FR2740907B1 - Dispositif a semiconducteur utilisant le carbure de silicium - Google Patents
Dispositif a semiconducteur utilisant le carbure de siliciumInfo
- Publication number
- FR2740907B1 FR2740907B1 FR9612392A FR9612392A FR2740907B1 FR 2740907 B1 FR2740907 B1 FR 2740907B1 FR 9612392 A FR9612392 A FR 9612392A FR 9612392 A FR9612392 A FR 9612392A FR 2740907 B1 FR2740907 B1 FR 2740907B1
- Authority
- FR
- France
- Prior art keywords
- semiconductor device
- silicon carbide
- carbide
- silicon
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 title 1
- 229910010271 silicon carbide Inorganic materials 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
- H01L29/7802—Vertical DMOS transistors, i.e. VDMOS transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System
- H01L29/1608—Silicon carbide
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System
- H01L29/161—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System including two or more of the elements provided for in group H01L29/16, e.g. alloys
- H01L29/165—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System including two or more of the elements provided for in group H01L29/16, e.g. alloys in different semiconductor regions, e.g. heterojunctions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
- H01L29/7802—Vertical DMOS transistors, i.e. VDMOS transistors
- H01L29/7813—Vertical DMOS transistors, i.e. VDMOS transistors with trench gate electrode, e.g. UMOS transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
- H01L29/861—Diodes
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Electrodes Of Semiconductors (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Bipolar Transistors (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US498395P | 1995-10-10 | 1995-10-10 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2740907A1 FR2740907A1 (fr) | 1997-05-09 |
FR2740907B1 true FR2740907B1 (fr) | 1999-05-14 |
Family
ID=21713529
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9612392A Expired - Fee Related FR2740907B1 (fr) | 1995-10-10 | 1996-10-10 | Dispositif a semiconducteur utilisant le carbure de silicium |
Country Status (9)
Country | Link |
---|---|
US (1) | US5877515A (fr) |
JP (1) | JPH09172159A (fr) |
KR (1) | KR970024296A (fr) |
DE (1) | DE19641839A1 (fr) |
FR (1) | FR2740907B1 (fr) |
GB (1) | GB2306250A (fr) |
IT (1) | IT1285498B1 (fr) |
SG (1) | SG64402A1 (fr) |
TW (1) | TW317647B (fr) |
Families Citing this family (64)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08213607A (ja) * | 1995-02-08 | 1996-08-20 | Ngk Insulators Ltd | 半導体装置およびその製造方法 |
JP3327135B2 (ja) * | 1996-09-09 | 2002-09-24 | 日産自動車株式会社 | 電界効果トランジスタ |
JP3461274B2 (ja) * | 1996-10-16 | 2003-10-27 | 株式会社東芝 | 半導体装置 |
JP3206727B2 (ja) * | 1997-02-20 | 2001-09-10 | 富士電機株式会社 | 炭化けい素縦型mosfetおよびその製造方法 |
KR100553650B1 (ko) * | 1997-06-23 | 2006-02-24 | 제임스 알버트 주니어 쿠퍼 | 폭이 넓은 밴드갭 반도체 내의 전력 소자 |
KR20000068738A (ko) * | 1997-08-13 | 2000-11-25 | 모리시타 요이찌 | 반도체기판 및 반도체소자 |
DE19741928C1 (de) * | 1997-09-10 | 1998-09-24 | Siemens Ag | Halbleiterbauelement |
US6624030B2 (en) | 2000-12-19 | 2003-09-23 | Advanced Power Devices, Inc. | Method of fabricating power rectifier device having a laterally graded P-N junction for a channel region |
US6331455B1 (en) | 1999-04-01 | 2001-12-18 | Advanced Power Devices, Inc. | Power rectifier device and method of fabricating power rectifier devices |
