GB2603403B - Prevention of bridging between solder joints - Google Patents

Prevention of bridging between solder joints Download PDF

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Publication number
GB2603403B
GB2603403B GB2205176.7A GB202205176A GB2603403B GB 2603403 B GB2603403 B GB 2603403B GB 202205176 A GB202205176 A GB 202205176A GB 2603403 B GB2603403 B GB 2603403B
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GB
United Kingdom
Prior art keywords
bridging
prevention
solder joints
solder
joints
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB2205176.7A
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English (en)
Other versions
GB2603403A (en
GB202205176D0 (en
Inventor
Miyazawa Risa
Watanabe Takahito
Mori Hiroyuki
Okamoto Keishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
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International Business Machines Corp
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Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of GB202205176D0 publication Critical patent/GB202205176D0/en
Publication of GB2603403A publication Critical patent/GB2603403A/en
Application granted granted Critical
Publication of GB2603403B publication Critical patent/GB2603403B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/01Manufacture or treatment
    • H10W70/05Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/01Manufacture or treatment
    • H10W70/05Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
    • H10W70/093Connecting or disconnecting other interconnections thereto or therefrom, e.g. connecting bond wires or bumps
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/01Manufacture or treatment
    • H10W70/05Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
    • H10W70/097Cleaning
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/611Insulating or insulated package substrates; Interposers; Redistribution layers for connecting multiple chips together
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/611Insulating or insulated package substrates; Interposers; Redistribution layers for connecting multiple chips together
    • H10W70/616Insulating or insulated package substrates; Interposers; Redistribution layers for connecting multiple chips together package substrates, interposers or redistribution layers combined with bridge chips
    • H10W70/618Insulating or insulated package substrates; Interposers; Redistribution layers for connecting multiple chips together package substrates, interposers or redistribution layers combined with bridge chips the bridge chips being embedded in the package substrates, interposers or redistribution layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/65Shapes or dispositions of interconnections
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/01Manufacture or treatment
    • H10W74/012Manufacture or treatment of encapsulations on active surfaces of flip-chip devices, e.g. forming underfills
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/10Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/131Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed
    • H10W74/141Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations being on at least the sidewalls of the semiconductor body
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/401Package configurations characterised by multiple insulating or insulated package substrates, interposers or RDLs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/01Manufacture or treatment
    • H10W72/012Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
    • H10W72/01271Cleaning, e.g. oxide removal or de-smearing
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/01Manufacture or treatment
    • H10W72/0198Manufacture or treatment batch processes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/072Connecting or disconnecting of bump connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/072Connecting or disconnecting of bump connectors
    • H10W72/07231Techniques
    • H10W72/07232Compression bonding, e.g. thermocompression bonding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/072Connecting or disconnecting of bump connectors
    • H10W72/07231Techniques
    • H10W72/07236Soldering or alloying
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/072Connecting or disconnecting of bump connectors
    • H10W72/07251Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
    • H10W72/07253Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting changes in shapes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/073Connecting or disconnecting of die-attach connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/221Structures or relative sizes
    • H10W72/222Multilayered bumps, e.g. a coating on top and side surfaces of a bump core
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/231Shapes
    • H10W72/237Multiple bump connectors having different shapes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/241Dispositions, e.g. layouts
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/241Dispositions, e.g. layouts
    • H10W72/242Dispositions, e.g. layouts relative to the surface, e.g. recessed, protruding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/251Materials
    • H10W72/252Materials comprising solid metals or solid metalloids, e.g. PbSn, Ag or Cu
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/281Auxiliary members
    • H10W72/287Flow barriers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/10Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/15Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/721Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
    • H10W90/724Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
GB2205176.7A 2019-09-27 2020-08-19 Prevention of bridging between solder joints Active GB2603403B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US16/585,337 US11004819B2 (en) 2019-09-27 2019-09-27 Prevention of bridging between solder joints
PCT/IB2020/057798 WO2021059047A1 (en) 2019-09-27 2020-08-19 Prevention of bridging between solder joints

Publications (3)

Publication Number Publication Date
GB202205176D0 GB202205176D0 (en) 2022-05-25
GB2603403A GB2603403A (en) 2022-08-03
GB2603403B true GB2603403B (en) 2023-10-25

Family

ID=75163699

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2205176.7A Active GB2603403B (en) 2019-09-27 2020-08-19 Prevention of bridging between solder joints

Country Status (6)

