EP1317763A1 - Cartouche fusible, son procede de production, ainsi que substance de brasure - Google Patents
Cartouche fusible, son procede de production, ainsi que substance de brasureInfo
- Publication number
- EP1317763A1 EP1317763A1 EP01980371A EP01980371A EP1317763A1 EP 1317763 A1 EP1317763 A1 EP 1317763A1 EP 01980371 A EP01980371 A EP 01980371A EP 01980371 A EP01980371 A EP 01980371A EP 1317763 A1 EP1317763 A1 EP 1317763A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- solder
- tin
- carrier
- copper
- substance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000126 substance Substances 0.000 title claims abstract description 30
- 238000004519 manufacturing process Methods 0.000 title claims description 6
- 238000000034 method Methods 0.000 title claims description 5
- 238000005476 soldering Methods 0.000 title abstract 2
- 229910000679 solder Inorganic materials 0.000 claims abstract description 93
- 239000010949 copper Substances 0.000 claims abstract description 33
- 229910052802 copper Inorganic materials 0.000 claims abstract description 28
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims abstract description 25
- 239000004020 conductor Substances 0.000 claims abstract description 22
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 18
- 239000000470 constituent Substances 0.000 claims abstract description 8
- 229910001128 Sn alloy Inorganic materials 0.000 claims abstract description 7
- 239000007788 liquid Substances 0.000 claims abstract description 4
- 239000007787 solid Substances 0.000 claims abstract description 4
- 239000013543 active substance Substances 0.000 claims abstract description 3
- 229910000881 Cu alloy Inorganic materials 0.000 claims description 16
- 229910052797 bismuth Inorganic materials 0.000 claims description 14
- 239000000463 material Substances 0.000 claims description 12
- ZWFRZGJUJSOHGL-UHFFFAOYSA-N [Bi].[Cu].[Sn] Chemical compound [Bi].[Cu].[Sn] ZWFRZGJUJSOHGL-UHFFFAOYSA-N 0.000 claims description 11
- 239000012535 impurity Substances 0.000 claims description 11
- 229910045601 alloy Inorganic materials 0.000 claims description 10
- 239000000956 alloy Substances 0.000 claims description 10
- 238000002844 melting Methods 0.000 claims description 10
- 230000008018 melting Effects 0.000 claims description 10
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims description 9
- PXFBZOLANLWPMH-UHFFFAOYSA-N 16-Epiaffinine Natural products C1C(C2=CC=CC=C2N2)=C2C(=O)CC2C(=CC)CN(C)C1C2CO PXFBZOLANLWPMH-UHFFFAOYSA-N 0.000 claims description 8
- 229910000640 Fe alloy Inorganic materials 0.000 claims description 5
- ZWNQSJPQMSUVSE-UHFFFAOYSA-N [Cu].[Sn].[In] Chemical compound [Cu].[Sn].[In] ZWNQSJPQMSUVSE-UHFFFAOYSA-N 0.000 claims description 5
- GHXLZHHDOCNNFH-UHFFFAOYSA-N [Fe].[Bi].[Sn] Chemical compound [Fe].[Bi].[Sn] GHXLZHHDOCNNFH-UHFFFAOYSA-N 0.000 claims description 4
- 230000002745 absorbent Effects 0.000 claims description 3
- 239000002250 absorbent Substances 0.000 claims description 3
- 238000001816 cooling Methods 0.000 claims description 3
- 238000002425 crystallisation Methods 0.000 claims description 3
- 230000008025 crystallization Effects 0.000 claims description 3
- 229910052738 indium Inorganic materials 0.000 claims description 3
- 230000003647 oxidation Effects 0.000 claims description 3
- 238000007254 oxidation reaction Methods 0.000 claims description 3
- 230000001590 oxidative effect Effects 0.000 claims description 3
- 229910052979 sodium sulfide Inorganic materials 0.000 claims description 3
- GRVFOGOEDUUMBP-UHFFFAOYSA-N sodium sulfide (anhydrous) Chemical compound [Na+].[Na+].[S-2] GRVFOGOEDUUMBP-UHFFFAOYSA-N 0.000 claims description 3
- 238000007669 thermal treatment Methods 0.000 claims description 2
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical compound [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 claims 1
- 239000013078 crystal Substances 0.000 abstract 1
- 230000004927 fusion Effects 0.000 abstract 1
