JP2001304816A5 - - Google Patents
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- Publication number
- JP2001304816A5 JP2001304816A5 JP2000166833A JP2000166833A JP2001304816A5 JP 2001304816 A5 JP2001304816 A5 JP 2001304816A5 JP 2000166833 A JP2000166833 A JP 2000166833A JP 2000166833 A JP2000166833 A JP 2000166833A JP 2001304816 A5 JP2001304816 A5 JP 2001304816A5
- Authority
- JP
- Japan
- Prior art keywords
- reflected light
- granular
- spot pattern
- laser
- movement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000003384 imaging method Methods 0.000 claims 4
- 238000000034 method Methods 0.000 claims 3
- 239000003550 marker Substances 0.000 claims 2
- 230000004297 night vision Effects 0.000 claims 2
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
Priority Applications (9)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000166833A JP2001304816A (ja) | 2000-04-26 | 2000-04-26 | レーザ反射光による粒状斑点模様を利用した移動量測定方式とその装置 |
| KR1020010021051A KR100995287B1 (ko) | 2000-04-26 | 2001-04-19 | 레이저 반사광에 의한 입상반점모양을 이용한 이동량측정방법과 그 장치 |
| EP01109671A EP1152210B1 (en) | 2000-04-26 | 2001-04-19 | Method and apparatus to measure amount of movement using granular speck pattern generated by reflecting laser beam |
| DE60135602T DE60135602D1 (de) | 2000-04-26 | 2001-04-19 | Verfahren und Vorrichtung zur Bewegungsmessung unter Verwendung eines von einem reflektierten Laserstrahl stammenden körnigen Fleckenmusters |
| US09/838,905 US6847910B2 (en) | 2000-04-26 | 2001-04-20 | Method and apparatus to measure amount of movement using granular speck pattern generated by reflecting laser beam |
| US09/973,247 US20020080264A1 (en) | 2000-04-26 | 2001-10-09 | Method and apparatus for direct image pick-up of granular speck pattern generated by reflecting light of laser beam |
| US10/737,336 US7165007B2 (en) | 2000-04-26 | 2003-12-16 | Method and apparatus for direct image pick-up of granular speck pattern generated by reflecting light of laser beam |
| US10/958,807 US7257510B2 (en) | 2000-04-26 | 2004-10-05 | Method and apparatus to measure amount of movement using granular speck pattern generated by reflecting laser beam |
| US11/468,895 US20060293865A1 (en) | 2000-04-26 | 2006-08-31 | Method and apparatus for direct image pick-up of granular speck pattern generated by reflecting light of laser beam |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000166833A JP2001304816A (ja) | 2000-04-26 | 2000-04-26 | レーザ反射光による粒状斑点模様を利用した移動量測定方式とその装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2001304816A JP2001304816A (ja) | 2001-10-31 |
| JP2001304816A5 true JP2001304816A5 (https=) | 2005-10-20 |
Family
ID=18670091
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000166833A Pending JP2001304816A (ja) | 2000-04-26 | 2000-04-26 | レーザ反射光による粒状斑点模様を利用した移動量測定方式とその装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (5) | US6847910B2 (https=) |
| EP (1) | EP1152210B1 (https=) |
| JP (1) | JP2001304816A (https=) |
| KR (1) | KR100995287B1 (https=) |
| DE (1) | DE60135602D1 (https=) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001304816A (ja) * | 2000-04-26 | 2001-10-31 | Kenichiro Kobayashi | レーザ反射光による粒状斑点模様を利用した移動量測定方式とその装置 |
