JP2003347229A5 - - Google Patents
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- Publication number
- JP2003347229A5 JP2003347229A5 JP2002158608A JP2002158608A JP2003347229A5 JP 2003347229 A5 JP2003347229 A5 JP 2003347229A5 JP 2002158608 A JP2002158608 A JP 2002158608A JP 2002158608 A JP2002158608 A JP 2002158608A JP 2003347229 A5 JP2003347229 A5 JP 2003347229A5
- Authority
- JP
- Japan
- Prior art keywords
- film
- silicon
- semiconductor device
- germanium
- manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims 86
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 claims 63
- 229910000577 Silicon-germanium Inorganic materials 0.000 claims 59
- 229910052732 germanium Inorganic materials 0.000 claims 39
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims 39
- 238000004519 manufacturing process Methods 0.000 claims 39
- 239000000758 substrate Substances 0.000 claims 27
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 26
- 229910052710 silicon Inorganic materials 0.000 claims 26
- 239000010703 silicon Substances 0.000 claims 26
- 239000007789 gas Substances 0.000 claims 20
- 238000000034 method Methods 0.000 claims 7
- 230000015572 biosynthetic process Effects 0.000 claims 2
- 230000007423 decrease Effects 0.000 claims 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 claims 1
- 229910021417 amorphous silicon Inorganic materials 0.000 claims 1
- 238000005530 etching Methods 0.000 claims 1
- 238000010438 heat treatment Methods 0.000 claims 1
- 229910000041 hydrogen chloride Inorganic materials 0.000 claims 1
- IXCSERBJSXMMFS-UHFFFAOYSA-N hydrogen chloride Substances Cl.Cl IXCSERBJSXMMFS-UHFFFAOYSA-N 0.000 claims 1
- 229910021426 porous silicon Inorganic materials 0.000 claims 1
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002158608A JP2003347229A (ja) | 2002-05-31 | 2002-05-31 | 半導体装置の製造方法および半導体装置 |
| US10/440,102 US6897129B2 (en) | 2002-05-31 | 2003-05-19 | Fabrication method of semiconductor device and semiconductor device |
| TW092113887A TWI260049B (en) | 2002-05-31 | 2003-05-22 | Fabrication method of semiconductor device and semiconductor device |
| KR10-2003-0034368A KR20030094018A (ko) | 2002-05-31 | 2003-05-29 | 반도체 장치의 제조 방법 및 반도체 장치 |
| US11/103,465 US20050173705A1 (en) | 2002-05-31 | 2005-04-12 | Fabrication method of semiconductor device and semiconductor device |
| US11/969,154 US8878244B2 (en) | 2002-05-31 | 2008-01-03 | Semiconductor device having strained silicon film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002158608A JP2003347229A (ja) | 2002-05-31 | 2002-05-31 | 半導体装置の製造方法および半導体装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006237138A Division JP4696037B2 (ja) | 2006-09-01 | 2006-09-01 | 半導体装置の製造方法および半導体装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2003347229A JP2003347229A (ja) | 2003-12-05 |
| JP2003347229A5 true JP2003347229A5 (enExample) | 2005-09-08 |
Family
ID=29561550
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002158608A Pending JP2003347229A (ja) | 2002-05-31 | 2002-05-31 | 半導体装置の製造方法および半導体装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (3) | US6897129B2 (enExample) |
| JP (1) | JP2003347229A (enExample) |
| KR (1) | KR20030094018A (enExample) |
| TW (1) | TWI260049B (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4557505B2 (ja) * | 2003-05-19 | 2010-10-06 | コバレントマテリアル株式会社 | 半導体基板の製造方法 |
