IT1200725B - Struttura di isolamento in dispositivi mos e procedimento di preparazione della stessa - Google Patents

Struttura di isolamento in dispositivi mos e procedimento di preparazione della stessa

Info

Publication number
IT1200725B
IT1200725B IT21994/85A IT2199485A IT1200725B IT 1200725 B IT1200725 B IT 1200725B IT 21994/85 A IT21994/85 A IT 21994/85A IT 2199485 A IT2199485 A IT 2199485A IT 1200725 B IT1200725 B IT 1200725B
Authority
IT
Italy
Prior art keywords
insulation structure
preparation procedure
mos devices
mos
devices
Prior art date
Application number
IT21994/85A
Other languages
English (en)
Other versions
IT8521994A0 (it
Inventor
Andrea Ravaglia
Original Assignee
Sgs Microelettronica Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sgs Microelettronica Spa filed Critical Sgs Microelettronica Spa
Priority to IT21994/85A priority Critical patent/IT1200725B/it
Publication of IT8521994A0 publication Critical patent/IT8521994A0/it
Priority to GB8612409A priority patent/GB2179788B/en
Priority to NL8602047A priority patent/NL8602047A/nl
Priority to DE3628488A priority patent/DE3628488C2/de
Priority to JP61196978A priority patent/JPH0821613B2/ja
Priority to FR868612138A priority patent/FR2586860B1/fr
Priority to US07/178,822 priority patent/US4868136A/en
Application granted granted Critical
Publication of IT1200725B publication Critical patent/IT1200725B/it

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76—Making of isolation regions between components
    • H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/76202—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO
    • H01L21/76221—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO with a plurality of successive local oxidation steps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/308—Chemical or electrical treatment, e.g. electrolytic etching using masks
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/32—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers using masks
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/975—Substrate or mask aligning feature

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Element Separation (AREA)
IT21994/85A 1985-08-28 1985-08-28 Struttura di isolamento in dispositivi mos e procedimento di preparazione della stessa IT1200725B (it)

Priority Applications (7)

Application Number Priority Date Filing Date Title
IT21994/85A IT1200725B (it) 1985-08-28 1985-08-28 Struttura di isolamento in dispositivi mos e procedimento di preparazione della stessa
GB8612409A GB2179788B (en) 1985-08-28 1986-05-21 Isolation structure in mos devices and process of preparing the same
NL8602047A NL8602047A (nl) 1985-08-28 1986-08-11 Isolatiestructuur in een mos-inrichting en een werkwijze om dit te bereiden.
DE3628488A DE3628488C2 (de) 1985-08-28 1986-08-22 Verfahren zur Herstellung von Isolationsstrukturen in MOS-Bauelementen
JP61196978A JPH0821613B2 (ja) 1985-08-28 1986-08-22 Ｍｏｓ装置の分離構造の製造方法
FR868612138A FR2586860B1 (fr) 1985-08-28 1986-08-27 Dispositif semi-conducteur mos a structure d'isolement perfectionnee et son procede de preparation.
US07/178,822 US4868136A (en) 1985-08-28 1988-03-24 Process of forming an isolation structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT21994/85A IT1200725B (it) 1985-08-28 1985-08-28 Struttura di isolamento in dispositivi mos e procedimento di preparazione della stessa

Publications (2)

Publication Number Publication Date
IT8521994A0 IT8521994A0 (it) 1985-08-28
IT1200725B true IT1200725B (it) 1989-01-27

Family

ID=11189929

Family Applications (1)

Application Number Title Priority Date Filing Date
IT21994/85A IT1200725B (it) 1985-08-28 1985-08-28 Struttura di isolamento in dispositivi mos e procedimento di preparazione della stessa

Country Status (7)

Country Link
US (1) US4868136A (it)
JP (1) JPH0821613B2 (it)
DE (1) DE3628488C2 (it)
FR (1) FR2586860B1 (it)
GB (1) GB2179788B (it)
IT (1) IT1200725B (it)
NL (1) NL8602047A (it)

