EP2409336A1 - Solarzellen mit einer barriereschicht auf basis von polysilazan - Google Patents
Solarzellen mit einer barriereschicht auf basis von polysilazanInfo
- Publication number
- EP2409336A1 EP2409336A1 EP10709428A EP10709428A EP2409336A1 EP 2409336 A1 EP2409336 A1 EP 2409336A1 EP 10709428 A EP10709428 A EP 10709428A EP 10709428 A EP10709428 A EP 10709428A EP 2409336 A1 EP2409336 A1 EP 2409336A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- polysilazane
- layer
- solar cell
- substrate
- barrier layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 229920001709 polysilazane Polymers 0.000 title claims abstract description 56
- 230000004888 barrier function Effects 0.000 title claims abstract description 31
- 239000000758 substrate Substances 0.000 claims abstract description 39
- 229910052751 metal Inorganic materials 0.000 claims abstract description 14
- 239000002184 metal Substances 0.000 claims abstract description 14
- KTSFMFGEAAANTF-UHFFFAOYSA-N [Cu].[Se].[Se].[In] Chemical compound [Cu].[Se].[Se].[In] KTSFMFGEAAANTF-UHFFFAOYSA-N 0.000 claims abstract description 12
- 239000011521 glass Substances 0.000 claims abstract description 12
- LCUOIYYHNRBAFS-UHFFFAOYSA-N copper;sulfanylideneindium Chemical compound [Cu].[In]=S LCUOIYYHNRBAFS-UHFFFAOYSA-N 0.000 claims abstract description 6
- 239000010409 thin film Substances 0.000 claims abstract description 6
- DVRDHUBQLOKMHZ-UHFFFAOYSA-N chalcopyrite Chemical compound [S-2].[S-2].[Fe+2].[Cu+2] DVRDHUBQLOKMHZ-UHFFFAOYSA-N 0.000 claims description 24
- 229910052951 chalcopyrite Inorganic materials 0.000 claims description 24
- 238000000034 method Methods 0.000 claims description 24
- 239000006096 absorbing agent Substances 0.000 claims description 15
- 229910052708 sodium Inorganic materials 0.000 claims description 14
- 239000011734 sodium Substances 0.000 claims description 14
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 claims description 13
- 229910000831 Steel Inorganic materials 0.000 claims description 12
- 239000002904 solvent Substances 0.000 claims description 12
- 239000010959 steel Substances 0.000 claims description 12
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 10
- 238000000576 coating method Methods 0.000 claims description 9
- 239000010408 film Substances 0.000 claims description 9
- 239000000463 material Substances 0.000 claims description 9
- 239000000203 mixture Substances 0.000 claims description 9
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 8
- 239000000654 additive Substances 0.000 claims description 8
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 7
- 239000011248 coating agent Substances 0.000 claims description 7
- 238000005538 encapsulation Methods 0.000 claims description 7
- 229910052750 molybdenum Inorganic materials 0.000 claims description 7
- 239000011733 molybdenum Substances 0.000 claims description 7
- 229910052757 nitrogen Inorganic materials 0.000 claims description 7
- 239000000919 ceramic Substances 0.000 claims description 6
- 239000004033 plastic Substances 0.000 claims description 6
- 229920003023 plastic Polymers 0.000 claims description 6
- PUZPDOWCWNUUKD-UHFFFAOYSA-M sodium fluoride Chemical group [F-].[Na+] PUZPDOWCWNUUKD-UHFFFAOYSA-M 0.000 claims description 6
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 5
- 125000003118 aryl group Chemical group 0.000 claims description 5
- 239000003054 catalyst Substances 0.000 claims description 5
- 239000001257 hydrogen Substances 0.000 claims description 5
- 229910052739 hydrogen Inorganic materials 0.000 claims description 5
- 239000002243 precursor Substances 0.000 claims description 5
- 125000000547 substituted alkyl group Chemical group 0.000 claims description 5
- 125000005369 trialkoxysilyl group Chemical group 0.000 claims description 5
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 claims description 5
- 229920002554 vinyl polymer Polymers 0.000 claims description 5
- 238000001704 evaporation Methods 0.000 claims description 4
- 238000010438 heat treatment Methods 0.000 claims description 4
- 229910001092 metal group alloy Inorganic materials 0.000 claims description 4
- 238000011417 postcuring Methods 0.000 claims description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 4
- DURPTKYDGMDSBL-UHFFFAOYSA-N 1-butoxybutane Chemical compound CCCCOCCCC DURPTKYDGMDSBL-UHFFFAOYSA-N 0.000 claims description 3
- VMHLLURERBWHNL-UHFFFAOYSA-M Sodium acetate Chemical compound [Na+].CC([O-])=O VMHLLURERBWHNL-UHFFFAOYSA-M 0.000 claims description 3
- 239000012298 atmosphere Substances 0.000 claims description 3
- 230000008020 evaporation Effects 0.000 claims description 3
- 238000002360 preparation method Methods 0.000 claims description 3
- 239000001632 sodium acetate Substances 0.000 claims description 3
- 235000017281 sodium acetate Nutrition 0.000 claims description 3
- 235000013024 sodium fluoride Nutrition 0.000 claims description 3
- 239000011775 sodium fluoride Substances 0.000 claims description 3
- 238000007740 vapor deposition Methods 0.000 claims description 3
- 239000002390 adhesive tape Substances 0.000 claims description 2
- 229910021538 borax Inorganic materials 0.000 claims description 2
- 239000010949 copper Substances 0.000 claims description 2
- UQGFMSUEHSUPRD-UHFFFAOYSA-N disodium;3,7-dioxido-2,4,6,8,9-pentaoxa-1,3,5,7-tetraborabicyclo[3.3.1]nonane Chemical compound [Na+].[Na+].O1B([O-])OB2OB([O-])OB1O2 UQGFMSUEHSUPRD-UHFFFAOYSA-N 0.000 claims description 2
