FR2432175A1 - Procede pour tester un systeme logique et systeme logique pour la mise en oeuvre de ce procede - Google Patents

Procede pour tester un systeme logique et systeme logique pour la mise en oeuvre de ce procede

Info

Publication number
FR2432175A1
FR2432175A1 FR7822228A FR7822228A FR2432175A1 FR 2432175 A1 FR2432175 A1 FR 2432175A1 FR 7822228 A FR7822228 A FR 7822228A FR 7822228 A FR7822228 A FR 7822228A FR 2432175 A1 FR2432175 A1 FR 2432175A1
Authority
FR
France
Prior art keywords
logic system
testing
phase
implementing
normal configuration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7822228A
Other languages
English (en)
Other versions
FR2432175B1 (fr
Inventor
Henry Feissel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bull SA
Original Assignee
Bull SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bull SA filed Critical Bull SA
Priority to FR7822228A priority Critical patent/FR2432175A1/fr
Priority to JP9516979A priority patent/JPS5518800A/ja
Priority to DE19792930610 priority patent/DE2930610A1/de
Publication of FR2432175A1 publication Critical patent/FR2432175A1/fr
Application granted granted Critical
Publication of FR2432175B1 publication Critical patent/FR2432175B1/fr
Priority to US06/267,347 priority patent/US4423509A/en
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals

Abstract

L'invention a pour objet un procédé pour tester un système logique dont les connexions internes ne sont pas accessibles depuis l'extérieur. Le procédé comprend plusieurs phases : une phase de contrôle de fonctionnement du système dans sa confi guration normale, une phase de test dans cette nouvelle configuration, une phase de restauration de la configuration normale. L'invention propose également un dispositif faisant application du procédé. Ce dispositif fait essentiellement appel à des bascules de forçage et/ou de prélèvement pour modifier les interconnexions logiques internes entre les opérateurs du système.
FR7822228A 1978-07-27 1978-07-27 Procede pour tester un systeme logique et systeme logique pour la mise en oeuvre de ce procede Granted FR2432175A1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR7822228A FR2432175A1 (fr) 1978-07-27 1978-07-27 Procede pour tester un systeme logique et systeme logique pour la mise en oeuvre de ce procede
JP9516979A JPS5518800A (en) 1978-07-27 1979-07-27 Method for testing logic device and logic device
DE19792930610 DE2930610A1 (de) 1978-07-27 1979-07-27 Verfahren zum ueberpruefen eines datenverarbeitungssystemes und datenverarbeitungssystem zur durchfuehrung des verfahrens
US06/267,347 US4423509A (en) 1978-07-27 1981-05-26 Method of testing a logic system and a logic system for putting the method into practice

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7822228A FR2432175A1 (fr) 1978-07-27 1978-07-27 Procede pour tester un systeme logique et systeme logique pour la mise en oeuvre de ce procede

Publications (2)

Publication Number Publication Date
FR2432175A1 true FR2432175A1 (fr) 1980-02-22
FR2432175B1 FR2432175B1 (fr) 1981-01-09

Family

ID=9211240

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7822228A Granted FR2432175A1 (fr) 1978-07-27 1978-07-27 Procede pour tester un systeme logique et systeme logique pour la mise en oeuvre de ce procede

Country Status (4)

Country Link
US (1) US4423509A (fr)
JP (1) JPS5518800A (fr)
DE (1) DE2930610A1 (fr)
FR (1) FR2432175A1 (fr)