- 229910052793 cadmium Inorganic materials 0.000 description 8
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 8
- 238000010586 diagram Methods 0.000 description 3
- 229910008348 SnCd Inorganic materials 0.000 description 2
- CSBHIHQQSASAFO-UHFFFAOYSA-N [Cd].[Sn] Chemical compound [Cd].[Sn] CSBHIHQQSASAFO-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- JWVAUCBYEDDGAD-UHFFFAOYSA-N bismuth tin Chemical compound [Sn].[Bi] JWVAUCBYEDDGAD-UHFFFAOYSA-N 0.000 description 2
- 239000000155 melt Substances 0.000 description 2
- 229920001296 polysiloxane Polymers 0.000 description 2
- 229910000925 Cd alloy Inorganic materials 0.000 description 1
- 230000001680 brushing effect Effects 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 239000012876 carrier material Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000010309 melting process Methods 0.000 description 1
- 238000001000 micrograph Methods 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
- 230000007306 turnover Effects 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H85/00—Protective devices in which the current flows through a part of fusible material and this current is interrupted by displacement of the fusible material when this current becomes excessive
- H01H85/02—Details
- H01H85/04—Fuses, i.e. expendable parts of the protective device, e.g. cartridges
- H01H85/05—Component parts thereof
- H01H85/055—Fusible members
- H01H85/08—Fusible members characterised by the shape or form of the fusible member
- H01H85/11—Fusible members characterised by the shape or form of the fusible member with applied local area of a metal which, on melting, forms a eutectic with the main material of the fusible member, i.e. M-effect devices
Definitions
- the invention initially relates to a fuse link, in particular for low-voltage high-performance fuses, NH fuses, which has at least one fuse element with a solder substance in a solder deposit of a carrier, specifically according to the preamble of claim 1.
- the solder is on the base is made of tin and the base is made of copper.
- fuse links are common on the market.
- a tin-cadmium alloy is usually used as the solder substance.
- SnCd 80 ie an alloy with 80 percent by weight tin and 20 percent by weight cadmium, is common. Recently, one would like to avoid cadmium for reasons of environmental protection.
- fuse links on the market whose fusible conductors have a solder substance made of SnBi 95 5. The melting times of the fusible conductors provided with this solder vary considerably more than those with the conventional SnCd solders.
- SnBi solders generally tend to melt away. To prevent this, the solder is covered with a silicone-containing layer in a fuse link on the market. The extinguishing behavior of the fuse link when the silicone decomposes can deteriorate significantly as a result of the carbon atoms.
- the fusible conductor and solder system should generally be designed so that if overflows are present for a longer period of time, the solder melts locally, dissolves the material of its carrier, ie the contact conductor, and thus speeds up the shutdown. This is usually referred to as an M effect.
- the solder should meet the following conditions: - Adequate solubility of the solder substance for the fuse element material, usually copper,
- An organic coating has already been provided as a solder stopping agent, which is intended to prevent the solder from flowing away in the case of a solder substance without cadmium.
- solder stopping agent which is intended to prevent the solder from flowing away in the case of a solder substance without cadmium.
- the invention is based on the object of developing a fuse link which works with a cadmium-free solder on the fuse element and in which the problems described, in particular the scattering of the switch-off values and the flow of the solder, are improved so that the otherwise good properties of cadmium-containing ones Fusible conductor systems can be achieved.
- a fuse link according to claim 1.
