FR2510260A1 - Dispositif semiconducteur sensible aux ions - Google Patents

Dispositif semiconducteur sensible aux ions Download PDF

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Publication number
FR2510260A1
FR2510260A1 FR8114501A FR8114501A FR2510260A1 FR 2510260 A1 FR2510260 A1 FR 2510260A1 FR 8114501 A FR8114501 A FR 8114501A FR 8114501 A FR8114501 A FR 8114501A FR 2510260 A1 FR2510260 A1 FR 2510260A1
Authority
FR
France
Prior art keywords
substrate
sensitive layer
drain
source
sensitive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR8114501A
Other languages
English (en)
French (fr)
Other versions
FR2510260B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Felix Rudolf
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SUISSE FOND RECH MICROTECH
Original Assignee
SUISSE FOND RECH MICROTECH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SUISSE FOND RECH MICROTECH filed Critical SUISSE FOND RECH MICROTECH
Priority to FR8114501A priority Critical patent/FR2510260A1/fr
Priority to DE19823226555 priority patent/DE3226555A1/de
Priority to GB08221136A priority patent/GB2103014B/en
Priority to CH4446/82A priority patent/CH649173A5/fr
Priority to JP57127804A priority patent/JPS5870155A/ja
Publication of FR2510260A1 publication Critical patent/FR2510260A1/fr
Application granted granted Critical
Publication of FR2510260B1 publication Critical patent/FR2510260B1/fr
Priority to US06/777,876 priority patent/US4636827A/en
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/68Floating-gate IGFETs
    • H10D30/681Floating-gate IGFETs having only two programming levels
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/403Cells and electrode assemblies
    • G01N27/414Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS

Landscapes

  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Molecular Biology (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Thin Film Transistor (AREA)
FR8114501A 1981-07-24 1981-07-24 Dispositif semiconducteur sensible aux ions Granted FR2510260A1 (fr)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FR8114501A FR2510260A1 (fr) 1981-07-24 1981-07-24 Dispositif semiconducteur sensible aux ions
DE19823226555 DE3226555A1 (de) 1981-07-24 1982-07-16 Ionenempfindliche halbleiteranordnung
GB08221136A GB2103014B (en) 1981-07-24 1982-07-21 Semiconductor device responsive to ions
CH4446/82A CH649173A5 (fr) 1981-07-24 1982-07-21 Dispositif semi-conducteur sensible aux ions.
JP57127804A JPS5870155A (ja) 1981-07-24 1982-07-23 イオンに応答する半導体装置
US06/777,876 US4636827A (en) 1981-07-24 1985-09-20 Semiconductor device responsive to ions

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8114501A FR2510260A1 (fr) 1981-07-24 1981-07-24 Dispositif semiconducteur sensible aux ions

Publications (2)

Publication Number Publication Date
FR2510260A1 true FR2510260A1 (fr) 1983-01-28
FR2510260B1 FR2510260B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1983-12-09

Family

ID=9260870

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8114501A Granted FR2510260A1 (fr) 1981-07-24 1981-07-24 Dispositif semiconducteur sensible aux ions

Country Status (6)

Country Link
US (1) US4636827A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS5870155A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CH (1) CH649173A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE3226555A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
FR (1) FR2510260A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB2103014B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

