IL156119A0 - Hollow cathode target and methods of making same - Google Patents
Hollow cathode target and methods of making sameInfo
- Publication number
- IL156119A0 IL156119A0 IL15611901A IL15611901A IL156119A0 IL 156119 A0 IL156119 A0 IL 156119A0 IL 15611901 A IL15611901 A IL 15611901A IL 15611901 A IL15611901 A IL 15611901A IL 156119 A0 IL156119 A0 IL 156119A0
- Authority
- IL
- Israel
- Prior art keywords
- methods
- making same
- hollow cathode
- cathode target
- target
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/342—Hollow targets
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3488—Constructional details of particle beam apparatus not otherwise provided for, e.g. arrangement, mounting, housing, environment; special provisions for cleaning or maintenance of the apparatus
- H01J37/3491—Manufacturing of targets
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US25311600P | 2000-11-27 | 2000-11-27 | |
US29541701P | 2001-06-01 | 2001-06-01 | |
PCT/US2001/043376 WO2002042513A2 (en) | 2000-11-27 | 2001-11-20 | Hollow cathode target and methods of making same |
Publications (1)
Publication Number | Publication Date |
---|---|
IL156119A0 true IL156119A0 (en) | 2003-12-23 |
Family
ID=26942945
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL15611901A IL156119A0 (en) | 2000-11-27 | 2001-11-20 | Hollow cathode target and methods of making same |
Country Status (11)
Country | Link |
---|---|
US (2) | US6887356B2 (ru) |
EP (1) | EP1339894B1 (ru) |
JP (1) | JP4828782B2 (ru) |
KR (1) | KR100831543B1 (ru) |
CN (1) | CN1293229C (ru) |
AU (1) | AU2002236445A1 (ru) |
IL (1) | IL156119A0 (ru) |
MX (1) | MXPA03004635A (ru) |
RU (1) | RU2261288C2 (ru) |
TW (1) | TW573032B (ru) |
WO (1) | WO2002042513A2 (ru) |
Families Citing this family (55)
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US6331233B1 (en) * | 2000-02-02 | 2001-12-18 | Honeywell International Inc. | Tantalum sputtering target with fine grains and uniform texture and method of manufacture |
KR20040043161A (ko) * | 2001-07-19 | 2004-05-22 | 허니웰 인터내셔널 인코포레이티드 | 스퍼터링 타겟, 스퍼터 리액터, 주조잉곳을 제조하는 방법및 금속제품을 제조하는 방법 |
KR100572263B1 (ko) * | 2001-11-26 | 2006-04-24 | 가부시키 가이샤 닛코 마테리알즈 | 스퍼터링 타겟트 및 그 제조방법 |
JP4911744B2 (ja) * | 2002-09-13 | 2012-04-04 | トーソー エスエムディー,インク. | スパッターされる材料の基板への均一な付着を助長する結晶方位を有する非平面スパッターターゲットと該ターゲットを製造する方法 |
US20040065546A1 (en) * | 2002-10-04 | 2004-04-08 | Michaluk Christopher A. | Method to recover spent components of a sputter target |
TWI341337B (en) * | 2003-01-07 | 2011-05-01 | Cabot Corp | Powder metallurgy sputtering targets and methods of producing same |
US20040262157A1 (en) * | 2003-02-25 | 2004-12-30 | Ford Robert B. | Method of forming sputtering target assembly and assemblies made therefrom |
US7297247B2 (en) * | 2003-05-06 | 2007-11-20 | Applied Materials, Inc. | Electroformed sputtering target |
US7228722B2 (en) | 2003-06-09 | 2007-06-12 | Cabot Corporation | Method of forming sputtering articles by multidirectional deformation |
US20040256226A1 (en) * | 2003-06-20 | 2004-12-23 | Wickersham Charles E. | Method and design for sputter target attachment to a backing plate |
EP1666630A4 (en) * | 2003-09-12 | 2012-06-27 | Jx Nippon Mining & Metals Corp | SPUTTERTARGET AND METHOD FOR FINISHING THE SURFACE OF SUCH A TARGET |
JP4391478B2 (ja) * | 2003-10-15 | 2009-12-24 | 日鉱金属株式会社 | ホローカソード型スパッタリングターゲットの包装装置及び包装方法 |
US7910218B2 (en) | 2003-10-22 | 2011-03-22 | Applied Materials, Inc. | Cleaning and refurbishing chamber components having metal coatings |
US20050252268A1 (en) * | 2003-12-22 | 2005-11-17 | Michaluk Christopher A | High integrity sputtering target material and method for producing bulk quantities of same |
EP1704266A2 (en) * | 2003-12-22 | 2006-09-27 | Cabot Corporation | High integrity sputtering target material and method for producing bulk quantities of same |
RU2006137650A (ru) * | 2004-03-26 | 2008-05-10 | Х.К. Штарк Инк. (US) | Чаши из тугоплавких металлов |
US20050279630A1 (en) * | 2004-06-16 | 2005-12-22 | Dynamic Machine Works, Inc. | Tubular sputtering targets and methods of flowforming the same |
