JP2002359246A5 - - Google Patents

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Publication number
JP2002359246A5
JP2002359246A5 JP2002089262A JP2002089262A JP2002359246A5 JP 2002359246 A5 JP2002359246 A5 JP 2002359246A5 JP 2002089262 A JP2002089262 A JP 2002089262A JP 2002089262 A JP2002089262 A JP 2002089262A JP 2002359246 A5 JP2002359246 A5 JP 2002359246A5
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JP
Japan
Prior art keywords
conductive layer
width
wiring
manufacturing
resist mask
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Application number
JP2002089262A
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English (en)
Japanese (ja)
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JP4338934B2 (ja
JP2002359246A (ja
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Priority to JP2002089262A priority Critical patent/JP4338934B2/ja
Priority claimed from JP2002089262A external-priority patent/JP4338934B2/ja
Publication of JP2002359246A publication Critical patent/JP2002359246A/ja
Publication of JP2002359246A5 publication Critical patent/JP2002359246A5/ja
Application granted granted Critical
Publication of JP4338934B2 publication Critical patent/JP4338934B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2002089262A 2001-03-27 2002-03-27 配線の作製方法 Expired - Lifetime JP4338934B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002089262A JP4338934B2 (ja) 2001-03-27 2002-03-27 配線の作製方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2001-91192 2001-03-27
JP2001091192 2001-03-27
JP2002089262A JP4338934B2 (ja) 2001-03-27 2002-03-27 配線の作製方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2008277827A Division JP5376709B2 (ja) 2001-03-27 2008-10-29 半導体装置及びその作製方法

Publications (3)

Publication Number Publication Date
JP2002359246A JP2002359246A (ja) 2002-12-13
JP2002359246A5 true JP2002359246A5 (enrdf_load_stackoverflow) 2005-09-08
JP4338934B2 JP4338934B2 (ja) 2009-10-07

Family

ID=26612251

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002089262A Expired - Lifetime JP4338934B2 (ja) 2001-03-27 2002-03-27 配線の作製方法

Country Status (1)

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JP (1) JP4338934B2 (enrdf_load_stackoverflow)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG116443A1 (en) * 2001-03-27 2005-11-28 Semiconductor Energy Lab Wiring and method of manufacturing the same, and wiring board and method of manufacturing the same.
US7183146B2 (en) 2003-01-17 2007-02-27 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing semiconductor device
US7405033B2 (en) 2003-01-17 2008-07-29 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing resist pattern and method for manufacturing semiconductor device
KR20080106361A (ko) 2003-02-05 2008-12-04 가부시키가이샤 한도오따이 에네루기 켄큐쇼 레지스트 패턴의 형성방법 및 반도체장치의 제조방법
EP1592049A1 (en) 2003-02-05 2005-11-02 Sel Semiconductor Energy Laboratory Co., Ltd. Process for manufacturing display
KR101069333B1 (ko) 2003-02-05 2011-10-05 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시장치의 제조방법
JP4748990B2 (ja) 2003-02-06 2011-08-17 株式会社半導体エネルギー研究所 半導体装置の製造方法
CN100472731C (zh) 2003-02-06 2009-03-25 株式会社半导体能源研究所 半导体制造装置
WO2004070821A1 (ja) 2003-02-06 2004-08-19 Semiconductor Energy Laboratory Co., Ltd. 表示装置の作製方法
JP4869601B2 (ja) 2003-03-26 2012-02-08 株式会社半導体エネルギー研究所 半導体装置および半導体装置の作製方法
US7061570B2 (en) 2003-03-26 2006-06-13 Semiconductor Energy Laboratory Co., Ltd. Display device and manufacturing method thereof
JPWO2004096449A1 (ja) 2003-04-25 2006-07-13 株式会社半導体エネルギー研究所 荷電ビームを用いた液滴吐出装置及び該装置を用いてのパターンの作製方法
US7192859B2 (en) 2003-05-16 2007-03-20 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing semiconductor device and display device
US7202155B2 (en) 2003-08-15 2007-04-10 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing wiring and method for manufacturing semiconductor device
CN100568457C (zh) 2003-10-02 2009-12-09 株式会社半导体能源研究所 半导体装置的制造方法
WO2005041310A1 (en) 2003-10-28 2005-05-06 Semiconductor Energy Laboratory Co., Ltd. Display device and method for manufacturing the same, and television receiver
WO2005041280A1 (en) 2003-10-28 2005-05-06 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
CN100464429C (zh) 2003-10-28 2009-02-25 株式会社半导体能源研究所 液晶显示设备及其制造方法,以及液晶电视接收机
US7439086B2 (en) 2003-11-14 2008-10-21 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing liquid crystal display device
US8247965B2 (en) 2003-11-14 2012-08-21 Semiconductor Energy Laboratory Co., Ltd. Light emitting display device and method for manufacturing the same
US20050170643A1 (en) 2004-01-29 2005-08-04 Semiconductor Energy Laboratory Co., Ltd. Forming method of contact hole, and manufacturing method of semiconductor device, liquid crystal display device and EL display device
US7416977B2 (en) 2004-04-28 2008-08-26 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing display device, liquid crystal television, and EL television
US7494923B2 (en) 2004-06-14 2009-02-24 Semiconductor Energy Laboratory Co., Ltd. Manufacturing method of wiring substrate and semiconductor device
US7859606B2 (en) 2004-09-15 2010-12-28 Semiconductor Energy Laboratory Co. Ltd. Semiconductor device
JP4817946B2 (ja) * 2005-04-15 2011-11-16 株式会社半導体エネルギー研究所 表示装置の作製方法
US7888702B2 (en) 2005-04-15 2011-02-15 Semiconductor Energy Laboratory Co., Ltd. Display device and manufacturing method of the display device
KR100817746B1 (ko) 2006-12-07 2008-03-31 한국전자통신연구원 다층 구조의 박막 트랜지스터 제조방법 및 상기 박막트랜지스터를 포함하는 능동 구동 표시 소자
JP2011064751A (ja) * 2009-09-15 2011-03-31 Seiko Epson Corp 導電膜積層部材、電気光学装置、電子機器
JP6585354B2 (ja) * 2014-03-07 2019-10-02 株式会社半導体エネルギー研究所 半導体装置
KR102470044B1 (ko) * 2016-05-13 2022-11-24 삼성디스플레이 주식회사 플렉서블 표시 장치 및 이의 제조 방법

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0945688A (ja) * 1995-07-28 1997-02-14 Sony Corp 配線構造及びその形成方法
JPH1116913A (ja) * 1997-06-27 1999-01-22 Sony Corp 半導体装置及びその製造方法
JP3883706B2 (ja) * 1998-07-31 2007-02-21 シャープ株式会社 エッチング方法、及び薄膜トランジスタマトリックス基板の製造方法
JP4159713B2 (ja) * 1998-11-25 2008-10-01 株式会社半導体エネルギー研究所 半導体装置
JP2001053283A (ja) * 1999-08-12 2001-02-23 Semiconductor Energy Lab Co Ltd 半導体装置及びその作製方法

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