KR100466082B1 - 스위치 전류 메모리 셀용 클록 피드스루 감소 시스템 - Google Patents

스위치 전류 메모리 셀용 클록 피드스루 감소 시스템 Download PDF

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Publication number
KR100466082B1
KR100466082B1 KR10-1999-7002163A KR19997002163A KR100466082B1 KR 100466082 B1 KR100466082 B1 KR 100466082B1 KR 19997002163 A KR19997002163 A KR 19997002163A KR 100466082 B1 KR100466082 B1 KR 100466082B1
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KR
South Korea
Prior art keywords
current
voltage
electrode
control
input
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Expired - Fee Related
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KR10-1999-7002163A
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English (en)
Korean (ko)
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KR20000036128A (ko
Inventor
카자지안진-자크스
Original Assignee
아트멜 코포레이숀
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Application filed by 아트멜 코포레이숀 filed Critical 아트멜 코포레이숀
Publication of KR20000036128A publication Critical patent/KR20000036128A/ko
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Publication of KR100466082B1 publication Critical patent/KR100466082B1/ko
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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G11C27/024—Sample-and-hold arrangements using a capacitive memory element
    • G11C27/028—Current mode circuits, e.g. switched current memories

Landscapes

  • Control Of Electrical Variables (AREA)
  • Analogue/Digital Conversion (AREA)
  • Dram (AREA)
  • Semiconductor Memories (AREA)
  • Electronic Switches (AREA)
KR10-1999-7002163A 1996-09-16 1997-09-04 스위치 전류 메모리 셀용 클록 피드스루 감소 시스템 Expired - Fee Related KR100466082B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/714,376 US5783952A (en) 1996-09-16 1996-09-16 Clock feedthrough reduction system for switched current memory cells
US08/714,376 1996-09-16
US8/714,376 1996-09-16

Publications (2)

Publication Number Publication Date
KR20000036128A KR20000036128A (ko) 2000-06-26
KR100466082B1 true KR100466082B1 (ko) 2005-01-13

Family

ID=24869791

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-1999-7002163A Expired - Fee Related KR100466082B1 (ko) 1996-09-16 1997-09-04 스위치 전류 메모리 셀용 클록 피드스루 감소 시스템

Country Status (8)

Country Link
US (1) US5783952A (enExample)
EP (1) EP0925588B1 (enExample)
JP (1) JP2001523371A (enExample)
KR (1) KR100466082B1 (enExample)
CN (1) CN1163909C (enExample)
DE (1) DE69717469T2 (enExample)
TW (1) TW337019B (enExample)
WO (1) WO1998011554A1 (enExample)

