HK1250975A1 - 電子零件移動裝置以及電子零件輸送裝置 - Google Patents

電子零件移動裝置以及電子零件輸送裝置

Info

Publication number
HK1250975A1
HK1250975A1 HK18110288.0A HK18110288A HK1250975A1 HK 1250975 A1 HK1250975 A1 HK 1250975A1 HK 18110288 A HK18110288 A HK 18110288A HK 1250975 A1 HK1250975 A1 HK 1250975A1
Authority
HK
Hong Kong
Prior art keywords
electronic component
conveying device
moving device
component conveying
component moving
Prior art date
Application number
HK18110288.0A
Other languages
English (en)
Inventor
木村浩之
Original Assignee
上野精機株式會社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 上野精機株式會社 filed Critical 上野精機株式會社
Publication of HK1250975A1 publication Critical patent/HK1250975A1/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2855Environmental, reliability or burn-in testing
    • G01R31/286External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867Handlers or transport devices, e.g. loaders, carriers, trays
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67144Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/02Feeding of components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/02Feeding of components
    • H05K13/021Loading or unloading of containers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/082Integration of non-optical monitoring devices, i.e. using non-optical inspection means, e.g. electrical means, mechanical means or X-rays

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Operations Research (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Specific Conveyance Elements (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
HK18110288.0A 2016-10-18 2018-08-10 電子零件移動裝置以及電子零件輸送裝置 HK1250975A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016204065A JP6164624B1 (ja) 2016-10-18 2016-10-18 電子部品移動装置及び電子部品搬送装置
PCT/JP2017/028147 WO2018074034A1 (ja) 2016-10-18 2017-08-02 電子部品移動装置及び電子部品搬送装置

Publications (1)

Publication Number Publication Date
HK1250975A1 true HK1250975A1 (zh) 2019-01-18

Family

ID=59351322

Family Applications (1)

Application Number Title Priority Date Filing Date
HK18110288.0A HK1250975A1 (zh) 2016-10-18 2018-08-10 電子零件移動裝置以及電子零件輸送裝置

Country Status (7)

Country Link
EP (1) EP3336024B1 (zh)
JP (1) JP6164624B1 (zh)
CN (1) CN108137247B (zh)
HK (1) HK1250975A1 (zh)
MY (1) MY196714A (zh)
SG (1) SG11201709049PA (zh)
WO (1) WO2018074034A1 (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108428653B (zh) * 2018-05-23 2023-12-08 重庆市嘉凌新科技有限公司 功率器件封装设备
CN109406921B (zh) * 2018-11-07 2023-08-29 东莞市柏尔电子科技有限公司 一种圆柱形电容的圆盘输送检测装置
DE102019125134A1 (de) 2019-09-18 2021-03-18 Mühlbauer Gmbh & Co. Kg Bauteilhandhabung, Bauteilinspektion
DE102019125127A1 (de) * 2019-09-18 2021-03-18 Mühlbauer Gmbh & Co. Kg Bauteilhandhabung, Bauteilinspektion
JP6775791B1 (ja) * 2020-05-27 2020-10-28 上野精機株式会社 部品受渡し装置
CN115092647B (zh) * 2022-07-26 2023-03-24 深圳市良机自动化设备有限公司 一种高压低压测试装置及测试系统
CN116466150B (zh) * 2023-03-02 2023-09-29 江苏省电子信息产品质量监督检验研究院(江苏省信息安全测评中心) 一种电子电器检测工作台

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006196524A (ja) * 2005-01-11 2006-07-27 Hi-Mecha Corp 半導体チップの分離装置および分離方法
FR2895384B1 (fr) * 2005-12-26 2009-10-30 Sidel Sas Dispositif de transfert selectif d'articles a grande cadence, application au tri de bouteilles, machine de soufflage comportant un tel dispositif
JP5035843B2 (ja) * 2007-12-04 2012-09-26 上野精機株式会社 半導体処理装置
JP2009154889A (ja) 2007-12-25 2009-07-16 Canon Machinery Inc 部品供給装置及びテーピング装置
JP5183220B2 (ja) * 2008-01-18 2013-04-17 株式会社ヒューモラボラトリー 部品分類装置および前記装置を用いた電子部品特性検査分類装置
MY159459A (en) * 2010-11-30 2017-01-13 Ueno Seiki Co Ltd Electronic component holding device, electronic component inspecting device provided therewith, and electronic component classification device provided therewith
MY167646A (en) * 2012-02-28 2018-09-21 Ueno Seiki Co Ltd Abnormal contact detecting method, electronic component holding apparatus, and electronic component carrying apparatus
WO2013171863A1 (ja) * 2012-05-16 2013-11-21 上野精機株式会社 ダイボンダー装置
JP5376386B1 (ja) 2012-12-04 2013-12-25 上野精機株式会社 移載装置
JP5777261B2 (ja) * 2012-12-04 2015-09-09 上野精機株式会社 ダイボンダー装置
WO2014087491A1 (ja) * 2012-12-04 2014-06-12 上野精機株式会社 移載装置
TWI478792B (zh) * 2012-12-27 2015-04-01 Ueno Seiki Co Ltd A method of moving the holding means, an electronic component holding means, and an electronic component handling means
JP5865470B1 (ja) * 2014-11-28 2016-02-17 上野精機株式会社 電子部品搬送装置
US9606171B2 (en) * 2015-01-28 2017-03-28 Asm Technology Singapore Pte Ltd High throughput test handler system
JP5975556B1 (ja) * 2015-12-11 2016-08-23 上野精機株式会社 移載装置
JP5999795B1 (ja) * 2015-12-11 2016-09-28 上野精機株式会社 処理ユニット及び電子部品搬送装置

Also Published As

Publication number Publication date
SG11201709049PA (en) 2018-06-28
MY196714A (en) 2023-05-02
JP2018065636A (ja) 2018-04-26
CN108137247B (zh) 2020-09-25
CN108137247A (zh) 2018-06-08
JP6164624B1 (ja) 2017-07-19
EP3336024B1 (en) 2021-05-26
EP3336024A4 (en) 2018-12-19
WO2018074034A1 (ja) 2018-04-26
EP3336024A1 (en) 2018-06-20

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