JP2001523371A - 切換電流メモリセルのためのクロックフィードスルー低減システム - Google Patents
切換電流メモリセルのためのクロックフィードスルー低減システムInfo
- Publication number
- JP2001523371A JP2001523371A JP51370398A JP51370398A JP2001523371A JP 2001523371 A JP2001523371 A JP 2001523371A JP 51370398 A JP51370398 A JP 51370398A JP 51370398 A JP51370398 A JP 51370398A JP 2001523371 A JP2001523371 A JP 2001523371A
- Authority
- JP
- Japan
- Prior art keywords
- current
- voltage
- electrode
- switch
- control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 230000009467 reduction Effects 0.000 title description 5
- 230000000694 effects Effects 0.000 claims abstract description 46
- 230000008878 coupling Effects 0.000 claims abstract description 16
- 238000010168 coupling process Methods 0.000 claims abstract description 16
- 238000005859 coupling reaction Methods 0.000 claims abstract description 16
- 239000003990 capacitor Substances 0.000 claims description 40
- 230000004044 response Effects 0.000 claims description 12
- 238000000034 method Methods 0.000 claims description 10
- 230000008859 change Effects 0.000 description 9
- 230000006870 function Effects 0.000 description 9
- 230000008569 process Effects 0.000 description 7
- 238000002347 injection Methods 0.000 description 6
- 239000007924 injection Substances 0.000 description 6
- 230000009471 action Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000002411 adverse Effects 0.000 description 2
- 230000006399 behavior Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000005669 field effect Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000002457 bidirectional effect Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 239000011435 rock Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
- G11C27/02—Sample-and-hold arrangements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
- G11C27/02—Sample-and-hold arrangements
- G11C27/024—Sample-and-hold arrangements using a capacitive memory element
- G11C27/028—Current mode circuits, e.g. switched current memories
Landscapes
- Control Of Electrical Variables (AREA)
- Analogue/Digital Conversion (AREA)
- Dram (AREA)
- Semiconductor Memories (AREA)
- Electronic Switches (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/714,376 | 1996-09-16 | ||
| US08/714,376 US5783952A (en) | 1996-09-16 | 1996-09-16 | Clock feedthrough reduction system for switched current memory cells |
| PCT/US1997/015590 WO1998011554A1 (en) | 1996-09-16 | 1997-09-04 | Clock feedthrough reduction system for switched current memory cells |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP2001523371A true JP2001523371A (ja) | 2001-11-20 |
Family
ID=24869791
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP51370398A Ceased JP2001523371A (ja) | 1996-09-16 | 1997-09-04 | 切換電流メモリセルのためのクロックフィードスルー低減システム |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US5783952A (enExample) |
| EP (1) | EP0925588B1 (enExample) |
| JP (1) | JP2001523371A (enExample) |
| KR (1) | KR100466082B1 (enExample) |
| CN (1) | CN1163909C (enExample) |
| DE (1) | DE69717469T2 (enExample) |
| TW (1) | TW337019B (enExample) |
| WO (1) | WO1998011554A1 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004354428A (ja) * | 2003-05-27 | 2004-12-16 | Sony Corp | 表示装置 |
| JP2006221702A (ja) * | 2005-02-09 | 2006-08-24 | Nagoya Institute Of Technology | サンプルホールド回路 |