- 229910052709 silver Inorganic materials 0.000 claims description 2
- 239000004332 silver Substances 0.000 claims description 2
- 239000004328 sodium tetraborate Substances 0.000 claims description 2
- 235000010339 sodium tetraborate Nutrition 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 79
- 230000007547 defect Effects 0.000 description 9
- 238000000151 deposition Methods 0.000 description 7
- 230000008021 deposition Effects 0.000 description 7
- 239000011888 foil Substances 0.000 description 7
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000005240 physical vapour deposition Methods 0.000 description 5
- 239000010936 titanium Substances 0.000 description 5
- 229910052719 titanium Inorganic materials 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 239000012071 phase Substances 0.000 description 4
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 230000032798 delamination Effects 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 238000010292 electrical insulation Methods 0.000 description 3
- 238000001755 magnetron sputter deposition Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 2
- 150000001338 aliphatic hydrocarbons Chemical class 0.000 description 2
- 150000001412 amines Chemical class 0.000 description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 238000003698 laser cutting Methods 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000000259 microwave plasma-assisted chemical vapour deposition Methods 0.000 description 2
- 239000002985 plastic film Substances 0.000 description 2
- 229920006255 plastic film Polymers 0.000 description 2
- 238000003980 solgel method Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- BFSVOASYOCHEOV-UHFFFAOYSA-N 2-diethylaminoethanol Chemical compound CCN(CC)CCO BFSVOASYOCHEOV-UHFFFAOYSA-N 0.000 description 1
- PYSGFFTXMUWEOT-UHFFFAOYSA-N 3-(dimethylamino)propan-1-ol Chemical compound CN(C)CCCO PYSGFFTXMUWEOT-UHFFFAOYSA-N 0.000 description 1
- UIKUBYKUYUSRSM-UHFFFAOYSA-N 3-morpholinopropylamine Chemical compound NCCCN1CCOCC1 UIKUBYKUYUSRSM-UHFFFAOYSA-N 0.000 description 1
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 238000012935 Averaging Methods 0.000 description 1
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 1
- FGUUSXIOTUKUDN-IBGZPJMESA-N C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 Chemical compound C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 FGUUSXIOTUKUDN-IBGZPJMESA-N 0.000 description 1
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical group [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 1
- UEEJHVSXFDXPFK-UHFFFAOYSA-N N-dimethylaminoethanol Chemical compound CN(C)CCO UEEJHVSXFDXPFK-UHFFFAOYSA-N 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- GSEJCLTVZPLZKY-UHFFFAOYSA-N Triethanolamine Chemical compound OCCN(CCO)CCO GSEJCLTVZPLZKY-UHFFFAOYSA-N 0.000 description 1
- GEIAQOFPUVMAGM-UHFFFAOYSA-N ZrO Inorganic materials [Zr]=O GEIAQOFPUVMAGM-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Chemical class 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 230000001464 adherent effect Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- 125000003277 amino group Chemical group 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 150000001983 dialkylethers Chemical class 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 150000008282 halocarbons Chemical class 0.000 description 1
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 229910021645 metal ion Inorganic materials 0.000 description 1
- 229910021424 microcrystalline silicon Inorganic materials 0.000 description 1
- 239000002105 nanoparticle Substances 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 238000005191 phase separation Methods 0.000 description 1
- 229920000548 poly(silane) polymer Polymers 0.000 description 1
- 229920001515 polyalkylene glycol Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 238000010248 power generation Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 150000003388 sodium compounds Chemical class 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000002436 steel type Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- 239000002341 toxic gas Substances 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/16—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers in which all the silicon atoms are connected by linkages other than oxygen atoms
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/60—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule in which all the silicon atoms are connected by linkages other than oxygen atoms
- C08G77/62—Nitrogen atoms
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
- H01L31/03923—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate including AIBIIICVI compound materials, e.g. CIS, CIGS
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
- H01L31/072—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN heterojunction type
- H01L31/0749—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN heterojunction type including a AIBIIICVI compound, e.g. CdS/CulnSe2 [CIS] heterojunction solar cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/541—CuInSe2 material PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present invention relates to a chalcopyrite solar cell comprising a substrate, a photovoltaic layer structure and an intermediate dielectric barrier layer.
