IT1198108B - Cella di memori aeeprom a due livelli di polisilicio con zona di ossiso di tunnel - Google Patents

Cella di memori aeeprom a due livelli di polisilicio con zona di ossiso di tunnel

Info

Publication number
IT1198108B
IT1198108B IT22372/86A IT2237286A IT1198108B IT 1198108 B IT1198108 B IT 1198108B IT 22372/86 A IT22372/86 A IT 22372/86A IT 2237286 A IT2237286 A IT 2237286A IT 1198108 B IT1198108 B IT 1198108B
Authority
IT
Italy
Prior art keywords
polysilicio
aisprom
oxyde
tunnel
level
Prior art date
Application number
IT22372/86A
Other languages
English (en)
Other versions
IT8622372A0 (it
Inventor
Carlo Riva
Original Assignee
Sgs Microelettronica Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sgs Microelettronica Spa filed Critical Sgs Microelettronica Spa
Priority to IT22372/86A priority Critical patent/IT1198108B/it
Publication of IT8622372A0 publication Critical patent/IT8622372A0/it
Priority to EP87202038A priority patent/EP0271932A3/en
Priority to JP62288599A priority patent/JPS63136572A/ja
Application granted granted Critical
Publication of IT1198108B publication Critical patent/IT1198108B/it

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/788Field effect transistors with field effect produced by an insulated gate with floating gate
    • H01L29/7881Programmable transistors with only two possible levels of programmation
    • H01L29/7883Programmable transistors with only two possible levels of programmation charging by tunnelling of carriers, e.g. Fowler-Nordheim tunnelling
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B69/00Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Non-Volatile Memory (AREA)
IT22372/86A 1986-11-18 1986-11-18 Cella di memori aeeprom a due livelli di polisilicio con zona di ossiso di tunnel IT1198108B (it)

Priority Applications (3)

Application Number Priority Date Filing Date Title
IT22372/86A IT1198108B (it) 1986-11-18 1986-11-18 Cella di memori aeeprom a due livelli di polisilicio con zona di ossiso di tunnel
EP87202038A EP0271932A3 (en) 1986-11-18 1987-10-23 Eeprom memory cell with two levels of polysilicon and a tunnel oxide zone
JP62288599A JPS63136572A (ja) 1986-11-18 1987-11-17 2層のポリシリコン層とトンネル酸化区域を有するeepromメモリセル

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT22372/86A IT1198108B (it) 1986-11-18 1986-11-18 Cella di memori aeeprom a due livelli di polisilicio con zona di ossiso di tunnel

Publications (2)

Publication Number Publication Date
IT8622372A0 IT8622372A0 (it) 1986-11-18
IT1198108B true IT1198108B (it) 1988-12-21

Family

ID=11195368

Family Applications (1)

Application Number Title Priority Date Filing Date
IT22372/86A IT1198108B (it) 1986-11-18 1986-11-18 Cella di memori aeeprom a due livelli di polisilicio con zona di ossiso di tunnel

Country Status (3)

Country Link
EP (1) EP0271932A3 (it)
JP (1) JPS63136572A (it)
IT (1) IT1198108B (it)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5060034A (en) * 1988-11-01 1991-10-22 Casio Computer Co., Ltd. Memory device using thin film transistors having an insulation film with si/n composition ratio of 0.85 to 1.1
US7800156B2 (en) 2008-02-25 2010-09-21 Tower Semiconductor Ltd. Asymmetric single poly NMOS non-volatile memory cell
US8344440B2 (en) 2008-02-25 2013-01-01 Tower Semiconductor Ltd. Three-terminal single poly NMOS non-volatile memory cell with shorter program/erase times
US7859043B2 (en) 2008-02-25 2010-12-28 Tower Semiconductor Ltd. Three-terminal single poly NMOS non-volatile memory cell

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5292441A (en) * 1976-01-30 1977-08-03 Toshiba Corp Semiconductor memory unit
DE2743422A1 (de) * 1977-09-27 1979-03-29 Siemens Ag Wortweise loeschbarer, nicht fluechtiger speicher in floating-gate-technik
US4479203A (en) * 1981-11-16 1984-10-23 Motorola, Inc. Electrically erasable programmable read only memory cell
JPS59121880A (ja) * 1982-12-28 1984-07-14 Toshiba Corp 不揮発性半導体記憶装置

Also Published As

Publication number Publication date
EP0271932A3 (en) 1988-12-07
JPS63136572A (ja) 1988-06-08
EP0271932A2 (en) 1988-06-22
IT8622372A0 (it) 1986-11-18

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