Families Citing this family (58)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9720740D0 (en) * 1997-10-01 1997-12-03 Philips Electronics Nv Switched-current memory
US6028466A (en) * 1998-02-05 2000-02-22 Lucent Technologies Inc. Integrated circuit including high transconductance voltage clamp
US6307406B1 (en) * 1998-09-25 2001-10-23 Lucent Technologies, Inc. Current comparator for current mode circuits
EP2148317B1 (en) 2001-08-29 2018-06-20 Gold Charm Limited A semiconductor device for driving a current load device and a current load device provided therewith
JP4193452B2 (ja) * 2001-08-29 2008-12-10 日本電気株式会社 電流負荷デバイス駆動用半導体装置及びそれを備えた電流負荷デバイス
US7365713B2 (en) 2001-10-24 2008-04-29 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and driving method thereof
US7456810B2 (en) 2001-10-26 2008-11-25 Semiconductor Energy Laboratory Co., Ltd. Light-emitting device and driving method thereof
US7576734B2 (en) * 2001-10-30 2009-08-18 Semiconductor Energy Laboratory Co., Ltd. Signal line driving circuit, light emitting device, and method for driving the same
US7742064B2 (en) * 2001-10-30 2010-06-22 Semiconductor Energy Laboratory Co., Ltd Signal line driver circuit, light emitting device and driving method thereof
US7193619B2 (en) * 2001-10-31 2007-03-20 Semiconductor Energy Laboratory Co., Ltd. Signal line driving circuit and light emitting device
TWI261217B (en) * 2001-10-31 2006-09-01 Semiconductor Energy Lab Driving circuit of signal line and light emitting apparatus
US6927618B2 (en) 2001-11-28 2005-08-09 Semiconductor Energy Laboratory Co., Ltd. Electric circuit
JP2003283271A (ja) * 2002-01-17 2003-10-03 Semiconductor Energy Lab Co Ltd 電気回路
JP4271479B2 (ja) * 2003-04-09 2009-06-03 株式会社半導体エネルギー研究所 ソースフォロワ及び半導体装置
TW591586B (en) * 2003-04-10 2004-06-11 Toppoly Optoelectronics Corp Data-line driver circuits for current-programmed electro-luminescence display device
JP4543625B2 (ja) * 2003-05-27 2010-09-15 ソニー株式会社 表示装置
US6844759B2 (en) * 2003-06-10 2005-01-18 Concordia University Method and circuit for eliminating charge injection from transistor switches
KR100515300B1 (ko) 2003-10-07 2005-09-15 삼성에스디아이 주식회사 전류 샘플/홀드 회로와 전류 샘플/홀드 방법 및 이를이용한 역다중화 장치와 디스플레이 장치
CA2490858A1 (en) 2004-12-07 2006-06-07 Ignis Innovation Inc. Driving method for compensated voltage-programming of amoled displays
US7068024B1 (en) * 2004-12-30 2006-06-27 Taiwan Semiconductor Manufacturing Company, Ltd. Voltage regulator having positive temperature coefficient for self-compensation and related method of regulating voltage
DE102005004608B3 (de) * 2005-02-01 2006-04-20 Siemens Ag Verfahren und Schaltungsanordnung zum Überprüfen von elektrischen Kontaktierungen zwischen einem ersten Ausgangspin eines ersten Leistungsschalters einer Leistungsschaltvorrichtung und einem externen Knoten
JP4779113B2 (ja) * 2005-02-09 2011-09-28 国立大学法人 名古屋工業大学 サンプルホールド回路
KR20080032072A (ko) 2005-06-08 2008-04-14 이그니스 이노베이션 인크. 발광 디바이스 디스플레이 구동 방법 및 시스템
US9489891B2 (en) 2006-01-09 2016-11-08 Ignis Innovation Inc. Method and system for driving an active matrix display circuit
EP1971975B1 (en) 2006-01-09 2015-10-21 Ignis Innovation Inc. Method and system for driving an active matrix display circuit
US9269322B2 (en) 2006-01-09 2016-02-23 Ignis Innovation Inc. Method and system for driving an active matrix display circuit
FR2899841B1 (fr) * 2006-04-12 2008-07-04 Bic Soc Pointe d'ecriture pour effectuer des traces de differentes largeurs et instrument d'ecriture comprenant une telle pointe
CN104299566B (zh) 2008-04-18 2017-11-10 伊格尼斯创新公司 用于发光器件显示器的系统和驱动方法
CA2637343A1 (en) 2008-07-29 2010-01-29 Ignis Innovation Inc. Improving the display source driver
US9370075B2 (en) 2008-12-09 2016-06-14 Ignis Innovation Inc. System and method for fast compensation programming of pixels in a display
US8283967B2 (en) 2009-11-12 2012-10-09 Ignis Innovation Inc. Stable current source for system integration to display substrate
CA2687631A1 (en) 2009-12-06 2011-06-06 Ignis Innovation Inc Low power driving scheme for display applications
CA2696778A1 (en) 2010-03-17 2011-09-17 Ignis Innovation Inc. Lifetime, uniformity, parameter extraction methods
KR101132216B1 (ko) * 2010-12-02 2012-04-02 금오공과대학교 산학협력단 라우팅 더미 커패시터를 구비한 디지털 아날로그 변환기
US20140368491A1 (en) 2013-03-08 2014-12-18 Ignis Innovation Inc. Pixel circuits for amoled displays
US9886899B2 (en) 2011-05-17 2018-02-06 Ignis Innovation Inc. Pixel Circuits for AMOLED displays
US9351368B2 (en) 2013-03-08 2016-05-24 Ignis Innovation Inc. Pixel circuits for AMOLED displays
EP2715711A4 (en) 2011-05-28 2014-12-24 Ignis Innovation Inc SYSTEM AND METHOD FOR FAST COMPENSATION PROGRAMMING OF PIXELS ON A DISPLAY
US9747834B2 (en) 2012-05-11 2017-08-29 Ignis Innovation Inc. Pixel circuits including feedback capacitors and reset capacitors, and display systems therefore
CN102915071A (zh) * 2012-10-23 2013-02-06 南京航空航天大学 面向混合信号处理的低电压低功耗开关电流采样保持电路
US8975948B2 (en) * 2012-11-15 2015-03-10 Texas Instruments Incorporated Wide common mode range transmission gate
US9336717B2 (en) 2012-12-11 2016-05-10 Ignis Innovation Inc. Pixel circuits for AMOLED displays
US9786223B2 (en) 2012-12-11 2017-10-10 Ignis Innovation Inc. Pixel circuits for AMOLED displays
US9721505B2 (en) 2013-03-08 2017-08-01 Ignis Innovation Inc. Pixel circuits for AMOLED displays
CA2894717A1 (en) 2015-06-19 2016-12-19 Ignis Innovation Inc. Optoelectronic device characterization in array with shared sense line
KR102158382B1 (ko) 2013-08-22 2020-09-22 삼성디스플레이 주식회사 전류 메모리 셀 및 이를 포함하는 전류 모드 디지털 아날로그 컨버터
CA2873476A1 (en) 2014-12-08 2016-06-08 Ignis Innovation Inc. Smart-pixel display architecture
CA2886862A1 (en) 2015-04-01 2016-10-01 Ignis Innovation Inc. Adjusting display brightness for avoiding overheating and/or accelerated aging
US10657895B2 (en) 2015-07-24 2020-05-19 Ignis Innovation Inc. Pixels and reference circuits and timing techniques
CA2898282A1 (en) 2015-07-24 2017-01-24 Ignis Innovation Inc. Hybrid calibration of current sources for current biased voltage progra mmed (cbvp) displays
US10373554B2 (en) 2015-07-24 2019-08-06 Ignis Innovation Inc. Pixels and reference circuits and timing techniques
CA2908285A1 (en) 2015-10-14 2017-04-14 Ignis Innovation Inc. Driver with multiple color pixel structure
US9728271B2 (en) * 2015-10-30 2017-08-08 Sony Semiconductor Solutions Corporation Charge injection noise reduction in sample-and-hold circuit
US9715941B2 (en) 2015-10-30 2017-07-25 Sony Semiconductor Solutions Corporation State machine controlled MOS linear resistor
EP3486912B1 (en) 2016-08-16 2021-04-21 Shenzhen Goodix Technology Co., Ltd. Current sampling and holding circuit and signal acquisition system
KR101767172B1 (ko) 2016-09-12 2017-08-10 서울과학기술대학교 산학협력단 클락-피드스루(clock-feedthrough) 최소화하기 위한 전류메모리 회로
US11469223B2 (en) * 2019-05-31 2022-10-11 Analog Devices International Unlimited Company High precision switched capacitor MOSFET current measurement technique
CN115622549B (zh) * 2022-12-19 2023-02-28 晟矽微电子(南京)有限公司 开关电路、数模转换器、芯片及电子设备