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US4502127A (en) * 1982-05-17 1985-02-26 Fairchild Camera And Instrument Corporation Test system memory architecture for passing parameters and testing dynamic components
US4556976A (en) * 1982-08-14 1985-12-03 International Computers Limited Checking sequential logic circuits
US4513418A (en) * 1982-11-08 1985-04-23 International Business Machines Corporation Simultaneous self-testing system
US4495629A (en) * 1983-01-25 1985-01-22 Storage Technology Partners CMOS scannable latch
US4534028A (en) * 1983-12-01 1985-08-06 Siemens Corporate Research & Support, Inc. Random testing using scan path technique
GB8432533D0 (en) * 1984-12-21 1985-02-06 Plessey Co Plc Integrated circuits
US4635261A (en) * 1985-06-26 1987-01-06 Motorola, Inc. On chip test system for configurable gate arrays
US4749947A (en) * 1986-03-10 1988-06-07 Cross-Check Systems, Inc. Grid-based, "cross-check" test structure for testing integrated circuits
US5065090A (en) * 1988-07-13 1991-11-12 Cross-Check Technology, Inc. Method for testing integrated circuits having a grid-based, "cross-check" te
DE3886529T2 (de) * 1988-08-27 1994-06-30 Ibm Einrichtung in einem Datenverarbeitungssystem zur System-Initialisierung und -Rückstellung.
NL8900151A (nl) * 1989-01-23 1990-08-16 Philips Nv Werkwijze voor het testen van een schakeling, alsmede schakeling geschikt voor een dergelijke werkwijze.
JP3118266B2 (ja) * 1990-03-06 2000-12-18 ゼロックス コーポレイション 同期セグメントバスとバス通信方法
US5166604A (en) * 1990-11-13 1992-11-24 Altera Corporation Methods and apparatus for facilitating scan testing of asynchronous logic circuitry
US5528600A (en) * 1991-01-28 1996-06-18 Actel Corporation Testability circuits for logic arrays
US5648661A (en) * 1992-07-02 1997-07-15 Lsi Logic Corporation Integrated circuit wafer comprising unsingulated dies, and decoder arrangement for individually testing the dies
US5389556A (en) * 1992-07-02 1995-02-14 Lsi Logic Corporation Individually powering-up unsingulated dies on a wafer
US5442282A (en) * 1992-07-02 1995-08-15 Lsi Logic Corporation Testing and exercising individual, unsingulated dies on a wafer
US5532174A (en) * 1994-04-22 1996-07-02 Lsi Logic Corporation Wafer level integrated circuit testing with a sacrificial metal layer
US6157210A (en) 1997-10-16 2000-12-05 Altera Corporation Programmable logic device with circuitry for observing programmable logic circuit signals and for preloading programmable logic circuits
DE102005009955A1 (de) * 2005-03-04 2006-09-07 Bayerische Motoren Werke Ag Verfahren und Vorrichtung zum Überwachen eines Ablaufs einer Rechenvorrichtung
KR100825013B1 (ko) * 2006-09-28 2008-04-24 주식회사 하이닉스반도체 패키지 레벨의 명령 테스트를 위한 반도체 장치

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2177791A1 (fr) * 1972-03-27 1973-11-09 Ibm
FR2330014A1 (fr) * 1973-05-11 1977-05-27 Ibm France Procede de test de bloc de circuits logiques integres et blocs en faisant application

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3815025A (en) * 1971-10-18 1974-06-04 Ibm Large-scale integrated circuit testing structure
US3789205A (en) * 1972-09-28 1974-01-29 Ibm Method of testing mosfet planar boards
US3784907A (en) * 1972-10-16 1974-01-08 Ibm Method of propagation delay testing a functional logic system
US3761695A (en) * 1972-10-16 1973-09-25 Ibm Method of level sensitive testing a functional logic system
US3961251A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
US3961252A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
US3961254A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
US4051352A (en) * 1976-06-30 1977-09-27 International Business Machines Corporation Level sensitive embedded array logic system
JPS5352029A (en) * 1976-10-22 1978-05-12 Fujitsu Ltd Arithmetic circuit unit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2177791A1 (fr) * 1972-03-27 1973-11-09 Ibm
FR2330014A1 (fr) * 1973-05-11 1977-05-27 Ibm France Procede de test de bloc de circuits logiques integres et blocs en faisant application

Also Published As

Publication number Publication date
JPS6258024B2 (fr) 1987-12-03
DE2930610A1 (de) 1980-02-07
FR2432175B1 (fr) 1981-01-09
US4423509A (en) 1983-12-27
JPS5518800A (en) 1980-02-09

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