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US4974592A (en) * 1988-11-14 1990-12-04 American Sensor Systems Corporation Continuous on-line blood monitoring system
JP3001104B2 (ja) * 1989-10-04 2000-01-24 オリンパス光学工業株式会社 センサー構造体及びその製造法
DE4209983A1 (de) * 1992-03-27 1993-09-30 Daimler Benz Ag Verfahren zur Herstellung von in einem Gehäuse angeordneten Halbleiterbauelementen
JP3152727B2 (ja) * 1992-03-31 2001-04-03 株式会社東芝 ノズル型分析装置
US5625209A (en) * 1992-08-26 1997-04-29 Texas Instruments Incorporated Silicon based sensor apparatus
DE4308081A1 (de) * 1993-03-13 1994-09-22 Fraunhofer Ges Forschung Halbleiterbauelement, insbesondere zur Ionendetektion
US6259937B1 (en) * 1997-09-12 2001-07-10 Alfred E. Mann Foundation Implantable substrate sensor
US6202473B1 (en) 1998-07-27 2001-03-20 General Electric Company Gas sensor with protective gate, method of forming the sensor, and method of sensing
US6041643A (en) * 1998-07-27 2000-03-28 General Electric Company Gas sensor with protective gate, method of forming the sensor, and method of sensing
DE10007525A1 (de) * 2000-02-18 2001-09-06 Erhard Kohn ph-Sensoren auf Halbleitern mit hohem Bandabstand
AU2003285092A1 (en) * 2002-10-29 2004-05-25 Cornell Research Foundation, Inc. Chemical-sensitive floating gate field effect transistor
US7361946B2 (en) * 2004-06-28 2008-04-22 Nitronex Corporation Semiconductor device-based sensors
WO2008076406A2 (en) 2006-12-14 2008-06-26 Ion Torrent Systems Incorporated Methods and apparatus for measuring analytes using large scale fet arrays
US8349167B2 (en) 2006-12-14 2013-01-08 Life Technologies Corporation Methods and apparatus for detecting molecular interactions using FET arrays
US8262900B2 (en) 2006-12-14 2012-09-11 Life Technologies Corporation Methods and apparatus for measuring analytes using large scale FET arrays
US11339430B2 (en) 2007-07-10 2022-05-24 Life Technologies Corporation Methods and apparatus for measuring analytes using large scale FET arrays
US20100301398A1 (en) 2009-05-29 2010-12-02 Ion Torrent Systems Incorporated Methods and apparatus for measuring analytes
CN103901090B (zh) * 2008-10-22 2017-03-22 生命技术公司 用于生物和化学分析的集成式传感器阵列
US20100137143A1 (en) 2008-10-22 2010-06-03 Ion Torrent Systems Incorporated Methods and apparatus for measuring analytes
DE102009002060B4 (de) * 2009-03-31 2023-08-03 Endress+Hauser Conducta Gmbh+Co. Kg Ionensensitiver Sensor mit Mehrfachschichtaufbau im sensitiven Bereich sowie Verfahren zur Herstellung eines solchen Sensors
US8776573B2 (en) 2009-05-29 2014-07-15 Life Technologies Corporation Methods and apparatus for measuring analytes
US20120261274A1 (en) 2009-05-29 2012-10-18 Life Technologies Corporation Methods and apparatus for measuring analytes
US8731847B2 (en) 2010-06-30 2014-05-20 Life Technologies Corporation Array configuration and readout scheme
CN106932456B (zh) 2010-06-30 2020-02-21 生命科技公司 用于测试isfet阵列的方法和装置
TWI547688B (zh) 2010-06-30 2016-09-01 生命技術公司 離子感測電荷累積電路及方法
US11307166B2 (en) 2010-07-01 2022-04-19 Life Technologies Corporation Column ADC
TWI527245B (zh) 2010-07-03 2016-03-21 生命技術公司 具有微摻雜汲極之化學感測器
WO2012036679A1 (en) 2010-09-15 2012-03-22 Life Technologies Corporation Methods and apparatus for measuring analytes
EP2522993B1 (en) * 2011-05-09 2015-11-25 Nxp B.V. FET based sensor with dual-gate stack
US9970984B2 (en) 2011-12-01 2018-05-15 Life Technologies Corporation Method and apparatus for identifying defects in a chemical sensor array
US8786331B2 (en) 2012-05-29 2014-07-22 Life Technologies Corporation System for reducing noise in a chemical sensor array
US9080968B2 (en) 2013-01-04 2015-07-14 Life Technologies Corporation Methods and systems for point of use removal of sacrificial material
US9841398B2 (en) 2013-01-08 2017-12-12 Life Technologies Corporation Methods for manufacturing well structures for low-noise chemical sensors
US8871549B2 (en) * 2013-02-14 2014-10-28 International Business Machines Corporation Biological and chemical sensors
US8963216B2 (en) 2013-03-13 2015-02-24 Life Technologies Corporation Chemical sensor with sidewall spacer sensor surface
US9835585B2 (en) 2013-03-15 2017-12-05 Life Technologies Corporation Chemical sensor with protruded sensor surface
CN105264366B (zh) 2013-03-15 2019-04-16 生命科技公司 具有一致传感器表面区域的化学传感器
US20140264471A1 (en) 2013-03-15 2014-09-18 Life Technologies Corporation Chemical device with thin conductive element
US20140336063A1 (en) 2013-05-09 2014-11-13 Life Technologies Corporation Windowed Sequencing
US10458942B2 (en) 2013-06-10 2019-10-29 Life Technologies Corporation Chemical sensor array having multiple sensors per well
US10077472B2 (en) 2014-12-18 2018-09-18 Life Technologies Corporation High data rate integrated circuit with power management
US10605767B2 (en) 2014-12-18 2020-03-31 Life Technologies Corporation High data rate integrated circuit with transmitter configuration
US10379079B2 (en) 2014-12-18 2019-08-13 Life Technologies Corporation Methods and apparatus for measuring analytes using large scale FET arrays
JP2017053794A (ja) * 2015-09-11 2017-03-16 株式会社東芝 電気化学センサ
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JP2019056581A (ja) * 2017-09-20 2019-04-11 ソニーセミコンダクタソリューションズ株式会社 電荷検出センサおよび電位計測システム
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DE2639398A1 (de) * 1976-09-01 1978-03-02 Johnson Controls Inc Kapazitive fuehleinrichtung fuer gasfoermige umweltprodukte
US4103227A (en) * 1977-03-25 1978-07-25 University Of Pennsylvania Ion-controlled diode
FR2392381A1 (fr) * 1977-05-26 1978-12-22 Kuraray Co Capteurs a transistor a effet de champ possedant une sensibilite chimique selective
EP0002343A1 (en) * 1977-12-02 1979-06-13 AIRCO, Inc. A chemical-sensitive field-effect transistor, method of manufacture, and use in a probe and an instrument