Country Link
US (2) US11004819B2 (enExample)
JP (1) JP7570410B2 (enExample)
CN (1) CN114303231B (enExample)
DE (1) DE112020004630T5 (enExample)
GB (1) GB2603403B (enExample)
WO (1) WO2021059047A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11004819B2 (en) * 2019-09-27 2021-05-11 International Business Machines Corporation Prevention of bridging between solder joints
US11574817B2 (en) 2021-05-05 2023-02-07 International Business Machines Corporation Fabricating an interconnection using a sacrificial layer
US11735529B2 (en) * 2021-05-21 2023-08-22 International Business Machines Corporation Side pad anchored by next adjacent via
KR102587161B1 (ko) * 2022-06-15 2023-10-11 엘지이노텍 주식회사 반도체 패키지
US20240324109A1 (en) * 2023-03-20 2024-09-26 Western Digital Technologies, Inc. Solder barrier contact for an integrated circuit
WO2025252529A1 (en) * 2024-06-05 2025-12-11 Ams-Osram International Gmbh Method for producing a display, display substrate and display

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101246933A (zh) * 2007-02-12 2008-08-20 福葆电子股份有限公司 用于发光二极管磊芯片的焊垫制程
CN101409267A (zh) * 2007-10-12 2009-04-15 恩益禧电子股份有限公司 半导体器件及其制造方法
US20090095514A1 (en) * 2007-10-05 2009-04-16 Shinko Electric Industries Co., Ltd. Wiring board, semiconductor apparatus and method of manufacturing them
CN101552211A (zh) * 2008-04-03 2009-10-07 旭德科技股份有限公司 复合金属基板及其工艺
US20150014027A1 (en) * 2013-07-11 2015-01-15 Shinko Electric Industries Co., Ltd. Wiring board and method for manufacturing the same
CN109378308A (zh) * 2014-12-10 2019-02-22 上海兆芯集成电路有限公司 线路基板和封装结构