| JP2002162355A (ja) * | 2000-11-27 | 2002-06-07 | Hiroyuki Konno | レーザ反射光による粒状斑点模様の直接撮像方法とその装置 |
| KR20030080162A (ko) * | 2002-04-06 | 2003-10-11 | 김희식 | 촬상소자 센서를 이용한 실시간 구조물 변위 계측기 |
| US7364081B2 (en) * | 2003-12-02 | 2008-04-29 | Hand Held Products, Inc. | Method and apparatus for reading under sampled bar code symbols |
| US7825972B2 (en) * | 2004-10-08 | 2010-11-02 | Cooper Allan J | Processing method device and system to produce a focused image signal from an unfocused image |
| CN1300548C (zh) * | 2005-03-23 | 2007-02-14 | 天津大学 | 基于共面标定参照物的线结构光传感器快速标定方法 |
| JP4914039B2 (ja) * | 2005-07-27 | 2012-04-11 | キヤノン株式会社 | 情報処理方法および装置 |
| JP2007064864A (ja) * | 2005-09-01 | 2007-03-15 | Toyo Seiki Seisakusho:Kk | 歪み計測方法、歪み計測装置 |
| JP2007170955A (ja) | 2005-12-21 | 2007-07-05 | Nagasaki Univ | 変位/ひずみ計測方法及び変位/ひずみ計測装置 |
| FI20065063A0 (fi) * | 2006-01-30 | 2006-01-30 | Visicamet Oy | Menetelmä ja mittalaite mitata pinnan siirtymä |
| JP2008304190A (ja) * | 2007-06-05 | 2008-12-18 | Toyo Seiki Seisakusho:Kk | レーザ反射光による被計測物の高精度変位計測方法とその装置 |
| US20130201297A1 (en) * | 2012-02-07 | 2013-08-08 | Alcatel-Lucent Usa Inc. | Lensless compressive image acquisition |
| US9344736B2 (en) | 2010-09-30 | 2016-05-17 | Alcatel Lucent | Systems and methods for compressive sense imaging |
| KR102107345B1 (ko) | 2019-12-11 | 2020-05-06 | 조성민 | 코킹 및 궤적연습용 골프 스윙 연습기 |
| CN111856480B (zh) * | 2020-07-29 | 2023-11-10 | 南京工程学院 | 一种设备位移快速检测方法及检测系统 |
| CN111854623B (zh) * | 2020-07-29 | 2022-02-11 | 南京工程学院 | 一种物体微小形变的快速检测方法及检测系统 |
| KR102770644B1 (ko) | 2022-08-25 | 2025-02-21 | (주)디엠비에이치 | 2개의 imu센서를 이용한 스윙연습기 |
| KR20250050308A (ko) | 2023-10-06 | 2025-04-15 | (주)디엠비에이치 | 2개의 imu센서를 이용한 스윙연습기 |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5219557Y2 (https=) * | 1971-03-31 | 1977-05-06 | ||
| US4591996A (en) * | 1981-05-18 | 1986-05-27 | Vachon Reginald I | Apparatus and method for determining stress and strain in pipes, pressure vessels, structural members and other deformable bodies |
| US4621063A (en) * | 1982-10-12 | 1986-11-04 | The Center For Immunological Studies | Methods for the detection and quantitation of immunological substances |
| US4794384A (en) * | 1984-09-27 | 1988-12-27 | Xerox Corporation | Optical translator device |
| US4798469A (en) * | 1985-10-02 | 1989-01-17 | Burke Victor B | Noncontact gage system utilizing reflected light |
| US4824250A (en) * | 1986-11-17 | 1989-04-25 | Newman John W | Non-destructive testing by laser scanning |
| JPH0421255A (ja) * | 1990-05-16 | 1992-01-24 | Canon Inc | カラー画像読取装置 |
| JPH05288516A (ja) * | 1992-04-07 | 1993-11-02 | Honda Motor Co Ltd | 非接触式位置検出装置 |
| JP2519375B2 (ja) * | 1992-08-18 | 1996-07-31 | 新日本製鐵株式会社 | レ―ザ距離計を用いた厚さ測定装置 |
| FR2701762B1 (fr) | 1993-02-19 | 1995-05-24 | Centre Nat Etd Spatiales | Dispositif de restitution d'orbite de corps célestes, notamment de satellites artificiels, par écartométrie. |
| US5343287A (en) * | 1993-04-05 | 1994-08-30 | The United States Of America As Represented By The Secretary Of The Air Force | Integrated atmospheric transverse coherence length/laser radiation angle-of-arrival measurement system |