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US4133735A (en) * 1977-09-27 1979-01-09 The Board Of Regents Of The University Of Washington Ion-sensitive electrode and processes for making the same
JPS5466194A (en) * 1977-11-04 1979-05-28 Kuraray Co Fet sensor
US4198851A (en) * 1978-05-22 1980-04-22 University Of Utah Method and structure for detecting the concentration of oxygen in a substance
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Patent Citations (4)

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DE2639398A1 (de) * 1976-09-01 1978-03-02 Johnson Controls Inc Kapazitive fuehleinrichtung fuer gasfoermige umweltprodukte
US4103227A (en) * 1977-03-25 1978-07-25 University Of Pennsylvania Ion-controlled diode
FR2392381A1 (fr) * 1977-05-26 1978-12-22 Kuraray Co Capteurs a transistor a effet de champ possedant une sensibilite chimique selective
EP0002343A1 (en) * 1977-12-02 1979-06-13 AIRCO, Inc. A chemical-sensitive field-effect transistor, method of manufacture, and use in a probe and an instrument

Non-Patent Citations (1)

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Also Published As

Publication number Publication date
US4636827A (en) 1987-01-13
FR2510260B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1983-12-09
JPH0153745B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1989-11-15
JPS5870155A (ja) 1983-04-26
CH649173A5 (fr) 1985-04-30
DE3226555A1 (de) 1983-02-24
GB2103014A (en) 1983-02-09
GB2103014B (en) 1985-08-21
DE3226555C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1991-08-29

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