IT1199828B - Cella di memoria eeprom a singolo livello di polisilicio scrivibile e cancellabile bit a bit - Google Patents
Cella di memoria eeprom a singolo livello di polisilicio scrivibile e cancellabile bit a bitInfo
- Publication number
- IT1199828B IT1199828B IT22800/86A IT2280086A IT1199828B IT 1199828 B IT1199828 B IT 1199828B IT 22800/86 A IT22800/86 A IT 22800/86A IT 2280086 A IT2280086 A IT 2280086A IT 1199828 B IT1199828 B IT 1199828B
- Authority
- IT
- Italy
- Prior art keywords
- bit
- polysilic
- cancellable
- writable
- memory cell
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/68—Floating-gate IGFETs
- H10D30/681—Floating-gate IGFETs having only two programming levels
- H10D30/683—Floating-gate IGFETs having only two programming levels programmed by tunnelling of carriers, e.g. Fowler-Nordheim tunnelling
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT22800/86A IT1199828B (it) | 1986-12-22 | 1986-12-22 | Cella di memoria eeprom a singolo livello di polisilicio scrivibile e cancellabile bit a bit |
| DE8787202392T DE3780784T2 (de) | 1986-12-22 | 1987-12-02 | Eeprom-speicherzelle mit einer einzigen polysiliziumschicht, bitweise schreibbar und loeschbar. |
| EP87202392A EP0272732B1 (en) | 1986-12-22 | 1987-12-02 | Eeprom memory cell with a single level of polysilicon writable and cancellable bit by bit |
| JP62317644A JPS63166274A (ja) | 1986-12-22 | 1987-12-17 | ビット毎に書込みおよび消去可能な単層ポリシリコン層を有するeepromメモリセル |
| US07/136,652 US4935790A (en) | 1986-12-22 | 1987-12-22 | EEPROM memory cell with a single level of polysilicon programmable and erasable bit by bit |
| US08/376,300 USRE37308E1 (en) | 1986-12-22 | 1995-01-23 | EEPROM memory cell with a single level of polysilicon programmable and erasable bit by bit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT22800/86A IT1199828B (it) | 1986-12-22 | 1986-12-22 | Cella di memoria eeprom a singolo livello di polisilicio scrivibile e cancellabile bit a bit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| IT8622800A0 IT8622800A0 (it) | 1986-12-22 |
| IT1199828B true IT1199828B (it) | 1989-01-05 |
Family
ID=11200571
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IT22800/86A IT1199828B (it) | 1986-12-22 | 1986-12-22 | Cella di memoria eeprom a singolo livello di polisilicio scrivibile e cancellabile bit a bit |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4935790A (it) |
| EP (1) | EP0272732B1 (it) |
| JP (1) | JPS63166274A (it) |
| DE (1) | DE3780784T2 (it) |
| IT (1) | IT1199828B (it) |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03206661A (ja) * | 1990-01-09 | 1991-09-10 | Fujitsu Ltd | 半導体装置 |
| JP2933090B2 (ja) * | 1990-04-25 | 1999-08-09 | 富士通株式会社 | 不揮発性半導体記憶装置 |
| JP3083547B2 (ja) * | 1990-07-12 | 2000-09-04 | 株式会社日立製作所 | 半導体集積回路装置 |
| US5355007A (en) * | 1990-11-23 | 1994-10-11 | Texas Instruments Incorporated | Devices for non-volatile memory, systems and methods |
| US5282161A (en) * | 1990-12-31 | 1994-01-25 | Sgs-Thomson Microelectronics S.R.L. | Eeprom cell having a read interface isolated from the write/erase interface |