Families Citing this family (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4968640A (en) * 1987-02-10 1990-11-06 Industrial Technology Research Institute Isolation structures for integrated circuits
US4981813A (en) * 1987-02-24 1991-01-01 Sgs-Thomson Microelectronics, Inc. Pad oxide protect sealed interface isolation process
JPS6430248A (en) * 1987-07-27 1989-02-01 Hitachi Ltd Formation of on-the-trench insulation film
US4906585A (en) * 1987-08-04 1990-03-06 Siemens Aktiengesellschaft Method for manufacturing wells for CMOS transistor circuits separated by insulating trenches
JPH02151050A (ja) * 1988-12-01 1990-06-11 Nec Corp 半導体装置
US5256592A (en) * 1989-10-20 1993-10-26 Oki Electric Industry Co., Ltd. Method for fabricating a semiconductor integrated circuit device
US5120675A (en) * 1990-06-01 1992-06-09 Texas Instruments Incorporated Method for forming a trench within a semiconductor layer of material
JP3134344B2 (ja) * 1991-05-17 2001-02-13 日本電気株式会社 半導体装置
US5236853A (en) * 1992-02-21 1993-08-17 United Microelectronics Corporation Self-aligned double density polysilicon lines for ROM and EPROM
US5439842A (en) * 1992-09-21 1995-08-08 Siliconix Incorporated Low temperature oxide layer over field implant mask
US5358892A (en) * 1993-02-11 1994-10-25 Micron Semiconductor, Inc. Etch stop useful in avoiding substrate pitting with poly buffered locos
DE69434736D1 (de) * 1993-08-31 2006-06-22 St Microelectronics Inc Isolationsstruktur und Verfahren zur Herstellung
US5372968A (en) * 1993-09-27 1994-12-13 United Microelectronics Corporation Planarized local oxidation by trench-around technology
US5294562A (en) * 1993-09-27 1994-03-15 United Microelectronics Corporation Trench isolation with global planarization using flood exposure
US5308786A (en) * 1993-09-27 1994-05-03 United Microelectronics Corporation Trench isolation for both large and small areas by means of silicon nodules after metal etching
US5366925A (en) * 1993-09-27 1994-11-22 United Microelectronics Corporation Local oxidation of silicon by using aluminum spiking technology
US5330924A (en) * 1993-11-19 1994-07-19 United Microelectronics Corporation Method of making 0.6 micrometer word line pitch ROM cell by 0.6 micrometer technology
US5543343A (en) * 1993-12-22 1996-08-06 Sgs-Thomson Microelectronics, Inc. Method fabricating an integrated circuit
KR960014455B1 (ko) * 1994-01-12 1996-10-15 금성일렉트론 주식회사 반도체장치의 및 그 제조방법
US5472904A (en) * 1994-03-02 1995-12-05 Micron Technology, Inc. Thermal trench isolation
US5438016A (en) * 1994-03-02 1995-08-01 Micron Semiconductor, Inc. Method of semiconductor device isolation employing polysilicon layer for field oxide formation
KR0156115B1 (ko) * 1994-06-16 1998-12-01 문정환 반도체 소자의 격리막 구조 및 형성방법
KR0148602B1 (ko) * 1994-11-23 1998-12-01 양승택 반도체 장치의 소자 격리방법
US5733794A (en) * 1995-02-06 1998-03-31 Motorola, Inc. Process for forming a semiconductor device with ESD protection
JP2715972B2 (ja) * 1995-03-04 1998-02-18 日本電気株式会社 半導体装置の製造方法
KR0151049B1 (ko) * 1995-05-29 1998-12-01 김광호 반도체장치의 소자분리방법
US5861339A (en) * 1995-10-27 1999-01-19 Integrated Device Technology, Inc. Recessed isolation with double oxidation
KR100190010B1 (ko) * 1995-12-30 1999-06-01 윤종용 반도체 소자의 소자분리막 형성방법
US5904539A (en) * 1996-03-21 1999-05-18 Advanced Micro Devices, Inc. Semiconductor trench isolation process resulting in a silicon mesa having enhanced mechanical and electrical properties
WO1997038442A1 (en) * 1996-04-10 1997-10-16 Advanced Micro Devices, Inc. Semiconductor trench isolation with improved planarization methodology
US5926713A (en) * 1996-04-17 1999-07-20 Advanced Micro Devices, Inc. Method for achieving global planarization by forming minimum mesas in large field areas
US5899727A (en) 1996-05-02 1999-05-04 Advanced Micro Devices, Inc. Method of making a semiconductor isolation region bounded by a trench and covered with an oxide to improve planarization
US5753962A (en) * 1996-09-16 1998-05-19 Micron Technology, Inc. Texturized polycrystalline silicon to aid field oxide formation
US5977638A (en) * 1996-11-21 1999-11-02 Cypress Semiconductor Corp. Edge metal for interconnect layers
US5897354A (en) * 1996-12-17 1999-04-27 Cypress Semiconductor Corporation Method of forming a non-volatile memory device with ramped tunnel dielectric layer
US6083809A (en) * 1997-10-01 2000-07-04 Texas Instruments Incorporated Oxide profile modification by reactant shunting
US5981358A (en) * 1997-11-06 1999-11-09 Advanced Micro Devices Encroachless LOCOS isolation
US5952707A (en) * 1997-12-05 1999-09-14 Stmicroelectronics, Inc. Shallow trench isolation with thin nitride as gate dielectric
US6022788A (en) * 1997-12-23 2000-02-08 Stmicroelectronics, Inc. Method of forming an integrated circuit having spacer after shallow trench fill and integrated circuit formed thereby
US6124171A (en) * 1998-09-24 2000-09-26 Intel Corporation Method of forming gate oxide having dual thickness by oxidation process
US6127215A (en) * 1998-10-29 2000-10-03 International Business Machines Corp. Deep pivot mask for enhanced buried-channel PFET performance and reliability
DE10131917A1 (de) * 2001-07-02 2003-01-23 Infineon Technologies Ag Verfahren zur Erzeugung einer stufenförmigen Struktur auf einem Substrat
DE10238590B4 (de) 2002-08-22 2007-02-15 Infineon Technologies Ag Verfahren zur Erzeugung einer Struktur auf einem Substrat