US6420225B1 (en) | 1999-04-01 | 2002-07-16 | Apd Semiconductor, Inc. | Method of fabricating power rectifier device |
US6448160B1 (en) | 1999-04-01 | 2002-09-10 | Apd Semiconductor, Inc. | Method of fabricating power rectifier device to vary operating parameters and resulting device |
US6498367B1 (en) | 1999-04-01 | 2002-12-24 | Apd Semiconductor, Inc. | Discrete integrated circuit rectifier device |
DE60033829T2 (de) * | 1999-09-07 | 2007-10-11 | Sixon Inc. | SiC-HALBLEITERSCHEIBE, SiC-HALBLEITERBAUELEMENT SOWIE HERSTELLUNGSVERFAHREN FÜR EINE SiC-HALBLEITERSCHEIBE |
US6303508B1 (en) | 1999-12-16 | 2001-10-16 | Philips Electronics North America Corporation | Superior silicon carbide integrated circuits and method of fabricating |
US6407014B1 (en) | 1999-12-16 | 2002-06-18 | Philips Electronics North America Corporation | Method achieving higher inversion layer mobility in novel silicon carbide semiconductor devices |
US6537860B2 (en) | 2000-12-18 | 2003-03-25 | Apd Semiconductor, Inc. | Method of fabricating power VLSI diode devices |
US6859074B2 (en) * | 2001-01-09 | 2005-02-22 | Broadcom Corporation | I/O circuit using low voltage transistors which can tolerate high voltages even when power supplies are powered off |
EP1267415A3 (fr) * | 2001-06-11 | 2009-04-15 | Kabushiki Kaisha Toshiba | Dispositif semi-conducteur de puissance ayant une région de type RESURF |
JP4288907B2 (ja) * | 2001-08-29 | 2009-07-01 | 株式会社デンソー | 炭化珪素半導体装置及びその製造方法 |
JP2003100657A (ja) * | 2001-09-20 | 2003-04-04 | Nissan Motor Co Ltd | 半導体装置の製造方法 |
US7138836B2 (en) * | 2001-12-03 | 2006-11-21 | Broadcom Corporation | Hot carrier injection suppression circuit |
JP2003174187A (ja) * | 2001-12-07 | 2003-06-20 | Sumitomo Chem Co Ltd | 薄膜半導体エピタキシャル基板及びその製造方法 |
JP3559971B2 (ja) * | 2001-12-11 | 2004-09-02 | 日産自動車株式会社 | 炭化珪素半導体装置およびその製造方法 |
US6515330B1 (en) * | 2002-01-02 | 2003-02-04 | Apd Semiconductor, Inc. | Power device having vertical current path with enhanced pinch-off for current limiting |
US7183575B2 (en) | 2002-02-19 | 2007-02-27 | Nissan Motor Co., Ltd. | High reverse voltage silicon carbide diode and method of manufacturing the same high reverse voltage silicon carbide diode |
US7282739B2 (en) * | 2002-04-26 | 2007-10-16 | Nissan Motor Co., Ltd. | Silicon carbide semiconductor device |
US7074643B2 (en) * | 2003-04-24 | 2006-07-11 | Cree, Inc. | Silicon carbide power devices with self-aligned source and well regions and methods of fabricating same |
JP2006245243A (ja) * | 2005-03-02 | 2006-09-14 | Fuji Electric Device Technology Co Ltd | 半導体装置およびその製造方法 |
US7588961B2 (en) * | 2005-03-30 | 2009-09-15 | Nissan Motor Co., Ltd. | Semiconductor device and manufacturing method thereof |
US8901699B2 (en) | 2005-05-11 | 2014-12-02 | Cree, Inc. | Silicon carbide junction barrier Schottky diodes with suppressed minority carrier injection |
JP4903439B2 (ja) * | 2005-05-31 | 2012-03-28 | 株式会社東芝 | 電界効果トランジスタ |
US7589004B2 (en) * | 2005-06-21 | 2009-09-15 | Los Alamos National Security, Llc | Method for implantation of high dopant concentrations in wide band gap materials |
DE102005047054B4 (de) * | 2005-09-30 | 2008-04-03 | Infineon Technologies Austria Ag | Leistungs-MOS-Transistor mit einer SiC-Driftzone und Verfahren zur Herstellung eines Leistungs-MOS-Transistors |
JP2007299845A (ja) * | 2006-04-28 | 2007-11-15 | Nissan Motor Co Ltd | 半導体装置の製造方法および半導体装置 |