US7922065B2 (en) | 2004-08-02 | 2011-04-12 | Ati Properties, Inc. | Corrosion resistant fluid conducting parts, methods of making corrosion resistant fluid conducting parts and equipment and parts replacement methods utilizing corrosion resistant fluid conducting parts |
JP2008531298A (ja) * | 2005-01-12 | 2008-08-14 | ニュー・ヨーク・ユニヴァーシティ | ホログラフィック光ピンセットによりナノワイヤを処理するためのシステムおよび方法 |
US7998287B2 (en) | 2005-02-10 | 2011-08-16 | Cabot Corporation | Tantalum sputtering target and method of fabrication |
US7708868B2 (en) * | 2005-07-08 | 2010-05-04 | Tosoh Smd, Inc. | Variable thickness plate for forming variable wall thickness physical vapor deposition target |
US8617672B2 (en) | 2005-07-13 | 2013-12-31 | Applied Materials, Inc. | Localized surface annealing of components for substrate processing chambers |
US7762114B2 (en) * | 2005-09-09 | 2010-07-27 | Applied Materials, Inc. | Flow-formed chamber component having a textured surface |
AT8697U1 (de) | 2005-10-14 | 2006-11-15 | Plansee Se | Rohrtarget |
US9127362B2 (en) | 2005-10-31 | 2015-09-08 | Applied Materials, Inc. | Process kit and target for substrate processing chamber |
US8647484B2 (en) * | 2005-11-25 | 2014-02-11 | Applied Materials, Inc. | Target for sputtering chamber |
CZ308045B6 (cs) | 2006-03-07 | 2019-11-20 | Cabot Corp | Způsob výroby kovového výrobku a kovová deska, vyrobená tímto způsobem |
US20070251818A1 (en) * | 2006-05-01 | 2007-11-01 | Wuwen Yi | Copper physical vapor deposition targets and methods of making copper physical vapor deposition targets |
US20070251819A1 (en) * | 2006-05-01 | 2007-11-01 | Kardokus Janine K | Hollow cathode magnetron sputtering targets and methods of forming hollow cathode magnetron sputtering targets |
US7776166B2 (en) * | 2006-12-05 | 2010-08-17 | Praxair Technology, Inc. | Texture and grain size controlled hollow cathode magnetron targets and method of manufacture |
US7981262B2 (en) * | 2007-01-29 | 2011-07-19 | Applied Materials, Inc. | Process kit for substrate processing chamber |
US7942969B2 (en) | 2007-05-30 | 2011-05-17 | Applied Materials, Inc. | Substrate cleaning chamber and components |
US8968536B2 (en) * | 2007-06-18 | 2015-03-03 | Applied Materials, Inc. | Sputtering target having increased life and sputtering uniformity |
JP4874879B2 (ja) * | 2007-06-21 | 2012-02-15 | Jx日鉱日石金属株式会社 | エルビウムスパッタリングターゲット及びその製造方法 |
US8702919B2 (en) * | 2007-08-13 | 2014-04-22 | Honeywell International Inc. | Target designs and related methods for coupled target assemblies, methods of production and uses thereof |
US20090084317A1 (en) * | 2007-09-28 | 2009-04-02 | Applied Materials, Inc. | Atomic layer deposition chamber and components |
US7901552B2 (en) | 2007-10-05 | 2011-03-08 | Applied Materials, Inc. | Sputtering target with grooves and intersecting channels |
EP2226828A1 (en) | 2007-12-28 | 2010-09-08 | Institute For Metals Superplasticity Problems Of The Russian Academy Of Sciences (IMSP RAS) | Cold cathode and a method for the production thereof |
DE102008007605A1 (de) | 2008-02-04 | 2009-08-06 | Uhde Gmbh | Modifiziertes Nickel |
WO2010051040A1 (en) * | 2008-11-03 | 2010-05-06 | Tosoh Smd, Inc. | Method of making a sputter target and sputter targets made thereby |
CN102301018B (zh) * | 2009-01-29 | 2015-07-15 | 吉坤日矿日石金属株式会社 | 高纯度铒的制造方法、高纯度铒、包含高纯度铒的溅射靶以及以高纯度铒为主要成分的金属栅膜 |
WO2010134417A1 (ja) * | 2009-05-22 | 2010-11-25 | Jx日鉱日石金属株式会社 | タンタルスパッタリングターゲット |
RU2454483C2 (ru) * | 2010-05-19 | 2012-06-27 | Федеральное государственное бюджетное учреждение науки Институт физики твердого тела Российской академии наук (ИФТТ РАН) | Способ производства литой мишени из сплава на основе тантала для магнетронного распыления |
SG186765A1 (en) * | 2010-08-09 | 2013-02-28 | Jx Nippon Mining & Metals Corp | Tantalum sputtering target |
JP5607512B2 (ja) * | 2010-11-24 | 2014-10-15 | 古河電気工業株式会社 | 円筒状ターゲット材、その製造方法、及び、そのシート被覆方法 |