- the solder contains as an active substance a tin alloy with two further constituents, a first constituent by weight percentage being larger but being smaller by weight percentage than the proportion the basic substance tin, is then selected to lower the melting temperature of the solder.
- a second component, smaller by weight percent, is a substance that does not dissolve in the tin, where due to the formation of crystallization nuclei on cooling from the liquid to the solid state, which result in a fine structure and prevent coarsening of the structure under load on the fuse.
- Such a fusible link solder system can be tuned to have a scattering behavior similar to that using cadmium and suitable response times.
- the fine structure obviously promotes the dissolution of the carrier material, i.e. the fuse element, which means that the same melting times and the same melting behavior as for fuse elements with conventional cadmium-containing ones
- Fusible conductor solders can be achieved. As a result, the melting process is not subjected to separate energy conversion, so that additional heating does not occur.
- Claims 2 to 6 relate to advantageous developments of the solder fusible link system.
- the invention is based on the further object of further developing a cadmium-free fuse link in such a way that the solder is promoted in its resistance to flow.
- the described object is achieved by a fuse link according to claim 7.
- the solder as solder material in the solder depot of a carrier, and / or the carrier is provided with an oxide skin.
- the oxide skin can be formed thermally or chemically. It is sufficient if the oxide skin is formed in the boundary area between the solder and the carrier.
- the wetting of the carrier can also be controlled as desired by the geometry of the oxidized areas.
- the invention further relates to a method for producing a fuse link, according to which solder and / or carrier are subjected to a thermal treatment in an oxidizing atmosphere.
- a method for producing a fuse link is also provided, according to which the solder and / or the carrier is treated with a substance affine to the solder and / or carrier.
- a sodium sulfide solution is particularly suitable for this.
- a substance affine to the solder and / or carrier can be applied between absorbent rollers and impregnated with the affine substance.
- solder material consisting of a tin-bismuth-copper alloy, a tin-indium-copper alloy or a tin-bismuth-iron alloy.
- a solder material which has a tin-bismuth-copper alloy with 10% to 30% bismuth and 0.3% to 1.0% copper, together with tin 99.5%, the rest usual impurities, has proven to be particularly advantageous having.
- melting tests are plotted in a diagram, with a conventional tin-cadmium-solder substance being illustrated in its switch-off behavior over several tests according to the prior art for comparison.
- the switch-off behavior of tin-bismuth copper at various proportions is illustrated.
- FIG. 2 a comparison is shown, on the left for cadmium-free solder without copper, on the right for an embodiment according to the invention with cadmium-containing solder and tin-bismuth with copper, a fusible conductor with a constriction in front of a solder depot after the fusible conductor responds and when the fusible conductor is interrupted.
- the response time of the fuse element is on the ordinate in seconds until it is interrupted tin alloys with the specified constituents and their proportions are plotted on the abscissa. The results are plotted over several tests.
- Copper served as the carrier for the solder.
- Tin-cadmium serves as an orientation value.
- bismuth is a proportion in weight percentages of 25%, 15% and 5% respectively under a load of 32 A phase current, in this case equivalent to 1.6 times the rated current, wor ⁇ examines the.
- the proportions of copper are each ' 0.8%.
- the proportion of tin in the difference is 99.5%, with the rest making up common impurities.
- the first further component of the tin alloy is in a smaller proportion than the proportion of the basic substance tin. This component lowers the melting temperature of the solder. Bismuth was used for this in the present case.
- a second component, which is smaller by weight percent, is a substance that does not dissolve in the tin, which causes crystallization nuclei when cooling from the liquid to the solid state, which result in a fine structure. Copper was used here.
- the diagram according to FIG. 1 shows the scattering behavior of the respective alloy and, for a specific geometry of the fusible conductor, with a constriction in front of the solder, the time until the device responds and until it is switched off. These times can be strongly influenced by the geometry of the fusible conductor and, if applicable, the type and dimensioning of a constriction in front of the solder for a planned current load and when using a specific alloy for the solder.
