FI20065063A0 - Menetelmä ja mittalaite mitata pinnan siirtymä - Google Patents

Menetelmä ja mittalaite mitata pinnan siirtymä

Info

Publication number
FI20065063A0
FI20065063A0 FI20065063A FI20065063A FI20065063A0 FI 20065063 A0 FI20065063 A0 FI 20065063A0 FI 20065063 A FI20065063 A FI 20065063A FI 20065063 A FI20065063 A FI 20065063A FI 20065063 A0 FI20065063 A0 FI 20065063A0
Authority
FI
Finland
Prior art keywords
measuring
displacement
measuring device
Prior art date
Application number
FI20065063A
Other languages
English (en)
Swedish (sv)
Inventor
Hannu Jokinen
Original Assignee
Visicamet Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Visicamet Oy filed Critical Visicamet Oy
Priority to FI20065063A priority Critical patent/FI20065063A0/fi
Publication of FI20065063A0 publication Critical patent/FI20065063A0/fi
Priority to BRPI0707526-0A priority patent/BRPI0707526A2/pt
Priority to CA002640507A priority patent/CA2640507A1/en
Priority to CN2007800037998A priority patent/CN101375127B/zh
Priority to EP20070730623 priority patent/EP1979705A4/en
Priority to JP2008551813A priority patent/JP2009525464A/ja
Priority to KR1020087021307A priority patent/KR101402326B1/ko
Priority to US12/223,323 priority patent/US8107089B2/en
Priority to EA200801617A priority patent/EA011851B1/ru
Priority to AU2007209273A priority patent/AU2007209273B2/en
Priority to PCT/FI2007/050049 priority patent/WO2007085704A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P13/00—Indicating or recording presence, absence, or direction, of movement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/36—Devices characterised by the use of optical means, e.g. using infrared, visible, or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/64—Devices characterised by the determination of the time taken to traverse a fixed distance
    • G01P3/68—Devices characterised by the determination of the time taken to traverse a fixed distance using optical means, i.e. using infrared, visible, or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/64—Devices characterised by the determination of the time taken to traverse a fixed distance
    • G01P3/80—Devices characterised by the determination of the time taken to traverse a fixed distance using auto-correlation or cross-correlation detection means
    • G01P3/806—Devices characterised by the determination of the time taken to traverse a fixed distance using auto-correlation or cross-correlation detection means in devices of the type to be classified in G01P3/68
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S11/00—Systems for determining distance or velocity not using reflection or reradiation
FI20065063A 2006-01-30 2006-01-30 Menetelmä ja mittalaite mitata pinnan siirtymä FI20065063A0 (fi)

Priority Applications (11)

Application Number Priority Date Filing Date Title
FI20065063A FI20065063A0 (fi) 2006-01-30 2006-01-30 Menetelmä ja mittalaite mitata pinnan siirtymä
PCT/FI2007/050049 WO2007085704A1 (en) 2006-01-30 2007-01-30 Method and measuring device for measuring translation of surface
EP20070730623 EP1979705A4 (en) 2006-01-30 2007-01-30 METHOD AND MEASURING DEVICE FOR MEASURING SURFACE TRANSLATION
CA002640507A CA2640507A1 (en) 2006-01-30 2007-01-30 Method and measuring device for measuring translation of surface
CN2007800037998A CN101375127B (zh) 2006-01-30 2007-01-30 用于测量表面平移的方法和测量设备
BRPI0707526-0A BRPI0707526A2 (pt) 2006-01-30 2007-01-30 método e dispositivo de medição para medir a translação de uma superfìcie
JP2008551813A JP2009525464A (ja) 2006-01-30 2007-01-30 表面の並進運動を測定する方法と装置
KR1020087021307A KR101402326B1 (ko) 2006-01-30 2007-01-30 표면의 병진이동을 측정하기 위한 방법 및 측정 장치
US12/223,323 US8107089B2 (en) 2006-01-30 2007-01-30 Method and measuring device for measuring translation of surface
EA200801617A EA011851B1 (ru) 2006-01-30 2007-01-30 Способ и устройство для измерения перемещения поверхности
AU2007209273A AU2007209273B2 (en) 2006-01-30 2007-01-30 Method and measuring device for measuring translation of surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20065063A FI20065063A0 (fi) 2006-01-30 2006-01-30 Menetelmä ja mittalaite mitata pinnan siirtymä

Publications (1)

Publication Number Publication Date
FI20065063A0 true FI20065063A0 (fi) 2006-01-30

Family

ID=35883960

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20065063A FI20065063A0 (fi) 2006-01-30 2006-01-30 Menetelmä ja mittalaite mitata pinnan siirtymä

Country Status (11)

Country Link
US (1) US8107089B2 (fi)
EP (1) EP1979705A4 (fi)
JP (1) JP2009525464A (fi)
KR (1) KR101402326B1 (fi)
CN (1) CN101375127B (fi)
AU (1) AU2007209273B2 (fi)
BR (1) BRPI0707526A2 (fi)
CA (1) CA2640507A1 (fi)
EA (1) EA011851B1 (fi)
FI (1) FI20065063A0 (fi)
WO (1) WO2007085704A1 (fi)