| KR100640971B1 (ko) * | 2004-12-31 | 2006-11-02 | 동부일렉트로닉스 주식회사 | 반도체 소자의 제조 방법 |
| US7972703B2 (en) * | 2005-03-03 | 2011-07-05 | Ferrotec (Usa) Corporation | Baffle wafers and randomly oriented polycrystalline silicon used therefor |
| EP1763069B1 (en) * | 2005-09-07 | 2016-04-13 | Soitec | Method for forming a semiconductor heterostructure |
| US20070154637A1 (en) * | 2005-12-19 | 2007-07-05 | Rohm And Haas Electronic Materials Llc | Organometallic composition |
| KR100873299B1 (ko) * | 2007-08-20 | 2008-12-11 | 주식회사 실트론 | Ssoi 기판의 제조방법 |
| JP5018473B2 (ja) * | 2007-12-28 | 2012-09-05 | 富士通セミコンダクター株式会社 | 半導体装置の製造方法 |
| JP2010103142A (ja) * | 2008-10-21 | 2010-05-06 | Toshiba Corp | 半導体装置の製造方法 |
| US8623728B2 (en) * | 2009-07-28 | 2014-01-07 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method for forming high germanium concentration SiGe stressor |
| US8598027B2 (en) * | 2010-01-20 | 2013-12-03 | International Business Machines Corporation | High-K transistors with low threshold voltage |
| US8598020B2 (en) * | 2010-06-25 | 2013-12-03 | Applied Materials, Inc. | Plasma-enhanced chemical vapor deposition of crystalline germanium |
| JP6004429B2 (ja) * | 2012-09-10 | 2016-10-05 | 国立研究開発法人産業技術総合研究所 | 単結晶SiGe層の製造方法及びそれを用いた太陽電池 |
| JP6640596B2 (ja) * | 2016-02-22 | 2020-02-05 | 東京エレクトロン株式会社 | 成膜方法 |
| CN108350602B (zh) * | 2016-03-18 | 2020-11-27 | 株式会社Lg化学 | 用于制造多晶硅的超高温沉淀工艺 |
| EP3229262B1 (en) | 2016-04-05 | 2018-08-15 | Siltronic AG | Method for the vapour phase etching of a semiconductor wafer for trace metal analysis |
| US11296227B2 (en) | 2019-10-16 | 2022-04-05 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method of manufacturing semiconductor devices and semiconductor devices |
| WO2025155387A1 (en) * | 2024-01-17 | 2025-07-24 | La Luce Cristallina Inc. | Twin-free, small lattice parameter perovskite pseudo-substrates on silicon carrier wafers and fabrication methods therefor |
Family Cites Families (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS648727U (enExample) | 1987-07-07 | 1989-01-18 | ||
| KR890003983A (ko) | 1987-08-27 | 1989-04-19 | 엔.라이스 머레트 | 종래의 cvd 반응로를 사용한 스트레인층 초격자의 연속 화학 증착 성장 방법 |
| US6004137A (en) * | 1991-01-10 | 1999-12-21 | International Business Machines Corporation | Method of making graded channel effect transistor |
| JPH0691249B2 (ja) | 1991-01-10 | 1994-11-14 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 変調ドープ形misfet及びその製造方法 |
| US5221413A (en) | 1991-04-24 | 1993-06-22 | At&T Bell Laboratories | Method for making low defect density semiconductor heterostructure and devices made thereby |
| CA2062134C (en) | 1991-05-31 | 1997-03-25 | Ibm | Low Defect Densiry/Arbitrary Lattice Constant Heteroepitaxial Layers |
| JPH05315269A (ja) | 1992-03-11 | 1993-11-26 | Central Glass Co Ltd | 薄膜の製膜方法 |
| JPH0669131A (ja) | 1992-08-17 | 1994-03-11 | Oki Electric Ind Co Ltd | 半導体薄膜形成方法 |
| JP3080806B2 (ja) | 1993-03-26 | 2000-08-28 | エア・ウォーター株式会社 | エピタキシャル膜成長法 |
| JPH0745530A (ja) | 1993-07-27 | 1995-02-14 | Shin Etsu Handotai Co Ltd | 縦型気相成長装置 |
| JPH07201740A (ja) | 1993-12-28 | 1995-08-04 | Toshiba Corp | エピタキシャル成長方法 |
| US5906951A (en) * | 1997-04-30 | 1999-05-25 | International Business Machines Corporation | Strained Si/SiGe layers on insulator |