- Fuse links with a solder substance of the fuse element made of tin-bismuth-copper alloy, made of tin-indium-copper alloy and made of tin-bis uth-iron alloy have proven to be very suitable.
- a tin-indium-copper alloy with the components in the ratio and by weight percent has also proven to be favorable: Sn from 70% to 96%, In from 3% to 30%, Cu from 0.3% to 5.0% ,
- FIG. 2 shows an interrupted constriction in front of the solder depot for a fusible conductor of the same geometric configuration, each in enlarged form, the largest
- Width of the fuse element in nature is 14 mm.
- a solder made of tin-bismuth with about 75% tin and 25% bismuth was used for a copper fusible conductor.
- a total of 99.5%, at 0.5% is usual Impurities, the situation after Interruption of the fusible conductor reproduced by the action of solder.
- solder and attacked fusible conductor have a fine structure and clean contours in the micrograph. The energy turnover when the fusible conductor melts is thus kept low and the formation of heat cracks is avoided.
- the behavior of the three-component alloys provided can be further promoted by an oxide skin on the solder in the solder depot and / or on the fuse element, at least in the vicinity of the solder depot.
- an oxide skin can prevent the melting solder from flowing off when the fuse element responds in the fuse link. This measure of using an oxide skin in a targeted manner can generally be used for solders that are not inherently stationary, regardless of the usual structure of the solder or the alloy serving as solder.
- Such an oxide skin can be formed thermally or chemically.
- Carriers are treated in an oxidizing atmosphere. You can work with local heat, for example through a clamp.
- Substances affine to the solder or to the carrier are suitable for chemical treatment.
- the fusible conductor can be treated with a sodium sulfide solution. In the simplest case, this can be done by brushing or by absorbent rollers soaked in the affine substance, which roll over the fusible conductor at the desired location. To prevent the solder from flowing out even more reliably, it is sufficient to carry out an oxidation only in the area of the solder and the adjacent areas of the carrier.
- Cadmium-free solder materials for fuse links can advantageously be a tin-bismuth-copper alloy, a tin Indium-copper alloy or a tin-bismuth-iron alloy. Without considering a geometrical configuration of the fuse element, it is advantageous if the proportions are as follows, each in percent by weight:
Landscapes
- Fuses (AREA)
- Coating With Molten Metal (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP01980371A EP1317763B1 (fr) | 2000-09-13 | 2001-09-11 | Cartouche fusible, son procede de production, ainsi que substance de brasure |
SI200130845T SI1317763T1 (sl) | 2000-09-13 | 2001-09-11 | Varovalni vloĹľek, postopek za njegovo izdelavo in snov za spajkanje |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP00119932 | 2000-09-13 | ||
EP00119932A EP1189252A1 (fr) | 2000-09-13 | 2000-09-13 | Elément fusible, son procédé de fabrication et matériau de soudure |