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4958123A (en) * 1987-12-23 1990-09-18 U.S. Philips Corporation Circuit arrangement for processing sampled analogue electrical signals
US4937469A (en) * 1988-08-30 1990-06-26 International Business Machines Corporation Switched current mode driver in CMOS with short circuit protection
GB2231423A (en) * 1989-05-10 1990-11-14 Philips Electronic Associated Integrator circuit
GB2231424A (en) * 1989-05-10 1990-11-14 Philips Electronic Associated Integrator circuit
GB2234835A (en) * 1989-08-07 1991-02-13 Philips Electronic Associated Intergrator circuit
GB2235799A (en) * 1989-09-06 1991-03-13 Philips Electronic Associated Differentiator circuit
US5296752A (en) * 1991-05-08 1994-03-22 U.S. Philips Corporation Current memory cell
GB9204763D0 (en) * 1992-03-05 1992-04-15 Philips Electronics Uk Ltd Signal processing arrangements
GB9301463D0 (en) * 1993-01-26 1993-03-17 Philips Electronics Uk Ltd Current memory
GB9424810D0 (en) * 1994-12-08 1995-02-08 Philips Electronics Uk Ltd Current comparator arrangement
GB9517787D0 (en) * 1995-08-31 1995-11-01 Philips Electronics Uk Ltd Current memory

Also Published As

Publication number Publication date
CN1163909C (zh) 2004-08-25
DE69717469D1 (de) 2003-01-09
HK1021064A1 (en) 2000-05-26
EP0925588B1 (en) 2002-11-27
US5783952A (en) 1998-07-21
EP0925588A1 (en) 1999-06-30
KR20000036128A (ko) 2000-06-26
EP0925588A4 (enExample) 1999-07-21
TW337019B (en) 1998-07-21
JP2001523371A (ja) 2001-11-20
WO1998011554A1 (en) 1998-03-19
DE69717469T2 (de) 2003-06-26
CN1234902A (zh) 1999-11-10

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