- the dielectric barrier layer arranged between the substrate and the photovoltaic layer structure is electrically insulating and shields the photovoltaic layer structure from foreign atoms which can diffuse out of the substrate and impair the efficiency of the solar cell.
- the solar cells of the present invention are, in particular, thin-film solar cells with a photovoltaic layer structure of the copper-indium-sulfide (CIS) or copper-indium-gallium-selenide (CIGSe) type.
- the invention furthermore relates to a process for the production of chalcopyrite-based solar cells.
- a barrier layer having a thickness in the range of 100 to 3000 nm is produced by curing a solution of polysilazanes and additives at a temperature in the range from 20 to 1000 ° C., in particular from 80 to 200 ° C.
- Solar cells convert sunlight into electricity.
- Predominantly crystalline or amorphous silicon is used as a light-absorbing semiconductive material in solar cells.
- the use of silicon is associated with considerable costs.
- thin film solar cells can be made with an absorber of a chalcopyrcrical material such as copper indium sulfide (CIS) or copper indium gallium selenide (CIGSe) at a substantially lower cost.
- CIS copper indium sulfide
- CGSe copper indium gallium selenide
- a solar module with monolithic interconnection consists of a multiplicity of separate solar cells arranged side by side on the substrate and connected electrically in series.
- the back contact and, on the other hand, the photovoltaic layer structure are subdivided according to a predetermined pattern-generally strip-shaped.
- the structuring of the back contact - the so-called P1 cut requires an electrically insulating substrate.
- the P1 cut is preferably made by evaporating the back contact along given separation lines by means of a focused laser beam.
- Glass or substrate films of metal or polyimide are used as support materials for chalcopyrite solar cells.
- Gias ais proves to be advantageous, since it is electrically insulating, has a smooth surface and, during the production of the chalcopyrite absorber layer, provides sodium, which diffuses out of the glass into the absorber layer and as dopant improves the properties of the absorber layer.
- a disadvantage of glass is its great weight and lack of flexibility. In particular, glass substrates can not be coated in cost-effective roll-to-roll processes because of their rigidity.
- Another disadvantage of glass is that even during later use of the solar cell sodium still diffuses into the chalcopyrite absorber layer, wherein the accumulated over a longer period of concentration can reach a value at which the chalcopyrite absorber layer is damaged - u. a. by continued crystallite growth.
- Film-like substrates made of metal or plastic are lighter than glass and in particular flexible, so that they are suitable for the production of solar cells by means of a cost-effective roll-to-roll process.
- metal or plastic films can adversely affect the property of the chalcopyrite layer composite and, moreover, do not have a sodium depot for absorbing doping. Because of the increased Temperatures (in some cases> 500 0 C), where the substrate is exposed during the preparation of chalkopyritician solar cells, metal foils made of steel or titanium are preferably employed.
- an electrically insulating layer between the substrate and the photovoltaic absorber must be introduced.