Families Citing this family (55)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB9720740D0 (en) * | 1997-10-01 | 1997-12-03 | Philips Electronics Nv | Switched-current memory |
| US6028466A (en) * | 1998-02-05 | 2000-02-22 | Lucent Technologies Inc. | Integrated circuit including high transconductance voltage clamp |
| US6307406B1 (en) * | 1998-09-25 | 2001-10-23 | Lucent Technologies, Inc. | Current comparator for current mode circuits |
| JP4193452B2 (ja) * | 2001-08-29 | 2008-12-10 | 日本電気株式会社 | 電流負荷デバイス駆動用半導体装置及びそれを備えた電流負荷デバイス |
| EP2148317B1 (en) * | 2001-08-29 | 2018-06-20 | Gold Charm Limited | A semiconductor device for driving a current load device and a current load device provided therewith |
| US7365713B2 (en) | 2001-10-24 | 2008-04-29 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and driving method thereof |
| US7456810B2 (en) * | 2001-10-26 | 2008-11-25 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting device and driving method thereof |
| US7576734B2 (en) * | 2001-10-30 | 2009-08-18 | Semiconductor Energy Laboratory Co., Ltd. | Signal line driving circuit, light emitting device, and method for driving the same |
| US7742064B2 (en) * | 2001-10-30 | 2010-06-22 | Semiconductor Energy Laboratory Co., Ltd | Signal line driver circuit, light emitting device and driving method thereof |
| US7193619B2 (en) | 2001-10-31 | 2007-03-20 | Semiconductor Energy Laboratory Co., Ltd. | Signal line driving circuit and light emitting device |
| TWI261217B (en) * | 2001-10-31 | 2006-09-01 | Semiconductor Energy Lab | Driving circuit of signal line and light emitting apparatus |
| US6927618B2 (en) * | 2001-11-28 | 2005-08-09 | Semiconductor Energy Laboratory Co., Ltd. | Electric circuit |
| JP2003283271A (ja) | 2002-01-17 | 2003-10-03 | Semiconductor Energy Lab Co Ltd | 電気回路 |
| JP4271479B2 (ja) * | 2003-04-09 | 2009-06-03 | 株式会社半導体エネルギー研究所 | ソースフォロワ及び半導体装置 |
| TW591586B (en) * | 2003-04-10 | 2004-06-11 | Toppoly Optoelectronics Corp | Data-line driver circuits for current-programmed electro-luminescence display device |
| US6844759B2 (en) * | 2003-06-10 | 2005-01-18 | Concordia University | Method and circuit for eliminating charge injection from transistor switches |
| KR100515300B1 (ko) | 2003-10-07 | 2005-09-15 | 삼성에스디아이 주식회사 | 전류 샘플/홀드 회로와 전류 샘플/홀드 방법 및 이를이용한 역다중화 장치와 디스플레이 장치 |
| CA2490858A1 (en) | 2004-12-07 | 2006-06-07 | Ignis Innovation Inc. | Driving method for compensated voltage-programming of amoled displays |
| US7068024B1 (en) * | 2004-12-30 | 2006-06-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Voltage regulator having positive temperature coefficient for self-compensation and related method of regulating voltage |
| TW200707376A (en) | 2005-06-08 | 2007-02-16 | Ignis Innovation Inc | Method and system for driving a light emitting device display |
| US9269322B2 (en) | 2006-01-09 | 2016-02-23 | Ignis Innovation Inc. | Method and system for driving an active matrix display circuit |
| US9489891B2 (en) | 2006-01-09 | 2016-11-08 | Ignis Innovation Inc. | Method and system for driving an active matrix display circuit |
| JP5164857B2 (ja) | 2006-01-09 | 2013-03-21 | イグニス・イノベイション・インコーポレーテッド | アクティブマトリクスディスプレイ回路の駆動方法および表示システム |
| FR2899841B1 (fr) * | 2006-04-12 | 2008-07-04 | Bic Soc | Pointe d'ecriture pour effectuer des traces de differentes largeurs et instrument d'ecriture comprenant une telle pointe |