DE102007004320A1 (de) * | 2007-01-29 | 2008-07-31 | Infineon Technologies Ag | Halbleiterbauelement mit vertikalen Strukturen von hohem Aspektverhältnis und Verfahren zur Herstellung einer kapazitiven Struktur in einem Halbleiterkörper |
EP2232559B1 (fr) * | 2007-09-26 | 2019-05-15 | STMicroelectronics N.V. | Redresseur à effet de champ ajustable |
US8148748B2 (en) * | 2007-09-26 | 2012-04-03 | Stmicroelectronics N.V. | Adjustable field effect rectifier |
US8492771B2 (en) | 2007-09-27 | 2013-07-23 | Infineon Technologies Austria Ag | Heterojunction semiconductor device and method |
US20090159896A1 (en) * | 2007-12-20 | 2009-06-25 | General Electric Company | Silicon carbide mosfet devices and methods of making |
WO2010080855A2 (fr) * | 2009-01-06 | 2010-07-15 | Lakota Technologies Inc. | Structures de diode à effet de champ à auto-amorçage et procédés correspondants |
SG183740A1 (en) | 2009-02-20 | 2012-09-27 | Semiconductor Energy Lab | Semiconductor device and manufacturing method of the same |
WO2010127370A2 (fr) * | 2009-05-01 | 2010-11-04 | Lakota Technologies, Inc. | Dispositif de limitation de courant série |
JP5699628B2 (ja) * | 2010-07-26 | 2015-04-15 | 住友電気工業株式会社 | 半導体装置 |
IT1401754B1 (it) * | 2010-08-30 | 2013-08-02 | St Microelectronics Srl | Dispositivo elettronico integrato e relativo metodo di fabbricazione. |
IT1401755B1 (it) | 2010-08-30 | 2013-08-02 | St Microelectronics Srl | Dispositivo elettronico integrato a conduzione verticale e relativo metodo di fabbricazione. |
IT1401756B1 (it) | 2010-08-30 | 2013-08-02 | St Microelectronics Srl | Dispositivo elettronico integrato con struttura di terminazione di bordo e relativo metodo di fabbricazione. |
JP5730521B2 (ja) * | 2010-09-08 | 2015-06-10 | 株式会社日立ハイテクノロジーズ | 熱処理装置 |
US8389348B2 (en) * | 2010-09-14 | 2013-03-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | Mechanism of forming SiC crystalline on Si substrates to allow integration of GaN and Si electronics |
GB2484506A (en) * | 2010-10-13 | 2012-04-18 | Univ Warwick | Heterogrowth |
DE102011053641A1 (de) * | 2011-09-15 | 2013-03-21 | Infineon Technologies Ag | SiC-MOSFET mit hoher Kanalbeweglichkeit |
CN104347708A (zh) * | 2013-08-07 | 2015-02-11 | 中芯国际集成电路制造(北京)有限公司 | 多栅vdmos晶体管及其形成方法 |
JP6228850B2 (ja) * | 2014-01-10 | 2017-11-08 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP6237408B2 (ja) * | 2014-03-28 | 2017-11-29 | 住友電気工業株式会社 | 炭化珪素半導体装置およびその製造方法 |
CN105336775B (zh) * | 2014-07-01 | 2018-03-09 | 无锡华润华晶微电子有限公司 | 一种vdmos器件的元胞结构及其制作方法 |
US10147813B2 (en) | 2016-03-04 | 2018-12-04 | United Silicon Carbide, Inc. | Tunneling field effect transistor |
CN105810722B (zh) * | 2016-03-16 | 2019-04-30 | 中国科学院半导体研究所 | 一种碳化硅mosfet器件及其制备方法 |
CN107086243A (zh) * | 2017-03-16 | 2017-08-22 | 西安电子科技大学 | 具有宽带隙材料与硅材料复合的u‑mosfet |
US10957791B2 (en) * | 2019-03-08 | 2021-03-23 | Infineon Technologies Americas Corp. | Power device with low gate charge and low figure of merit |
CN110429137B (zh) * | 2019-08-15 | 2020-08-21 | 西安电子科技大学 | 具有部分氮化镓/硅半导体材料异质结的vdmos及其制作方法 |
US10777689B1 (en) | 2019-10-18 | 2020-09-15 | Hong Kong Applied Science and Technology Research Institute Company, Limited | Silicon-carbide shielded-MOSFET embedded with a trench Schottky diode and heterojunction gate |
CN116741639A (zh) * | 2023-06-20 | 2023-09-12 | 中国科学院上海微系统与信息技术研究所 | 半导体器件的制备方法及半导体器件 |