US8869443B2 (en) | 2011-03-02 | 2014-10-28 | Ati Properties, Inc. | Composite gun barrel with outer sleeve made from shape memory alloy to dampen firing vibrations |
CN102517550B (zh) * | 2011-12-20 | 2014-07-09 | 宁波江丰电子材料有限公司 | 高纯钽靶材的制备方法和高纯钽靶材 |
US10118259B1 (en) | 2012-12-11 | 2018-11-06 | Ati Properties Llc | Corrosion resistant bimetallic tube manufactured by a two-step process |
US9508532B2 (en) | 2013-03-13 | 2016-11-29 | Bb Plasma Design Ab | Magnetron plasma apparatus |
RU2548019C1 (ru) * | 2013-11-28 | 2015-04-10 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Ульяновский государственный университет" | Способ и устройство извлечения из цилиндрической мишени полученных в результате облучения целевых компонентов |
US9771637B2 (en) | 2014-12-09 | 2017-09-26 | Ati Properties Llc | Composite crucibles and methods of making and using the same |
WO2016187011A2 (en) | 2015-05-15 | 2016-11-24 | Materion Corporation | Methods for surface preparation of sputtering target |
CN111590279A (zh) * | 2020-06-03 | 2020-08-28 | 福建阿石创新材料股份有限公司 | 一种高纯金属旋转靶材及其制备方法 |
CN112808833B (zh) * | 2020-12-31 | 2023-01-10 | 有研科技集团有限公司 | 一种制备高性能铁磁性靶材的方法 |
RU2763719C1 (ru) * | 2021-04-27 | 2021-12-30 | Федеральное государственное бюджетное образовательное учреждение высшего образования "Омский государственный технический университет"(ОмГТУ) | Способ изготовления катодов для установок магнетронного распыления из тугоплавких металлов |
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US3800406A (en) * | 1969-03-20 | 1974-04-02 | Trw Inc | Tantalum clad niobium |
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JPH0774436B2 (ja) * | 1990-09-20 | 1995-08-09 | 富士通株式会社 | 薄膜形成方法 |
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JPH04371578A (ja) | 1991-06-19 | 1992-12-24 | Sony Corp | マグネトロンスパッタリング装置 |
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DE19651615C1 (de) | 1996-12-12 | 1997-07-10 | Fraunhofer Ges Forschung | Verfahren zum Aufbringen von Kohlenstoffschichten durch reaktives Magnetron-Sputtern |
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KR20000062587A (ko) | 1999-03-02 | 2000-10-25 | 로버트 에이. 바쎄트 | 박막 증착에 사용 및 재사용하기 위한 열분사에 의한스퍼터 타깃의 제조 및 재충전 방법 |
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US6462339B1 (en) * | 2000-09-20 | 2002-10-08 | Cabot Corporation | Method for quantifying the texture homogeneity of a polycrystalline material |
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-
2001
- 2001-11-09 US US10/036,338 patent/US6887356B2/en not_active Expired - Lifetime
- 2001-11-20 WO PCT/US2001/043376 patent/WO2002042513A2/en active Application Filing
- 2001-11-20 AU AU2002236445A patent/AU2002236445A1/en not_active Abandoned
- 2001-11-20 EP EP01985970.1A patent/EP1339894B1/en not_active Expired - Lifetime
- 2001-11-20 MX MXPA03004635A patent/MXPA03004635A/es unknown
- 2001-11-20 KR KR1020037007050A patent/KR100831543B1/ko active IP Right Grant
- 2001-11-20 RU RU2003119076/02A patent/RU2261288C2/ru not_active IP Right Cessation
- 2001-11-20 IL IL15611901A patent/IL156119A0/xx unknown
- 2001-11-20 JP JP2002545213A patent/JP4828782B2/ja not_active Expired - Fee Related
- 2001-11-20 CN CNB018222552A patent/CN1293229C/zh not_active Expired - Fee Related
- 2001-11-27 TW TW90129308A patent/TW573032B/zh not_active IP Right Cessation
-
2005
- 2005-03-28 US US11/091,029 patent/US7468110B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
AU2002236445A1 (en) | 2002-06-03 |
US20030019746A1 (en) | 2003-01-30 |
US7468110B2 (en) | 2008-12-23 |
US6887356B2 (en) | 2005-05-03 |
JP2004536958A (ja) | 2004-12-09 |
RU2261288C2 (ru) | 2005-09-27 |
EP1339894B1 (en) | 2014-04-23 |
WO2002042513A3 (en) | 2003-06-05 |
EP1339894A2 (en) | 2003-09-03 |
CN1293229C (zh) | 2007-01-03 |
CN1531605A (zh) | 2004-09-22 |
US20050167015A1 (en) | 2005-08-04 |
TW573032B (en) | 2004-01-21 |
MXPA03004635A (es) | 2004-05-17 |
WO2002042513A2 (en) | 2002-05-30 |
KR20030057557A (ko) | 2003-07-04 |
KR100831543B1 (ko) | 2008-05-21 |
RU2003119076A (ru) | 2005-01-10 |
JP4828782B2 (ja) | 2011-11-30 |
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