| DE69018832T2 (de) * | 1990-12-31 | 1995-11-23 | Sgs Thomson Microelectronics | EEPROM-Zelle mit einschichtigem Metallgate und mit einem Lese-Interface des externen Schaltkreises, welches isoliert ist vom Schreib/Lösch-Interface des Programmierungsschaltkreises. |
| US5217915A (en) * | 1991-04-08 | 1993-06-08 | Texas Instruments Incorporated | Method of making gate array base cell |
| US5412599A (en) * | 1991-09-26 | 1995-05-02 | Sgs-Thomson Microelectronics, S.R.L. | Null consumption, nonvolatile, programmable switch |
| JP3293893B2 (ja) * | 1991-12-09 | 2002-06-17 | 株式会社東芝 | 半導体不揮発性記憶装置の製造方法 |
| US5440159A (en) * | 1993-09-20 | 1995-08-08 | Atmel Corporation | Single layer polysilicon EEPROM having uniform thickness gate oxide/capacitor dielectric layer |
| JP2663863B2 (ja) * | 1994-04-19 | 1997-10-15 | 日本電気株式会社 | 不揮発性半導体記憶装置 |
| US5753954A (en) * | 1996-07-19 | 1998-05-19 | National Semiconductor Corporation | Single-poly neuron MOS transistor |
| US5719427A (en) * | 1997-01-14 | 1998-02-17 | Pericom Semiconductor Corp. | Avalanche-enhanced CMOS transistor for EPROM/EEPROM and ESD-protection structures |
| US5885871A (en) * | 1997-07-31 | 1999-03-23 | Stmicrolelectronics, Inc. | Method of making EEPROM cell structure |
| US6044018A (en) * | 1998-06-17 | 2000-03-28 | Mosel Vitelic, Inc. | Single-poly flash memory cell for embedded application and related methods |
| JP3503538B2 (ja) * | 1999-08-20 | 2004-03-08 | セイコーエプソン株式会社 | 半導体記憶装置 |
| EP1091408A1 (en) * | 1999-10-07 | 2001-04-11 | STMicroelectronics S.r.l. | Non-volatile memory cell with a single level of polysilicon |
| EP1096575A1 (en) | 1999-10-07 | 2001-05-02 | STMicroelectronics S.r.l. | Non-volatile memory cell with a single level of polysilicon and corresponding manufacturing process |
| US6747308B2 (en) * | 2001-12-28 | 2004-06-08 | Texas Instruments Incorporated | Single poly EEPROM with reduced area |
| KR100505107B1 (ko) * | 2003-01-08 | 2005-07-29 | 삼성전자주식회사 | 이이피롬 장치 |
| JP2005353984A (ja) | 2004-06-14 | 2005-12-22 | Seiko Epson Corp | 不揮発性記憶装置 |
| JP4591691B2 (ja) * | 2005-06-07 | 2010-12-01 | セイコーエプソン株式会社 | 半導体装置 |
| JP4548603B2 (ja) | 2005-06-08 | 2010-09-22 | セイコーエプソン株式会社 | 半導体装置 |
| JP2006344735A (ja) * | 2005-06-08 | 2006-12-21 | Seiko Epson Corp | 半導体装置 |
| JP4404032B2 (ja) * | 2005-09-09 | 2010-01-27 | セイコーエプソン株式会社 | 集積回路装置及び電子機器 |
| JP4613761B2 (ja) | 2005-09-09 | 2011-01-19 | セイコーエプソン株式会社 | 集積回路装置及び電子機器 |
| JP4665677B2 (ja) | 2005-09-09 | 2011-04-06 | セイコーエプソン株式会社 | 集積回路装置及び電子機器 |
| KR100667909B1 (ko) * | 2005-12-29 | 2007-01-11 | 매그나칩 반도체 유한회사 | 비휘발성 반도체 메모리 장치 |
| US8040212B2 (en) * | 2009-07-22 | 2011-10-18 | Volterra Semiconductor Corporation | Low profile inductors for high density circuit boards |
| JP5668905B2 (ja) * | 2009-09-07 | 2015-02-12 | セイコーNpc株式会社 | 不揮発性半導体メモリ |
| US11282844B2 (en) * | 2018-06-27 | 2022-03-22 | Ememory Technology Inc. | Erasable programmable non-volatile memory including two floating gate transistors with the same floating gate |