| EP1016129B2 (en) | 1997-06-24 | 2009-06-10 | Massachusetts Institute Of Technology | Controlling threading dislocation densities using graded layers and planarization |
| US6127233A (en) * | 1997-12-05 | 2000-10-03 | Texas Instruments Incorporated | Lateral MOSFET having a barrier between the source/drain regions and the channel region |
| US6350993B1 (en) * | 1999-03-12 | 2002-02-26 | International Business Machines Corporation | High speed composite p-channel Si/SiGe heterostructure for field effect devices |
| KR100441469B1 (ko) | 1999-03-12 | 2004-07-23 | 인터내셔널 비지네스 머신즈 코포레이션 | 전계 효과 장치용 고속 게르마늄 채널 이종구조물 |
| JP2000331943A (ja) | 1999-05-20 | 2000-11-30 | Komatsu Electronic Metals Co Ltd | 半導体ウェーハの薄膜形成方法および半導体ウェーハの薄膜形成装置 |
| US6326667B1 (en) | 1999-09-09 | 2001-12-04 | Kabushiki Kaisha Toshiba | Semiconductor devices and methods for producing semiconductor devices |
| JP4212228B2 (ja) | 1999-09-09 | 2009-01-21 | 株式会社東芝 | 半導体装置の製造方法 |
| JP4220665B2 (ja) | 1999-11-15 | 2009-02-04 | パナソニック株式会社 | 半導体装置 |
| EP1672700A2 (en) * | 1999-11-15 | 2006-06-21 | Matsushita Electric Industrial Co., Ltd. | Field effect semiconductor device |
| TW497120B (en) * | 2000-03-06 | 2002-08-01 | Toshiba Corp | Transistor, semiconductor device and manufacturing method of semiconductor device |
| JP3777306B2 (ja) | 2000-03-06 | 2006-05-24 | 株式会社東芝 | 半導体装置の製造方法 |
| JP3603747B2 (ja) | 2000-05-11 | 2004-12-22 | 三菱住友シリコン株式会社 | SiGe膜の形成方法とヘテロ接合トランジスタの製造方法、及びヘテロ接合バイポーラトランジスタ |
| EP1223608A1 (en) | 2000-06-16 | 2002-07-17 | Matsushita Electric Industrial Co., Ltd. | Structure evaluating method, method for manufacturing semiconductor devices, and recording medium |
| JP4642276B2 (ja) | 2000-06-16 | 2011-03-02 | パナソニック株式会社 | 半導体装置の製造方法及び記録媒体 |
| JP2002043566A (ja) * | 2000-07-27 | 2002-02-08 | Matsushita Electric Ind Co Ltd | 半導体装置及びその製造方法 |
| JP4269541B2 (ja) | 2000-08-01 | 2009-05-27 | 株式会社Sumco | 半導体基板と電界効果型トランジスタ並びにSiGe層の形成方法及びこれを用いた歪みSi層の形成方法と電界効果型トランジスタの製造方法 |
| US6613695B2 (en) * | 2000-11-24 | 2003-09-02 | Asm America, Inc. | Surface preparation prior to deposition |
| JP2002329664A (ja) | 2001-04-26 | 2002-11-15 | Mitsubishi Materials Silicon Corp | SiGe層の形成方法及びこれを用いた歪みSi層の形成方法と電界効果型トランジスタの製造方法、並びに半導体ウェーハ及びこれを用いた歪みSiウェーハと電界効果型トランジスタ |
| JP2003077845A (ja) * | 2001-09-05 | 2003-03-14 | Hitachi Kokusai Electric Inc | 半導体装置の製造方法および基板処理装置 |
| US20030111013A1 (en) * | 2001-12-19 | 2003-06-19 | Oosterlaken Theodorus Gerardus Maria | Method for the deposition of silicon germanium layers |
| US20030124818A1 (en) * | 2001-12-28 | 2003-07-03 | Applied Materials, Inc. | Method and apparatus for forming silicon containing films |
| US20030227057A1 (en) * | 2002-06-07 | 2003-12-11 | Lochtefeld Anthony J. | Strained-semiconductor-on-insulator device structures |
-
2002
- 2002-05-31 JP JP2002158608A patent/JP2003347229A/ja active Pending
-
2003
- 2003-05-19 US US10/440,102 patent/US6897129B2/en not_active Expired - Lifetime
- 2003-05-22 TW TW092113887A patent/TWI260049B/zh not_active IP Right Cessation
- 2003-05-29 KR KR10-2003-0034368A patent/KR20030094018A/ko not_active Ceased
-
2005
- 2005-04-12 US US11/103,465 patent/US20050173705A1/en not_active Abandoned
-
2008
- 2008-01-03 US US11/969,154 patent/US8878244B2/en active Active
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