- the insulating layer should also act as a diffusion barrier to prevent the diffusion of metal ions from the substrate, which may damage the absorber layer. For example, iron atoms diffusing from steel may reduce the recombination rate of
- silicon oxide In many silicon-based electronic components and Soiarzeiien of amorphous or microcrystalline silicon, silicon oxide (SiO x ) is used as a material for insulating or dielectric layers. Such SiO x layers are deposited from the vapor or liquid phase on a substrate such as a silicon wafer. The deposition is preferably carried out by means of CVD, microwave plasma assisted CVD (MWPECVD), PVD (magnetron sputtering) or a sol-gel process.
- CVD chemical vapor plasma assisted CVD
- PVD magnetictron sputtering
- SiO x layers produced by means of the sol-gel method have low adhesion to metallic substrates.
- the durability of sol-gel materials is so low that even with short storage characteristic material properties can change significantly and the quality of the layers produced with it varies greatly.
- SiO x layers which are produced from polysilazane and used in solar cells for the purpose of passivation or for encapsulation are known in the state of the art.
- US Pat. No. 7,396,563 discloses the deposition of dielectric and passivating polysilazane layers by means of PA-CVD, where polysilanes are used as the CVD precursor.
- US 4,751,191 teaches the deposition of polysilazane coatings for solar cells by means of PA-CVD.
- the resulting polysilazane layer is patterned photolithographically and serves to mask metallic contacts and as an antireflection layer.
- the barrier layer according to the invention should ensure a high diffusion barrier effect and electrical insulation in conjunction with good adhesion to glass or flexible substrates made of metal or plastic and have a low density of defects such as holes and cracks.
- a chalcopyrite solar cell comprising a substrate, a photovoltaic layer structure and an interposed dielectric barrier layer based on polysilazane.
- FIG. 1 shows a perspective view of a section through a solar cell 10 according to the invention with a substrate 1, a barrier layer 2 and a photovoltaic layer structure 4.
- the solar cell 10 is preferably configured as a thin-film solar cell and has a photovoltaic layer structure 4 of the copper-indium-sulfide type (CIS ) or copper indium gallium selenide (CIGSe). Further developments of the solar cell 10 according to the invention are characterized in that:
- the photovoltaic layer structure 4 has a back contact 41 made of molybdenum, an absorber 42 of the composition CulnS ⁇ 2 , CuInS 2 , CuGaS ⁇ 2,
- the substrate 1 is made of a material containing metal, metal alloys, glass, ceramic or plastic;
- the substrate 1 is formed as a film, in particular as a steel or titanium foil;
- the barrier layer 2 consists of a hardened solution of polysilazanes and additives in a solvent, which is preferably dibutyl ether; the barrier layer 2 contains sodium or comprises a sodium-containing precursor layer 21;
- the barrier layer 2 has a thickness of from 100 to 3,000 nm, preferably from 200 to 2,500 nm, and in particular from 300 to 2,000 nm; -
- the barrier layer 2 has a measured according to DIN IEC 60093 specific volume resistivity of greater than 1 -10 9 M ⁇ -cm, preferably greater than 1 -10 10 M ⁇ -cm, and in particular greater than 1-10 11 M ⁇ -cm;
- the solar cell 10 comprises an encapsulation layer 5 consisting of a hardened solution of polysilazanes and additives in a solvent; the barrier layer 2 and optionally the encapsulation layer 5 of polysilazanes of the general formula (I)
- 150,000 g / mol preferably from 50,000 to 150,000 g / mol, and especially from 100,000 to 150,000 g / mol;
- the process for producing the solar cells according to the invention comprises the following steps a) to g): a) coating a substrate of metal, metal alloys, glass, ceramic or plastic with a solution comprising at least one polysilazane of the general formula (I)
- R 1 , R", R '" are identical or different and independently of one another represent hydrogen or an optionally substituted alkyl, aryl, vinyl or (trialkoxysilyl) alkyl Rest, where n is an integer and n is such that the polysilazane has a number average molecular weight of 150 to 150,000 g / mol, preferably from 50,000 to 150,000 g / mol, and in particular from 100,000 to 150,000 g / b) removing the solvent by evaporation, wherein a
- Polysilazane layer having a thickness of 100 to 3,000 nm, preferably from 200 to 2,500 nm, and in particular from 300 to 2,000 nm is obtained on the substrate, c) optionally one or more repetitions of steps a) and b), d) curing the Polysilazane layer by i) heating to a temperature in the range of 20 to 1000 0 C, in particular 80 to 200 0 C and / or ii) irradiation with UV light with wavelength proportions in the range of 180 to 230 nm, wherein the heating and / or irradiation over a period of time from 1 min to 14 h, preferably 1 min to 60 min, and especially 1 min to 30 min, preferably in an atmosphere of water vapor-containing air or nitrogen, e) optional post-curing of the polysilazane at a temperature of 20 to 1000 0 C, preferably 60 to 130 ° C.