CN116895699A (zh) * | 2023-09-08 | 2023-10-17 | 成都蓉矽半导体有限公司 | 一种具有异质结的共源共栅沟槽mosfet及制备方法 |
CN117423729A (zh) * | 2023-12-18 | 2024-01-19 | 深圳天狼芯半导体有限公司 | 一种具有异质结的沟槽栅vdmos及制备方法 |
CN117438446A (zh) * | 2023-12-18 | 2024-01-23 | 深圳天狼芯半导体有限公司 | 一种具有异质结的平面vdmos及制备方法 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2159592A5 (en) * | 1971-11-04 | 1973-06-22 | Anvar | Beta-silicon carbide/silicon semiconductor device - made by epitaxial growth |
JPS60136223A (ja) * | 1983-12-23 | 1985-07-19 | Sharp Corp | 炭化珪素半導体素子の製造方法 |
JPS63254762A (ja) * | 1987-04-13 | 1988-10-21 | Nissan Motor Co Ltd | Cmos半導体装置 |
US5216264A (en) * | 1989-06-07 | 1993-06-01 | Sharp Kabushiki Kaisha | Silicon carbide MOS type field-effect transistor with at least one of the source and drain regions is formed by the use of a schottky contact |
JPH04335538A (ja) * | 1991-05-10 | 1992-11-24 | Mitsubishi Electric Corp | 半導体装置およびその製造方法 |
JPH0521762A (ja) * | 1991-07-10 | 1993-01-29 | Mitsubishi Electric Corp | 電界効果型トランジスタを備えた半導体装置およびその製造方法 |
US5234848A (en) * | 1991-11-05 | 1993-08-10 | Texas Instruments Incorporated | Method for fabricating lateral resonant tunneling transistor with heterojunction barriers |
US5272096A (en) * | 1992-09-29 | 1993-12-21 | Motorola, Inc. | Method for making a bipolar transistor having a silicon carbide layer |
US5506421A (en) * | 1992-11-24 | 1996-04-09 | Cree Research, Inc. | Power MOSFET in silicon carbide |
US5539217A (en) * | 1993-08-09 | 1996-07-23 | Cree Research, Inc. | Silicon carbide thyristor |
US5323040A (en) * | 1993-09-27 | 1994-06-21 | North Carolina State University At Raleigh | Silicon carbide field effect device |
US5378912A (en) * | 1993-11-10 | 1995-01-03 | Philips Electronics North America Corporation | Lateral semiconductor-on-insulator (SOI) semiconductor device having a lateral drift region |
US5510275A (en) * | 1993-11-29 | 1996-04-23 | Texas Instruments Incorporated | Method of making a semiconductor device with a composite drift region composed of a substrate and a second semiconductor material |
US5396085A (en) * | 1993-12-28 | 1995-03-07 | North Carolina State University | Silicon carbide switching device with rectifying-gate |
-
1996
- 1996-09-30 US US08/720,465 patent/US5877515A/en not_active Expired - Fee Related
- 1996-10-09 JP JP8268602A patent/JPH09172159A/ja active Pending
- 1996-10-09 TW TW085112366A patent/TW317647B/zh active
- 1996-10-09 SG SG1996010812A patent/SG64402A1/en unknown
- 1996-10-10 FR FR9612392A patent/FR2740907B1/fr not_active Expired - Fee Related
- 1996-10-10 IT IT96MI002098A patent/IT1285498B1/it active IP Right Grant
- 1996-10-10 KR KR1019960044989A patent/KR970024296A/ko not_active Application Discontinuation
- 1996-10-10 GB GB9621170A patent/GB2306250A/en not_active Withdrawn
- 1996-10-10 DE DE19641839A patent/DE19641839A1/de not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
SG64402A1 (en) | 1999-04-27 |
IT1285498B1 (it) | 1998-06-08 |
ITMI962098A1 (it) | 1998-04-10 |
KR970024296A (ko) | 1997-05-30 |
GB9621170D0 (en) | 1996-11-27 |
GB2306250A (en) | 1997-04-30 |
FR2740907A1 (fr) | 1997-05-09 |
DE19641839A1 (de) | 1997-05-15 |
JPH09172159A (ja) | 1997-06-30 |
US5877515A (en) | 1999-03-02 |
TW317647B (fr) | 1997-10-11 |
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Legal Events
Date | Code | Title | Description |
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ST | Notification of lapse |