EP01980371A EP1317763B1 (fr) | 2000-09-13 | 2001-09-11 | Cartouche fusible, son procede de production, ainsi que substance de brasure |
PCT/EP2001/010499 WO2002023575A1 (fr) | 2000-09-13 | 2001-09-11 | Cartouche fusible, son procede de production, ainsi que substance de brasure |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1317763A1 true EP1317763A1 (fr) | 2003-06-11 |
EP1317763B1 EP1317763B1 (fr) | 2008-05-14 |
Family
ID=8169826
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP00119932A Withdrawn EP1189252A1 (fr) | 2000-09-13 | 2000-09-13 | Elément fusible, son procédé de fabrication et matériau de soudure |
EP01980371A Expired - Lifetime EP1317763B1 (fr) | 2000-09-13 | 2001-09-11 | Cartouche fusible, son procede de production, ainsi que substance de brasure |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP00119932A Withdrawn EP1189252A1 (fr) | 2000-09-13 | 2000-09-13 | Elément fusible, son procédé de fabrication et matériau de soudure |
Country Status (12)
Country | Link |
---|---|
US (1) | US7109839B2 (fr) |
EP (2) | EP1189252A1 (fr) |
CN (1) | CN100350539C (fr) |
AT (1) | ATE395715T1 (fr) |
BR (1) | BRPI0113834B1 (fr) |
CZ (1) | CZ299341B6 (fr) |
DE (1) | DE50113976D1 (fr) |
ES (1) | ES2302752T3 (fr) |
HU (1) | HU226335B1 (fr) |
PL (1) | PL202046B1 (fr) |
SI (1) | SI1317763T1 (fr) |
WO (1) | WO2002023575A1 (fr) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005171371A (ja) * | 2003-12-15 | 2005-06-30 | Uchihashi Estec Co Ltd | 合金型温度ヒューズ及び温度ヒューズエレメント用線材 |
EP1557476A1 (fr) * | 2004-01-15 | 2005-07-27 | ETI Elektroelement d.d. | Alliage à bas point de fusion d'étain, de bismuth et d'antimoIne pour des éléments fusibles pour les dispositifs fusibles à basse tension |
DE102006040661A1 (de) * | 2006-08-30 | 2008-03-13 | Robert Bosch Gmbh | Strom-Überlastschutz eines Bürstenapparates |
DE102007014334A1 (de) * | 2007-03-26 | 2008-10-02 | Robert Bosch Gmbh | Schmelzlegierungselement, Thermosicherung mit einem Schmelzlegierungselement sowie Verfahren zum Herstellen einer Thermosicherung |
US8454254B2 (en) | 2007-11-28 | 2013-06-04 | Kinesis Corporation | Support accessory for split keyboard |
KR20090090161A (ko) * | 2008-02-20 | 2009-08-25 | 삼성전자주식회사 | 전기적 퓨즈 소자 |
KR20090112390A (ko) * | 2008-04-24 | 2009-10-28 | 삼성전자주식회사 | 전기적 퓨즈 소자 |
JP7231527B2 (ja) * | 2018-12-28 | 2023-03-01 | ショット日本株式会社 | 保護素子用ヒューズ素子およびそれを利用した保護素子 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2703352A (en) * | 1953-08-13 | 1955-03-01 | Chase Shawmut Co | Fuse and fuse link of the time lag type |
DE1035749B (de) * | 1955-08-23 | 1958-08-07 | Licencia Talalmanyokat | UEberstromtraege Schmelzsicherung |
US3236976A (en) * | 1961-06-22 | 1966-02-22 | Gen Electric | Fuse device |
CA868830A (en) * | 1967-12-16 | 1971-04-20 | A. Ibscher Rolf | Ternary fusible alloy |
DE2551627A1 (de) * | 1975-11-18 | 1977-06-02 | Borchart Hans F Dipl Ing | Schmelzleiter fuer traege elektrische schmelzsicherungen |
CS265255B1 (cs) * | 1987-03-02 | 1989-10-13 | Jindrich Kadlec | Tavný vodič elektrické výkonové pojistky |
CS363190A2 (en) * | 1989-07-24 | 1991-08-13 | Schrack Telecom | Thermal cut-out |