| US10846458B2 (en) | 2018-08-30 | 2020-11-24 | Taiwan Semiconductor Manufacturing Company Ltd. | Engineering change order cell structure having always-on transistor |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL7500550A (nl) * | 1975-01-17 | 1976-07-20 | Philips Nv | Halfgeleider-geheugeninrichting. |
| US4037242A (en) * | 1975-12-29 | 1977-07-19 | Texas Instruments Incorporated | Dual injector, floating gate MOS electrically alterable, non-volatile semiconductor memory device |
| DE3007892C2 (de) * | 1980-03-01 | 1982-06-09 | Deutsche Itt Industries Gmbh, 7800 Freiburg | Floating-Gate-Speicherzelle |
| US4404577A (en) * | 1980-06-30 | 1983-09-13 | International Business Machines Corp. | Electrically alterable read only memory cell |
| DE3029539A1 (de) * | 1980-08-04 | 1982-03-11 | Deutsche Itt Industries Gmbh, 7800 Freiburg | Nichtfluechtige, programmierbare integrierte halbleiterspeicherzelle |
| JPS6034198B2 (ja) * | 1980-11-26 | 1985-08-07 | 富士通株式会社 | 不揮発性メモリ |
| DE3174417D1 (en) * | 1980-12-08 | 1986-05-22 | Toshiba Kk | Semiconductor memory device |
| US4531203A (en) * | 1980-12-20 | 1985-07-23 | Tokyo Shibaura Denki Kabushiki Kaisha | Semiconductor memory device and method for manufacturing the same |
| US4558339A (en) * | 1982-03-09 | 1985-12-10 | Rca Corporation | Electrically alterable, nonvolatile floating gate memory device |
| WO1983003167A1 (en) * | 1982-03-09 | 1983-09-15 | Rca Corp | An electrically alterable, nonvolatile floating gate memory device |
| JPS5960797A (ja) * | 1982-09-30 | 1984-04-06 | Toshiba Corp | 不揮発性半導体メモリ装置 |
| JPS59155968A (ja) * | 1983-02-25 | 1984-09-05 | Toshiba Corp | 半導体記憶装置 |
| JPS6074577A (ja) * | 1983-09-30 | 1985-04-26 | Toshiba Corp | 不揮発性半導体メモリ装置 |
| JPS60260147A (ja) * | 1984-06-06 | 1985-12-23 | Fujitsu Ltd | 半導体装置 |
| US4616245A (en) * | 1984-10-29 | 1986-10-07 | Ncr Corporation | Direct-write silicon nitride EEPROM cell |
| US4649520A (en) * | 1984-11-07 | 1987-03-10 | Waferscale Integration Inc. | Single layer polycrystalline floating gate |
| JPH06101548B2 (ja) * | 1985-03-30 | 1994-12-12 | 株式会社東芝 | 半導体記憶装置 |
-
1986
- 1986-12-22 IT IT22800/86A patent/IT1199828B/it active
-
1987
- 1987-12-02 EP EP87202392A patent/EP0272732B1/en not_active Expired
- 1987-12-02 DE DE8787202392T patent/DE3780784T2/de not_active Expired - Fee Related
- 1987-12-17 JP JP62317644A patent/JPS63166274A/ja active Pending
- 1987-12-22 US US07/136,652 patent/US4935790A/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| US4935790A (en) | 1990-06-19 |
| EP0272732B1 (en) | 1992-07-29 |
| JPS63166274A (ja) | 1988-07-09 |
| DE3780784T2 (de) | 1993-03-18 |
| DE3780784D1 (de) | 1992-09-03 |
| EP0272732A3 (en) | 1989-03-15 |
| EP0272732A2 (en) | 1988-06-29 |
| IT8622800A0 (it) | 1986-12-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| TA | Fee payment date (situation as of event date), data collected since 19931001 |
Effective date: 19961227 |