| JP2681745B2 (ja) * | 1993-10-08 | 1997-11-26 | 岸本産業株式会社 | レーザ光を利用したスペックルパターンによる被計測物の上下および横移動量の測定方法。 |
| US6097477A (en) * | 1994-05-27 | 2000-08-01 | American Research Corporation Of Virginia | Laser speckle strain and deformation sensor using linear array image cross-correlation method for specifically arranged triple-beam triple-camera configuration |
| US5633714A (en) * | 1994-12-19 | 1997-05-27 | International Business Machines Corporation | Preprocessing of image amplitude and phase data for CD and OL measurement |
| JP3029238B2 (ja) * | 1995-08-08 | 2000-04-04 | 岸本産業株式会社 | レーザ光を用いた被計測物の遠近方向の移動量測定方法 |
| US5694480A (en) * | 1995-08-30 | 1997-12-02 | Tsukishima Kikai Co., Ltd. | Molten slag flow rate measuring device and furnace facilities using the same |
| SG52900A1 (en) * | 1996-01-08 | 1998-09-28 | Matsushita Electric Industrial Co Ltd | Mounting apparatus of electronic components and mounting methods of the same |
| DE19620419A1 (de) * | 1996-05-21 | 1997-11-27 | Ettemeyer Gmbh & Co Mes Und Pr | Verfahren zur berührungslosen und markierungsfreien Messung von Verschiebungen |
| DE19739679A1 (de) | 1996-09-18 | 1998-10-01 | Univ Ilmenau Tech | Streulichtsensor |
| CA2276462C (en) * | 1996-12-31 | 2007-06-12 | High Throughput Genomics, Inc. | Multiplexed molecular analysis system apparatus and method |
| DE69806952T2 (de) * | 1997-05-16 | 2002-11-21 | Forskningscenter Riso, Roskilde | Speckle verfahren und apparatur zur bestimmung von winkelverschiebung, oberflächenverschiebung und torsion |
| JP3867389B2 (ja) | 1998-03-05 | 2007-01-10 | フジノン株式会社 | カメラのエクステンダー装置 |
| US6424407B1 (en) * | 1998-03-09 | 2002-07-23 | Otm Technologies Ltd. | Optical translation measurement |
| JP2961413B1 (ja) * | 1998-04-16 | 1999-10-12 | 岸本産業株式会社 | レーザ投影法による計測器から被計測物までの非接触による前後移動距離計測方法 |
| DE19817664A1 (de) | 1998-04-21 | 1999-11-04 | Peter Lehmann | Verfahren und Vorrichtung zur Rauheitsmessung an technischen Oberflächen bei Beleuchtung mit einem Specklemuster |
| KR100296668B1 (ko) * | 1998-06-01 | 2001-10-26 | 윤종용 | 웨이퍼검사장비및이를이용한웨이퍼검사방법 |
| US6262818B1 (en) * | 1998-10-07 | 2001-07-17 | Institute Of Applied Optics, Swiss Federal Institute Of Technology | Method for simultaneous amplitude and quantitative phase contrast imaging by numerical reconstruction of digital holograms |
| JP2001304816A (ja) | 2000-04-26 | 2001-10-31 | Kenichiro Kobayashi | レーザ反射光による粒状斑点模様を利用した移動量測定方式とその装置 |
-
2000
- 2000-04-26 JP JP2000166833A patent/JP2001304816A/ja active Pending
-
2001
- 2001-04-19 KR KR1020010021051A patent/KR100995287B1/ko not_active Expired - Fee Related
- 2001-04-19 EP EP01109671A patent/EP1152210B1/en not_active Expired - Lifetime
- 2001-04-19 DE DE60135602T patent/DE60135602D1/de not_active Expired - Lifetime
- 2001-04-20 US US09/838,905 patent/US6847910B2/en not_active Expired - Fee Related
- 2001-10-09 US US09/973,247 patent/US20020080264A1/en not_active Abandoned
-
2003
- 2003-12-16 US US10/737,336 patent/US7165007B2/en not_active Expired - Fee Related
-
2004
- 2004-10-05 US US10/958,807 patent/US7257510B2/en not_active Expired - Fee Related
-
2006
- 2006-08-31 US US11/468,895 patent/US20060293865A1/en not_active Abandoned
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