JP2003169778A5 - - Google Patents

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Publication number
JP2003169778A5
JP2003169778A5 JP2001373744A JP2001373744A JP2003169778A5 JP 2003169778 A5 JP2003169778 A5 JP 2003169778A5 JP 2001373744 A JP2001373744 A JP 2001373744A JP 2001373744 A JP2001373744 A JP 2001373744A JP 2003169778 A5 JP2003169778 A5 JP 2003169778A5
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JP
Japan
Prior art keywords
measurement
index
shape
measuring
projecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001373744A
Other languages
English (en)
Japanese (ja)
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JP2003169778A (ja
JP3703429B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2001373744A priority Critical patent/JP3703429B2/ja
Priority claimed from JP2001373744A external-priority patent/JP3703429B2/ja
Priority to US10/310,761 priority patent/US6755528B2/en
Priority to DE60216557T priority patent/DE60216557T2/de
Priority to EP02027562A priority patent/EP1317899B1/en
Publication of JP2003169778A publication Critical patent/JP2003169778A/ja
Publication of JP2003169778A5 publication Critical patent/JP2003169778A5/ja
Application granted granted Critical
Publication of JP3703429B2 publication Critical patent/JP3703429B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2001373744A 2001-12-07 2001-12-07 角膜形状測定装置 Expired - Fee Related JP3703429B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2001373744A JP3703429B2 (ja) 2001-12-07 2001-12-07 角膜形状測定装置
US10/310,761 US6755528B2 (en) 2001-12-07 2002-12-06 Shape measurement apparatus
DE60216557T DE60216557T2 (de) 2001-12-07 2002-12-09 Formmessvorrichtung
EP02027562A EP1317899B1 (en) 2001-12-07 2002-12-09 Shape measurement apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001373744A JP3703429B2 (ja) 2001-12-07 2001-12-07 角膜形状測定装置

Publications (3)

Publication Number Publication Date
JP2003169778A JP2003169778A (ja) 2003-06-17
JP2003169778A5 true JP2003169778A5 (enExample) 2005-06-23
JP3703429B2 JP3703429B2 (ja) 2005-10-05

Family

ID=19182409

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001373744A Expired - Fee Related JP3703429B2 (ja) 2001-12-07 2001-12-07 角膜形状測定装置

Country Status (4)

Country Link
US (1) US6755528B2 (enExample)
EP (1) EP1317899B1 (enExample)
JP (1) JP3703429B2 (enExample)
DE (1) DE60216557T2 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007114426A1 (ja) 2006-03-31 2007-10-11 Nidek Co., Ltd. 眼科装置
EP2144582B1 (en) 2007-05-11 2017-08-23 AMO Development, LLC Combined wavefront and topography systems and methods
US7976163B2 (en) 2007-06-27 2011-07-12 Amo Wavefront Sciences Llc System and method for measuring corneal topography
US7988290B2 (en) * 2007-06-27 2011-08-02 AMO Wavefront Sciences LLC. Systems and methods for measuring the shape and location of an object
US7988293B2 (en) * 2008-11-14 2011-08-02 AMO Wavefront Sciences LLC. Method of qualifying light spots for optical measurements and measurement instrument employing method of qualifying light spots
JP5654225B2 (ja) * 2009-09-30 2015-01-14 株式会社ニデック 角膜形状測定装置
JP5484139B2 (ja) * 2010-03-15 2014-05-07 株式会社ニデック 眼科装置
JP6007466B2 (ja) 2010-12-27 2016-10-12 株式会社ニデック 角膜形状測定装置
EP2688460B1 (en) * 2011-03-25 2018-09-26 Novartis AG Apparatus and method for modelling ocular structures
US8622546B2 (en) 2011-06-08 2014-01-07 Amo Wavefront Sciences, Llc Method of locating valid light spots for optical measurement and optical measurement instrument employing method of locating valid light spots
US8562135B2 (en) 2011-08-31 2013-10-22 Nidek Co., Ltd. Ophthalmic apparatus
JP2013135837A (ja) 2011-11-30 2013-07-11 Nidek Co Ltd 眼科装置及び眼科プログラム
DE102012019474A1 (de) * 2012-09-28 2014-04-03 Carl Zeiss Meditec Ag Vorrichtung zur verlässlichen Bestimmung biometrischer Messgrößen des gesamten Auges
CN103292738B (zh) * 2013-06-26 2015-12-09 中国科学院光电技术研究所 一种球面面形误差绝对检测方法
CN104976964B (zh) * 2015-06-09 2017-07-14 中国科学院长春光学精密机械与物理研究所 球面镜和平面镜面形误差的绝对检测方法
JP2017087509A (ja) * 2015-11-06 2017-05-25 東芝テック株式会社 ポータブルプリンタ及びコンピュータプログラム

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Publication number Priority date Publication date Assignee Title
US4051483A (en) 1976-09-03 1977-09-27 Fuji Photo Optical Co., Ltd. System for measuring and recording three dimensional configuration of object
US4420228A (en) 1980-06-12 1983-12-13 Humphrey Instruments, Inc. Method and apparatus for analysis of corneal shape
US4572628A (en) 1981-05-29 1986-02-25 Nippon Kogaku K.K. Method of and apparatus for measuring radius
JPS6185920A (ja) * 1984-10-03 1986-05-01 株式会社　ニデツク 角膜形状測定装置
GB8517595D0 (en) 1985-07-12 1985-08-21 Clement Clarke Int Keratometer
JPS6419896A (en) 1987-07-15 1989-01-23 Toshiba Corp Feeding system for telephone set controller
JPH05146407A (ja) * 1991-11-26 1993-06-15 Canon Inc 曲率半径測定装置
US5355210A (en) 1991-12-20 1994-10-11 Rotlex Optics Ltd. Method and apparatus for measuring optical properties of optical devices
JP3221733B2 (ja) * 1992-06-30 2001-10-22 株式会社ニデック レンズ測定装置
US5463430A (en) 1992-07-31 1995-10-31 Nidek Co., Ltd. Examination apparatus for examining an object having a spheroidal reflective surface
JP3269665B2 (ja) * 1992-07-31 2002-03-25 株式会社ニデック アライメント検出装置及び該アライメント検出装置を用いた眼科装置
JPH06154166A (ja) * 1992-11-27 1994-06-03 Topcon Corp コンタクトレンズの判別装置
JP3445634B2 (ja) 1993-03-31 2003-09-08 株式会社ニデック 眼科装置
JPH09138181A (ja) 1995-11-15 1997-05-27 Nikon Corp 光学系の屈折力および曲率半径の測定装置
EP0836830B1 (en) 1996-10-03 2004-06-30 Nidek Co., Ltd Ophthalmic refraction measurement apparatus
JP3560746B2 (ja) * 1996-10-03 2004-09-02 株式会社ニデック 眼屈折力測定装置
US6222621B1 (en) * 1998-10-12 2001-04-24 Hoyo Corporation Spectacle lens evaluation method and evaluation device
JP2003093345A (ja) * 2001-09-27 2003-04-02 Canon Inc 眼科装置
JP2003106935A (ja) * 2001-09-28 2003-04-09 Tomey Corporation コンタクトレンズの形状測定

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