- Poiysiiazaniösung used for coating contains one or more of the following components:
- Sodium preferably in the form of sodium acetate or sodium tetraborate.
- a sodium-containing precursor layer is deposited on the polysilazane layer, preferably by vapor deposition of sodium fluoride.
- a substrate configured as a flexible web is preferred, which makes it possible to produce the chalcopyrite solar cells in a roll-to-roll process.
- the proportion of polysilazane is from 1 to 80% by weight, preferably 2 to 50 wt .-%, and in particular 5 to 20 wt .-%, based on the total weight of the solution.
- Particularly suitable solvents are organic, preferably aprotic, solvents which contain no water and no reactive groups such as hydroxyl or amino groups and which are inert to the polysilazane.
- aromatic or aliphatic hydrocarbons and mixtures thereof are, for example, aliphatic or aromatic hydrocarbons, halogenated hydrocarbons, esters such as ethyl acetate or butyl acetate, ketones such as acetone or methyl ethyl ketone, ethers such as tetrahydrofuran or dibutyl ether, and mono- and polyalkylene glycol dialkyl ethers (glymes) or mixtures of these solvents.
- Additional constituents of the polysilazane solution may be catalysts, for example organic amines, acids, as well as metals or metal salts or
- Suitable amine catalysts are in particular N, N-diethylethanolamine,
- Triethanolamine and 3-morpholinopropylamine are preferably used in amounts of 0.001 to 10 wt .-%, in particular 0.01 to
- Further constituents may be additives for substrate wetting and film formation as well as inorganic nanoparticles of oxides such as SiO 2 , TiO 2 , ZnO, ZrO 2 or Al 2 O 3 .
- a polysilazane solution of the composition described above is applied by conventional coating methods, for example by means of spray nozzles or dip bath to a substrate, preferably on a steel foil and optionally smoothed with an elastic doctor to a uniform thickness distribution or mass coverage on the substrate guarantee.
- a substrate preferably on a steel foil
- an elastic doctor to a uniform thickness distribution or mass coverage on the substrate guarantee.
- flexible Substrates such as metal or plastic films suitable for roll-to-roll coating can also be used as slit nozzles as the application system for obtaining very thin homogeneous layers.
- the solvent is evaporated. This can be done at room temperature or when using suitable dryer at higher temperatures, preferably from 40 to 60 0 C in the roll-to-roll process at speeds of> 1 m / min.
- the step sequence of coating with polysilazane solution, followed by evaporation of the solvent, is optionally repeated one, two or more times to obtain a dry uncured ("green") polysilazane layer having a total thickness of 100 to 3,000 nm.
- a dry uncured ("green") polysilazane layer having a total thickness of 100 to 3,000 nm.
- the content of solvent in the green polysilazane layer is greatly reduced or eliminated.
- the adhesion of the cured polysilazane film can be improved on difficult substrates such as steel or titanium foils.
- Another advantage of multiple coating and drying is that any holes or cracks in individual layers are largely covered and closed, so that the number of electrical insulation defects on conductive substrates such as steel or titanium foils is greatly reduced. Electrical insulation defects are mainly caused by mechanical defects on the surface of the steel or titanium foils such as rolling tracks or adherent sharp-edged particles, which can penetrate a thin (single-layer) Polysilazantik.
- the dried or green polysilazane layer is cured by curing
- a transparent ceramic phase Hardening is carried out in a convection oven, which is optionally operated with filtered and steam-humidified air or with nitrogen. Depending on the temperature, duration and furnace atmosphere - water vapor-containing air or nitrogen - the ceramic phase has a different composition. If the curing takes place, for example, in water containing steam, a phase of the composition SiN v H w O ⁇ C y with x>v; v ⁇ 1; 0 ⁇ x ⁇ 1 : 3; 0 ⁇ w ⁇ 2.5 and y ⁇ 0.5.
