having a barrier between the source/drain regions and the channel region
US6350993B1 (en) * 1999-03-12 2002-02-26 International Business Machines Corporation High speed composite p-channel Si/SiGe heterostructure for field effect devices
KR100441469B1 (ko) 1999-03-12 2004-07-23 인터내셔널 비지네스 머신즈 코포레이션 전계 효과 장치용 고속 게르마늄 채널 이종구조물
JP2000331943A (ja) 1999-05-20 2000-11-30 Komatsu Electronic Metals Co Ltd 半導体ウェーハの薄膜形成方法および半導体ウェーハの薄膜形成装置
US6326667B1 (en) 1999-09-09 2001-12-04 Kabushiki Kaisha Toshiba Semiconductor devices and methods for producing semiconductor devices
JP4212228B2 (ja) 1999-09-09 2009-01-21 株式会社東芝 半導体装置の製造方法
JP4220665B2 (ja) 1999-11-15 2009-02-04 パナソニック株式会社 半導体装置
EP1672700A2 (en) * 1999-11-15 2006-06-21 Matsushita Electric Industrial Co., Ltd. Field effect semiconductor device
TW497120B (en) * 2000-03-06 2002-08-01 Toshiba Corp Transistor, semiconductor device and manufacturing method of semiconductor device
JP3777306B2 (ja) 2000-03-06 2006-05-24 株式会社東芝 半導体装置の製造方法
JP3603747B2 (ja) 2000-05-11 2004-12-22 三菱住友シリコン株式会社 SiGe膜の形成方法とヘテロ接合トランジスタの製造方法、及びヘテロ接合バイポーラトランジスタ
EP1223608A1 (en) 2000-06-16 2002-07-17 Matsushita Electric Industrial Co., Ltd. Structure evaluating method, method for manufacturing semiconductor devices, and recording medium
JP4642276B2 (ja) 2000-06-16 2011-03-02 パナソニック株式会社 半導体装置の製造方法及び記録媒体
JP2002043566A (ja) * 2000-07-27 2002-02-08 Matsushita Electric Ind Co Ltd 半導体装置及びその製造方法
JP4269541B2 (ja) 2000-08-01 2009-05-27 株式会社Sumco 半導体基板と電界効果型トランジスタ並びにSiGe層の形成方法及びこれを用いた歪みSi層の形成方法と電界効果型トランジスタの製造方法
US6613695B2 (en) * 2000-11-24 2003-09-02 Asm America, Inc. Surface preparation prior to deposition
JP2002329664A (ja) 2001-04-26 2002-11-15 Mitsubishi Materials Silicon Corp SiGe層の形成方法及びこれを用いた歪みSi層の形成方法と電界効果型トランジスタの製造方法、並びに半導体ウェーハ及びこれを用いた歪みSiウェーハと電界効果型トランジスタ
JP2003077845A (ja) * 2001-09-05 2003-03-14 Hitachi Kokusai Electric Inc 半導体装置の製造方法および基板処理装置
US20030111013A1 (en) * 2001-12-19 2003-06-19 Oosterlaken Theodorus Gerardus Maria Method for the deposition of silicon germanium layers
US20030124818A1 (en) * 2001-12-28 2003-07-03 Applied Materials, Inc. Method and apparatus for forming silicon containing films
US20030227057A1 (en) * 2002-06-07 2003-12-11 Lochtefeld Anthony J. Strained-semiconductor-on-insulator device structures

Similar Documents

Publication Publication Date Title
JP2003347229A5 (enExample)
TWI855223B (zh) 用於生長磷摻雜矽層之方法
TWI686505B (zh) 矽膜之形成方法與形成裝置及記錄媒體
JP5741382B2 (ja) 薄膜の形成方法及び成膜装置
TWI665719B (zh) 凹部內之結晶成長方法及處理裝置與記錄媒體
CN101496150B (zh) 控制外延层形成期间形态的方法
JP2005537660A5 (enExample)
CN101307488B (zh) 多晶硅薄膜的制备方法
JP4519947B2 (ja) Si層凝集抑制方法、半導体装置の製造方法及び真空処理装置
JP5854112B2 (ja) 薄膜の形成方法及び成膜装置
JP7072440B2 (ja) シリコン含有膜のエッチング方法、コンピュータ記憶媒体、及びシリコン含有膜のエッチング装置
KR102116165B1 (ko) 오목부의 매립 방법 및 처리 장치
JP2007519241A (ja) 半導体材料の堆積方法
CN103972079B (zh) 一种三维空间分布有序硅量子点的制备方法
JPWO2011078240A1 (ja) ドープエピタキシャル膜の選択成長方法及びドープエピタキシャル膜の選択成長装置
JPH04139819A (ja) シリコンエピタキシャル膜の選択成長方法及びその装置
TWI608133B (zh) 一種形成氧化層和磊晶層的方法
CN103132077A (zh) 基于SiGe量子点模板刻蚀技术制备锗硅纳米柱的方法
CN104495766B (zh) 一种氮化铝一维纳米结构材料的制备方法
US8158495B2 (en) Process for forming a silicon-based single-crystal portion
TWI749775B (zh) 氧化層去除方法及半導體加工設備
CN116525418B (zh) 基于111晶向的硅外延片制备方法、硅外延片及半导体器件
JP2022075996A (ja) シリコン含有膜のエッチング方法、コンピュータ記憶媒体、及びシリコン含有膜のエッチング装置
CN104465346B (zh) 形成栅极的方法
CN111916349A (zh) 硅刻蚀方法