JP2747877B2 (ja) * | 1993-10-28 | 1998-05-06 | 矢崎総業株式会社 | 遅断ヒューズ及びその製造方法 |
KR19990028259A (ko) * | 1995-06-20 | 1999-04-15 | 모리시따요오이 찌 | 땜납 및 납땜에 의해 실장되는 전자 부품과 전자 회로 기판 |
JP3242835B2 (ja) * | 1996-03-29 | 2001-12-25 | 矢崎総業株式会社 | ヒューズ及びその製造方法 |
GB9701819D0 (en) * | 1997-01-29 | 1997-03-19 | Alpha Fry Ltd | Lead-free tin alloy |
US6160471A (en) * | 1997-06-06 | 2000-12-12 | Littlelfuse, Inc. | Fusible link with non-mechanically linked tab description |
JPH1125829A (ja) * | 1997-07-04 | 1999-01-29 | Yazaki Corp | 温度ヒューズ及び車両用ワイヤハーネスの異常検出装置 |
US6064293A (en) * | 1997-10-14 | 2000-05-16 | Sandia Corporation | Thermal fuse for high-temperature batteries |
EP0935273A3 (fr) * | 1998-02-04 | 2000-03-22 | Lindner GmbH | Conducteur fusible pour cartouche à fusible |
JP2000073154A (ja) * | 1998-08-27 | 2000-03-07 | Totoku Electric Co Ltd | はんだめっき線 |
EP1134769A1 (fr) * | 2000-03-08 | 2001-09-19 | Cooper Bussmann UK Limited | Procédé pour appliquer une couche de matériau à effet M |
DE10022241A1 (de) * | 2000-05-08 | 2001-11-15 | Abb Research Ltd | Schmelzleiter und Verfahren zu seiner Herstellung sowie Sicherungsleiter und Sicherung |
JP2001325867A (ja) * | 2000-05-18 | 2001-11-22 | Sorudaa Kooto Kk | 温度ヒューズおよび温度ヒューズ素子用線材 |
-
2000
- 2000-09-13 EP EP00119932A patent/EP1189252A1/fr not_active Withdrawn
-
2001
- 2001-09-11 CZ CZ20031036A patent/CZ299341B6/cs not_active IP Right Cessation
- 2001-09-11 WO PCT/EP2001/010499 patent/WO2002023575A1/fr active IP Right Grant
- 2001-09-11 BR BRPI0113834A patent/BRPI0113834B1/pt not_active IP Right Cessation
- 2001-09-11 AT AT01980371T patent/ATE395715T1/de not_active IP Right Cessation
- 2001-09-11 ES ES01980371T patent/ES2302752T3/es not_active Expired - Lifetime
- 2001-09-11 HU HU0300734A patent/HU226335B1/hu not_active IP Right Cessation
- 2001-09-11 DE DE50113976T patent/DE50113976D1/de not_active Expired - Lifetime
- 2001-09-11 US US10/380,238 patent/US7109839B2/en not_active Expired - Fee Related
- 2001-09-11 CN CNB018156037A patent/CN100350539C/zh not_active Expired - Fee Related
- 2001-09-11 EP EP01980371A patent/EP1317763B1/fr not_active Expired - Lifetime
- 2001-09-11 SI SI200130845T patent/SI1317763T1/sl unknown
- 2001-09-11 PL PL362409A patent/PL202046B1/pl not_active IP Right Cessation
Non-Patent Citations (1)
Title |
---|
See references of WO0223575A1 * |
Also Published As
Publication number | Publication date |
---|---|
WO2002023575A1 (fr) | 2002-03-21 |
BR0113834A (pt) | 2004-09-28 |
EP1317763B1 (fr) | 2008-05-14 |
PL362409A1 (en) | 2004-11-02 |
CN100350539C (zh) | 2007-11-21 |
BRPI0113834B1 (pt) | 2015-09-15 |
EP1189252A1 (fr) | 2002-03-20 |
ES2302752T3 (es) | 2008-08-01 |
HU226335B1 (en) | 2008-09-29 |
SI1317763T1 (sl) | 2008-10-31 |
CN1455942A (zh) | 2003-11-12 |
US20040027226A1 (en) | 2004-02-12 |
CZ20031036A3 (cs) | 2003-09-17 |
HUP0300734A2 (hu) | 2003-09-29 |
CZ299341B6 (cs) | 2008-06-25 |
PL202046B1 (pl) | 2009-05-29 |
ATE395715T1 (de) | 2008-05-15 |
HUP0300734A3 (en) | 2005-12-28 |
DE50113976D1 (de) | 2008-06-26 |
US7109839B2 (en) | 2006-09-19 |
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