- the electrical defect density is determined by vapor deposition or sputtering of a 1 to 3 ⁇ m thick aluminum film onto a steel foil (Hamilton steel type SS420) provided with a polysilazane layer according to the invention. Then, by means of a laser cutting device, ten surfaces of the aluminum film approximately 10 x 10 cm 2 are subdivided into 100 adjacent electrically isolated square measuring fields each having 1 x 1 cm 2 and the electrical resistance between the steel foil and each of the 1,000 measuring fields determined in the aluminum film by means of an ohmmeter. If the resistance measured at one measurement field is less than 100 K ⁇ , the relevant measurement field is considered as having an electrical defect and is evaluated with a defect density of 1 cm "2. Averaging over all 1,000 measurement fields calculates the electrical defect density.
- the chalcopyrite-based photovoltaic layer structure is produced in accordance with known methods.
- a back contact is first deposited on the barrier layer of polysilazane according to the invention from an about 1 micron thick molybdenum layer by means of DC magnetron sputtering and preferably structured for monolithic shading (P1 cut).
- P1 cut monolithic shading
- the necessary division of the molybdenum layer into strips is carried out with a laser cutting device.
- the efficiency of chalcopyrite solar cells can be significantly increased by monolithic interconnection.
- Chalcopyrite absorber layers are conventionally deposited by means of processes such as CVD, PVD and rapid thermal processing (RTP), the temperature of the solar cell assuming values between 450 and 600 ° C.
- CVD chemical vapor deposition
- PVD physical vapor deposition
- RTP rapid thermal processing
- these delaminations caused by thermal stresses are avoided by maintaining the temperature of the solar cell during the deposition of chalkopyritician absorber layer in a range of 360 up to 400 0 C.
- the preparation of the absorber layer is carried out in a 3-step PVD process at a pressure of about 3-10 "6 mbar.
- the total duration of the PVD process is about 1, 5 h, the substrates a maximum temperature below 400 0 C. accept.
- the delamination can be counteracted by hardening the polysilazane layer for a further time prior to the deposition of the molybdenum back contact.
- This "postcuring" takes place in particular at a temperature around 85 ° C. in air with a relative humidity of 85% over a period of 1 h. Spectroscopic analyzes show that the postcuring significantly lowers the nitrogen content of the polysilazane layer.
- the deposition of the CdS buffer layer is wet-chemically at a temperature of about 60 0 C.
- the window layer of i-ZnO and doped with aluminum ZnO is deposited by means of DC magnetron sputtering.
- the barrier layer is provided with a sodium depot.
- the polysilazane solution used to prepare the barrier layer is preferably admixed with sodium acetate.
- the cured polysilazane layer is vapor-deposited with a 5 to 20 nm-thick layer of sodium fluoride.
- V O c is the no-load voltage
- Isc is the short-circuit current
- jsc is the short-circuit current density
- FF is the fill factor
- ⁇ is the efficiency.
- the numerical values given in the table represent the mean value of test series with 8 solar cells each, with the chalcopyrite coating layer Gn of all 24 solar cells having been produced by the same process.
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Abstract
Description
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DE102009013903A DE102009013903A1 (de) | 2009-03-19 | 2009-03-19 | Solarzellen mit einer Barriereschicht auf Basis von Polysilazan |