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DE102007013299A1 (de) * 2007-03-06 2008-09-11 Cedes Ag Sensorvorrichtung sowie Anlage mit einem Förderer und einer Sensorvorrichtung
JP2009084009A (ja) * 2007-10-01 2009-04-23 Hitachi Ltd 移動体速度検出装置
DE102007062996A1 (de) * 2007-12-21 2009-06-25 Robert Bosch Gmbh Werkzeugmaschinenvorrichtung
CN102128947B (zh) * 2010-01-14 2012-12-12 宝山钢铁股份有限公司 一种冲压成形中板材与模具相对滑动速度的检测方法及传感器
IT1398006B1 (it) * 2010-02-11 2013-02-04 Danieli Automation Spa Dispositivo per l'analisi e la determinazione delle caratteristiche di movimento di prodotti, in particolare in una linea di colata, e relativo procedimento.
ITVR20100143A1 (it) * 2010-07-15 2012-01-16 Microtec Srl Metodo ed apparecchiatura per determinare lunghezza e/o velocità di pezzi di legname che avanzano longitudinalmente su un trasportatore
KR101939267B1 (ko) * 2010-07-21 2019-01-16 삼성전자주식회사 주사기의 주사량 측정 장치 및 방법
US8804136B2 (en) * 2012-12-06 2014-08-12 Asm Technology Singapore Pte Ltd Apparatus and method for locating a plurality of placement positions on a carrier object
US10834065B1 (en) 2015-03-31 2020-11-10 F5 Networks, Inc. Methods for SSL protected NTLM re-authentication and devices thereof
RU2619805C2 (ru) * 2015-09-28 2017-05-18 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Череповецкий государственный университет" Способ измерения амплитуды неплоскостности листового проката
JP2017111232A (ja) * 2015-12-15 2017-06-22 コニカミノルタ株式会社 画像形成装置、制御方法、および制御プログラム
US10404698B1 (en) 2016-01-15 2019-09-03 F5 Networks, Inc. Methods for adaptive organization of web application access points in webtops and devices thereof
CN114026436A (zh) * 2019-06-25 2022-02-08 索尼集团公司 图像处理装置、图像处理方法和程序
CN112577971A (zh) * 2019-09-30 2021-03-30 深圳中科飞测科技股份有限公司 一种检测方法、系统及设备
IL273288B2 (en) * 2020-03-12 2023-10-01 Elbit Systems Ltd A system and method for detecting relative motion between two or more bodies

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US3508066A (en) * 1966-06-16 1970-04-21 Marconi Co Ltd Apparatus comprising light-electric translating device for measuring speed of moving member having an ordinary surface
US3890462A (en) * 1974-04-17 1975-06-17 Bell Telephone Labor Inc Speed and direction indicator for video systems
US4162509A (en) * 1978-06-21 1979-07-24 The United States Of America As Represented By The Secretary Of The Army Non-contact velocimeter using arrays
US4495589A (en) * 1982-09-20 1985-01-22 Crane Co. Aircraft ground velocity determination system
US4580894A (en) * 1983-06-30 1986-04-08 Itek Corporation Apparatus for measuring velocity of a moving image or object
US4922337B1 (en) * 1988-04-26 1994-05-03 Picker Int Inc Time delay and integration of images using a frame transfer ccd sensor
FI80527C (fi) * 1988-12-13 1990-06-11 Valtion Teknillinen Foerfarande foer optisk faststaellning av en ytas hastighet.
US5149980A (en) * 1991-11-01 1992-09-22 Hewlett-Packard Company Substrate advance measurement system using cross-correlation of light sensor array signals
EP0560610B1 (en) * 1992-03-13 1998-12-09 Canon Kabushiki Kaisha Movement vector detecting apparatus
JPH0763552A (ja) 1993-08-27 1995-03-10 Omron Corp 光電スイッチ
EP0683389A1 (en) * 1994-05-12 1995-11-22 Kabushiki Kaisha Toshiba Laminograph and inspection and repair device using the same
JPH0855887A (ja) 1994-08-10 1996-02-27 Toshiba Corp ラミノグラフ
WO1998030029A1 (fr) * 1996-12-26 1998-07-09 Sony Corporation Dispositif et procede pour synthese d'images
SE9701911D0 (sv) 1997-05-22 1997-05-22 Optronic Consult Ab Sätt och anordning för beröringsfri inmätning av förflyttning
US5936411A (en) * 1997-11-28 1999-08-10 Sarcos L.C. Apparatus and method for measuring strain within a structure
JP2001304816A (ja) 2000-04-26 2001-10-31 Kenichiro Kobayashi レーザ反射光による粒状斑点模様を利用した移動量測定方式とその装置
JP2003279348A (ja) * 2002-03-26 2003-10-02 Seiko Precision Inc 位相差検出方法、位相差検出装置、測距装置および撮像装置
JP2004117010A (ja) 2002-09-24 2004-04-15 Yokogawa Electric Corp 変位測定装置
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JP4189925B2 (ja) 2003-09-05 2008-12-03 福岡県 表面変位計測方法および表面変位計測装置
DE102005009817B4 (de) * 2005-03-03 2008-09-18 Siemens Ag Lochmaske für einen Röntgenstrahlendetektor, Computertomographiegerät, aufweisend eine Lochmaske und Verfahren zur Justierung einer Lochmaske

Also Published As

Publication number Publication date
WO2007085704A1 (en) 2007-08-02
AU2007209273B2 (en) 2012-03-22
BRPI0707526A2 (pt) 2011-05-03
AU2007209273A1 (en) 2007-08-02
CN101375127A (zh) 2009-02-25
CN101375127B (zh) 2011-07-20
CA2640507A1 (en) 2007-08-02
EP1979705A4 (en) 2012-04-25
EP1979705A1 (en) 2008-10-15
JP2009525464A (ja) 2009-07-09
US20100225931A1 (en) 2010-09-09
EA200801617A1 (ru) 2008-12-30
US8107089B2 (en) 2012-01-31
KR20080091283A (ko) 2008-10-09
KR101402326B1 (ko) 2014-06-02
EA011851B1 (ru) 2009-06-30

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Legal Events

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FA Application withdrawn