| CA2660598A1 (en) | 2008-04-18 | 2009-06-22 | Ignis Innovation Inc. | System and driving method for light emitting device display |
| CA2637343A1 (en) | 2008-07-29 | 2010-01-29 | Ignis Innovation Inc. | Improving the display source driver |
| US9370075B2 (en) | 2008-12-09 | 2016-06-14 | Ignis Innovation Inc. | System and method for fast compensation programming of pixels in a display |
| US8283967B2 (en) * | 2009-11-12 | 2012-10-09 | Ignis Innovation Inc. | Stable current source for system integration to display substrate |
| CA2687631A1 (en) | 2009-12-06 | 2011-06-06 | Ignis Innovation Inc | Low power driving scheme for display applications |
| CA2696778A1 (en) | 2010-03-17 | 2011-09-17 | Ignis Innovation Inc. | Lifetime, uniformity, parameter extraction methods |
| KR101132216B1 (ko) * | 2010-12-02 | 2012-04-02 | 금오공과대학교 산학협력단 | 라우팅 더미 커패시터를 구비한 디지털 아날로그 변환기 |
| US9351368B2 (en) | 2013-03-08 | 2016-05-24 | Ignis Innovation Inc. | Pixel circuits for AMOLED displays |
| US9886899B2 (en) | 2011-05-17 | 2018-02-06 | Ignis Innovation Inc. | Pixel Circuits for AMOLED displays |
| US20140368491A1 (en) | 2013-03-08 | 2014-12-18 | Ignis Innovation Inc. | Pixel circuits for amoled displays |
| EP3404646B1 (en) | 2011-05-28 | 2019-12-25 | Ignis Innovation Inc. | Method for fast compensation programming of pixels in a display |
| US9747834B2 (en) | 2012-05-11 | 2017-08-29 | Ignis Innovation Inc. | Pixel circuits including feedback capacitors and reset capacitors, and display systems therefore |
| CN102915071A (zh) * | 2012-10-23 | 2013-02-06 | 南京航空航天大学 | 面向混合信号处理的低电压低功耗开关电流采样保持电路 |
| US8975948B2 (en) * | 2012-11-15 | 2015-03-10 | Texas Instruments Incorporated | Wide common mode range transmission gate |
| US9786223B2 (en) | 2012-12-11 | 2017-10-10 | Ignis Innovation Inc. | Pixel circuits for AMOLED displays |
| US9336717B2 (en) | 2012-12-11 | 2016-05-10 | Ignis Innovation Inc. | Pixel circuits for AMOLED displays |
| US9721505B2 (en) | 2013-03-08 | 2017-08-01 | Ignis Innovation Inc. | Pixel circuits for AMOLED displays |
| CA2894717A1 (en) | 2015-06-19 | 2016-12-19 | Ignis Innovation Inc. | Optoelectronic device characterization in array with shared sense line |
| KR102158382B1 (ko) | 2013-08-22 | 2020-09-22 | 삼성디스플레이 주식회사 | 전류 메모리 셀 및 이를 포함하는 전류 모드 디지털 아날로그 컨버터 |
| CA2873476A1 (en) | 2014-12-08 | 2016-06-08 | Ignis Innovation Inc. | Smart-pixel display architecture |
| CA2886862A1 (en) | 2015-04-01 | 2016-10-01 | Ignis Innovation Inc. | Adjusting display brightness for avoiding overheating and/or accelerated aging |
| US10373554B2 (en) | 2015-07-24 | 2019-08-06 | Ignis Innovation Inc. | Pixels and reference circuits and timing techniques |
| US10657895B2 (en) | 2015-07-24 | 2020-05-19 | Ignis Innovation Inc. | Pixels and reference circuits and timing techniques |
| CA2898282A1 (en) | 2015-07-24 | 2017-01-24 | Ignis Innovation Inc. | Hybrid calibration of current sources for current biased voltage progra mmed (cbvp) displays |
| CA2908285A1 (en) | 2015-10-14 | 2017-04-14 | Ignis Innovation Inc. | Driver with multiple color pixel structure |
| US9715941B2 (en) | 2015-10-30 | 2017-07-25 | Sony Semiconductor Solutions Corporation | State machine controlled MOS linear resistor |
| US9728271B2 (en) * | 2015-10-30 | 2017-08-08 | Sony Semiconductor Solutions Corporation | Charge injection noise reduction in sample-and-hold circuit |
| KR101947303B1 (ko) | 2016-08-16 | 2019-02-12 | 선전 구딕스 테크놀로지 컴퍼니, 리미티드 | 전류 샘플링 유지 회로 및 신호 수집 시스템 |