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5146083A (en) * 1974-10-18 1976-04-20 Hitachi Ltd Handotaisochino seizohoho
US4131910A (en) * 1977-11-09 1978-12-26 Bell Telephone Laboratories, Incorporated High voltage semiconductor devices
JPS55154748A (en) * 1979-05-23 1980-12-02 Toshiba Corp Complementary mos semiconductor device
JPS5658259A (en) * 1979-10-18 1981-05-21 Toshiba Corp Semiconductor device and production thereof
US4271583A (en) * 1980-03-10 1981-06-09 Bell Telephone Laboratories, Incorporated Fabrication of semiconductor devices having planar recessed oxide isolation region
US4334348A (en) * 1980-07-21 1982-06-15 Data General Corporation Retro-etch process for forming gate electrodes of MOS integrated circuits
US4390393A (en) * 1981-11-12 1983-06-28 General Electric Company Method of forming an isolation trench in a semiconductor substrate
KR880000975B1 (ko) * 1982-08-24 1988-06-07 니혼덴싱뎅와 가부시끼가이샤 반도체 장치의 기판구조 및 그 제조방법
JPS6045037A (ja) * 1983-08-23 1985-03-11 Nippon Telegr & Teleph Corp <Ntt> 半導体装置の基板構造およびその製造方法
NL187373C (nl) * 1982-10-08 1991-09-02 Philips Nv Werkwijze voor vervaardiging van een halfgeleiderinrichting.
JPS59119848A (ja) * 1982-12-27 1984-07-11 Fujitsu Ltd 半導体装置の製造方法
JPS60171761A (ja) * 1984-02-17 1985-09-05 Hitachi Ltd 半導体集積回路装置及びその製造方法
GB2156149A (en) * 1984-03-14 1985-10-02 Philips Electronic Associated Dielectrically-isolated integrated circuit manufacture
JPS60241231A (ja) * 1984-05-15 1985-11-30 Nippon Telegr & Teleph Corp <Ntt> 半導体集積回路装置の製法
US4561172A (en) * 1984-06-15 1985-12-31 Texas Instruments Incorporated Integrated circuit fabrication method utilizing selective etching and oxidation to form isolation regions
JPS6185838A (ja) * 1984-10-04 1986-05-01 Nec Corp 半導体装置の製造方法
US4593459A (en) * 1984-12-28 1986-06-10 Gte Laboratories Incorporated Monolithic integrated circuit structure and method of fabrication

Also Published As

Publication number Publication date
DE3628488A1 (de) 1987-03-05
DE3628488C2 (de) 1995-07-06
IT8521994A0 (it) 1985-08-28
US4868136A (en) 1989-09-19
FR2586860A1 (fr) 1987-03-06
GB8612409D0 (en) 1986-06-25
FR2586860B1 (fr) 1991-07-05
JPS6254936A (ja) 1987-03-10
NL8602047A (nl) 1987-03-16
GB2179788B (en) 1989-08-09
GB2179788A (en) 1987-03-11
JPH0821613B2 (ja) 1996-03-04

Similar Documents

Publication Publication Date Title
IT1200725B (it) Struttura di isolamento in dispositivi mos e procedimento di preparazione della stessa
DK621786A (da) Smoerefedt og fremgangsmaade til fremstilling deraf
KR870700343A (ko) 진주광택 샴푸 및 이의 제조방법
KR860006844A (ko) 반도체장치 및 그 제조방법
BR8706754A (pt) Estrutura de parede de gabinete isolante para uso em aparelho de refrigeracao e semelhantes
DK551187D0 (da) Terapeutisk praeparat og dettes fremstilling
KR880700494A (ko) 전기 터미널 및 그 제조방법
DE3685501D1 (de) Abtast- und halteschaltung.
IT8647745A0 (it) Complesso vetrato multiplo incapsulato e procedimento di fabbricazione
DK565386A (da) Isoleringskomposition
DE3664244D1 (en) Semiconductor device with interconnection and insulating layers
FR2576655B1 (fr) Hauban isolant
KR900014995U (ko) 절연단자 및 모듈
IT1196591B (it) Polipeptidi e loro procedimento di preparazione
KR860007756A (ko) 반도체장치와 그 제조방법
FR2593844B1 (fr) Entrevous isolants et planchers correspondants
IT1222031B (it) Dispositivo di ombreggiamento e di isolamento termico
IT8548420A0 (it) Struttura di copertura e traliccio
KR870006449U (ko) 방한 및 방풍마스크
KR860010668U (ko) 조작장치 또는 작동장치에 있어서의 와이어의 연결부 구조
KR870002665A (ko) 반도체장치 및 그 제조방법
TR23414A (tr) Agartma ve parlaklastirma terkibi ve yoentemi
GB2176228B (en) Improvements in building methods and building devices
BR8503651A (pt) Disposicoes introduzidas em ligacao e instalacao de jarra eletrica
BR8503961A (pt) Aperfeicoamento em dispositivo de acionamento remoto de equipamentos eletricos e similares

Legal Events

Date Code Title Description
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19970829