PCT/EP2010/001638 WO2010105798A1 (de) | 2009-03-19 | 2010-03-16 | Solarzellen mit einer barriereschicht auf basis von polysilazan |
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EP2409336A1 true EP2409336A1 (de) | 2012-01-25 |
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EP10709428A Withdrawn EP2409336A1 (de) | 2009-03-19 | 2010-03-16 | Solarzellen mit einer barriereschicht auf basis von polysilazan |
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US (1) | US9234119B2 (de) |
EP (1) | EP2409336A1 (de) |
JP (1) | JP5653994B2 (de) |
CN (1) | CN102414828B (de) |
DE (1) | DE102009013903A1 (de) |
WO (1) | WO2010105798A1 (de) |
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013542603A (ja) * | 2010-10-12 | 2013-11-21 | サン−ゴバン グラス フランス | 積層板構造を備えた薄膜太陽モジュール |
JP6109074B2 (ja) * | 2010-11-17 | 2017-04-05 | スリーエム イノベイティブ プロパティズ カンパニー | 銀のエレクトロマイグレーションの低減方法及びそれによって製造される物品 |
WO2013023161A1 (en) | 2011-08-10 | 2013-02-14 | Ascent Solar Technologies, Inc. | Multilayer thin-film back contact system for flexible photovoltaic devices on polymer substrates |
US9209322B2 (en) | 2011-08-10 | 2015-12-08 | Ascent Solar Technologies, Inc. | Multilayer thin-film back contact system for flexible photovoltaic devices on polymer substrates |
US9780242B2 (en) | 2011-08-10 | 2017-10-03 | Ascent Solar Technologies, Inc. | Multilayer thin-film back contact system for flexible photovoltaic devices on polymer substrates |
KR20130105325A (ko) * | 2012-03-12 | 2013-09-25 | 한국에너지기술연구원 | Na 무함유 기판을 이용한 CIGS계 박막 태양전지의 제조방법 및 이에 따라 제조된 태양전지 |
WO2015138728A1 (en) * | 2014-03-13 | 2015-09-17 | Ascent Solar Technologies, Inc. | Multilayer thin-film back contact system for flexible photovoltaic devices on polymer substrates |
KR101497500B1 (ko) * | 2014-06-16 | 2015-03-03 | 한국과학기술연구원 | 파장변환층을 구비하는 태양전지 및 그의 제조 방법 |
KR102487423B1 (ko) | 2014-07-29 | 2023-01-10 | 메르크 파텐트 게엠베하 | 광전자 부품의 코팅 수단으로 사용하기 위한 하이브리드 재료 |
CN104993018A (zh) * | 2015-06-29 | 2015-10-21 | 福建铂阳精工设备有限公司 | 控制cigs薄膜中钠含量的方法、太阳能电池及结构 |
WO2020205917A1 (en) * | 2019-04-01 | 2020-10-08 | First Solar, Inc. | Photovoltaic devices with encapsulation layers and systems and methods for forming the same |
CN113896543B (zh) * | 2021-10-11 | 2023-03-14 | 西北工业大学 | 一种具有层状结构吸波硅碳氮陶瓷及制备方法 |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4751191A (en) | 1987-07-08 | 1988-06-14 | Mobil Solar Energy Corporation | Method of fabricating solar cells with silicon nitride coating |
KR100412742B1 (ko) * | 1999-03-30 | 2003-12-31 | 제이에스알 가부시끼가이샤 | 태양 전지의 제조 방법 |
JP4408994B2 (ja) | 1999-07-13 | 2010-02-03 | Azエレクトロニックマテリアルズ株式会社 | 低誘電率多孔質シリカ質膜、半導体装置およびコーティング組成物 |
JP2001111076A (ja) * | 1999-10-08 | 2001-04-20 | Tdk Corp | コーティング体および太陽電池モジュール |
JP3503824B2 (ja) * | 2000-03-23 | 2004-03-08 | 松下電器産業株式会社 | 太陽電池およびその製造方法 |
US7067069B2 (en) | 2001-08-14 | 2006-06-27 | Jsr Corporation | Silane composition, silicon film forming method and solar cell production method |
WO2003100123A1 (en) | 2002-05-23 | 2003-12-04 | UNIVERSITé DE SHERBROOKE | Ceramic thin film on various substrates, and process for producing same |
US7560641B2 (en) | 2002-06-17 | 2009-07-14 | Shalini Menezes | Thin film solar cell configuration and fabrication method |
JP2004047860A (ja) * | 2002-07-15 | 2004-02-12 | Matsushita Electric Ind Co Ltd | 薄膜太陽電池およびその製造方法 |
JP2004179328A (ja) * | 2002-11-26 | 2004-06-24 | Matsushita Electric Ind Co Ltd | 太陽電池およびその製造方法 |
DE10259472B4 (de) | 2002-12-19 | 2006-04-20 | Solarion Gmbh | Flexible Dünnschichtsolarzelle mit flexibler Schutzschicht |
JP2005033063A (ja) | 2003-07-08 | 2005-02-03 | Sharp Corp | 太陽電池用反射防止膜およびその作製方法 |
SE525704C2 (sv) * | 2003-08-12 | 2005-04-05 | Sandvik Ab | Belagd stålprodukt av metallbandsmaterial innefattande ett elektriskt isolerande skikt dopat med en eller flera alkalimetaller |