Family Cites Families (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02251145A (ja) * 1989-03-24 1990-10-08 Citizen Watch Co Ltd 突起電極形成方法
US5241456A (en) 1990-07-02 1993-08-31 General Electric Company Compact high density interconnect structure
US5785585A (en) * 1995-09-18 1998-07-28 International Business Machines Corporation Polish pad conditioner with radial compensation
US5910341A (en) * 1996-10-31 1999-06-08 International Business Machines Corporation Method of controlling the spread of an adhesive on a circuitized organic substrate
US6544584B1 (en) * 1997-03-07 2003-04-08 International Business Machines Corporation Process for removal of undesirable conductive material on a circuitized substrate and resultant circuitized substrate
JPH10290054A (ja) * 1997-04-16 1998-10-27 Sony Corp プリント配線基板
US6099959A (en) * 1998-07-01 2000-08-08 International Business Machines Corporation Method of controlling the spread of an adhesive on a circuitized organic substrate
US6056831A (en) * 1998-07-10 2000-05-02 International Business Machines Corporation Process for chemically and mechanically enhancing solder surface properties
US6224392B1 (en) * 1998-12-04 2001-05-01 International Business Machines Corporation Compliant high-density land grid array (LGA) connector and method of manufacture
US6177729B1 (en) * 1999-04-03 2001-01-23 International Business Machines Corporation Rolling ball connector
JP2004140050A (ja) 2002-10-16 2004-05-13 Asahi Kasei Chemicals Corp 高信頼性プリント配線板
US7015580B2 (en) * 2003-11-25 2006-03-21 International Business Machines Corporation Roughened bonding pad and bonding wire surfaces for low pressure wire bonding
US7861915B2 (en) 2004-04-16 2011-01-04 Ms2 Technologies, Llc Soldering process
JP4997105B2 (ja) * 2005-05-23 2012-08-08 イビデン株式会社 プリント配線板およびその製造方法
JP5021472B2 (ja) 2005-06-30 2012-09-05 イビデン株式会社 プリント配線板の製造方法
US7999383B2 (en) 2006-07-21 2011-08-16 Bae Systems Information And Electronic Systems Integration Inc. High speed, high density, low power die interconnect system
JP5143382B2 (ja) * 2006-07-27 2013-02-13 オンセミコンダクター・トレーディング・リミテッド 半導体装置及びその製造方法
US20140145328A1 (en) 2009-07-13 2014-05-29 Georgia Tech Research Corporation Interconnect assemblies and methods of making and using same
JP5428667B2 (ja) 2009-09-07 2014-02-26 日立化成株式会社 半導体チップ搭載用基板の製造方法
JP2011082305A (ja) 2009-10-06 2011-04-21 Renesas Electronics Corp 半導体装置およびその製造方法
JP5544872B2 (ja) * 2009-12-25 2014-07-09 富士通セミコンダクター株式会社 半導体装置及びその製造方法
JP2012029418A (ja) * 2010-07-22 2012-02-09 Nagano Japan Radio Co 電力伝送システム
US8901431B2 (en) * 2010-12-16 2014-12-02 Ibiden Co., Ltd. Printed wiring board and method for manufacturing printed wiring board
JP5240742B2 (ja) * 2011-08-25 2013-07-17 京セラ株式会社 携帯通信端末
JP2014007363A (ja) * 2012-06-27 2014-01-16 Renesas Electronics Corp 半導体装置の製造方法および半導体装置
JP5891157B2 (ja) * 2012-09-19 2016-03-22 ルネサスエレクトロニクス株式会社 半導体装置の製造方法
KR20140087541A (ko) 2012-12-31 2014-07-09 삼성전기주식회사 솔더 프린트된 회로 기판 및 회로기판의 솔더 프린팅 방법
US9324557B2 (en) * 2014-03-14 2016-04-26 Avago Technologies General Ip (Singapore) Pte. Ltd. Method for fabricating equal height metal pillars of different diameters
US10249593B2 (en) 2014-06-20 2019-04-02 Agency For Science, Technology And Research Method for bonding a chip to a wafer
JP2016066745A (ja) * 2014-09-25 2016-04-28 イビデン株式会社 プリント配線基板およびこれを備えた半導体装置
JP6434328B2 (ja) 2015-02-04 2018-12-05 新光電気工業株式会社 配線基板及び電子部品装置とそれらの製造方法
TWI575686B (zh) 2015-05-27 2017-03-21 南茂科技股份有限公司 半導體結構
DK3130407T3 (da) * 2015-08-10 2021-02-01 Apator Miitors Aps Fremgangsmåde til binding af en piezoelektrisk ultralydstransducer
US9559081B1 (en) 2015-08-21 2017-01-31 Apple Inc. Independent 3D stacking
US10186478B2 (en) * 2016-12-30 2019-01-22 Texas Instruments Incorporated Packaged semiconductor device with a particle roughened surface
US10622311B2 (en) 2017-08-10 2020-04-14 International Business Machines Corporation High-density interconnecting adhesive tape
US10522436B2 (en) 2017-11-15 2019-12-31 Taiwan Semiconductor Manufacturing Company, Ltd. Planarization of semiconductor packages and structures resulting therefrom
US11166381B2 (en) * 2018-09-25 2021-11-02 International Business Machines Corporation Solder-pinning metal pads for electronic components
US11004819B2 (en) * 2019-09-27 2021-05-11 International Business Machines Corporation Prevention of bridging between solder joints
US11264314B2 (en) * 2019-09-27 2022-03-01 International Business Machines Corporation Interconnection with side connection to substrate
KR102876447B1 (ko) * 2020-09-16 2025-10-24 삼성전자주식회사 반도체 패키지 장치
US12100662B2 (en) 2020-12-18 2024-09-24 Intel Corporation Power-forwarding bridge for inter-chip data signal transfer
KR20250027433A (ko) * 2023-08-18 2025-02-26 삼성전자주식회사 반도체 패키지

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101246933A (zh) * 2007-02-12 2008-08-20 福葆电子股份有限公司 用于发光二极管磊芯片的焊垫制程
US20090095514A1 (en) * 2007-10-05 2009-04-16 Shinko Electric Industries Co., Ltd. Wiring board, semiconductor apparatus and method of manufacturing them
CN101409267A (zh) * 2007-10-12 2009-04-15 恩益禧电子股份有限公司 半导体器件及其制造方法
CN101552211A (zh) * 2008-04-03 2009-10-07 旭德科技股份有限公司 复合金属基板及其工艺
US20150014027A1 (en) * 2013-07-11 2015-01-15 Shinko Electric Industries Co., Ltd. Wiring board and method for manufacturing the same
CN109378308A (zh) * 2014-12-10 2019-02-22 上海兆芯集成电路有限公司 线路基板和封装结构

Also Published As

Publication number Publication date
CN114303231A (zh) 2022-04-08
CN114303231B (zh) 2025-11-28
US20210098404A1 (en) 2021-04-01
JP2022549632A (ja) 2022-11-28
US11456269B2 (en) 2022-09-27
JP7570410B2 (ja) 2024-10-21
GB2603403A (en) 2022-08-03
GB202205176D0 (en) 2022-05-25
US11004819B2 (en) 2021-05-11
DE112020004630T5 (de) 2022-06-09
WO2021059047A1 (en) 2021-04-01
US20210210454A1 (en) 2021-07-08

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