| KR101767172B1 (ko) | 2016-09-12 | 2017-08-10 | 서울과학기술대학교 산학협력단 | 클락-피드스루(clock-feedthrough) 최소화하기 위한 전류메모리 회로 |
| US11469223B2 (en) * | 2019-05-31 | 2022-10-11 | Analog Devices International Unlimited Company | High precision switched capacitor MOSFET current measurement technique |
| CN115622549B (zh) * | 2022-12-19 | 2023-02-28 | 晟矽微电子(南京)有限公司 | 开关电路、数模转换器、芯片及电子设备 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4958123A (en) * | 1987-12-23 | 1990-09-18 | U.S. Philips Corporation | Circuit arrangement for processing sampled analogue electrical signals |
| US4937469A (en) * | 1988-08-30 | 1990-06-26 | International Business Machines Corporation | Switched current mode driver in CMOS with short circuit protection |
| GB2231424A (en) * | 1989-05-10 | 1990-11-14 | Philips Electronic Associated | Integrator circuit |
| GB2231423A (en) * | 1989-05-10 | 1990-11-14 | Philips Electronic Associated | Integrator circuit |
| GB2234835A (en) * | 1989-08-07 | 1991-02-13 | Philips Electronic Associated | Intergrator circuit |
| GB2235799A (en) * | 1989-09-06 | 1991-03-13 | Philips Electronic Associated | Differentiator circuit |
| US5296752A (en) * | 1991-05-08 | 1994-03-22 | U.S. Philips Corporation | Current memory cell |
| GB9204763D0 (en) * | 1992-03-05 | 1992-04-15 | Philips Electronics Uk Ltd | Signal processing arrangements |
| GB9301463D0 (en) * | 1993-01-26 | 1993-03-17 | Philips Electronics Uk Ltd | Current memory |
| GB9424810D0 (en) * | 1994-12-08 | 1995-02-08 | Philips Electronics Uk Ltd | Current comparator arrangement |
| GB9517787D0 (en) * | 1995-08-31 | 1995-11-01 | Philips Electronics Uk Ltd | Current memory |
-
1996
- 1996-09-16 US US08/714,376 patent/US5783952A/en not_active Expired - Lifetime
-
1997
- 1997-09-04 CN CNB971991340A patent/CN1163909C/zh not_active Expired - Fee Related
- 1997-09-04 WO PCT/US1997/015590 patent/WO1998011554A1/en not_active Ceased
- 1997-09-04 DE DE69717469T patent/DE69717469T2/de not_active Expired - Lifetime
- 1997-09-04 KR KR10-1999-7002163A patent/KR100466082B1/ko not_active Expired - Fee Related
- 1997-09-04 EP EP97940818A patent/EP0925588B1/en not_active Expired - Lifetime
- 1997-09-04 JP JP51370398A patent/JP2001523371A/ja not_active Ceased
- 1997-09-05 TW TW086112807A patent/TW337019B/zh not_active IP Right Cessation
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004354428A (ja) * | 2003-05-27 | 2004-12-16 | Sony Corp | 表示装置 |
| JP2006221702A (ja) * | 2005-02-09 | 2006-08-24 | Nagoya Institute Of Technology | サンプルホールド回路 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1163909C (zh) | 2004-08-25 |
| DE69717469T2 (de) | 2003-06-26 |
| EP0925588B1 (en) | 2002-11-27 |
| EP0925588A1 (en) | 1999-06-30 |
| KR20000036128A (ko) | 2000-06-26 |
| TW337019B (en) | 1998-07-21 |
| DE69717469D1 (de) | 2003-01-09 |
| US5783952A (en) | 1998-07-21 |
| HK1021064A1 (en) | 2000-05-26 |
| CN1234902A (zh) | 1999-11-10 |
| WO1998011554A1 (en) | 1998-03-19 |
| KR100466082B1 (ko) | 2005-01-13 |
| EP0925588A4 (enExample) | 1999-07-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20040721 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20061219 |
|
| A313 | Final decision of rejection without a dissenting response from the applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A313 Effective date: 20070509 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20070619 |