DE102004011212A1 (de) * | 2004-03-04 | 2005-09-29 | Clariant International Limited | Perhydropolysilazane enthaltende Beschichtungen für Metall- und Polymeroberflächen |
JP2006080370A (ja) * | 2004-09-10 | 2006-03-23 | Matsushita Electric Ind Co Ltd | 太陽電池 |
JP2006140414A (ja) * | 2004-11-15 | 2006-06-01 | Matsushita Electric Ind Co Ltd | 太陽電池用基板及びこれを用いた太陽電池 |
JP4969785B2 (ja) * | 2005-02-16 | 2012-07-04 | 本田技研工業株式会社 | カルコパイライト型太陽電池及びその製造方法 |
DE102005034817A1 (de) * | 2005-07-26 | 2007-02-01 | Clariant International Limited | Verfahren zur Herstellung einer dünnen glasartigen Beschichtung auf Substraten zur Verringerung der Gaspermeation |
DE102005042944A1 (de) * | 2005-09-08 | 2007-03-22 | Clariant International Limited | Polysilazane enthaltende Beschichtungen für Metall- und Polymeroberflächen |
EP1996648B1 (de) | 2006-03-17 | 2010-06-09 | Akzo Nobel N.V. | Verfahren zur herstellung einer kautschukzusammensetzung, daraus gewonnene kautschukzusammensetzung und verwendung |
US20080169025A1 (en) * | 2006-12-08 | 2008-07-17 | Basol Bulent M | Doping techniques for group ibiiiavia compound layers |
KR20090107882A (ko) | 2008-04-10 | 2009-10-14 | 삼성전자주식회사 | 고정층을 포함하는 경사 조성 봉지 박막 및 그의 제조방법 |
DE102008020324A1 (de) * | 2008-04-23 | 2009-10-29 | Clariant International Limited | Polysilazane enthaltende Beschichtungen zur Erhöhung der Lichtausbeute von verkapselten Solarzellen |
DE102009013904A1 (de) | 2009-03-19 | 2010-09-23 | Clariant International Limited | Solarzellen mit einer Verkapselungsschicht auf Basis von Polysilazan |
-
2009
- 2009-03-19 DE DE102009013903A patent/DE102009013903A1/de not_active Withdrawn
-
2010
- 2010-03-16 JP JP2012500138A patent/JP5653994B2/ja not_active Expired - Fee Related
- 2010-03-16 US US13/257,037 patent/US9234119B2/en not_active Expired - Fee Related
- 2010-03-16 WO PCT/EP2010/001638 patent/WO2010105798A1/de active Application Filing
- 2010-03-16 EP EP10709428A patent/EP2409336A1/de not_active Withdrawn
- 2010-03-16 CN CN201080018736.1A patent/CN102414828B/zh not_active Expired - Fee Related
Non-Patent Citations (5)
Title |
---|
AHN S ET AL: "Cu(In,Ga)Se2 thin film solar cells from nanoparticle precursors", CURRENT APPLIED PHYSICS, NORTH-HOLLAND, AMSTERDAM, NL, vol. 8, no. 6, 1 October 2008 (2008-10-01), pages 766 - 769, XP022941836, ISSN: 1567-1739, [retrieved on 20080721], DOI: 10.1016/J.CAP.2007.04.037 * |
KAELIN M ET AL: "Low-cost CIGS solar cells by paste coating and selenization", THIN SOLID FILMS, ELSEVIER-SEQUOIA S.A. LAUSANNE, CH, vol. 480-481, 1 June 2005 (2005-06-01), pages 486 - 490, XP027865279, ISSN: 0040-6090, [retrieved on 20050601] * |
KESSLER F ET AL: "Flexible and monolithically integrated CIGS-Modules", MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, MATERIALS RESEARCH SOCIETY, PITTSBURG, PA; US, vol. 668, 1 January 2001 (2001-01-01), pages H3.6.1 - H3.6.6, XP007921107 * |
RUDMANN D ET AL: "Low temperature growth of CIGS thin films for flexible solar cells", II-VI COMPOUND SEMICONDUCTOR PHOTOVOLTAIC MATERIALS : SYMPOSIUM HELD [AT THE 2001 MRS SPRING MEETING,] APRIL 16 - 20, 2001, SAN FRANCISCO, CALIFORNIA, U.S.A, MATERIALS RESEARCH SOCIETY, WARRENDALE, PA, vol. 668, 16 April 2001 (2001-04-16), pages H3.8.1 - H3.8.6, XP009158387, ISBN: 978-1-55899-604-5 * |
See also references of WO2010105798A1 * |
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US20120006403A1 (en) | 2012-01-12 |
CN102414828A (zh) | 2012-04-11 |
JP2012521081A (ja) | 2012-09-10 |
DE102009013903A1 (de) | 2010-09-23 |
US9234119B2 (en) | 2016-01-12 |
JP5653994B2 (ja) | 2015-01-14 |
WO2010105798A1 (de) | 2010-09-23 |
CN102414828B (zh) | 2015-05-27 |
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