DK166595B1 - Integreret kredsloeb med indbygget selvtest - Google Patents

Integreret kredsloeb med indbygget selvtest Download PDF

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Publication number
DK166595B1
DK166595B1 DK600185A DK600185A DK166595B1 DK 166595 B1 DK166595 B1 DK 166595B1 DK 600185 A DK600185 A DK 600185A DK 600185 A DK600185 A DK 600185A DK 166595 B1 DK166595 B1 DK 166595B1
Authority
DK
Denmark
Prior art keywords
integrated circuit
test
clb
combinatorial logic
function
Prior art date
Application number
DK600185A
Other languages
Danish (da)
English (en)
Other versions
DK600185A (da
DK600185D0 (da
Inventor
William Laurence Knight
Mark Paraskeva
David Frank Burrows
Original Assignee
Roke Manor Research
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Roke Manor Research filed Critical Roke Manor Research
Publication of DK600185D0 publication Critical patent/DK600185D0/da
Publication of DK600185A publication Critical patent/DK600185A/da
Application granted granted Critical
Publication of DK166595B1 publication Critical patent/DK166595B1/da

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Bipolar Transistors (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Amplifiers (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Semiconductor Integrated Circuits (AREA)
DK600185A 1984-12-21 1985-12-20 Integreret kredsloeb med indbygget selvtest DK166595B1 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB848432533A GB8432533D0 (en) 1984-12-21 1984-12-21 Integrated circuits
GB8432533 1984-12-21

Publications (3)

Publication Number Publication Date
DK600185D0 DK600185D0 (da) 1985-12-20
DK600185A DK600185A (da) 1986-06-22
DK166595B1 true DK166595B1 (da) 1993-06-14

Family

ID=10571663

Family Applications (1)

Application Number Title Priority Date Filing Date
DK600185A DK166595B1 (da) 1984-12-21 1985-12-20 Integreret kredsloeb med indbygget selvtest

Country Status (10)

Country Link
US (1) US4764926A (fr)
EP (1) EP0195164B1 (fr)
JP (1) JPH0660933B2 (fr)
AT (1) ATE55837T1 (fr)
AU (1) AU580362B2 (fr)
DE (1) DE3579314D1 (fr)
DK (1) DK166595B1 (fr)
GB (1) GB8432533D0 (fr)
GR (1) GR853067B (fr)
IE (1) IE56976B1 (fr)

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Also Published As

Publication number Publication date
ATE55837T1 (de) 1990-09-15
GR853067B (fr) 1986-04-21
DE3579314D1 (de) 1990-09-27
DK600185A (da) 1986-06-22
AU580362B2 (en) 1989-01-12
EP0195164B1 (fr) 1990-08-22
AU5109585A (en) 1986-06-26
DK600185D0 (da) 1985-12-20
IE56976B1 (en) 1992-02-26
US4764926A (en) 1988-08-16
JPS61155878A (ja) 1986-07-15
JPH0660933B2 (ja) 1994-08-10
GB8432533D0 (en) 1985-02-06
IE853221L (en) 1986-06-21
EP0195164A1 (fr) 1986-09-24

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Legal Events

Date Code Title Description
B1 Patent granted (law 1993)
PBP Patent lapsed